Abstract: A microscopy method for three-dimensionally imaging an object, including imaging the object along a beam path into a first image on a first image plane. A first microlens array is arranged on the first image plane, and a second microlens array with the same pitch is arranged downstream of the first array. The two arrays laterally segment the first image and image same into a second image in which the segments are spaced apart and separated by gaps. On a pupil plane downstream of the microlens array, a phase mask is provided which generates a spot for each segment of the second image according to a pixel diffusion function. A detector detects the shape and structure of the spot, and a controller ascertains a lateral intensity distribution and depth specification from the shape and/or structure of the spot for each segment and generates a depth-resolved image of the object therefrom.

Abstract: A method and microscope for high-resolution 2D scanning microscopy of a sample, wherein the sample is illuminated with illumination radiation in such a way that the illumination radiation is focused in or on the sample to form a diffraction-limited illumination spot at a point. The point is imaged in a diffraction-limited manner into a diffraction image on a spatially resolving surface detector, wherein the surface detector has a spatial resolution that resolves a diffraction structure of the diffraction image. Neither an imaging point spread function nor an illumination point spread function is manipulated for producing an asymmetry. The point is displaced relative to the sample into different scanning positions. A 2D image of the sample is produced from the data of the surface detector and from the scanning positions assigned to said data. The 2D image has a resolution that is increased beyond a resolution limit for imaging.

Abstract: An optical arrangement for light beam shaping for a light microscope has a first and a second liquid crystal region or lifting micromirror region, each of which has a plurality of independently switchable liquid crystal elements or mirrors with which a phase of incident light is changeable in a settable manner, an input-/output-coupling polarization beam splitter, a polarization beam splitter arranged between the input-/output-coupling polarization beam splitter and the liquid crystal regions or lifting micromirror regions such that the polarization beam splitter separates the light coming from the input-/output-coupling polarization beam splitter in a polarization-dependent manner into a first partial beam, which is directed to the first liquid crystal region or lifting micromirror region, and into a second partial beam, which is directed to the second liquid crystal region or lifting micromirror region, and that the polarization beam splitter combines the two partial beams returning from the liquid crystal

Abstract: One or more images of a sample may be split into image data split according to dyes. The sample has at least two different dyes, in particular fluorescent dyes. The method for splitting the one or more images includes providing the one or more images of the sample and inputting the one or more images into a machine learning system. The method then includes generating the image data split according to dyes from the image or the images, using the machine learning system. The machine learning system removes at least one partial structure of the sample that is present in the image data split according to dyes of more than one dye from the image data of one or more dyes.

Abstract: A microscope having an imaging beam path, an illumination beam path, a detection device, and a control device for controlling the detection device and the illumination device. The control device divides the light sources of the detection device in an array into at least a first and a second group, wherein each group is composed of light sources adjacent to each other in the array and covers part of the array. The control device switches on only one light source of the first group at a point in time and connects the light sources of the first group in a sequence with a clocking in such a way that two light sources switched on one after the other are adjacent to each other in the array and switches the light sources of the second group with the same clocking as the light sources of the first group. The control device reads out the detection device with the same clocking as the connecting of the light sources.

Abstract: The invention relates to a method for high-resolution scanning microscopy of a sample M which a) the sample is illuminated at a point in or on the sample by means of illumination radiation, b) the point is imaged along an optical axis and according to a point spread function into a diffraction image on a spatially resolving surface detector that comprises detector pixels in which a diffraction structure of the diffraction image is resolved, c) the point is displaced relative to the sample in at least two scanning directions and pixel signals are read from the detector pixels in various scanning positions, wherein the pixel signals are respectively assigned to that scanning position at which they were read out and adjacent scanning positions overlap one another and are dis posed according to a scanning increment, d) an image of the sample having a resolution that is increased beyond a resolution limit of the imaging is generated from the read pixel signals and the assigned scanning positions, wherein a deconvo

Abstract: Accelerated methods and apparatuses for three-dimensional microscopy with structured illumination, in which focal planes of the sample are focused and each focal plane is illuminated in a plurality of phases sequentially with structured illumination light and the sample light emitted by the sample is recorded in a respective individual image. A resulting image having a resolution that is increased with respect to the individual images is reconstructed from the individual images to produce a super-resolved image stack. By reconstructing a resulting image from individual images of two different focal planes by approximation methods, said resulting image represents a sample plane that is situated between said focal planes, an image stack can be produced in a shorter period with less stress on the sample.

Abstract: In a high-resolution spectrally selective scanning microscopy of a sample, the sample is excited with illumination radiation in order to emit fluorescence radiation such that the illumination radiation is bundled into an illumination spot in or on the sample. The illumination spot is diffraction-limited in at least one spatial direction and has a minimum extension in said spatial direction. Fluorescence radiation emitted from the illumination spot is imaged into a diffraction image lying on an image plane in a diffraction-limited manner and is detected with a spatial resolution which resolves a structure of a diffraction image of the fluorescence radiation emitted from the illumination spot. The illumination spot is moved into different scanning positions. An individual image is generated for each scanning position, in a diffraction-limited manner onto a detector.

Abstract: In high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescence radiation in such a way that the illumination radiation is focused at a point in or on the sample to form a diffraction-limited illumination spot. The point is imaged in a diffraction-limited manner into a diffraction image on a spatially resolving surface detector, wherein the surface detector has a spatial resolution that resolves a structure of the diffraction image. The sample is scanned by means of different scanning positions with an increment of less than half the diameter of the illumination spot. An image of the sample is generated from the data of the surface detector and from the scanning positions assigned to said data, said image having a resolution that is increased beyond a resolution limit for imaging.

