Abstract: An erbium-doped (Er-doped) superfluorescent fiber source (SFS) has an enhanced mean wavelength stability. A method determines an estimated mean wavelength of a SFS. The method includes providing an Er-doped SFS having an actual mean wavelength. The method further includes configuring the SFS such that the actual mean wavelength has a dependence on the temperature of the EDF. The method further includes obtaining the dependence of the actual mean wavelength on the temperature of the EDF. The method further includes measuring the temperature of the EDF. The method further includes calculating the estimated mean wavelength using the measured temperature of the EDF and the dependence of the actual mean wavelength on the temperature of the EDF.

Abstract: An optical head for confocal microscopy that is especially advantageous for measurements on thick samples is provided. An interface between the optical head and the sample is index matched, to avoid beam aberration at this interface. The optical head includes a window having a convex surface facing away from the sample, so that light beams crossing this convex surface do so at or near normal incidence and are therefore not significantly aberrated. The window is rotationally symmetric about an axis perpendicular to the interface between the head and the sample. The head also includes at least two optical fibers, which can be used for input and/or output. Beams passing to and/or from the fibers are collimated by collimators. A single focusing element couples all the collimated beams to focused beams which pass through the window to intersect within a target region of the sample as confocal beams.

Abstract: A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.

Abstract: A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.

Abstract: A photonic-bandgap fiber includes a photonic crystal lattice with a first material having a first refractive index and a pattern of a second material formed therein. The second material has a second refractive index lower than the first refractive index. The photonic crystal lattice has a plurality of first regions that support intensity lobes of the highest frequency bulk mode and has a plurality of second regions that do not support intensity lobes of the highest frequency bulk mode. The photonic-bandgap fiber further includes a central core formed in the photonic crystal lattice. The photonic-bandgap fiber further includes a core ring having an outer perimeter. The core ring surrounds the central core, wherein the outer perimeter of the core ring passes only through the second regions of the photonic crystal lattice.

Abstract: A method measures a physical function, such as a second-order optical nonlinearity profile, or a temporal waveform of a laser pulse. The method includes forming a symmetric composite function by superimposing the physical function with a substantially identical physical function. The method further includes obtaining a Fourier transform of the symmetric composite function. The method further includes calculating an inverse Fourier transform of the obtained Fourier transform. The calculated inverse Fourier transform provides information regarding the physical function.

Abstract: A dual beam confocal microscope is provided. An optical source assembly provides two mutually coherent optical beams differing in frequency by a frequency difference ?f. The two beams are received by focusing assemblies that provide two focused beams to a sample. The focused beams intersect at a beam intersection angle within a target region of the sample. The two focused beams have respective focal regions preferably overlapping with the target region. A detector receives radiation emitted from the sample, including radiation emitted from the target region. The detector output, responsive to received intensity, is filtered with an electrical filter to provide a filtered signal. The electrical filter has a frequency response H(f), where H(f) has a pass band including f=?f and a stop band including f=0. Optionally, an optical filter and/or a collection assembly can be placed between the sample and detector.

Abstract: Coupling of core modes to surface modes in an air-core photonic-bandgap fiber (PBF) can cause large propagation losses. Computer simulations analyze the relationship between the geometry and the presence of surface modes in PBFs having a triangular hole pattern and identify ranges of core characteristic dimensions (e.g., radii) for which the fiber supports no surface modes (i.e., only core modes are present) over the entire wavelength range of the bandgap. In particular, for a hole spacing ? and a hole radius ?=0.47?, the core supports a single mode and supports no surface modes for core radii between about 0.68? and about 1.05?. The existence of surface modes can be predicted simply and expediently by studying either the bulk modes alone or the geometry of the fiber without requiring a full analysis of the defect modes.

Abstract: A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.

Abstract: A method measures a nolinearity profile of a sample with at least one sample surface and having a sample nonlinearity profile along a sample line through a predetermined point on the sample surface. The sample line is oriented perpendicularly to the sample surface. The method includes measuring a Fourier transform of the sample nonlinearity profile and obtaining a reference nonlinearity profile from a reference material. The method includes forming a first composite sample having a first composite nonlinearity profile and forming a second composite sample having a second composite nonlinearity profile inequivalent to the first composite nonlinearity profile. The method further includes measuring a Fourier transform of the first composite nonlinearity profile and measuring a Fourier transform of the second composite nonlinearity profile.

