Abstract: A method and circuit are disclosed for generating an internal power voltage in a semiconductor memory device. The method includes receiving an external power voltage in an internal power voltage generating circuit and activating a power-up signal during a first period in the applied external power voltage rising to a desired level, powering-up the internal power voltage in relation to the external power voltage during the first period, and continuing the power-up of the internal power voltage during a second period following the first period, the second period extending beyond the deactivation of the power-up signal until receipt of an active command signal.

Abstract: A multi-port semiconductor memory device having variable access paths and a method therefor are provided. The semiconductor memory device includes a plurality of input/output ports; a memory array divided into a plurality of memory areas; and a select control unit to variably control access paths between the memory areas and the input/output ports so that each memory area is accessed through at least one of the input/output ports.

Abstract: A semiconductor memory device including a plurality of ports, at least one shared memory region of a memory cell array accessible through the ports, and a data transmission controller coupled to the shared memory region and the ports. The data transmission controller is configured to apply a read command of a read operation to the shared memory region after a write command of a write operation before applying any other commands to the shared memory region when at least a portion of a write address associated with the write operation and at least a portion of a read address associated with the read operation are substantially equivalent.

Abstract: I claim a device and method for selecting 1-row and 2-row activation. A device includes a memory block array including a plurality of memory blocks arranged in a row-column format, a plurality of local inter-connectors to selectively couple upper local lines to lower local lines in corresponding rows of memory blocks and a plurality of local-to-global connection points to selectively couple the upper and lower local lines to one or more global lines in at least an upper left block area and a lower right block area of the memory block array, or in a lower left block area and an upper right block area of the memory block array.

Abstract: A voltage generation circuit and semiconductor memory device including the same are provided.

Abstract: A semiconductor memory device includes a core block having sub-arrays and sense amplifier regions. First and second charge storing regions are disposed at sides of the core block. First and second decoupling capacitors are formed at the first and second charge storing regions, respectively. A plurality of first voltage supply lines are disposed to supply a power supply voltage to the sense amplifier regions and are connected to one electrode of each of the first and second decoupling capacitors. A plurality of second voltage supply lines are disposed to supply a ground voltage to the sense amplifier regions and are connected to the other electrode of each of the first and second decoupling capacitors.

Abstract: Systems and methods for performing a PASR (partial array self-refresh) operation wherein a refresh operation for recharging stored data is performed on a portion (e.g., ½ ¼, ?, or 1/16) of one or more selected memory banks comprising a cell array in a semiconductor memory device. In one aspect, a PASR operation is performed by (1) controlling the generation of row addresses by a row address counter during a self-refresh operation and (2) controlling a self-refresh cycle generating circuit to adjust the self-refresh cycle output therefrom. The self-refresh cycle is adjusted in a manner that provides a reduction in the current dissipation during the PASR operation. In another aspect, a PASR operation is performed by controlling one or more row addresses corresponding to a partial cell array during a self-refresh operation, whereby a reduction in a self-refresh current dissipation is achieved by blocking the activation of a non-used block of a memory bank.

Abstract: Systems and methods for performing a PASR (partial array self-refresh) operation wherein a refresh operation for recharging stored data is performed on a portion (e.g., ½ ¼, ?, or {fraction (1/16)}) of one or more selected memory banks comprising a cell array in a semiconductor memory device. In one aspect, a PASR operation is performed by (1) controlling the generation of row addresses by a row address counter during a self-refresh operation and (2) controlling a self-refresh cycle generating circuit to adjust the self-refresh cycle output therefrom. The self-refresh cycle is adjusted in a manner that provides a reduction in the current dissipation during the PASR operation. In another aspect, a PASR operation is performed by controlling one or more row addresses corresponding to a partial cell array during a self-refresh operation, whereby a reduction in a self-refresh current dissipation is achieved by blocking the activation of a non-used block of a memory bank.

Abstract: Systems and methods for performing a PASR (partial array self-refresh) operation wherein a refresh operation for recharging stored data is performed on a portion (e.g., ½ ¼, ⅛, or {fraction (1/16)}) of one or more selected memory banks comprising a cell array in a semiconductor memory device. In one aspect, a PASR operation is performed by (1) controlling the generation of row addresses by a row address counter during a self-refresh operation and (2) controlling a self-refresh cycle generating circuit to adjust the self-refresh cycle output therefrom. The self-refresh cycle is adjusted in a manner that provides a reduction in the current dissipation during the PASR operation. In another aspect, a PASR operation is performed by controlling one or more row addresses corresponding to a partial cell array during a self-refresh operation, whereby a reduction in a self-refresh current dissipation is achieved by blocking the activation of a non-used block of a memory bank.

