Abstract: The present disclosure relates to a structure which includes a current-mirror control node which is configured to adjust a current margin and provide the adjusted current margin to at least one one-time programmable memory (OTPM) cell.

Abstract: The present disclosure relates to a structure which includes a current-mirror control node which is configured to adjust a current margin and provide the adjusted current margin to at least one one-time programmable memory (OTPM) cell.

Abstract: A high speed VPP level translator circuit using thin-oxide field effect transistors (FETs) and methods of use are disclosed. The level translator includes a resistor divider and a one-shot circuit in parallel with the resistor divider. The one-shot circuit conducts to assist a transition from a first state to a second state, and is non-conducting during the transition from the second state to the first state.

Abstract: An electrostatic discharge protection circuit includes a power clamp device, a timing circuit including a first resistor, a first capacitor that is connected with the first resistor at a first node, and a second capacitor that is connected to a second node, a logic gate including a first input connected with the first node, a second input connected with the second node, and an output connected with the power clamp device, and a decoder device connected with a first address pin and a second address pin. The first address pin and the second address pin are used to detect the power clamp device switching on at time of power on and draining current.

Abstract: Differential voltage generators receive an initial target voltage, and provide the initial target voltage to a first offset element and a second offset element. The first offset element includes first transistors, and the second offset element includes second transistors. Each of the first transistors is capable of changing the initial target voltage by a different incremental amount to change the initial target voltage to an altered target voltage. The second transistors are capable of removing a current generated by the first transistors, thereby causing an opposite current and leaving the initial target voltage unaffected on a second output. Each of the first transistors has a corresponding second transistor that produces the same current. A first output is capable of outputting the altered target voltage, and the second output is capable of outputting the initial target voltage.

Abstract: An electrostatic discharge protection circuit includes a transistor device, a first timing circuit including a first resistor and a first capacitor that is connected with the first resistor at a first node, a second timing circuit including a second resistor and a second capacitor that is connected with the second resistor at a second node, and a logic gate including a first input connected with the first node, a second input coupled with the second node, and an output connected with the transistor device.

Abstract: The present disclosure relates to a structure which includes a twin-cell memory which is configured to program a plurality of write operations, a current sense amplifier which is connected to the twin-cell memory and is configured to sense a current differential and latch a differential voltage based on the current differential, and at least one current source which is connected to the current sense amplifier and is configured to add an offset current to the current sense amplifier to create the differential voltage.

Abstract: A voltage boost circuit for eDram using thin oxide field effect transistors (FETs) is disclosed. The voltage boost circuit includes a boost capacitor which is precharged with a precharge voltage in a precharge stage and which provides a boosted supply voltage to a thin oxide FET during a pump phase. The voltage boost circuit further include a drive capacitor which provides a turn on voltage to the thin oxide FET so that the boosted supply voltage can pass to an output node in the pump phase.

Abstract: A voltage boost circuit for eDram using thin oxide field effect transistors (FETs) is disclosed. The voltage boost circuit includes a boost capacitor which is precharged with a precharge voltage in a precharge stage and which provides a boosted supply voltage to a thin oxide FET during a pump phase. The voltage boost circuit further include a drive capacitor which provides a turn on voltage to the thin oxide FET so that the boosted supply voltage can pass to an output node in the pump phase.

Abstract: The present disclosure relates to a structure which includes a twin-cell memory which is configured to program a plurality of write operations, a current sense amplifier which is connected to the twin-cell memory and is configured to sense a current differential and latch a differential voltage based on the current differential, and at least one current source which is connected to the current sense amplifier and is configured to add an offset current to the current sense amplifier to create the differential voltage.

Abstract: A method of generating a high differential read current through a non-volatile memory, includes receiving a voltage read input from a word line voltage generator, outputting a first current to a bit line true (BLT), outputting a second current to a bit line complement (BLC), and generating the high differential read current through a difference between the first current and the second current.

Abstract: Approaches for a write assist circuit are provided. The write assist circuit includes a boost capacitor with a first node coupled to a bitline through control logic and a second node connected to a field effect transistor (FET) diode stack, a plurality of boot enabled transistors which each contain a gate connected to a boost control signal, and a controlled current source coupled between a ground signal and the second node of the boost capacitor. In the write assist circuit, the boost capacitor has a discharge path which is controlled to provide a boost voltage which is invariant to a level of a power supply signal.

Abstract: The present disclosure relates to a structure which includes a twin-cell memory which is configured to program a plurality of write operations, a current sense amplifier which is connected to the twin-cell memory and is configured to sense a current differential and latch a differential voltage based on the current differential, and at least one current source which is connected to the current sense amplifier and is configured to add an offset current to the current sense amplifier to create the differential voltage.

Abstract: An electrostatic discharge protection circuit includes a power clamp device, a timing circuit including a first resistor, a first capacitor that is connected with the first resistor at a first node, and a second capacitor that is connected to a second node, a logic gate including a first input connected with the first node, a second input connected with the second node, and an output connected with the power clamp device, and a decoder device connected with a first address pin and a second address pin. The first address pin and the second address pin are used to detect the power clamp device switching on at time of power on and draining current.

Abstract: An electrostatic discharge protection circuit includes a transistor device, a first timing circuit including a first resistor and a first capacitor that is connected with the first resistor at a first node, a second timing circuit including a second resistor and a second capacitor that is connected with the second resistor at a second node, and a logic gate including a first input connected with the first node, a second input coupled with the second node, and an output connected with the transistor device.

Abstract: The present disclosure relates to a method of generating a high differential read current through a non-volatile memory, including receiving a voltage read input from a word line voltage generator, outputting a first current to a bit line true (BLT), outputting a second current to a bit line complement (BLC), and generating the high differential read current through a difference between the first current and the second current.

Abstract: A high speed VPP level translator circuit using thin-oxide field effect transistors (FETs) and methods of use are disclosed. The level translator includes a resistor divider and a one-shot circuit in parallel with the resistor divider. The one-shot circuit conducts to assist a transition from a first state to a second state, and is non-conducting during the transition from the second state to the first state.

Abstract: Electrostatic discharge protection circuits and methods of fabricating an electrostatic discharge protection circuit, as well as methods of protecting an integrated circuit from a transient electrostatic discharge event. The electrostatic discharge protection circuit includes a power clamp device, a first timing circuit with a first resistor and a first capacitor that is coupled with the first resistor at a first node, and a second timing circuit including a second resistor and a second capacitor that is coupled with the second resistor at a second node. The electrostatic discharge protection circuit further includes a logic gate with a first input coupled with the first node, a second input coupled with the second node, and an output coupled with the power clamp device. The logic gate responds to voltages at the first and second nodes to control the impedance state of the power clamp device.

Abstract: A high speed VPP level translator circuit using thin-oxide field effect transistors (FETs) and methods of use are disclosed. The level translator includes a resistor divider and a one-shot circuit in parallel with the resistor divider. The one-shot circuit conducts to assist a transition from a first state to a second state, and is non-conducting during the transition from the second state to the first state.

Abstract: A latching current sensing amplifier circuit for memory arrays and a current sensing technique using the latching current sensing amplifier circuit are provided. The current sense-amplifier circuit includes a first and second pair of series connected transistors configured with a common gate node for a sense operation and reconfigurable as a cross-coupled pair for a latching operation.