Abstract: The electronic circuit performs binary computation operations and comprises word, bit and source lines, and memory cells organized in rows and columns. Each cell includes one pair of memristors and one pair of switches, each memristor being connected to a switch and linked to the same source line during each computation operation, each pair of memristors storing a binary value; the switches being linked to a word line and to a pair of complementary bit lines. The circuit comprises a reading module including: a logic unit for each column, each comprising an input terminal connected to a source line to receive a column value, the logic unit toggling between values, depending on a comparison of the column value with a toggle threshold value; a modification unit for modifying, for at least one logic unit and depending on the computation operation, a difference between the column and threshold values.

Abstract: The present description concerns a memory device (200) including a non-volatile memory circuit (101); a buffer memory circuit (203) comprising a volatile memory circuit (221); an input-output circuit (105); a first data link (104) coupling the non-volatile memory circuit (101) to the buffer memory circuit (203); a second data link (106) coupling the buffer memory circuit (203) to the input-output circuit (105); and a control circuit (225), wherein the buffer memory circuit (203) is adapted to implementing calculations having as operands data stored in the volatile memory circuit (221).

Abstract: The present description concerns a system comprising at least one first and one second memory circuits; and a direct data transfer circuit which is adapted to receiving specific instructions originating from an external processor, and to decoding specific instructions comprising: a specific instruction SET_REGION of definition of a sub-region in the first memory circuit towards and from which the data will be transferred; and a specific instruction of transfer between said sub-region and the second memory circuit, the specific transfer instruction comprising a first address field containing the relative coordinates, in said sub-region, of a first reference cell.

Abstract: A static random access memory device includes a memory matrix provided with at least one set of SRAM memory cells and a circuit for initializing cells of the set, the setting circuit being able to carry out various setting types and in particular a “deterministic” setting in which the cells are established at an imposed value and to carry out a “free” setting in which the cells are established at a value that depends on their manufacturing method.

Abstract: The present invention relates to a neuromorphic circuit suitable for implementing a neural network, the neuromorphic circuit comprising: lines of words, pairs of complementary bit-lines, source lines, a set of elementary cells, an electronic circuit implementing a neurone having an output and including: a set of logic components, a counting unit, a comparison unit comprising a comparator and a comparison voltage generator, the comparator being suitable for comparing the output of the counting unit with the comparison voltage generated by the comparison voltage generator in order to output a signal dependent on the comparison and corresponding to the output of the electronic circuit which implements a neurone.

Abstract: A method of circuit conception of a computational memory circuit including a memory having memory cells, the method including: receiving an indication of the memory storage size and an indication of an instruction frequency of the instructions to be executed by the computational memory circuit; evaluating for a plurality of candidate types of memory cells, a number representing an average number of cycles of the memory of the computational memory circuit per instruction to be executed; determining, for each of the plurality of candidate types of memory cells, a minimum operating frequency of the computational memory circuit based on the number N and on the memory storage size; selecting one of the plurality of candidate types of memory cells based on the determined minimum operating frequency; and performing the circuit conception based on the selected type of candidate memory cell.

Abstract: The present description concerns a memory device (200) including a non-volatile memory circuit (101); a buffer memory circuit (203) comprising a volatile memory circuit (221); an input-output circuit (105); a first data link (104) coupling the non-volatile memory circuit (101) to the buffer memory circuit (203); a second data link (106) coupling the buffer memory circuit (203) to the input-output circuit (105); and a control circuit (225), wherein the buffer memory circuit (203) is adapted to implementing calculations having as operands data stored in the volatile memory circuit (221).

Abstract: A Memory device comprising a matrix of memory cells, the matrix being provided with at least one first column, the device also being provided with a test circuit configured to perform a test phase during a read operation to indicate whether or not the proportion of cells in said column storing the same logical data, particularly a logical ‘1’, is greater than a predetermined threshold.

Abstract: A memory circuit including: a plurality of elementary storage cells arranged in an array of rows and of columns, the cells of a same column sharing a same read bit line and a same write bit line; an internal control circuit capable of implementing a calculation operation including the simultaneous activation in read mode of at least two rows of the array; and a shuffle circuit including a data input register, a configuration register, and an output port, the shuffle circuit being capable of delivering on its output port the data stored in its input register shuffled according to a shuffle operation defined according to the state of its configuration register.

