Abstract: A gate drive circuit of the present invention is a gate drive circuit for driving an insulated gate switching element, which comprises a control drive circuit for applying a driving voltage to a control terminal of the switching element at a predetermined timing, and a voltage monitoring circuit for monitoring both a first voltage which is a power supply voltage of the control drive circuit and a second voltage which negatively biases the control terminal of the switching element, and in the gate drive circuit, the control drive circuit cuts off an output when at least one of the first and second voltages monitored by the voltage monitoring circuit becomes lower than a threshold value. It is an object of the present invention to provide an insulated gate switching element which can suppress wrong ON.

Abstract: A connecting device electrically connects a performance board which has PB terminals and a test head, and includes a sub board which is electrically connected to the test head and has sub terminals which face the PB terminals, a sealing mechanism which forms a sealed space between the sub board and the performance board, and a pressure reducing device which reduces the pressure of the sealed space. The pressure reducing device reduces the pressure of the sealed space so that the performance board and the sub board approach each other and the PB terminals and the sub terminals contact.

Abstract: Provided is a circuit board unit for connecting a connecting terminal of a testing apparatus to a connected terminal of a device under test, including: a circuit board having, on one surface, a contact corresponding to the connected terminal; and a connector guide provided on the one surface of the circuit board, the connector guide guiding a connector having the connecting terminal to the circuit board, and pulling the connector towards the circuit board. In this circuit board unit, the connector guide may bias the connector on a side of the connecting terminal, towards the circuit board. Moreover in the circuit board unit, the circuit board may further have a substrate frame that is coupled to the connector guide and biases the connector guide towards the circuit board.

Abstract: Provided is a test apparatus for testing a plurality of devices under test formed on a semiconductor wafer, including: a probe card to be connected to respective contacts of the plurality of the devices under test on a connection surface to be overlapped on the semiconductor wafer, the probe card being provided with a plurality of corresponding contacts on a rear surface of the connection surface; and a test head that tests the plurality of devices under test on the semiconductor wafer by sequentially connecting to each part of the plurality of contacts of the probe card.

Abstract: Provided is a circuit board unit for connecting a connecting terminal of a testing apparatus to a connected terminal of a device under test, including: a circuit board having, on one surface, a contact corresponding to the connected terminal; and a connector guide provided on the one surface of the circuit board, the connector guide guiding a connector having the connecting terminal to the circuit board, and pulling the connector towards the circuit board. In this circuit board unit, the connector guide may bias the connector on a side of the connecting terminal, towards the circuit board. Moreover in the circuit board unit, the circuit board may further have a substrate frame that is coupled to the connector guide and biases the connector guide towards the circuit board.

Abstract: An aging apparatus has a roller group consisting of a front roller, a middle roller and a rear roller, and a table for supporting the roller group. The middle roller takes a press state pressing a flexible tube with a constant force and a retraction state staying away from the flexible tube. In aging operation, while the middle roller comes in the press state, the table moves from a start position being a farthest end of the flexible tube to an end position. After the aging operation, the middle roller comes in the retraction state and the table returns to the start position. The aging operation is performed a predetermined number of times on the same flexible tube, so that the flexible tube is bent more largely with increase in the number of execution.

Abstract: The present invention is to provide a method of quickly detecting an antigen at an arbitrary concentration in an antigen sample, without a multi-stage examination of the concentration ratio between a detection reagent and an antigen to be detected, particularly when the concentration of the antigen in the sample is unknown, in the method of detecting an antigen using fluorescence correlation spectroscopy (FCS) or fluorescence cross-correlation spectroscopy (FCCS).

Abstract: An aging apparatus has a roller group consisting of a front roller, a middle roller and a rear roller, and a table for supporting the roller group. The middle roller takes a press state pressing a flexible tube with a constant force and a retraction state staying away from the flexible tube. In aging operation, while the middle roller comes in the press state, the table moves from a start position being a farthest end of the flexible tube to an end position. After the aging operation, the middle roller comes in the retraction state and the table returns to the start position. The aging operation is performed a predetermined number of times on the same flexible tube, so that the flexible tube is bent more largely with increase in the number of execution.

Abstract: The present invention provides a method of quickly and accurately detecting and/or assaying an antigen using fluorescence correlation spectroscopy (FCS), which involves a fluorescence-labeled antibody fragment and a non-fluorescence-labeled intact antibody that form a complex with the antigen. There is a significant difference in diffusion rate between the fluorescence-labeled antibody fragment not bonded to the antigen and the complex formed by the the fluorescence-labeled antibody fragment, the antigen, and the non-fluorescence-labeled intact antibody, and this diffusion rate can be determined using FCS. The antigen can be an antigenic protein, such as an abnormal prion or a harmful protein contained in a food material. According to this method, antigens over a wide scope can be assayed regardless of the shape or molecular weight.

Abstract: A biological signal detection system includes a pair of electrodes, adapted to be attached on a living body; a transmitter, adapted to be attached on the living body, and including an electric circuit operable to process the biological signal and to telemeter the processed signal; and a biological signal inputting apparatus. The system may also include a receiver-transmitter operable to receive the processed signal telemetered from the transmitter and to telemeter the processed signal to the biological signal inputting apparatus by way of a wide area network; and a storage for storing the processed signal telemetered from the transmitter as biological signal data and for inputting the biological signal data to the biological signal inputting apparatus. Also, the system may include a storage for storing the processed signal telemetered from the transmitter as biological signal data and for inputting the biological signal data to the biological signal inputting apparatus.

