Abstract: There is disclosed a synchronous digital circuit having a system clock and for processing a data signal, wherein the digital circuit comprises a data path, a hard macro having a macro input, a logic circuit in the data path upstream of the macro input and having a first part and a second part, the second part being immediately upstream of the macro input, a set-up timing error detector having an input, wherein the input is on the data path between the first part and the second part, and a timing correction unit, wherein the data transit time across the second part is equal to or less than one half of a clock period, and wherein the timing correction unit is configured to correct, in response to the set-up timing error detector detecting a set-up timing error, the detected set-up timing error before the data reaches the macro input.

Abstract: In accordance with an embodiment of the invention, an integrated circuit (IC) device is disclosed. In the embodiment, the IC device includes an SRAM module, wrapper logic coupled to the SRAM module, a context source, and an ECC profile controller coupled to the context source and to the wrapper logic, the ECC profile controller configured to select an ECC profile in response to context information received from the context source for use by the wrapper logic.

Abstract: There is disclosed a synchronous digital circuit having a system clock and for processing a data signal, wherein the digital circuit comprises a data path, a hard macro having a macro input, a logic circuit in the data path upstream of the macro input and having a first part and a second part, the second part being immediately upstream of the macro input, a set-up timing error detector having an input, wherein the input is on the data path between the first part and the second part, and a timing correction unit, wherein the data transit time across the second part is equal to or less than one half of a clock period, and wherein the timing correction unit is configured to correct, in response to the set-up timing error detector detecting a set-up timing error, the detected set-up timing error before the data reaches the macro input.

Abstract: Aspects of the disclosure are directed to communications between respective power domains (circuitry) that may operate in a stacked arrangement in which the each domain operates over a different voltage range. A first circuit provides differential outputs that vary between first and second voltage levels, based on transitions of an input signal received from a first one of the power domains. First and second driver circuits are respectively coupled to the first and second differential outputs. A third driver circuit operates with the first and second circuits to level-shift the input signal from the first power domain to an output signal on a second power domain by driving an output circuit at the second voltage level in response to the input signal being at the first voltage level, and driving the output circuit at a third voltage level in response to the input signal being at the second voltage level.

Abstract: Aspects of this disclosure are directed to level-shifting approaches with communications between respective circuits. As may be implemented in accordance with one or more embodiments characterized herein, a voltage level of communications passed between respective circuits are selectively shifted. Where the respective circuits operate under respective power domains that are shifted in voltage range relative to one another, the voltage level of the communications is shifted. This approach may, for example, facilitate power-savings for stacked circuits in which a low-level voltage of one circuit is provided as a high-level voltage for another circuit. When the respective circuits operate under a common power domain, the communications are passed directly between the respective circuits (e.g., bypassing any level-shifting, and facilitating fast communication).

Abstract: In accordance with an embodiment of the invention, an integrated circuit (IC) device is disclosed. In the embodiment, the IC device includes an SRAM module, wrapper logic coupled to the SRAM module, a context source, and an ECC profile controller coupled to the context source and to the wrapper logic, the ECC profile controller configured to select an ECC profile in response to context information received from the context source for use by the wrapper logic.

Abstract: Aspects of this disclosure are directed to level-shifting approaches with communications between respective circuits. As may be implemented in accordance with one or more embodiments characterized herein, a voltage level of communications passed between respective circuits are selectively shifted. Where the respective circuits operate under respective power domains that are shifted in voltage range relative to one another, the voltage level of the communications is shifted. This approach may, for example, facilitate power-savings for stacked circuits in which a low-level voltage of one circuit is provided as a high-level voltage for another circuit. When the respective circuits operate under a common power domain, the communications are passed directly between the respective circuits (e.g., bypassing any level-shifting, and facilitating fast communication).

Abstract: Aspects of the disclosure are directed to communications between respective power domains (circuitry) that may operate in a stacked arrangement in which the each domain operates over a different voltage range. A first circuit provides differential outputs that vary between first and second voltage levels, based on transitions of an input signal received from a first one of the power domains. First and second driver circuits are respectively coupled to the first and second differential outputs. A third driver circuit operates with the first and second circuits to level-shift the input signal from the first power domain to an output signal on a second power domain by driving an output circuit at the second voltage level in response to the input signal being at the first voltage level, and driving the output circuit at a third voltage level in response to the input signal being at the second voltage level.

Abstract: An integrated circuit comprising a set of data processing units including a first data processing unit and at least one second data processing unit operable at variable frequencies is disclosed. The integrated circuit further includes an instruction scheduler adapted to evaluate data dependencies between individual instructions in a received plurality of instructions and assign the instructions to the first data processing unit and the at least one second data processing unit for parallel execution in accordance with said data dependencies. The integrated circuit is operable in a first power mode and a second power mode. The second power mode is a reduced power mode compared to the first power mode and is adapted to adjust the operating frequency of the first data processing unit and the at least one second data processing unit in the second power mode as a function of the evaluated data dependencies.

Abstract: A tuneable buffer circuit for use in a clock tree has multiple buffers in parallel, each buffer having a grounding function, and also a bypass switch in parallel with the buffers. The circuit has a normal mode of one buffer connected into circuit, a first low voltage mode of multiple buffers connected into circuit in parallel without grounding function, a second low voltage mode of the buffers connected into circuit in parallel with grounding function and a bypass mode.

Abstract: Embodiments of a processing architecture are described. The architecture includes a fetch unit for fetching instructions from a data bus. A scheduler receives data from the fetch unit and creates a schedule allocates the data and schedule to a plurality of computational units. The scheduler also modifies voltage and frequency settings of the processing architecture to optimize power consumption and throughput of the system. The computational units include control units and execute units. The control units receive and decode the instructions and send the decoded instructions to execute units. The execute units then execute the instructions according to relevant software.

