Patents by Inventor Jovan Jovanovic
Jovan Jovanovic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11977098Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: GrantFiled: January 26, 2023Date of Patent: May 7, 2024Assignee: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
-
Publication number: 20240103068Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: November 29, 2023Publication date: March 28, 2024Applicant: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
-
Publication number: 20240044971Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus to facilitate movement of a wafer pack holding a vacuum without human oversight. These functionalities include a latch system to keep the wafer pack intact and a pressure sensing system to detect and relay a pressure in the wafer pack.Type: ApplicationFiled: October 17, 2023Publication date: February 8, 2024Applicant: AEHR TEST SYSTEMSInventors: Gaylord Lewis Erickson, II, Jovan Jovanovic
-
Publication number: 20240036103Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: October 12, 2023Publication date: February 1, 2024Applicant: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
-
Patent number: 11860221Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: January 12, 2022Date of Patent: January 2, 2024Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
-
Patent number: 11835575Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus to facilitate movement of a wafer pack holding a vacuum without human oversight. These functionalities include a latch system to keep the wafer pack intact and a pressure sensing system to detect and relay a pressure in the wafer pack.Type: GrantFiled: October 5, 2021Date of Patent: December 5, 2023Assignee: AEHR TEST SYSTEMSInventors: Gaylord Lewis Erickson, II, Jovan Jovanovic
-
Patent number: 11821940Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: GrantFiled: March 1, 2023Date of Patent: November 21, 2023Assignee: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
-
Publication number: 20230204651Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: March 1, 2023Publication date: June 29, 2023Applicant: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
-
Publication number: 20230168277Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: ApplicationFiled: January 26, 2023Publication date: June 1, 2023Applicant: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
-
Patent number: 11635459Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: GrantFiled: November 10, 2021Date of Patent: April 25, 2023Assignee: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
-
Patent number: 11592465Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: GrantFiled: August 2, 2021Date of Patent: February 28, 2023Assignee: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
-
Publication number: 20220373595Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: ApplicationFiled: July 18, 2022Publication date: November 24, 2022Applicant: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
-
Patent number: 11448695Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: GrantFiled: April 23, 2020Date of Patent: September 20, 2022Assignee: Aehr Test SystemsInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
-
Publication number: 20220137121Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: January 12, 2022Publication date: May 5, 2022Applicant: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
-
Publication number: 20220107358Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus to facilitate movement of a wafer pack holding a vacuum without human oversight. These functionalities include a latch system to keep the wafer pack intact and a pressure sensing system to detect and relay a pressure in the wafer pack.Type: ApplicationFiled: October 5, 2021Publication date: April 7, 2022Applicant: AEHR TEST SYSTEMSInventors: Gaylord Lewis Erickson, II, Jovan Jovanovic
-
Publication number: 20220082636Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: ApplicationFiled: November 22, 2021Publication date: March 17, 2022Applicant: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps
-
Publication number: 20220065921Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: ApplicationFiled: November 10, 2021Publication date: March 3, 2022Applicant: AEHR TEST SYSTEMSInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey
-
Patent number: 11255903Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: September 29, 2020Date of Patent: February 22, 2022Assignee: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
-
Patent number: 11209497Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: GrantFiled: September 19, 2019Date of Patent: December 28, 2021Assignee: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps
-
Patent number: 11199572Abstract: A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.Type: GrantFiled: March 26, 2020Date of Patent: December 14, 2021Assignee: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps, Scott E. Lindsey