Abstract: The present invention provides a water-soluble fluorescent material having a luminescent region at a visible range and having excellent luminescent efficiency. The present invention relates to a water-soluble fluorescent material having a semiconductor nanocrystal; a linear or cyclic phenol compound having hydrophilic group and hydrophobic group that coats at least a portion of the surface of the semiconductor nanocrystal; and a coordinating organic compound coating at least a portion of the surface of the semiconductor nanocrystal.

Abstract: As devices are often different in the characteristics from one another, semiconductor chips based on the devices have discrepancies in the performance. A semiconductor device having a semiconductor switching element and a drive controlling means (1) for generating from input signals (A) and (B) drive signals (a) and (b) to control the action of the semiconductor switching element is provided comprising a characteristic compensating means (2) for generating from a characteristic compensation input signal a compensation signal to eliminate variations in the transmission delay time of the drive controlling means (1).

Abstract: The present invention provides a method of quickly and accurately detecting and/or assaying an antigen using fluorescence correlation spectroscopy (FCS), which involves a fluorescence-labeled antibody fragment and a non-fluorescence-labeled intact antibody that form a complex with the antigen. There is a significant difference in diffusion rate between the fluorescence-labeled antibody fragment not bonded to the antigen and the complex formed by the the fluorescence-labeled antibody fragment, the antigen, and the non-fluorescence-labeled intact antibody, and this diffusion rate can be determined using FCS. The antigen can be an antigenic protein, such as an abnormal prion or a harmful protein contained in a food material. According to this method, antigens over a wide scope can be assayed regardless of the shape or molecular weight.

Abstract: A control output signal is supplied to a gate electrode of an insulated gate transistor from a control signal output terminal of a control device, however, with regard to the insulated gate transistor, a control output signal is also influenced when that transistor is short-circuited, and a signal waveform different from that in a normal operating state occurs. The short-circuit is detected by monitoring the control output signal of the insulated gate transistor, and in case of the short-circuit, the short-circuit protection of the insulated gate transistor is performed by forcing the control device to stop that control output signal.

Abstract: As devices are often different in the characteristics from one another, semiconductor chips based on the devices have discrepancies in the performance. A semiconductor device having a semiconductor switching element and a drive controlling means (1) for generating from input signals (A) and (B) drive signals (a) and (b) to control the action of the semiconductor switching element is provided comprising a characteristic compensating means (2) for generating from a characteristic compensation input signal a compensation signal to eliminate variations in the transmission delay time of the drive controlling means (1).

Abstract: An electrode 4 for detecting a biological signal and a loop antenna 3 are integrally mounted on a support 2 placed on the surface of a living body and a transmitter 5 is placed on the support 2. A biological signal detected on the electrode 4 is input through a connector 11 to electric circuitry 10 of the transmitter 5 and an electric signal processed by the electric circuitry 10 is output through connectors 12 and 13 to both ends of the loop antenna 3 from which the biological signal is emitted to a receiver. At this time, the opening face of the loop antenna 3 is in a direction almost perpendicular to the surface of a living body for improving sensitivity.

Abstract: A pulse generation part outputs a first ON pulse signal for turning a switching device on to a control part on based on the leading edge of a signal from the outside of a semiconductor device. The pulse generation part subsequently outputs a second ON pulse signal for turning the switching device on to the control part based on the same leading edge of the signal as the first ON pulse signal after a lapse of prescribed time after outputting the first ON pulse signal. Even if the control part cannot output an ON signal to the switching device based on the first ON pulse signal, the control part can output an ON signal based on the second ON pulse signal.

Abstract: There is provided an apparatus for picking up a defective portion replica that can pick up a replica with high accuracy and positively even from a surface of a structure in the water. Within a container part provided at a leading end of a replica pickup part is displaced a deformable member, such as a porous expansion member, which is excellent in adhesion with a replica and which deforms when a replica material is poured into a gap between a surface of a structure and the deformable member. The replica material from the replica material supply nozzle is poured into the gap between the surface of a structure and the porous expansion member and the replica is recovered by making use of adhesion with the porous expansion member.

Abstract: A shunt voltage that is generated at a shunt resistor (50) is input to overcurrent detecting means (22). When detecting an overcurrent, the overcurrent detecting means (22) inputs a current abnormality signal indicative of a current abnormality to reset signal outputting means (24). The reset signal outputting means (24) stores the occurrence of abnormality from the received current abnormality signal, and waits for recovery from the abnormality afterward. Then, when an overcurrent is no longer detected from the received current abnormality signal, the reset signal outputting means (24) determines that recovery from the abnormality has taken place, and inputs a reset signal composed of a pulse signal of H level for starting the operation to a fault signal output circuit (17) through a reset terminal (RESET). The fault signal output circuit (17) which has received the reset signal inputs a fault signal that has been shifted from L level to H level to a lower arm drive circuit (14).

Abstract: A semiconductor apparatus is provided with a power switching semiconductor device, a control integrated circuit, a current detector section, and a protection circuit. The control integrated circuit drives the power switching semiconductor device, and the current detector section detects a current flowing in the power switching semiconductor device. The protection circuit compares a detected voltage obtained from the current detector section with a comparison reference voltage obtained from a predetermined reference voltage, and stops the control integrated circuit from driving the power switching semiconductor device when the detected voltage is higher than the comparison reference voltage. A terminal is further provided that pulls out a line of the comparison reference voltage to an external circuit of the semiconductor apparatus so as to change the comparison reference voltage by means of an external resistor connected to the terminal.