Abstract: A contacting unit (30) for a test handler (100) for carrying out functional tests on semiconductor elements having a surface, in particular on ICs (200), has a contacting module (60).

Abstract: A contacting unit (30) for a test handler (100) for carrying out functional tests on semiconductor elements having a surface, in particular on ICs (200), has a contacting module (60).

Abstract: A device for picking up, transporting and sorting electronic components in particular integrated circuits includes at least one loading device, one transport device, and one unloading device. The transport device has at least one transport wheel which is rotatable around a rotation axis and which has a peripheral face. The transport device also has at least one pick-up module which is arranged at the peripheral face and is suitable for accommodating components. In addition, the transport device is provided with a pressure source which is connected to the pick-up module. The pick-up module has at least one pick-up space for one individual component which extends along the peripheral face and can be moved between an initial position and an end position. The pressure source enables a prescribed pressure to be exerted at the pick-up space by means of which the component can be retained at the pick-up space or can be ejected from the pick-up space.

Abstract: A handling device for positioning a test head, in particular at a test station, is provided with a positioning means enabling the test head to be positioned with respect to three dimensions. The handling device also has a mounting on which the test head can be attached and which is connected to the positioning means. The handling device is also provided with a fastening plate which is movably mounted and a compliance module by means of which the fastening plate can be moved between a starting position (I) and an end position (II, III) against the effect of a return force. The compliance module includes a housing, a spindle, a first sliding bushing and a second sliding bushing which are arranged in a movable manner on the spindle between a first stop and a second stop, and a spring element arranged between the sliding bushings and which impinges on the sliding bushings. The sliding bushings are movable relative to the housing. The compliance module permits bi-directional compliance of the test head.

Abstract: A manipulator for positioning a test head is provided with a positioning means by which the test head is three-dimensionally positionable and with a cradle to which the test head is securable and which is connected to the positioning means. The manipulator includes a compensator which can be loaded by the mass of the test head. The positioning means includes a column and at least one lead screw extending in the vertical direction. The compensator is connected to the cradle and can be moved by the lead screw in the vertical direction. The compensator includes a driver cooperating with the lead screw and is guided in the vertical direction on the column. The compensator has a spring element which is biased and supported by the driver.

Abstract: A manipulator for positioning a test head is provided with a positioning means by which the test head is three-dimensionally positionable and with a cradle to which the test head is securable and which is connected to the positioning means. The manipulator includes a compensator which can be loaded by the mass of the test head. The positioning means includes a column and at least one lead screw extending in the vertical direction. The compensator is connected to the cradle and can be moved by the lead screw in the vertical direction. The compensator includes a driver cooperating with the lead screw and is guided in the vertical direction on the column. The compensator has a spring element which is biased and supported by the driver.

Abstract: A handling device for positioning a test head, in particular at a test station, is provided with positioning means enabling the test head to be positioned with respect to three dimensions. The handling device also has a mounting on which the test head can be attached and which is connected to the positioning means. The handling device is also provided with a fastening plate which is movably mounted and a compliance module by means of which the fastening plate can be moved between a starting position (I) and an end position (II, III) against the effect of a return force. The compliance module comprises a housing, a spindle, a first sliding bushing and a second sliding bushing which are arranged in a movable manner on the spindle between a first stop and a second stop, and a spring element arranged between the sliding bushings and which impinges on the sliding bushings. The sliding bushings are movable relative to the housing. The compliance module permits bi-directional compliance of the test head.

Abstract: A device for picking up, transporting and sorting electronic components in particular integrated circuits includes at least one loading device, one transport device, and one unloading device. The transport device has at least one transport wheel which is rotatable around a rotation axis and which has a peripheral face. The transport device also has at least one pick-up module which is arranged at the peripheral face and is suitable for accommodating components. In addition, the transport device is provided with a pressure source which is connected to the pick-up module. The pick-up module has at least one pick-up space for one individual component which extends along the peripheral face and can be moved between an initial position and an end position. The pressure source enables a prescribed pressure to be exerted at the pick-up space by means of which the component can be retained at the pick-up space or can be ejected from the pick-up space.

