Abstract: Embodiments herein describe correcting nonlinearity in a Digital-to-Time Converter (DTC) by relaxing a DTC linearity requirement, which results in the correction being co-adapted with a DTC gain calibration loop which can operate in parallel with a DTC integral nonlinearity (INL) correction loop. In one embodiment, the DTC gain calibration loop and the DTC INL correction loop are constrained when determining a nonlinearity correction code to improve the likelihood they converge. Once determined, the nonlinearity correction code can be combined with an digital code output by a time-to-digital converter (TDC) to generate a phase difference between a reference clock and a feedback clock.

Abstract: Embodiments herein describe normalizing an output of a TDC in a DPLL to a resolution of the TDC. A DTC can delay a reference clock which is then input into the TDC. The TDC outputs a digital code indicating a time difference between the delayed reference clock output by the DTC and a clock generated by a DCO in the DPLL. This digital code is normalized to a resolution of the TDC and the result is filtered by a DLF.

Abstract: Examples herein relate to electronic devices that include an asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) that implements timing adjustment based on output statistics. In an example, an electronic device includes an asynchronous SAR ADC, a statistics monitor, and an operation setting circuit. The asynchronous SAR ADC is configured to output output data. The statistics monitor is configured to capture samples at a bit position of the output data. The statistics monitor is further configured to generate an operational setting based on the captured samples. The operation setting circuit is configured to adjust an operating condition of the asynchronous SAR ADC based on the operational setting.

Abstract: A continuous time linear equalizer (CTLE) is disclosed. The CTLE may include a first cell configured to buffer and invert an input signal and generate a first intermediate signal, a second cell configured to buffer and invert the input signal and generate a second intermediate signal, and a first frequency section configured to selectively buffer and invert a first range of frequencies of the second intermediate signal. The first frequency section may include a first tunable resistor configured to provide a first resistance and a third cell coupled to the first tunable resistor configured to generate a third intermediate signal based on the first resistance.

Abstract: An analog signal buffer is disclosed. The analog signal buffer may include a transconductance cell and an active load. The active load may load the current from the transconductance cell with a PMOS transistor and an NMOS transistor and provide a feedback resistance. A transimpedance amplifier is disclosed. The transimpedance amplifier may include a first cell configured to receive a first signal and output a second signal and a second cell coupled to the first cell. The second cell may include an active feedback structure configured to couple an output of the second cell to an input of the second cell.

Abstract: A speculative decision feedback equalizer with split unroll multiplexers is provided. The speculative decision feedback equalizer splits an unroll multiplexer into two multiplexers. One split multiplexer provides a data path for the unroll selection signal, and the other split multiplexer provides a separate data path for the summer differential tap. In this way, the loading of an input stage of the summer circuit and the loading from the h1 unrolling loop are decoupled, allowing each split multiplexer to be configured according to a specific timing requirement along a respective data path. Thus, timing performance of the speculative decision feedback equalizer is improved.

Abstract: A method for testing on-die capacitors is provided. The method comprises transmitting, during a first time period, a first modulated testing signal from a first transmitter port of a transmitter to a first receiver port of a receiver along a first path of a differential signal, the first receiver port connected to a first on-die capacitor in the receiver along the first path; driving, during the first time period, a constant voltage on a second transmitter port of the transmitter to a second receiver port of the receiver along a second path of the differential signal comprising a second on-die capacitor; and determining whether the first on-die capacitor is functional, based on the first modulated testing signal.

Abstract: A circuit for receiving signals in an integrated circuit device. The circuit comprises a first equalizer circuit having a first input for receiving a first input signal and generating an output signal at a first output; a second equalizer circuit having a second input for receiving the output signal generated at the first output of the first equalizer circuit and having a second output; and a control circuit having a control output coupled to the second output of the second equalizer circuit; wherein the control circuit provides an offset cancellation signal or a loopback signal to the second output of the second equalizer circuit. A method of receiving signals in an integrated circuit is also described.

Abstract: A circuit for receiving a signal in an integrated circuit is described. The circuit comprises a sampler configured to receive an input data signal, wherein the sampler generates sampled data and a recovered clock; a clock and data recovery circuit configured to receive the sampled data and the recovered clock and to generate a phase interpolator code; and a phase interpolator configured to receive the phase interpolator code; wherein the phase interpolator generates multiple phase interpolator control signals during a clock cycle based upon the phase interpolator code generated for the clock cycle.

Abstract: A circuit for receiving a signal in an integrated circuit is described. The circuit comprises a sampler configured to receive an input data signal, wherein the sampler generates sampled data and a recovered clock; a clock and data recovery circuit configured to receive the sampled data and the recovered clock and to generate a phase interpolator code; and a phase interpolator configured to receive the phase interpolator code; wherein the phase interpolator generates multiple phase interpolator control signals during a clock cycle based upon the phase interpolator code generated for the clock cycle.