Abstract: A memory device including a matrix of memory cells including FET transistors including back-bias elements, of which at least one column forms back-bias bits; a back-bias circuit outputting voltages dependent on back-bias bits; first and second coupling elements, coupling memory dots of back-bias bits with the back-bias circuit, and the back-bias circuit with the back-bias elements of the cells of the matrix; wherein the device forms a 3D circuit including first and second active layers between which several interconnection layers are stacked; the first and/or the second coupling elements include metallic portions of one of the interconnection layers.

Abstract: A memory circuit including a plurality of elementary cells arranged in a plurality of arrays, each including a plurality of rows and a plurality of columns, and wherein: the elementary cells having the same coordinates in the different arrays share a same first conductive track; and in each array, the elementary cells of a same row of the array share a same second conductive track and a same third conductive track.

Abstract: A memory circuit including: a plurality of elementary storage cells arranged in an array of rows and of columns; a data input/output port; an address input port; a mode selection input port; and an internal control circuit configured to: read a mode selection signal applied to the mode selection port; when the mode selection signal is in a first state, read an address of a row from the address input port and implement a read or write operation in this row; and when the mode selection signal is in a second state, read from the data input/output port an instruction signal and implement an operation including the simultaneous activation in read or write mode of at least two rows.

Abstract: SRAM memory including: a matrix of memory cells; bit lines and word lines; read ports associated with the memory cells and coupled to the bit lines and to the word lines; local virtual ground, LVGND, lines each coupled to the reference potential terminals of the read ports of at least one row of memory cells; local control elements each configured to electrically couple one of the LVGND lines to a power supply potential or to a global virtual ground line, or GVGND line; a global control element configured to couple the GVGND line to the power supply electric potential or to a reference electric potential.

Abstract: A memory circuit including a plurality of elementary cells arranged in an array of rows and of columns, and a control circuit capable of implementing an operation of vertical reading of a word from a column of the array.

Abstract: A memory circuit including a plurality of elementary cells distributed in a plurality of arrays, each including N columns, N being an integer greater than or equal to 2, wherein: each column of each array includes a first local bit line directly connected to each of the cells in the column; each column of each array includes a first general bit line coupled to the first local bit line of the column by a first coupling circuit; and the first general bit lines of the columns of same rank j of the different arrays, j being an integer in the range from 0 to M?1, are coupled together.

Abstract: A Memory device comprising a matrix of memory cells, the matrix being provided with at least one first column, the device also being provided with a test circuit configured to perform a test phase during a read operation to indicate whether or not the proportion of cells in said column storing the same logical data, particularly a logical ‘1’, is greater than a predetermined threshold.

Abstract: A memory circuit including: a plurality of elementary storage cells arranged in an array of rows and of columns; a data input/output port; an address input port; a mode selection input port; and an internal control circuit configured to: read a mode selection signal applied to the mode selection port; when the mode selection signal is in a first state, read an address of a row from the address input port and implement a read or write operation in this row; and when the mode selection signal is in a second state, read from the data input/output port an instruction signal and implement an operation including the simultaneous activation in read or write mode of at least two rows.

Abstract: A 3D-RAM memory comprising: several memory cell arrays distributed in several superimposed memory layers; a word line driver; a row decoder coupled to the word line driver; wherein the row decoder and the word line driver are arranged in a layer of command electronics which is separate from the memory layers, and wherein, in each of the memory layers, each of the word lines is connected to an output of an electronic selection device arranged in the memory layer, a data input of which is connected to the word line driver, a command input of which is connected to the row decoder, and which is configured to let a signal of access to the transistors pass or not depending on the value of a received command signal.

Abstract: A memory circuit including: a plurality of elementary storage cells arranged in an array of rows and of columns, the cells of a same column sharing a same read bit line and a same write bit line; an internal control circuit capable of implementing a calculation operation including the simultaneous activation in read mode of at least two rows of the array; and a shuffle circuit including a data input register, a configuration register, and an output port, the shuffle circuit being capable of delivering on its output port the data stored in its input register shuffled according to a shuffle operation defined according to the state of its configuration register.

Abstract: SRAM memory including: a matrix of memory cells; bit lines and word lines; read ports associated with the memory cells and coupled to the bit lines and to the word lines; local virtual ground, LVGND, lines each coupled to the reference potential terminals of the read ports of at least one row of memory cells; local control elements each configured to electrically couple one of the LVGND lines to a power supply potential or to a global virtual ground line, or GVGND line; a global control element configured to couple the GVGND line to the power supply electric potential or to a reference electric potential.