Patents by Inventor Hiroshi Tasaki
Hiroshi Tasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11967458Abstract: A superconducting coil includes: a winding member 12 that has a side surface 18 along a coil radial direction and is formed by laminating a superconducting tape wire 20 in the coil radial direction by winding; and a bypass 19 that is provided on the side surface 18 of the winding member 12 and electrically connects the superconducting tape wire 20 in the coil radial direction.Type: GrantFiled: June 30, 2023Date of Patent: April 23, 2024Assignees: KABUSHIKI KAISHA TOSHIBA, Toshiba Energy Systems & Solutions CorporationInventors: Sadanori Iwai, Taizo Tosaka, Hiroshi Miyazaki, Kenji Tasaki
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Patent number: 10839043Abstract: A state change detection unit obtains the data generation probability on the basis of the values of observation data and the value of a parameter of a prior distribution, obtains, on the basis of the data generation probability, a run length probability distribution of the time-series observation data acquired up to the current time point as a condition, and detects a change in the state of a facility on the basis of the run length probability distribution. Furthermore, an update unit updates the value of the parameter of the prior distribution using the values of the observation data, to generate the prior distribution to be used for calculating the data generation probability at a next time point.Type: GrantFiled: December 6, 2016Date of Patent: November 17, 2020Assignee: OMRON CorporationInventor: Hiroshi Tasaki
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Patent number: 10678887Abstract: A state change detection unit obtains the data occurrence probability based on the values of observation data and the value of a parameter of a prior distribution, obtains, based on the data generation probability, a run length probability distribution when the time-series observation data acquired up to the current time point is used as a condition, and detects a change in the state of a facility based on the run length probability distribution. An update unit updates the value of the parameter of the prior distribution using the value of the observation data, to generate the prior distribution for calculating the data occurrence probability at a next time point. In cases when the current time point is determined to be a change point in the state of the facility, the state change detection unit also searches for a change indication point based on the run length probability distribution.Type: GrantFiled: December 6, 2016Date of Patent: June 9, 2020Assignee: OMRON CorporationInventor: Hiroshi Tasaki
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Patent number: 10521193Abstract: Provided is a monitoring system including an operation results acquisition unit that acquires time series data of each of a plurality of indexes that indicate operation results of a monitoring target; an overall index generation unit that produces time series data of an overall index by combining a plurality of index values at a same time point based on the time series data of each of the plurality of indexes; and a change point detection unit that analyzes the time series data of the overall index, and detects a point where a significant change appears in the overall index values, as a change point in a status of the monitoring target.Type: GrantFiled: January 21, 2015Date of Patent: December 31, 2019Assignee: OMRON CorporationInventor: Hiroshi Tasaki
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Publication number: 20180232339Abstract: A state change detection unit obtains the data occurrence probability based on the values of observation data and the value of a parameter of a prior distribution, obtains, based on the data generation probability, a run length probability distribution when the time-series observation data acquired up to the current time point is used as a condition, and detects a change in the state of a facility based on the run length probability distribution. An update unit updates the value of the parameter of the prior distribution using the value of the observation data, to generate the prior distribution for calculating the data occurrence probability at a next time point. In cases when the current time point is determined to be a change point in the state of the facility, the state change detection unit also searches for a change indication point based on the run length probability distribution.Type: ApplicationFiled: December 6, 2016Publication date: August 16, 2018Applicant: OMRON CorporationInventor: Hiroshi TASAKI
