Abstract: An organic substance analyzer, which comprises a irradiating unit for irradiating a specimen containing organic substances with an electron beam, a spectrum detecting unit for detecting spectrum of fluorescent light emitted from said specimen, a storage unit for storing a shape of a reference spectrum of fluorescent light of each specific type of organic substance when the electron beam is irradiated on said specific type of organic substance, and a searching unit for classification and identifying organic substances in the specimen by comparing the shape of said stored reference spectrum with that of said detected spectrum, whereby the electron beam having higher energy than light is irradiated the specimen for analysis, fluorescent light with spectrum in wider range is emitted from the specimen even in ultraviolet range, and organic substances in the specimen are discriminated and identified by comparing shapes of the measured spectral pattern obtained from the fluorescent light with a reference spectral pa

Abstract: A specific binding material labeled with an ultrafine inorganic phosphor 1 to 100 nm in particle size is disclosed The composition of the ultrafine inorganic phosphor is one of Ln.sub.2 O.sub.3 :Re, Ln.sub.2 O.sub.2 S:Re, ZnO, CaWO.sub.4, MO.xAl.sub.2 O.sub.3 :Eu, Zn.sub.2 SiO.sub.4 :Mn, and LaPO.sub.4 :Ce,Tb, wherein Ln represents at least one element selected from La, Gd, Lu, and Y, Re represents at least one element selected from lanthanide elements, M represents at least one element selected from alkali earth metals, and x represents a value from 0.5 to 15. This ultrafine inorganic phosphor is prepared by one of the following processes a process of evaporation in a gas including an RF thermal plasma process, dc plasma thermal spraying, sputtering, glass crystallization, a sol-gel process, precipitation including hydrothermal synthesis, and a spraying process.

Abstract: An apparatus for displaying a sample image comprises a scanning illumination system 3 for scanning a sample by an irradiation ray ray being relatively moved, a first detection portion 7 for detecting a first detection signal obtained from a continuous area of the sample by the irradiation ray ray, a second detection portion 9 for detecting a faint second detection signal obtained from a micro-discrete area of the sample by the irradiation ray ray, a signal processing portion 16 for processing the second detection signal such that a pixel size in accordance with the second detection signal is enlarged relative to a pixel size in accordance with the first detection signal, an image signal formation portion 17 for forming a superimposed image signal by superimposing the second detection signal processed by the signal processing portion upon the first detection signal, and an image display portion 19 for displaying an image of the sample in accordance with the superimposed image signal.

Abstract: The present invention aims at providing an apparatus for morphological observation of a sample or easily identifying a luminous part of a sample.

Abstract: An electron microscope of a scanning type provided with two specimen stages for allowing specimens of a large size and a small size to be selectively and interchangeably observed. The microscope comprises an electron gun, a first objective lens for observing a small size specimen, a second objective lens for observing a large size specimen, the second objective lens being disposed in axial opposition to the electron gun with the first objective lens disposed therebetween. The specimen stage for the small size specimen is disposed in the vicinity of the first objective lens, while the specimen stage for the large size specimen is disposed near the focal plane of the second objective lens. Improved stability, high resolving power and simplified manipulatability are attained.

Abstract: An electron microscope of scanning type comprises first and second detectors for detecting secondary electrons emitted from a specimen irradiated by a scanning electron beam are disposed across the magnetic field of an objective lens of an electron-optical system of the microscope. The detection signals obtained from the outputs of both detectors are subjected to simultaneous signal processings.

Abstract: A scanning electron microscope comprising a double gap lens in its electron beam irradiating system. The double gap lens is arranged between the electron gun and the final stage condenser lens, and is excited by a lens current such that a large change of electron beam diameter may be controlled by a small change of lens excitation current.