Abstract: An integrated circuit comprising a set of data processing units including a first data processing unit and at least one second data processing unit operable at variable frequencies is disclosed. The integrated circuit further includes an instruction scheduler adapted to evaluate data dependencies between individual instructions in a received plurality of instructions and assign the instructions to the first data processing unit and the at least one second data processing unit for parallel execution in accordance with said data dependencies. The integrated circuit is operable in a first power mode and a second power mode. The second power mode is a reduced power mode compared to the first power mode and is adapted to adjust the operating frequency of the first data processing unit and the at least one second data processing unit in the second power mode as a function of the evaluated data dependencies.

Abstract: A tuneable buffer circuit for use in a clock tree has multiple buffers in parallel, each buffer having a grounding function, and also a bypass switch in parallel with the buffers. The circuit has a normal mode of one buffer connected into circuit, a first low voltage mode of multiple buffers connected into circuit in parallel without grounding function, a second low voltage mode of the buffers connected into circuit in parallel with grounding function and a bypass mode.

Abstract: A method and apparatus for testing analogue or RF circuitry, wherein the power supply VDD is ramped up (step 100) and quiescent current measurements are taken at selected values of VDD (step 102) to generate a current signature (step 104). When the power supply is ramped up, all transistors in the circuit pass through several regions of operation, e.g. subthreshold (region A), linear (region B), and saturation (region C). The advantage of transition from region to region is that defects can be detected with distinct accuracy in each of the operating regions. Once the current signature has been generated it can be compared with the current signature of a fault-free device (step 106), to determine (step 108) if the device is operating correctly, and if not, it is discarded.

Abstract: Testing device for testing a phase locked loop having a power supply input, said testing device comprising: a power supply unit for providing a power supply signal VDD having a variation profile to the power supply input of the phase locked loop, wherein a width and height of said variation profile are formed in such a way, that the voltage controlled oscillator is prevented from outputting an oscillating output signal U,,,, ta means for disabling a feedback signal to a phase comparator of the phase locked loop such that said phase locked loop is operated in an open loop mode, and a meter for measuring a measurement signal of the phase locked loop, while said power supply signal is provided to the power supply input.

Abstract: A sensor for contactlessly detecting currents, has a sensor element having a magnetic tunnel junction (MTJ), and detection circuitry, the sensor element having a resistance which varies with the magnetic field, and the detection circuitry is arranged to detect a tunnel current flowing through the tunnel junction. The sensor element may share an MTJ stack with memory elements. Also it can provide easy integration with next generation CMOS processes, including MRAM technology, be more compact, and use less power. Solutions for increasing sensitivity of the sensor, such as providing a flux concentrator, and for generating higher magnetic fields with a same current, such as forming L-shaped conductor elements, are given. The greater sensitivity enables less post processing to be used, to save power for applications such as mobile devices. Applications include current sensors, built-in current sensors, and IDDQ and IDDT testing, even for next generation CMOS processes.

Abstract: A test apparatus for testing a device under test (DUT) to detect a defect comprises a measurement circuit (ME), a threshold circuit (TH), and a control circuit (CG). The measurement circuit (ME) comprises a counter (C1) which counts clock pulses (CLK) during a count period (TC) to obtain a counted number (N) of clock pulses (CLK). The count period (TC) has a start determined by the start (t1) of a testing cycle which occurs at the instant a switch (S) which is coupled to an terminal (IN) of the device under test (DUT) removes a power supply voltage (VDD) from the terminal (IN) and the voltage (VDD?) at the terminal (IN) starts decaying. An end of the count period (TC) is determined by an instant (t2) a comparator (COM1) detects that the voltage (VDD?) at the terminal (IN) crosses a reference value (VREF). The control circuit (CG) generates the clock signal (CLK) and/or a reference number (NTH) taking into account the variability of the manufacturing process of the circuit under test (CUT).

Abstract: The present invention relates to an electronic circuit, apparatus and method for monitoring and controlling power consumption. Accordingly, there is provided an electronic circuit, apparatus and method that includes one or more sequential logic elements (12) that are capable of receiving a clock signal (CLK) and an input signal (I) and providing an output signal (O). The sequential logic element (12) further comprises circuitry (20) for monitoring the input and output signals (I, O), and providing a control signal (CS) in response to the input and output signals (I, O), wherein the IC's power consumption is operatively controllable in response to the control signal.

Abstract: The present invention relates to a method and circuit arrangement for determining power supply noise of a power distribution network. The power supply noise is determined by measuring the propagation delay of a delay circuit powered by the power distribution network, wherein the result of the measuring step is used as an indicator of the power supply noise. Thereby, a real-time power supply noise monitoring can be carried out at any point of a power distribution network of an observed circuitry.

Abstract: A method and apparatus for testing a static random access memory (SRAM) array for the presence of weak defects. A 0/1 ratio is first written to the memory array (step 100), following which the bit lines BL and BLB are pre-charged and equalized to a threshold detection voltage (step 102). The threshold detection voltage is programmed according to the 0/1 ratio of cells, so as to take into account specific cell criterion and/or characteristics. Next, the word lines associated with all of the cells in the array are enabled substantially simultaneously (step 104), the bit lines are then shorted together (step 106), the word lines are disabled (step 108) and the bit lines are released (step 110). Following these steps, the contents of the SRAM array are read and compared against the original 0/1 ratio (step 112). 10 Any cells whose contents do not match the original 0/1 ratio (i.e. those whose contents have flipped) are marked or otherwise identified as “weak” (step 114).