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Publication number: 20180232338Abstract: A state change detection unit obtains the data generation probability on the basis of the values of observation data and the value of a parameter of a prior distribution, obtains, on the basis of the data generation probability, a run length probability distribution of the time-series observation data acquired up to the current time point as a condition, and detects a change in the state of a facility on the basis of the run length probability distribution. Furthermore, an update unit updates the value of the parameter of the prior distribution using the values of the observation data, to generate the prior distribution to be used for calculating the data generation probability at a next time point.Type: ApplicationFiled: December 6, 2016Publication date: August 16, 2018Applicant: OMRON CorporationInventor: Hiroshi TASAKI
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Publication number: 20180231427Abstract: Provided is a sensor device (1) that accurately calculate a temperature of a detection target and simplifies a shape of a housing. The sensor device (1) includes a pressure sensor (60), a first temperature sensor (70) that detects a temperature conducted from a detection target, a second temperature sensor (80) that is provided at a position that is more distant from the detection target than the first temperature sensor (70), and a temperature calculator (11) that calculates a temperature of the detection target from a detected temperature of the first temperature sensor (70) and a detected temperature of the second temperature sensor (80).Type: ApplicationFiled: November 15, 2017Publication date: August 16, 2018Applicant: OMRON CorporationInventor: Hiroshi TASAKI
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Publication number: 20160342392Abstract: Provided is a monitoring system including an operation results acquisition unit that acquires time series data of each of a plurality of indexes that indicate operation results of a monitoring target; an overall index generation unit that produces time series data of an overall index by combining a plurality of index values at a same time point based on the time series data of each of the plurality of indexes; and a change point detection unit that analyzes the time series data of the overall index, and detects a point where a significant change appears in the overall index values, as a change point in a status of the monitoring target.Type: ApplicationFiled: January 21, 2015Publication date: November 24, 2016Applicant: OMRON CorporationInventor: Hiroshi TASAKI
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Patent number: 9136533Abstract: This invention provides a lithium nickel manganese cobalt composite oxide having a composition of LiaNixMnyCozO2 (x+y+z=1, 1.05<a<1.3), wherein, in the data obtained by measuring a Raman spectrum of the composite oxide, the peak intensity of an Eg oscillation mode of a hexagonal crystal structure located at 480 to 495 cm?1 and the peak intensity of an F2g oscillation mode of a spinel structure located at 500 to 530 cm?1 in relation to the peak intensity of an A1g oscillation mode having a hexagonal crystal structure in which the main peak is located at 590 to 610 cm?1 are respectively 15% or higher and 40% or lower than the peak intensity of the A1g oscillation mode of a hexagonal crystal structure as the main peak. Thereby, the Raman spectrum can be used for the identification of the crystal structure to clarify the characteristics of a positive electrode precursor composed of lithium nickel manganese cobalt composite oxide.Type: GrantFiled: December 8, 2006Date of Patent: September 15, 2015Assignee: JX Nippon Mining & Metals CorporationInventors: Ryuichi Nagase, Yoshio Kajiya, Hiroshi Tasaki
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Patent number: 8630823Abstract: A feature parameter candidate generation apparatus has a storage unit that stores the values of feature parameters extracted from each of samples, an index value calculation unit that calculates an index value, which is obtained by normalizing the number of the kinds of the values of feature parameters by the number of the samples, for each of the feature parameters, an evaluation object selection unit that selects combinations of feature parameters which are objects to be evaluated, an evaluation unit that evaluates whether the uniformity of a frequency distribution of index values of the individual feature parameters for combinations of feature parameters selected as the objects to be evaluated satisfies a predetermined criterion, and a candidate determination unit that determines, as feature parameter candidates to be given to the model generation device, a combination of feature parameters that is evaluated to satisfy the predetermined criterion.Type: GrantFiled: October 31, 2008Date of Patent: January 14, 2014Assignee: Omron CorporationInventors: Mitsuhiro Yoneda, Hiroshi Nakajima, Naoki Tsuchiya, Hiroshi Tasaki
