Abstract: A data storage library system includes a data storage library having at least one library frame, at least one environmental conditioning unit associated with the data storage library and configured to control one or more interior environmental conditions within the at least one library frame, and at least one access door for providing access to an interior portion of the at least one library frame. The system also includes a library controller configured to initiate a service mode prior to and/or during a service procedure performed within the at least one library frame, wherein the service mode comprises configuring the at least one environmental conditioning unit to adjust the one or more environmental conditions within the at least one library frame toward one or more exterior environmental conditions outside of the data storage library. Optionally, a lock and/or indicator (visual and/or audible) may control access to the interior of the library frames.

Abstract: A computer-implemented method includes, by one or more processors in electronic communication with a tunneling magnetoresistive sensor, wherein the tunneling magnetoresistive sensor is a component of a magnetic storage drive configured to read magnetic data from a magnetic storage medium, detecting a short across the tunneling magnetoresistive sensor, measuring a change in resistance of the tunneling magnetoresistive sensor, measuring a change in voltage amplitude for the tunneling magnetoresistive sensor, and dividing said change in voltage amplitude by said change in resistance to yield a ratio. The computer-implemented method further includes, responsive to the ratio being greater than a predetermined ratio threshold, determining that the short is caused by a magnetic shunt. A corresponding computer program product and computer system are also disclosed.

Abstract: A computer-implemented method includes, by one or more processors in electronic communication with a tunneling magnetoresistive sensor, wherein the tunneling magnetoresistive sensor is a component of a magnetic storage drive configured to read magnetic data from a magnetic storage medium, detecting a short across the tunneling magnetoresistive sensor, measuring a change in resistance of the tunneling magnetoresistive sensor, measuring a change in voltage amplitude for the tunneling magnetoresistive sensor, and dividing said change in voltage amplitude by said change in resistance to yield a ratio. The computer-implemented method further includes, responsive to the ratio being greater than a predetermined ratio threshold, determining that the short is caused by a magnetic shunt. A corresponding computer program product and computer system are also disclosed.

Abstract: Embodiments of the present invention provide methods, systems, and computer program products for detecting damage to tunneling magnetoresistance (TMR) sensors. In one embodiment, resistances of a TMR sensor are measured upon application of one or both of negative polarity bias current and positive polarity bias current at a plurality of current magnitudes. Resistances of the TMR sensor can then be analyzed with respect to current, voltage, voltage squared, and/or power, including analyses of changes to slopes calculated with these values and hysteresis-induced fluctuations, all of which can be used to detect damage to the TMR sensor. The present invention also describes methods to utilize the measured values of neighbor TMR sensors to distinguish normal versus damaged parts for head elements containing multiple TMR read elements.

Abstract: Embodiments of the present invention provide methods, systems, and computer program products for detecting damage to tunneling magnetoresistance (TMR) sensors. In one embodiment, resistances of a TMR sensor are measured upon application of one or both of negative polarity bias current and positive polarity bias current at a plurality of current magnitudes. Resistances of the TMR sensor can then be analyzed with respect to current, voltage, voltage squared, and/or power, including analyzes of changes to slopes calculated with these values and hysteresis-induced fluctuations, all of which can be used to detect damage to the TMR sensor. The present invention also describes methods to utilize the measured values of neighbor TMR sensors to distinguish normal versus damaged parts for head elements containing multiple TMR read elements.

Abstract: ESD protection circuitry that includes one, or more, of the following features, characteristics and/or advantages: (i) use of different “diode types” (for example, Schottky type, PN type, p-type diode-connected field-effect transistor (FET) type, NFET type)) in a series-connected diode set (connected in series with respect to a device-under-protection) and a parallel-connected diode set (connected in parallel with respect to a device-under-protection and the series-connected diode set); (ii) a FET is connected in series with a target device such that the FET's gate can be turned on during normal operation and the FET's gate is resistively coupled to the FET's source; and/or (iii) two FETs are connected in series with a target device such both FETs gates can be turned on during normal operation, one FET's gate is resistively coupled to its source, and the other FET's gate is electrically coupled to its drain.