Abstract: A device and a method for imaging a sample arranged in an object plane. The device includes an optical relay system that images an area of the sample from the object plane into an intermediate image plane. The device may also include an optical imaging system with an objective having an optical axis that lies perpendicularly on the intermediate image plan, and which is focused on the intermediate image plane, with the result that the object plane can be imaged undistorted onto a detector. The device also can include an illumination apparatus for illuminating the sample with a light sheet, wherein the light sheet lies essentially in the object plane and defines an illumination direction, and wherein the normal of the object plane defines a detection direction.

Abstract: For the purposes of high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescent radiation in such a way that the illumination radiation is focused at a point in or on the sample, so as to form a diffraction-limited illumination spot. The point is imaged in a diffraction image on a detector in a diffraction-limited manner, wherein the detector has detector elements and a plurality of location channels which resolve a diffraction structure of the diffraction image. The sample is scanned with various scanning positions with an increment smaller than half the diameter of the illumination spot. An image of the sample with a resolution that is increased beyond a resolution limit of the image is generated from the data of the detector and from the scanning positions associated with these data.

Abstract: A microscope and method for high resolution scanning microscopy of a sample, having an illumination device, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device is used for detecting the single image in the detection plane for various scan positions, with a location accuracy which, taking into account the reproduction scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image.

Abstract: An optical device comprises a light source and a detector, and also a sample holder, which is configured to fix an object in the optical path of light. A scanning optical unit is configured, for a multiplicity of scanning positions, in each case selectively to direct light incident from different angular ranges from the object onto the detector. On the basis of a three-dimensional light field represented by corresponding measurement data of the multiplicity of scanning positions, a spatially resolved imaging of the object is generated, said imaging comprising at least two images from different object planes of the object.

Abstract: A microscope and method for high resolution scanning microscopy of a sample, having an illumination device, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device is used for detecting the single image in the detection plane for various scan positions, with a location accuracy which, taking into account the reproduction scale in at least one dimension/measurement, is at least twice as high as a full width at half maximum of the diffraction-limited single image.

Abstract: An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen situated on a specimen carrier in a specimen region of a specimen plane via an illumination beam path. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane, in respect of which the specimen carrier is aligned, and the illumination is implemented in the plane. Further, a detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective comprises an illumination correction element arranged in the beam path and/or a detection correction element.

Abstract: A microscope having an imaging beam path, an illumination beam path, a detection device, and a control device for controlling the detection device and the illumination device. The control device divides the light sources of the detection device in an array into at least a first and a second group, wherein each group is composed of light sources adjacent to each other in the array and covers part of the array. The control device switches on only one light source of the first group at a point in time and connects the light sources of the first group in a sequence with a clocking in such a way that two light sources switched on one after the other are adjacent to each other in the array and switches the light sources of the second group with the same clocking as the light sources of the first group. The control device reads out the detection device with the same clocking as the connecting of the light sources.

Abstract: A microscope and method for imaging an object in an object field, the microscope having an illumination device for wide-field illumination of the object. The illumination device has a plurality of light sources, a detection device for recording a wide-field image of the object, and a control device for controlling the detection device and the illumination device. The control device divides the light sources into at least two groups. The light sources of all groups combined fill the object field entirely. The control device for each group switches on all light sources of the group, causes the detection device to record a single image of the object, switches off the light sources of the group, and thus interconnects all groups, and generates a plurality of single images. From the generated single images, an image of the object is generated by the control device.

Abstract: Microscope and method for high resolution scanning microscopy of a sample, wherein the sample is illuminated; at least one point spot or line spot, which is guided in a scanning manner over the sample, is imaged into a still image; wherein the spot is imaged in a diffraction limited manner into the still image with magnification, and the still image lies still in a plane of detection; the still image is detected for different scan positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited still image, so that a diffraction pattern of the still image is detected; the diffraction pattern of the still image is evaluated for each scan position, and an image of the sample is generated that has a resolution that is increased beyond the diffraction limit, wherein a detector array is provided that has pixels and is larger than the still image; and radiation of the still image from the plane of detecti

Abstract: A method and microscope for high-resolution 2D scanning microscopy of a sample, wherein the sample is illuminated with illumination radiation in such a way that the illumination radiation is focused in or on the sample to form a diffraction-limited illumination spot at a point. The point is imaged in a diffraction-limited manner into a diffraction image on a spatially resolving surface detector, wherein the surface detector has a spatial resolution that resolves a diffraction structure of the diffraction image. Neither an imaging point spread function nor an illumination point spread function is manipulated for producing an asymmetry. The point is displaced relative to the sample into different scanning positions. A 2D image of the sample is produced from the data of the surface detector and from the scanning positions assigned to said data. The 2D image has a resolution that is increased beyond a resolution limit for imaging.

Abstract: For the purposes of high-resolution scanning microscopy, a sample is excited by illumination radiation to emit fluorescent radiation in such a way that the illumination radiation is focused at a point in or on the sample, so as to form a diffraction-limited illumination spot. The point is imaged in a diffraction image on a detector in a diffraction-limited manner, wherein the detector has detector elements and a plurality of location channels which resolve a diffraction structure of the diffraction image. The sample is scanned with various scanning positions with an increment smaller than half the diameter of the illumination spot. An image of the sample with a resolution that is increased beyond a resolution limit of the image is generated from the data of the detector and from the scanning positions associated with these data.