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Publication number: 20120185221Abstract: Suitability of determination standard value for intermediate inspection is determined. A correlation between measured values X for intermediate inspection and measured values Y for final inspection is derived. For each of calculation target points on X-axis, a distribution pattern of measured values Y is specified for measured value Xn of the point based on the correlation, and probabilities of a range determined to be non-defective by determination standard value of final inspection and a range determined to be defective that are included in the distribution are calculated. For each of the ranges of measured values X determined to be non-defective and defective based on the determination standard value of the intermediate inspection, a degree of consistency and a degree of inconsistency between results of inspections are determined using the probabilities. Suitability of the determination standard value is determined based on the two degrees.Type: ApplicationFiled: October 25, 2011Publication date: July 19, 2012Applicant: OMRON CORPORATIONInventors: Hiroyuki Mori, Katsuki Nakajima, Hiroshi Tasaki
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Inspection standard setting device, inspection standard setting method and process inspection device
Patent number: 8224605Abstract: An information processing device stores an extracted feature of each inspection item of the process inspection, and a determination result of a final inspection in a memory device, calculates a separation degree between a distribution of features of products which were determined as good products at the final inspection and a distribution of features of products which were determined as defective products at the final inspection for every inspection item or every combination of inspection items based on data of the products stored in the memory device, selects an inspection item whose inspection standard is to be reset from the inspection items or the combinations of the inspection items based on a value of the separation degree. Thus providing a method of appropriately setting an inspection standard for detecting a defect sign during process inspection. Further a process inspection device and inspection standard setting device which implements the same.Type: GrantFiled: May 12, 2006Date of Patent: July 17, 2012Assignee: OMRON CorporationInventors: Hiroshi Tasaki, Kazuto Kojitani -
Patent number: 7860620Abstract: An inspection apparatus includes a discrimination function determination unit which determines whether or not a discrimination function forms an area including a discrimination sample. The discrimination function is used in non-parametric one-class discrimination. The discrimination sample is discriminated into a class as a single area in an input space where learning samples are plotted.Type: GrantFiled: May 9, 2007Date of Patent: December 28, 2010Assignee: OMRON CorporationInventors: Kazuto Kojitani, Hiroshi Tasaki, Hiroshi Nakajima, Seiko Ito
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Patent number: 7799301Abstract: Provided is a cathode material for a lithium secondary battery composed of an aggregate of Li-A-O composite oxide particles (wherein A represents one or more metal elements selected from Mn, Fe, Co and Ni), wherein the lithium composite oxide contains 20 to 100 ppm (by mass) of P, and the total content of impurity elements excluding essential components is 2000 ppm or less. Also provided is a manufacturing method of such a cathode material for a lithium secondary battery including the steps of suspending lithium carbonate in water and thereafter introducing a metallic salt solution of one or more metal elements selected from Mn, Fe, Co and Ni in the lithium carbonate suspension, adding a small amount of phosphoric acid so that the P content in the Li-A-O composite oxide particles will be 20 to 100 ppm (by mass), and forming an aggregate of Li-A-O composite oxide particles containing 20 to 100 ppm (by mass) of P by filtering, cleansing, drying and thereafter oxidizing the obtained carbonate.Type: GrantFiled: October 13, 2005Date of Patent: September 21, 2010Assignee: Nippon Mining & Metals Co., Ltd.Inventors: Yoshio Kajiya, Hiroshi Tasaki
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Publication number: 20100235151Abstract: A feature parameter candidate generation apparatus has a storage unit that stores the values of feature parameters extracted from each of samples, an index value calculation unit that calculates an index value, which is obtained by normalizing the number of the kinds of the values of feature parameters by the number of the samples, for each of the feature parameters, an evaluation object selection unit that selects combinations of feature parameters which are objects to be evaluated, an evaluation unit that evaluates whether the uniformity of a frequency distribution of index values of the individual feature parameters for combinations of feature parameters selected as the objects to be evaluated satisfies a predetermined criterion, and a candidate determination unit that determines, as feature parameter candidates to be given to the model generation device, a combination of feature parameters that is evaluated to satisfy the predetermined criterion.Type: ApplicationFiled: October 31, 2008Publication date: September 16, 2010Inventors: Mitsuhiro Yoneda, Hiroshi Nakajima, Naoki Tsuchiya, Hiroshi Tasaki