Abstract: An audit device according to one embodiment includes a substrate; at least one test element coupled to the substrate; a connector adapted for coupling the at least one test element to leads of a cable; and a probe for detecting at least one of: voltage across and current through the at least one test element. One test element is coupled to a group of leads of the connector. All positive polarity leads of the group of leads are coupled together on the substrate, and all negative polarity leads of the group of leads are coupled together on the substrate, such that the test element is coupled across the positive and the negative coupled leads of the group of leads of the connector. The test element is coupled across pairs of leads of the cable when the cable is coupled to the connector. Additional systems and methods are also presented.

Abstract: Embodiments of the present disclosure related to automated static control. A set of static sensor data may be obtained from two or more static sensors. The set of static sensor data may be analyzed to determine whether a static condition exists. In response to a determination that a static condition exists, a set of mobile static unit data may be collected from one or more mobile static units. The set of mobile static unit data may be analyzed to select a mobile static unit of the one or more mobile static units. An action may be transmitted to the selected mobile static unit, and the selected mobile static unit may be deployed to mitigate the static condition.

Abstract: A magnetic head, according to one embodiment, includes a rowbar substrate having a tape support surface and a gap surface at a substrate edge. A closure is positioned opposite the gap surface of the rowbar substrate, the closure forming a portion of the tape support surface. A recessed gap region is interposed between the gap surface of the rowbar substrate and the closure, the recessed gap region having a recessed gap profile that extends between the gap surface of the rowbar substrate and the closure, the recessed gap region having a transducer row with at least one magnetic sensor on the gap surface of the rowbar substrate. An insulation layer is positioned over the recessed gap profile of the recessed gap region.

Abstract: A computer-implemented method, according to one embodiment, includes: collecting performance data corresponding to a tape drive and/or a magnetic tape head, storing the performance data in memory, and using the data to perform problem analysis. The performance data includes a resistance of the tape drive and/or magnetic tape head and a resolution of the tape drive and/or the magnetic tape head. Moreover, performing the problem analysis includes: determining a condition of the tape drive and/or the magnetic tape head, wherein the condition is selected from a group consisting of: wear, corrosion, defective leads and wire bonds. Other systems, methods, and computer program products are described in additional embodiments.

Abstract: A computer program product according to one embodiment includes a computer readable storage medium having program instructions embodied therewith. The program instructions area executable by a data processing system having at least one processor to cause the data processing system to apply, by the data processing system, a current to a lead of a tunneling magnetoresistance (TMR) sensor for inducing joule heating of the lead or a heating layer, the level of joule heating being sufficient to anneal a magnetic layer of the sensor; and maintain, by the data processing system, the current at the level for an amount of time sufficient to anneal the sensor.

Abstract: A method of making a magnetic head, according to one embodiment, includes supplying a magnetic recording head having a gap disposed between a rowbar substrate and a closure, said rowbar substrate and closure having a tape support surface, recessing the gap below the level of the tape support surface, sputter cleaning the head, and depositing an insulation layer on the tape support surface and the recessed gap. In addition, about an entire upper surface of the insulation layer above the gap is recessed from the tape support surface.

Abstract: A data storage library system includes a data storage library, at least one environmental conditioning unit, at least one data storage drive retained within the data storage library, and at least one access door for providing access to an interior portion of the data storage library. The system also includes a library controller, wherein the library controller is configured to initiate a service mode prior to and during a service procedure performed within the data storage library, and further wherein at least one operational state within the at least one data storage drive is changed during the service mode. The change in the at least one operational state may be, for example, an increase in temperature within the at least one data storage drive, or the insertion of a data storage cartridge into the at least one data storage drive during the service mode.