Abstract: A dual beam confocal microscope is provided. An optical source assembly provides two mutually coherent optical beams differing in frequency by a frequency difference &Dgr;f. The two beams are received by focusing assemblies that provide two focused beams to a sample. The focused beams intersect at a beam intersection angle within a target region of the sample. The two focused beams have respective focal regions preferably overlapping with the target region. A detector receives radiation emitted from the sample, including radiation emitted from the target region. The detector output, responsive to received intensity, is filtered with an electrical filter to provide a filtered signal. The electrical filter has a frequency response H(f), where H(f) has a pass band including f=&Dgr;f and a stop band including f=0. Optionally, an optical filter and/or a collection assembly can be placed between the sample and detector.

Abstract: Devices and methods for using surface or acoustic waves in a recording head to prevent particles from settling down on an interfacing surface on the head.

Abstract: An erbium-doped (Er-doped) superfluorescent fiber source (SFS) has an enhanced mean wavelength stability. A method determines an estimated mean wavelength of a SFS. The method includes providing an Er-doped SFS having an actual mean wavelength. The method further includes configuring the SFS such that the actual mean wavelength has a dependence on the temperature of the EDF. The method further includes obtaining the dependence of the actual mean wavelength on the temperature of the EDF. The method further includes measuring the temperature of the EDF. The method further includes calculating the estimated mean wavelength using the measured temperature of the EDF and the dependence of the actual mean wavelength on the temperature of the EDF.

Abstract: A method for measuring a physical function forms a symmetric composite function by combining the physical function with a reference function. The method obtains a Fourier transform of the symmetric composite function. The method calculates an inverse Fourier transform of the obtained Fourier transform, wherein the calculated inverse Fourier transform provides information regarding the physical function. The physical function can be a nonlinearity profile of a sample with at least one sample surface. The physical function can alternatively by a sample temporal waveform of a sample optical pulse.

Abstract: A scanning optical microscope which includes an optical fiber which serves as a point source of light and for collecting reflected light is disclosed. A lens for focusing the light from the optical fiber onto an image plane and for gathering light reflected form the image plane and focusing it into the optical fiber is also disclosed, together with a scanning mechanism for scanning the light to scan a field of view.

Abstract: This invention provides an angled-dual-axis confocal scanning microscope comprising a fiber-coupled, angled-dual-axis confocal scanning head and a vertical scanning unit. The angled-dual-axis confocal scanning head is configured such that an illumination beam and an observation beam intersect optimally at an angle &thgr; within an object and the scanning is achieved by pivoting the illumination and observation beams using a single scanning element, thereby producing an arc-line scan. The vertical scanning unit causes the angled-dual-axis confocal scanning head to move towards or away from the object.

Abstract: This invention provides an angled-dual-axis optical coherence scanning microscope comprising a fiber-coupled, high-speed angled-dual-axis confocal scanning head and a vertical scanning unit. The angled-dual-axis confocal scanning head is configured such that an illumination beam and an observation beam intersect optimally at an angle &thgr; within an object and the scanning is achieved by pivoting the illumination and observation beams jointly using a high-speed scanning element. The vertical scanning unit causes the angled-dual-axis confocal scanning head to move towards or away from the object, thereby yielding a vertical cross-section scan of the object, while keeping the optical path lengths of the illumination and observation beams unchanged. By incorporating MEMS scanning mirrors and fiber-optic components, the angled-dual-axis optical coherence scanning microscope of the present invention can be miniaturized to provide a particularly powerful tool for in vivo medical imaging applications.

Abstract: A method measures a nolinearity profile of a sample with at least one sample surface and having a sample nonlinearity profile along a sample line through a predetermined point on the sample surface. The sample line is oriented perpendicularly to the sample surface. The method includes measuring a Fourier transform of the sample nonlinearity profile and obtaining a reference nonlinearity profile from a reference material. The method includes forming a first composite sample having a first composite nonlinearity profile and forming a second composite sample having a second composite nonlinearity profile inequivalent to the first composite nonlinearity profile. The method further includes measuring a Fourier transform of the first composite nonlinearity profile and measuring a Fourier transform of the second composite nonlinearity profile.

Abstract: A method measures a physical function, such as a second-order optical nonlinearity profile, or a temporal waveform of a laser pulse. The method includes forming a symmetric composite function by superimposing the physical function with a substantially identical physical function. The method further includes obtaining a Fourier transform of the symmetric composite function. The method further includes calculating an inverse Fourier transform of the obtained Fourier transform. The calculated inverse Fourier transform provides information regarding the physical function.

Abstract: This invention provides an angled-dual-axis confocal scanning microscope comprising a fiber-coupled, angled-dual-axis confocal scanning head and a vertical scanning unit. The angled-dual-axis confocal scanning head is configured such that an illumination beam and an observation beam intersect optimally at an angle &thgr; within an object and the scanning is achieved by pivoting the illumination and observation beams using a single scanning element, thereby producing an arc-line scan. The vertical scanning unit causes the angled-dual-axis confocal scanning head to move towards or away from the object.