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Publication number: 20090200508Abstract: This invention provides a lithium nickel manganese cobalt composite oxide having a composition of LiaNixMnyCozO2 (x+y+z=1, 1.05<a<1.3), wherein, in the data obtained by measuring a Raman spectrum of the composite oxide, the peak intensity of an Eg oscillation mode of a hexagonal crystal structure located at 480 to 495 cm?1 and the peak intensity of an F2g oscillation mode of a spinel structure located at 500 to 530 cm?1 in relation to the peak intensity of an A1g oscillation mode having a hexagonal crystal structure in which the main peak is located at 590 to 610 cm?1 are respectively 15% or higher and 40% or lower than the peak intensity of the A1g oscillation mode of a hexagonal crystal structure as the main peak. Thereby, the Raman spectrum can be used for the identification of the crystal structure to clarify the characteristics of a positive electrode precursor composed of lithium nickel manganese cobalt composite oxide.Type: ApplicationFiled: December 8, 2006Publication date: August 13, 2009Applicant: NIPPON MINING & METALS CO., LTD.Inventors: Ryuichi Nagase, Yoshio Kajiya, Hiroshi Tasaki
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Publication number: 20090121198Abstract: Provided is a cathode material for a lithium secondary battery composed of an aggregate of Li-A-O composite oxide particles (wherein A represents one or more metal elements selected from Mn, Fe, Co and Ni), wherein the lithium composite oxide contains 20 to 100 ppm (by mass) of P, and the total content of impurity elements excluding essential components is 2000 ppm or less. Also provided is a manufacturing method of such a cathode material for a lithium secondary battery including the steps of suspending lithium carbonate in water and thereafter introducing a metallic salt solution of one or more metal elements selected from Mn, Fe, Co and Ni in the lithium carbonate suspension, adding a small amount of phosphoric acid so that the P content in the Li-A-O composite oxide particles will be 20 to 100 ppm (by mass), and forming an aggregate of Li-A-O composite oxide particles containing 20 to 100 ppm (by mass) of P by filtering, cleansing, drying and thereafter oxidizing the obtained carbonate.Type: ApplicationFiled: October 13, 2005Publication date: May 14, 2009Applicant: NIPPON MINING & METALS CO., LTD.Inventors: Yoshio Kajiya, Hiroshi Tasaki
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Publication number: 20080219544Abstract: A factor estimating support device supports estimation of factor from a result generated in a production system. In the factor estimating support device, material/environment history data and test history data acquired from the production system, and the causality structure data indicating causality between the plurality of variables are stored in the storage unit, where when determined that the final quality characteristic is abnormal in the final quality abnormal detecting part, determination is made on whether each variable other than the final quality characteristic is abnormal in the variable abnormality detecting part, and the determination result is reflected on a visible image in which the causality structure data is visualized in the visible image creating part.Type: ApplicationFiled: March 7, 2008Publication date: September 11, 2008Applicant: OMRON CORPORATIONInventors: Hiroshi Tasaki, Yoshifumi Hasegawa, Kazuto Kojitani, Satoshi Ohtani, Takuma Kawai
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Publication number: 20070265743Abstract: An inspection apparatus includes a discrimination function determination unit which determines whether or not a discrimination function forms an area including a discrimination sample. The discrimination function is used in non-parametric one-class discrimination. The discrimination sample is discriminated into a class as a single area in an input space where learning samples are plotted.Type: ApplicationFiled: May 9, 2007Publication date: November 15, 2007Applicant: OMRON CorporationInventors: Kazuto Kojitani, Hiroshi Tasaki, Hiroshi Nakajima, Seiko Ito
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Patent number: D841501Type: GrantFiled: September 7, 2017Date of Patent: February 26, 2019Assignee: OMRON CorporationInventors: Tetsu Shimizu, Takamasa Kameda, Koyo Ozaki, Hiroshi Tasaki, Takashi Muramatsu, Yuki Marumoto