Abstract: The present disclosure relates to a suction brush for a vacuum cleaner, which is connected to a suction extension pipe connected to a main body of the vacuum cleaner and draws in foreign materials using a suction force generated in the main body. The suction brush includes a bottom housing with a dust entering port; a top housing connected to the bottom housing so as to cover the bottom housing; a connector disposed between the top housing and the bottom housing, the connector connected to the suction extension pipe; and a flow rate controller disposed at the connector, the flow rate controller controlling a volume of the air entering through the dust entering port so as to control a suction force.

Abstract: The present disclosure relates to a dust separating apparatus using a centrifugal force. The dust separating apparatus includes a cyclone body configured to separate dust from air using centrifugal force, and having an entering pipe through which the air enters; a dust collecting receptacle configured to be detachably connected to a bottom end of the cyclone body, and for collecting dust separated from the air; and a filter unit configured to be detachably disposed to the cyclone body, wherein the filter unit has a compact, at least double structure formed by a filter for filtering large dust and a filter for filtering fine dust.

Abstract: The present disclosure relates to a handle unit for a vacuum cleaner. The handle unit for the vacuum cleaner for controlling a cleaner body of the vacuum cleaner includes a handle body of the vacuum cleaner; and a supporting unit projected from one side of the handle body, the supporting unit holding an accessory brush, wherein the supporting unit and the handle body is molded in a single piece by the injection molding process.

Abstract: An overlay measurement method and related apparatus are provided in which overlay measurement data is calculated on the basis of distances measured in disparate manners in relation to whether the current process is an initial process or a subsequent process. Related overlay marks are also described.

Abstract: In a method and an apparatus for measuring process errors capable of reducing the process errors, and a method and an apparatus for measuring an overlay, at least two regions are assigned on an object to be measured, which has been passed through a predetermined unit process. Process error values of each region are detected. Error correcting values of each region are calculated based on the process error values. The calculated error correcting values are fed back to a device performing the predetermined unit process. The process error values are merged and outputted as one file. The error correcting values of each region formed on the object are reflected in the device performing the unit process, so the process failure generated in each region of the object can be reduced when the unit process is performed.

Abstract: In a method and an apparatus for measuring process errors capable of reducing the process errors, and a method and an apparatus for measuring an overlay, at least two regions are assigned on an object to be measured, which has been passed through a predetermined unit process. Process error values of each region are detected. Error correcting values of each region are calculated based on the process error values. The calculated error correcting values are fed back to a device performing the predetermined unit process. The process error values are merged and outputted as one file. The error correcting values of each region formed on the object are reflected in the device performing the unit process, so the process failure generated in each region of the object can be reduced when the unit process is performed.