Abstract: A microscope control method for operating a microscope, includes: capturing an item of acoustic, graphically represented and/or electronically coded voice information; comparing the voice information with stored reference commands and determining a voice command on the basis of a predetermined degree of correspondence between at least one section of the voice information and a reference command; selecting that reference command to which the voice command corresponds at least to a predetermined degree; generating at least one control command suitable for operating the microscope, wherein the control command is either an invariable control command assigned to the selected reference command or the control command is generated on the basis of a rule assigned to the reference command for forming a generated control command, and controlling the microscope by means of the assigned or generated control command. Also, a microscope is designed to carry out the microscope control method.

Abstract: A method for operating a scanning microscope and for determining point spread functions, with which sample images are recorded with the scanning microscope. The method includes scanning a sample with at least one illuminating light beam; recording at least one sample image with a detector device during a scan by the illuminating light beam; and comprising the point spread function, with which a sample image is recorded, from the at least one sample image. A detector device having receiving elements is used, where the distance between the receiving elements is smaller than a diffraction disk that generates a sample point on the detector device. Detector signals, generated by means of the receiving elements, are read out for each of the different positions of the illuminating light beam on the sample, as a result of which the scanning of the sample allows the detector signals, which are read out, to generate a plurality of sample images.

Abstract: An optical transmission system configured to image a selected region of a sample arranged in a first medium in an object plane on or in a sample carrier, which includes plane-parallel plate, from the object plane into an intermediate image plane in a second medium. The plane-parallel plate is located between the optical transmission system and the sample during the imaging. The object plane and the intermediate image plane form an angle between 0° and 90° with an optical axis of the transmission system. The optical transmission system is positioned relative to region of the sample such that the sample is located within the focal length of the lens of the optical transmission system closest to the sample. The intermediate image plane and the object plane are located on the same side of the optical transmission system, and the intermediate image is a virtual image.

Abstract: The invention relates to the high-resolution spectrally selective scanning microscopy of a sample. The sample is excited with illumination radiation in order to emit fluorescence radiation such that the illumination radiation is bundled into an illumination spot in or on the sample. The illumination spot is diffraction-limited in at least one spatial direction and has a minimum extension in said spatial direction. Fluorescence radiation emitted from the illumination spot is imaged into a diffraction image lying on an image plane in a diffraction-limited manner and is detected with a spatial resolution which resolves a structure of a diffraction image of the fluorescence radiation emitted from the illumination spot. The illumination spot is moved into different scanning positions relative to the sample in increments which are smaller than half the minimum extension of the illumination spot.

Abstract: An arrangement and method for light sheet microscopy. The arrangement has an illumination apparatus for producing a light sheet for illuminating a stripe of a specimen, and has a detection apparatus for detecting fluorescence radiation emitted by the specimen. The recording speed of the arrangement is increased by an illumination apparatus which is configured to produce at least one further light sheet that is arranged parallel to a first light sheet for illuminating a further stripe of the specimen, and advantageously by a detection apparatus which is configured for the simultaneous detection of the fluorescence radiation excited by the light sheets that are arranged parallel to one another.

Abstract: A microscope and method for high resolution scanning microscopy of a sample, having: an illumination device for the purpose of illuminating the sample, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device for detecting the single image in the detection plane for various scan positions is also provided. An evaluation device for the purpose of evaluating a diffraction structure of the single image for the scan positions is provided. The detector device has a detector array which has pixels and which is larger than the single image.

Abstract: In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than t

Abstract: The invention relates to a device and a method for imaging a sample (2) arranged in an object plane (1). Such a device comprises an optical relay system (3) which images an area of the sample (2) from the object plane (1) into an intermediate image plane (4). Here, the object plane (1) and the intermediate image plane (4) with an optical axis (5) of the relay system (3) include an angle different from 90°. The optical relay system (3) is composed of several lenses. The device also comprises an optical imaging system (6) with an objective, the optical axis (7) of which lies perpendicularly on the intermediate image plane (4) and which is focused on the intermediate image plane (4), with the result that the object plane (1) can be imaged undistorted onto a detector (8).

Abstract: A microscopy high-resolution scanning method, including exciting a sample with illumination radiation focused at a point to form a diffraction-limited illumination spot so as to emit fluorescence radiation. The point is imaged in a diffraction image on a spatially resolving two-dimensional detector. The sample is scanned at scanning positions with increments that are smaller than half the diameter of the spot. An image of the sample with a resolution increased beyond a resolution limit of the image is generated from the data of the two-dimensional detector and the scanning positions. To discriminate between at least two predetermined wavelength ranges in the fluorescence radiation of the sample, Airy disks corresponding to the wavelength ranges are generated on the two-dimensional detector, the Airy disks being offset laterally from one another such that the diffraction image consists of the mutually offset Airy disks. The Airy disks are evaluated when generating the sample image.