Abstract: A data storage library system includes at least one data storage library comprising at least one library frame and at least one environmental conditioning unit, the at least one environmental conditioning unit configured to control one or more environmental conditions within the at least one library frame. The system further includes at least one access door for providing access to an interior portion of the data storage library, a library controller, and at least one warning indicator associated with the data storage library and in electronic communication with the library controller. The at least one warning indicator is configured to provide an indication to an operator when the conditions within the data storage library are such that the at least one access door may be opened and when the conditions within the data storage library are such that the access door should not be opened.

Abstract: A data storage library system includes at least one data storage library, the at least one data storage library comprising at least one library frame, wherein the at least one library frame has at least one environmental conditioning unit configured to control one or more environmental conditions within the at least one library frame. The system also includes at least one access door for providing access to an interior portion of the at least one library frame, a library controller, and at least one louver, where the louver may be selectively moveable to control a communication pathway for external air to enter the at least one library frame. In one embodiment, the at least one louver may be controlled by the library controller to automatically open when it is detected that the one or more access doors are opened, and to close the louver when the one or more access doors are closed.

Abstract: A data storage library system includes a data storage library having at least one library frame, at least one environmental conditioning unit associated with the data storage library and configured to control one or more interior environmental conditions within the at least one library frame, and at least one access door for providing access to an interior portion of the at least one library frame. The system also includes a library controller configured to initiate a service mode prior to and/or during a service procedure performed within the at least one library frame, wherein the service mode comprises configuring the at least one environmental conditioning unit to adjust the one or more environmental conditions within the at least one library frame toward one or more exterior environmental conditions outside of the data storage library. Optionally, a lock and/or indicator (visual and/or audible) may control access to the interior of the library frames.

Abstract: Embodiments of the invention relate to electrostatic discharge (ESD) protection. One embodiment includes creating a window for multiple leads in a first plane on a cable. A common bus bar is attached adjacent to the window in a second plane on the cable. A first dissipative adhesive (DA) is applied across at least a portion of the multiple leads to connect the multiple leads to one another and to the common bus bar. At least some leads of the multiple leads are operatively connected to an element of an electronic device.

Abstract: ESD protection circuitry that includes one, or more, of the following features, characteristics and/or advantages: (i) use of different “diode types” (for example, Schottky type, PN type, p-type diode-connected field-effect transistor (FET) type, NFET type)) in a series-connected diode set (connected in series with respect to a device-under-protection) and a parallel-connected diode set (connected in parallel with respect to a device-under-protection and the series-connected diode set); (ii) a FET is connected in series with a target device such that the FET's gate can be turned on during normal operation and the FET's gate is resistively coupled to the FET's source; and/or (iii) two FETs are connected in series with a target device such both FETs gates can be turned on during normal operation, one FET's gate is resistively coupled to its source, and the other FET's gate is electrically coupled to its drain.

Abstract: A data storage library system includes at least one data storage library comprising at least one library frame and at least one environmental conditioning unit, the at least one environmental conditioning unit configured to control one or more environmental conditions within the at least one library frame. The system further includes at least one access door for providing access to an interior portion of the data storage library, a library controller, and at least one warning indicator associated with the data storage library and in electronic communication with the library controller. The at least one warning indicator is configured to provide an indication to an operator when the conditions within the data storage library are such that the at least one access door may be opened and when the conditions within the data storage library are such that the access door should not be opened.

Abstract: ESD protection circuitry that includes one, or more, of the following features, characteristics and/or advantages: (i) use of different “diode types” (for example, Schottky type, PN type, p-type diode-connected field-effect transistor (FET) type, NFET type)) in a series-connected diode set (connected in series with respect to a device-under-protection) and a parallel-connected diode set (connected in parallel with respect to a device-under-protection and the series-connected diode set); (ii) a FET is connected in series with a target device such that the FET's gate can be turned on during normal operation and the FET's gate is resistively coupled to the FET's source; and/or (iii) two FETs are connected in series with a target device such both FETs gates can be turned on during normal operation, one FET's gate is resistively coupled to its source, and the other FET's gate is electrically coupled to its drain.