Abstract: The present invention discloses an address buffer and a semiconductor memory device having the address buffer. The address buffer comprises a first buffer for latching a signal in response to a first control signal in a normal operation mode in the semiconductor memory device and generating a buffered signal by buffering the latched signal in response to a second control signal, and a second buffer for maintaining a mode-setting signal in a reset status in the normal operation mode and for outputting the mode-setting signal by using the latched signal in response to the first control signal and a mode-setting command in a mode-setting operation mode. Accordingly, the mode-setting signal is generated only in the mode-setting operation mode, thereby reducing undesirable current consumption.

Abstract: A semiconductor memory device includes a core block having sub-arrays and sense amplifier regions. First and second charge storing regions are disposed at sides of the core block. First and second decoupling capacitors are formed at the first and second charge storing regions, respectively. A plurality of first voltage supply lines are disposed to supply a power supply voltage to the sense amplifier regions and are connected to one electrode of each of the first and second decoupling capacitors. A plurality of second voltage supply lines are disposed to supply a ground voltage to the sense amplifier regions and are connected to the other electrode of each of the first and second decoupling capacitors.

Abstract: The present invention discloses an address buffer and a semiconductor memory device having the address buffer. The address buffer comprises a first buffer for latching a signal in response to a first control signal in a normal operation mode in the semiconductor memory device and generating a buffered signal by buffering the latched signal in response to a second control signal, and a second buffer for maintaining a mode-setting signal in a reset status in the normal operation mode and for outputting the mode-setting signal by using the latched signal in response to the first control signal and a mode-setting command in a mode-setting operation mode. Accordingly, the mode-setting signal is generated only in the mode-setting operation mode, thereby reducing undesirable current consumption.

Abstract: Systems and methods for performing a PASR (partial array self-refresh) operation wherein a refresh operation for recharging stored data is performed on a portion (e.g., ½ ¼, ⅛, or {fraction (1/16)}) of one or more selected memory banks comprising a cell array in a semiconductor memory device. In one aspect, a PASR operation is performed by (1) controlling the generation of row addresses by a row address counter during a self-refresh operation and (2) controlling a self-refresh cycle generating circuit to adjust the self-refresh cycle output therefrom. The self-refresh cycle is adjusted in a manner that provides a reduction in the current dissipation during the PASR operation. In another aspect, a PASR operation is performed by controlling one or more row addresses corresponding to a partial cell array during a self-refresh operation, whereby a reduction in a self-refresh current dissipation is achieved by blocking the activation of a non-used block of a memory bank.

Abstract: Systems and methods for performing a PASR (partial array self-refresh) operation wherein a refresh operation for recharging stored data is performed on a portion (e.g., ½ ¼, ⅛, or {fraction (1/16)}) of one or more selected memory banks comprising a cell array in a semiconductor memory device. In one aspect, a PASR operation is performed by (1) controlling the generation of row addresses by a row address counter during a self-refresh operation and (2) controlling a self-refresh cycle generating circuit to adjust the self-refresh cycle output therefrom. The self-refresh cycle is adjusted in a manner that provides a reduction in the current dissipation during the PASR operation. In another aspect, a PASR operation is performed by controlling one or more row addresses corresponding to a partial cell array during a self-refresh operation, whereby a reduction in a self-refresh current dissipation is achieved by blocking the activation of a non-used block of a memory bank.

Abstract: Systems and methods for performing a PASR (partial array self-refresh) operation wherein a refresh operation for recharging stored data is performed on a portion (e.g., ½¼, ⅛, or {fraction (1/16)}) of one or more selected memory banks comprising a cell array in a semiconductor memory device. In one aspect, a PASR operation is performed by (1) controlling the generation of row addresses by a row address counter during a self-refresh operation and (2) controlling a self-refresh cycle generating circuit to adjust the self-refresh cycle output therefrom. The self-refresh cycle is adjusted in a manner that provides a reduction in the current dissipation during the PASR operation. In another aspect, a PASR operation is performed by controlling one or more row addresses corresponding to a partial cell array during a self-refresh operation, whereby a reduction in a self-refresh current dissipation is achieved by blocking the activation of a non-used block of a memory bank.