Abstract: A device 1 for the inspection of one or a plurality of moving surfaces 8, more particularly for the inspection of a rotating surface 8 of a silicon wafer 13. The device comprises at least a laser light source 1 and a beam splitter 4 for splitting a light beam 2 that is emitted by said light source 1 into at least two sub-beams 5, 6 that interfere with one another so as to produce an interference pattern 10 on the surface 8 to be inspected. The device is arranged so that the interference pattern 10 contains a plurality of lines 11 of maximum intensity and lines 12 of minimum intensity, said lines extending essentially transversely of the direction of movement of the surface 8.

Abstract: The invention relates to methods of localizing a deviant region in a turbid medium. The invention also relates to devices for carrying out such methods. Said methods can possibly be used in optical mammography where a breast of a female body is examined by means of light. Said methods produce images in which any deviations, for example tumors, can be clearly recognized. This is achieved inter alia by providing markers (10) in an image (9) of the turbid medium.