Abstract: An apparatus and method and system therefor relates generally to decision threshold control. In such an apparatus, an ac-coupler circuit is configured as a high-pass circuit path for a first frequency range. A buffer amplifier circuit is coupled in parallel with the ac-coupler circuit. The buffer amplifier circuit is configured as a low-pass circuit path for a second frequency range. An offset injection circuit is coupled to both the ac-coupler circuit and the buffer amplifier circuit and configured to inject an offset.

Abstract: In one example, a driver circuit includes a differential transistor pair configured to be biased by a current source and including a differential input and a differential output. The driver circuit further includes a resistor pair coupled between a node pair and the differential output, a transistor pair coupled between a voltage supply and the node pair, and a bridge transistor coupled between the node pair. The driver circuit further includes a pair of three-state circuit elements having a respective pair of input ports, a respective pair of control ports, and a respective pair of output ports. The pair of output ports is respectively coupled to the node pair. The pair of control ports is coupled to a common node comprising each gate of the transistor pair and a gate of the bridge transistor.

Abstract: An integrated circuit (IC) includes a serial-to-parallel converter configured to receive a serial input signal to provide one or more parallel output signals. The serial input signal is an M-level Pulse-Amplitude Modulated (PAM) signal, wherein M is a positive integer. The serial-to-parallel converter includes a data converter configured to receive the serial input signal and provide a data converter output signal. The data converter output signal represents information of the serial input signal with N1 bits, and N1 is a positive integer. An encoder is configured to encode the data converter output signal to provide encoder output signal with N2 bits, wherein N2 is a positive integer less than half of N1. One or more sub-deserializers are configured to receive the encoder output signal and generate the one or more parallel output signals.

Abstract: In one example, a driver circuit includes a differential transistor pair configured to be biased by a current source and including a differential input and a differential output. The driver circuit further includes a resistor pair coupled between a node pair and the differential output, a transistor pair coupled between a voltage supply and the node pair, and a bridge transistor coupled between the node pair. The driver circuit further includes a pair of three-state circuit elements having a respective pair of input ports, a respective pair of control ports, and a respective pair of output ports. The pair of output ports is respectively coupled to the node pair. The pair of control ports is coupled to a common node comprising each gate of the transistor pair and a gate of the bridge transistor.

Abstract: An integrated circuit and method for providing a differential transmission line driver are disclosed. One embodiment of the differential transmission line driver comprises a current mode logic (CML) stage, and a cross-coupled n-channel enhancement type metal-oxide semiconductor field-effect transistor (NMOS) stage, wherein the cross-coupled NMOS stage provides a feedback current to the CML stage, where each output voltage of the differential transmission line driver is characterized by symmetrical rising and falling edges.

Abstract: At least one MOS parameter of a MOS fuse is characterized to provide at least one MOS parameter reference value. Then, the MOS fuse is programmed by applying a programming signal to the fuse terminals so that programming current flows through the fuse link. The fuse resistance is measured to provide a measured fuse resistance associated with a first logic value. A MOS parameter of the programmed MOS fuse is measured to provide a measured MOS parameter value. The measured MOS parameter value is compared to the reference MOS parameter value to determine a second logic value of the MOS fuse, and a bit value is output based on the comparison.

Abstract: A technique for setting Vgg in an IC is disclosed. The technique includes specifying a design reliability lifetime for the IC, and a relationship between maximum gate bias and gate dielectric thickness for the IC sufficient to achieve the design reliability lifetime is established. The IC is fabricated and the gate dielectric thickness is measured. A maximum gate bias voltage is determined according to the gate dielectric thickness and the relationship between maximum gate bias and gate dielectric thickness, and a Vgg trim circuit of the IC is set to provide Vgg having the maximum gate bias voltage that will achieve the design reliability lifetime according to the measured gate dielectric thickness.

Abstract: An electronic fuse (“E-fuse”) cell is formed on a semiconductor substrate. The E-fuse cell has a fuse element with a fuse link extending from a first fuse terminal across a thick dielectric structure to a second fuse terminal. The first and second fuse terminals are separated from the semiconductor substrate by a thin dielectric layer.

Abstract: E-fuses in an E-fuse memory array are programmed by applying a first programming pulse to a plurality of E-fuses to program the plurality of E-fuses to a first state; and then applying a second programming pulse to at least a selected E-fuse in the plurality of E-fuses to program the selected E-fuse to a second state.

Abstract: An integrated circuit includes an electronic fuse (“E-fuse”) cell having a fuse link and an E-fuse programming current generator. The fuse link has a width (FLw) and a thickness (FLT) and is fabricated from a layer of link material. An E-fuse programming current generator includes a reference link array having a plurality of reference links. Each of the reference links has the fuse link width and the fuse link thickness, and is fabricated from the layer of link material.