Abstract: A memory device having a high bus efficiency on a network, an operating method of the memory device, and a memory system including the memory device are provided. The memory device includes banks, a programming register, and a controller. Each of the banks has a plurality of memory cells arranged in a matrix of rows and columns. In a write operation, the programming register stores simultaneous write information on how many banks there are in which data are stored. In a read operation, the controller selects one of the banks subjected to the write operation in response to the simultaneous write information to read out the memory cell data in the selected bank.

Abstract: A method for generating an initializing signal capable of preventing inner circuits installed in a semiconductor memory device from being initially unstably operated due to the application of external electric power. The method includes the steps of: (a) receiving a precharge command for precharging the semiconductor memory device; (b) activating the initializing signal to a first level in response to the received precharge command; (c) receiving a refresh command for refreshing the semiconductor memory device after receipt of the precharge command; (d) receiving a mode set command for setting an operational mode of the semiconductor memory device after receipt of the refresh command; and (e) deactivating the initializing signal to a second level in response to the received mode set command.

Abstract: A memory device having a high bus efficiency on a network, an operating method of the memory device, and a memory system including the memory device are provided. The memory device includes banks, a programming register, and a controller. Each of the banks has a plurality of memory cells arranged in a matrix of rows and columns. In a write operation, the programming register stores simultaneous write information on how many banks there are in which data are stored. In a read operation, the controller selects one of the banks subjected to the write operation in response to the simultaneous write information to read out the memory cell data in the selected bank.

Abstract: A method for generating an initializing signal capable of preventing inner circuits installed in a semiconductor memory device from being initially unstably operated due to the application of external electric power. The method includes the steps of: (a) receiving a precharge command for precharging the semiconductor memory device; (b) activating the initializing signal to a first level in response to the received precharge command; (c) receiving a refresh command for refreshing the semiconductor memory device after receipt of the precharge command; (d) receiving a mode set command for setting an operational mode of the semiconductor memory device after receipt of the refresh command; and (e) deactivating the initializing signal to a second level in response to the received mode set command.

Abstract: A semiconductor memory device is disclosed. The device comprises at least one data input/output reference signal input and output pin and a plurality of integrated circuits, each with a data input/output reference signal input and output pad connected to the data input/output reference signal input and output pin. Each integrated circuit further comprises a data input/output reference signal input and output buffer for buffering a data input/output reference signal input from the data input/output reference signal input and output pad when data is input. This buffer also buffers an internally generated data input/output reference signal, and outputs the buffered signal when data is output. The internally generated data input/output reference signal output can be disabled on each integrated circuit in response to a control signal, thus allowing a single one of the plurality of integrated circuits to be selected to generate the reference signal.

Abstract: Integrated circuit memory devices include a data latch circuit having a data input, a control input and a clock input, and a strobe signal input buffer. The strobe signal input buffer is preferably responsive to a data strobe signal and an indication signal. The strobe signal input buffer operates as a filter by selectively passing an inactive-to-active transition of the data strobe signal to the control input of the data latch when the indication signal is active, while blocking passage of the inactive-to-active transition of the data strobe signal to the control input when the indication signal is inactive. These filtering operations are preferably performed to inhibit the occurrence of data errors when excessive timing skew is present between a system clock and a data strobe signal at a given rate of speed. Accordingly, the operating speeds of memory devices according to embodiments of the present invention may be reliably increased.

Abstract: A synchronous DRAM which can mix memory modules having different organizations in a memory system and a memory system including the same are provided. The synchronous DRAM includes a data masking pin which receives a data masking signal for masking input data during writing, and outputs the same signal as a data strobe signal through the data masking pin during reading. The synchronous DRAM further includes a data masking signal input buffer for buffering the data masking signal received from the data masking pin and outputting it to an internal circuit, and an auxiliary data strobe signal output buffer for buffering an internal data strobe signal generated internally and outputting it to the data masking pin. Also, the synchronous DRAM further includes a mode register which can be controlled externally, and the auxiliary data strobe signal output buffer is controlled by an output signal of the mode register.

Abstract: A synchronous DRAM which can mix memory modules having different organizations in a memory system and a memory system including the same are provided. The synchronous DRAM includes a data masking pin which receives a data masking signal for masking input data during writing, and outputs the same signal as a data strobe signal through the data masking pin during reading. The synchronous DRAM further includes a data masking signal input buffer for buffering the data masking signal received from the data masking pin and outputting it to an internal circuit, and an auxiliary data strobe signal output buffer for buffering an internal data strobe signal generated internally and outputting it to the data masking pin. Also, the synchronous DRAM further includes a mode register which can be controlled externally, and the auxiliary data strobe signal output buffer is controlled by an output signal of the mode register.