Abstract: A compliance module, particularly for a manipulator for positioning a test head, comprising a housing that is securable to a component. The compliance module furthermore comprises an inner sleeve shiftingly mounted in said housing and axially urged by a spring element, and a pin arranged on said housing and connected to said inner sleeve. A compliance module of such kind provides a precise location on the one hand and a certain compliance achievable of a portion of the manipulator for positioning a test head on the other hand.

Abstract: A manipulator, particularly for positioning a test head (70), is provided with positioning means (10) for three-dimensionally positioning the test head (70). In addition, the manipulator is provided with a mount (30) for the test head (70). The mount (30) comprises a rotary guide (31) by means of which the test head (70) is rotatable about an axis of rotation (y). The rotary guide (31) comprises a mounting plate (40) connected to the positioning means (10) and a supporting plate (50) rotatable relative to the mounting plate (40) about the axis of rotation (y), the test head (70) being securable to the supporting plate (50). Mounting plate (40) and supporting plate (50) have concentric openings (41, 51) for receiving a connecting cable connecting the test head (70) and feeder sectors (42, 52) forming an aperture open to the edge of each of the mounting plate (40) and supporting plate (50).

Abstract: A compliance module, particularly for a manipulator for positioning a test head, comprising a housing that is securable to a component. The compliance module furthermore comprises an inner sleeve shiftingly mounted in said housing and axially urged by a spring element, and a pin arranged on said housing and connected to said inner sleeve. A compliance module of such kind provides a precise location on the one hand and a certain compliance achievable of a portion of the manipulator for positioning a test head on the other hand.

Abstract: Disclosed is a handling device, especially for positioning a test head on a testing device, including a holder for a test head and a column. Positioning apparatus adjustable in a vertical direction is connected to the test head on the column. The handling device advantageously has a simple and compact structure and an exactly reproducible, smooth movement of the test head, because the positioning apparatus has at least one pair of interspaced articulated arms in which one end thereof is respectively articulated on the holder and the other end thereof is articulated on a carriage which can be displaced in a horizontal direction. The articulated arms can be pivotably arranged around a vertical axis. The carriages can move independently from each other.

Abstract: The present invention relates to a device and method for contacting one or more terminals (19) on an electronic component (18) including at least one elongated contact element (11). In this arrangement, one terminal (19) and a corresponding contact element (11) each can be pressed together in a first direction (16) by a contact force (F). The invention provides for elastically prestressing the contact element (11) in a second direction (26) differing from the first direction (16). To produce the prestress, a movable actuator (23) is used to advantage. In accordance with another aspect of the invention the lower end of the contact element is arranged non-shiftable whilst the second end is shifted by the actuator (23) for contacting. In both cases, a compact contacting device (10) is provided which maintains the desired contact force (F) accurately and features a long life due to the contact elements (11) being prestressed.

Abstract: A device for docking two means (100, 200), more particularly a probe (100) and a tester (200), including a first mounting board (110) arranged at the first means (100) and a second mounting board (210) arranged at the second means (200) which in the docked condition of the means (100, 200) are adjoined in a docking plane, the first mounting board (110) being provided with a recess (111) oriented inclined to the docking plane for engaging at least one peg (220) shiftingly mounted on the second mounting board (210), the second mounting board (210) comprising an actuator (300) by means of which the peg (220) guided in the recess (111) is shiftable between an open position and a docked position mutually clamping the first mounting board (110) and the second mounting board (210), wherein the actuator (300) has a slide (310, 311) mounting the peg (220) which is movable by means of a spindle (330, 331) between the open position and the docked position of the peg (220) in order to achieve a compact design and relativ

Abstract: A manipulator, particularly for positioning a test head (70), is provided with positioning means (10) for three-dimensionally positioning the test head (70). In addition, the manipulator is provided with a mount (30) for the test head (70). The mount (30) comprises a rotary guide (31) by means of which the test head (70) is rotatable about an axis of rotation (y). The rotary guide (31) comprises a mounting plate (40) connected to the positioning means (10) and a supporting plate (50) rotatable relative to the mounting plate (40) about the axis of rotation (y), the test head (70) being securable to the supporting plate (50). Mounting plate (40) and supporting plate (50) have concentric openings (41, 51) for receiving a connecting cable connecting the test head (70) and feeder sectors (42, 52) forming an aperture open to the edge of each of the mounting plate (40) and supporting plate (50).