Abstract: A microscopy method for producing a high-resolution image of a sample which includes furnishing the sample with a marker that emits statistically flashing luminescence radiation after excitation, or using a sample that has molecules that emit statistically flashing luminescence radiation after excitation. The sample is excited to luminescence in such a manner that the marker/molecules emit luminescence radiation flashing at a flash rate, wherein—the illumination is structured in such a manner that the flash rate varies locally and—the sample is repeatedly illuminated in different illumination states of the structured illumination. The luminescing sample is repeatedly imaged on a detector in each of the different illumination states.

Abstract: In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than t

Abstract: An optical device comprises a light source and a detector, and also a sample holder, which is configured to fix an object in the optical path of light. A scanning optical unit is configured, for a multiplicity of scanning positions, in each case selectively to direct light incident from different angular ranges from the object onto the detector. On the basis of a three-dimensional light field represented by corresponding measurement data of the multiplicity of scanning positions, a spatially resolved imaging of the object is generated, said imaging comprising at least two images from different object planes of the object.

Abstract: An optical arrangement for positioning in a beam path of a light microscope, has an optical carrier, on which a first set of optical assemblies for generating structured illumination light of different orientations is arranged. The optical arrangement includes an adjustable deflection device provided for selectably deflecting a light beam to one of the optical assemblies and for deflecting one light beam coming from said optical assembly into the direction of a sample that is to be examined. The invention further relates to a light microscope having an optical arrangement according to the invention.

Abstract: A microscope including a sample carrier configured to support a sample. Excitation light illuminates the sample via an excitation beam path, Detection light from the sample is guided to detection means via a detection beam path. Through an objective arranged along the optical axis, excitation light is guided in direction of the sample carrier and detection light coming from the sample is guided in direction of the detection means. Beam-splitting means separate excitation light and detection light. Also provided are means for generating a light sheet from excitation light, and means for illuminating the sample with this light sheet. The light sheet lies in a plane at a nonzero angle to the optical axis. The means for illuminating the sample include an optical-deflecting device arranged on or at the sample carrier, which deflects excitation light from the objective into the plane of the light sheet via an optically active surface.

Abstract: A microscopy method for generating a high-resolution image (55) of a sample (2) comprising the following steps: a) the sample (2) is provided with a marker, which upon excitation emits statistically flashing luminescent radiation, or a sample (2) is used which upon excitation emits locally distributed, statistically flashing luminescent radiation; b) the sample (2) is excited to luminescence by means of structured illumination, wherein the sample is repeatedly illuminated in at least nine different illumination conditions (0.01-0.09) of the structured illumination by realizing at least three rotary positions, and at least three displacement positions per rotary position of the structured illumination; c) the luminescing sample (2) is repeatedly displayed in each of the different illumination conditions on a flat panel detector having pixels, such that an image sequence (44.01-44.09) is obtained for each of the different illumination conditions (0.01-0.

Abstract: A microscope including a sample carrier configured to support a sample. Excitation light illuminates the sample via an excitation beam path. Detection light from the sample is guided to detection means via a detection beam path. Through an objective arranged along the optical axis, excitation light is guided in direction of the sample carrier and detection light coming from the sample is guided in direction of the detection means. Beam-splitting means separate excitation light and detection light. Also provided are means for generating a light sheet from excitation light, and means for illuminating the sample with this light sheet. The light sheet lies in a plane at a nonzero angle to the optical axis. The means for illuminating the sample include an optical-deflecting device arranged on or at the sample carrier, which deflects excitation light from the objective into the plane of the light sheet via an optically active surface.

Abstract: A light microscope having a specimen plane, in which a specimen to be examined is positioned, having a light source to emit illuminating light, having optical imaging means to convey the illuminating light into the specimen plane, having a first scanning means, with which an optical path of the illuminating light and the specimen can be moved relative to each other to produce an illumination scanning movement of the illuminating light relative to the specimen, having a detector means to detect specimen light coming from the specimen and having electronic means to produce an image of the specimen based on the specimen light detected by the detector means at different specimen regions. A second scanning means is present, with which it can be adjusted which specimen region can be imaged on a determined detector element.

Abstract: In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than t

Abstract: A method for high-resolution PAL microscopy, wherein a sample field is imaged on a detector surface of a detector, the sample field is imaged into an image field which is smaller than the detector surface, and the image field on the detector surface is shifted, so that the same sample field is imaged in different positions located adjacent to one another on the image field in order to determine information about changes in the sample field.

Abstract: The invention relates to a method and a microscope for generating a microscopic image, wherein a) the sample is illuminated in each case by the microscope lens using the TIRF method; and b) the sample is illuminated in a structured fashion in different displacement positions of the structure. The sample light of the method according to a) and b) is detected in each case for generating an image of at least once sample region, wherein the sample images generated according to a) and b) are set off against one another, preferably multiplied, and the result is stored for generating a new sample image.