Abstract: Integrated circuit memory devices include a data latch circuit having a data input, a control input and a clock input, and a strobe signal input buffer. The strobe signal input buffer is preferably responsive to a data strobe signal and an indication signal. The strobe signal input buffer operates as a filter by selectively passing an inactive-to-active transition of the data strobe signal to the control input of the data latch when the indication signal is active, while blocking passage of the inactive-to-active transition of the data strobe signal to the control input when the indication signal is inactive. These filtering operations are preferably performed to inhibit the occurrence of data errors when excessive timing skew is present between a system clock and a data strobe signal at a given rate of speed. Accordingly, the operating speeds of memory devices according to embodiments of the present invention may be reliably increased.

Abstract: A delay locked loop circuit includes a variable delay circuit that receives an input clock signal and produces a delayed clock signal that is variably delayed with respect to the input clock signal responsive to a delay control signal applied to the variable delay circuit. A delay control circuit is responsive to the input clock signal and to the delayed clock signal, and applies a delay control signal to the variable delay circuit based on a comparison of an edge of the delayed clock signal corresponding to a first edge of the input clock signal to a second edge of the input clock signal that follows the first edge of the input clock signal. In an embodiment, the delay control circuit includes a phase comparator circuit that receives the input clock signal and the delayed clock signal and produces a phase comparison signal that indicates whether the edge of the delayed clock signal corresponding to the first edge of the reference clock signal leads or lags the second edge of the input clock signal.

Abstract: A multi-bit test circuit detects the fail cells in a memory block accurately even though there exists a short bridge between bit lines or between memory cells. The circuit includes an input buffer for transferring a same test data bit received from a multi-bit input/output pin to selected ones of the memory cells in each block in response to a multi-bit test enable signal, a plurality of sense amplifier drivers connected to the respective memory cells, for amplifying the test data bits to transfer the amplified data bits to the associated memory cells, and reading out the test data bits stored into the associated memory cells, and a comparator for comparing the same data bits stored into the same block to generate a comparison data bit in response to the multi-bit input/output enable signal, and transferring the comparison data to the multi-bit input/output pin.

Abstract: External data and an external data masking signal are synchronized to a data strobe signal rather than a clock signal in an SDRAM. Since both the data masking signal and the data are synchronized with the data strobe signal, they can react in the same way to conditions such as voltage, temperature and process variations. Accordingly, the sampling window of the data can be larger and the number of pins for inputting the data masking signal need not increase. More specifically, integrated circuit memory devices include a memory cell array and an address buffer that buffers address data for the memory cell array in response to a clock signal. A command buffer buffers read and write commands for the memory cell array in response to the clock signal. The data input and output buffer buffers data for the memory cell array in response to a data strobe signal that is different from the clock signal. A data masking buffer buffers the data masking signal that masks the data in response to the data strobe signal.

Abstract: A DRAM includes a refresh controller including a clock control section for producing a refresh mode signal in response to an external control clock signal, a refresh logic section for producing an enable signal in response to the refresh mode signal, a refresh counter for sequentially producing a first plurality of row address signals during an active period of a row address strobe signal in response to the enable signal, a row address buffer for producing a second plurality of row address signals in response to the row address signals, and a row decoder including a plurality of word line drivers which sequentially decode the second plurality of row address signals provided from the row address buffer and sequentially enables word lines corresponding to the decoded row address signals.

Abstract: An active power supply voltage boosting circuit for a semiconductor memory device according to the present invention causes operation of the active cycle boosted voltage generating circuit to elevate the level of the boosted power supply voltage V.sub.PP when the detected level of the boosted power supply voltage V.sub.PP is lower than a target voltage level. Thus, the boosted power supply voltage V.sub.PP can be stably maintained to the target voltage level. When the boosted power supply voltage V.sub.PP becomes higher than the target voltage level, generation of the boosted power supply voltage V.sub.PP is stopped, and as a result, unwanted consumption of the electrical current and also the damage to the semiconductor memory device by high voltage can be prevented.

Abstract: A wafer burn-in test circuit for sensing a defective cell of a semiconductor memory device having a plurality of memory cells connected to a word line and a row decoder for selecting the word line. The burn-in test includes a word line driver circuit having an input coupled to a row decoding signal generated by the row decoder, and an ouput coupled to the word line, a control circuit having a first input coupled to a burn-in voltage signal, and a second input coupled to a control signal, and an electrical line connected between the word line driver circuit and the control circuit. In a normal mode of operation, the word line driver circuit is responsive to the row decoding signal for raising the word line to an enable voltage level. In a burn-in test mode of operation, the control circuit is responsive to the control signal for applying a burn-in voltage to the word line via the electrical line and the word line driver circuit.

Abstract: A word line driver circuit for use in a semiconductor memory device for driving a word line of the memory device to a word line driving voltage having a voltage level greater than that of a power supply voltage includes a control circuit and a word line driving circuit. The word line driving circuit includes a pull-up transistor which is connected in series between the word line driving voltage and the word line, a transfer transistor connected in series between a row decoding signal and the gate electrode of the pull-up transistor. The control circuit generates a transfer output signal which is applied to the gate electrode of the transfer transistor. In a first operating mode, the transfer output signal has a voltage level greater than the power supply voltage by an amount equal to the threshold voltage of the transfer transistor, and, in a second operating mode, the transfer output signal has a voltage level equal to the power supply voltage.