Abstract: The invention relates to a handling device, especially for positioning a test head (40) on a testing device, comprising a holder (30) for a test head (30) and a column (10). Positioning means (20) which are adjustable in a vertical direction are connected to the test head (40) on said column (10). The inventive handling device has a simple and compact structure and is characterized by an exactly reproducible, smooth movement of the test head (40), the reason therefor being that the positioning means (20) are provided with at least one pair of interspaced articulated arms (21a, 22a, 22b) whereby one end thereof is respectively articulated on the holder (30) and the other end thereof is articulated on a carriage which can be displaced in a horizontal direction. The a arms (21a, 22a, 22b) can be pivotably arranged around a vertical axis. The carriages (23a, 23b) can move independently from each other.

Abstract: A device for docking two means (100, 200), more particularly a probe (100) and a tester (200), including a first mounting board (110) arranged at the first means (100) and a second mounting board (210) arranged at the second means (200) which in the docked condition of the means (100, 200) are adjoined in a docking plane, the first mounting board (110) being provided with a recess (111) oriented inclined to the docking plane for engaging at least one peg (220) shiftingly mounted on the second mounting board (210), the second mounting board (210) comprising an actuator (300) by means of which the peg (220) guided in the recess (111) is shiftable between an open position and a docked position mutually clamping the first mounting board (110) and the second mounting board (210), wherein the actuator (300) has a slide (310, 311) mounting the peg (220) which is movable by means of a spindle (330, 331) between the open position and the docked position of the peg (220) in order to achieve a compact design and relativ

Abstract: The invention relates to a picker for electronic components (24, 25, 26), more particularly for picking and subsequently testing the components (24, 25, 26). The picker has a fixed feed rail (11) for accommodating a plurality of components (24, 25, 26) arranged juxtaposed in a row as well as a conveyor unit (17) arranged at an exit opening (43) of the feed rail (11) and perpendicularly shiftable thereto. The conveyor unit has a window (27) suitable for receiving a single component (24, 25, 26). An impact-controllable stop (14) is provided in the feed rail (11) upstream of the conveyor unit (17) for arresting components (24, 25, 26) accommodated in the feed rail (11). The spacing between the stop (14) and an end of the feed rail (11) facing the conveyor unit (17) is substantially twice the overall length of a component (24, 25, 26). Pressure acting on a single component (24; 25; 26) arranged in the conveyor window (27) is reduced.

Abstract: The present invention relates to a device and method for contacting one or more terminals (19) on an electronic component (18) including at least one elongated contact element (11). In this arrangement, one terminal (19) and a corresponding contact element (11) each can be pressed together in a first direction (16) by a contact force (F). The invention provides for elastically prestressing the contact element (11) in a second direction (26) differing from the first direction (16). To produce the prestress, a movable actuator (23) is used to advantage. In accordance with another aspect of the invention the lower end of the contact element is arranged non-shiftable whilst the second end is shifted by the actuator (23) for contacting. In both cases, a compact contacting device (10) is provided which maintains the desired contact force (F) accurately and features a long life due to the contact elements (11) being prestressed.

Abstract: The invention relates to a picker for electronic components (24, 25, 26), more particularly for picking and subsequently testing the components (24, 25, 26). The picker comprises a fixed feed rail (11) for accommodating a plurality of components (24, 25, 26) arranged juxtaposed in a row as well as a conveyor unit (17) arranged at an exit opening (43) of the feed rail (11) and perpendicularly shiftable thereto. The conveyor unit comprises a window (27) suitable for receiving a single component (24, 25, 26).