Patents by Inventor Jovan Jovanovic
Jovan Jovanovic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9880197Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: GrantFiled: March 8, 2017Date of Patent: January 30, 2018Assignee: Aehr Test SystemsInventors: Scott E. Lindsey, Junyje Yeh, Jovan Jovanovic, Seang P. Malathong
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Publication number: 20170200660Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.Type: ApplicationFiled: January 6, 2017Publication date: July 13, 2017Applicant: Aehr Test SystemsInventors: Jovan Jovanovic, Kenneth W. Deboe, Steven C. Steps
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Publication number: 20170176492Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: ApplicationFiled: March 8, 2017Publication date: June 22, 2017Applicant: Aehr Test SystemsInventors: Scott E. Lindsey, Junyje Yeh, Jovan Jovanovic, Seang P. Malathong
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Patent number: 9625521Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: GrantFiled: December 26, 2014Date of Patent: April 18, 2017Assignee: Aehr Test SystemsInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
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Publication number: 20160187416Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: March 3, 2016Publication date: June 30, 2016Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 9316683Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: August 24, 2015Date of Patent: April 19, 2016Assignee: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20160103179Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: ApplicationFiled: December 17, 2015Publication date: April 14, 2016Applicant: Aehr Test SystemsInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
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Patent number: 9250291Abstract: A cartridge, including a cartridge frame, formations on the cartridge frame for mounting the cartridge frame in a fixed position to an apparatus frame, a contactor support structure, a contactor interface on the contactor support structure, a plurality of terminals, held by the contactor support structure, for contacting contacts on a device, and a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals.Type: GrantFiled: July 20, 2012Date of Patent: February 2, 2016Assignee: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Jovan Jovanovic, David S. Hendrickson, Donald P. Richmond, II
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Publication number: 20150369858Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: August 24, 2015Publication date: December 24, 2015Applicant: AEHR TEST SYSTEMSInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 9151797Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: April 28, 2014Date of Patent: October 6, 2015Assignee: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 9139544Abstract: The invention relates to a process for the production of ethylene oxide, comprising the steps of: producing ethylene resulting in a stream comprising ethylene and ethane; separating the stream comprising ethylene and ethane into a stream comprising ethylene and ethane in which stream the amount of ethylene is greater than the amount of ethane and a stream comprising ethane and ethylene in which stream the amount of ethane is greater than the amount of ethylene; producing ethylene oxide by subjecting ethylene and ethane from the stream comprising ethylene and ethane, in which stream the amount of ethylene is greater than the amount of ethane, to oxidation conditions resulting in a stream comprising ethylene oxide, unconverted ethylene and ethane; and recovering ethylene oxide from the stream comprising ethylene oxide, unconverted ethylene and ethane.Type: GrantFiled: March 25, 2013Date of Patent: September 22, 2015Assignee: Shell Oil CompanyInventors: Jovan Jovanovic, Timothy Michael Nisbet, Timothe Johannes Olthof, Michael Johannes Franciscus Maria Verhaak
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Publication number: 20150129464Abstract: The present invention provides a method of filtering a solvent-containing slurry stream including: (a) providing a solvent-containing slurry stream, the solvent comprising an aliphatic hydrocarbon; (b) depositing the solvent-containing slurry stream provided in step (a) as a filter cake on a filter medium, wherein a top layer of liquid is formed on the filter cake; (c) allowing the top layer of liquid as formed in step (b) to drain through the filter cake such that substantially no liquid remains on top of the filter cake; (d) allowing a gas to partially penetrate into the filter cake thereby obtaining a filter cake with a liquid solvent-depleted top layer; (e) passing liquid solvent through the filter cake with the liquid solvent-depleted top layer as obtained in step (d) thereby obtaining a washed filter cake; (f) removing solvent from the washed filter cake as obtained in step (e) thereby obtaining a solvent-depleted filter cake; and (g) removing the solvent-depleted filter cake as obtained in step (f) froType: ApplicationFiled: November 6, 2014Publication date: May 14, 2015Inventors: Ingmar Hubertus Josephina PLOEMEN, Jovan JOVANOVIC, Bernardus Cornelis Maria IN' T VEEN, Julian Robert KIFT, Cherish Marie HOFFMAN
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Publication number: 20150109011Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: ApplicationFiled: December 26, 2014Publication date: April 23, 2015Applicant: AEHR TEST SYSTEMSInventors: Scott E. Lindsey, Junjye Yeh, Jovan Jovanovic, Seang P. Malathong
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Patent number: 8986048Abstract: The invention relates to an apparatus for testing an integrated circuit of an electronic device.Type: GrantFiled: June 24, 2011Date of Patent: March 24, 2015Assignee: Aehr Test SystemsInventors: David S. Hendrickson, Jovan Jovanovic, Donald P. Richmond, II, William D. Barraclough
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Publication number: 20150080590Abstract: The invention relates to a process for the production of ethylene oxide, comprising the steps of: producing ethylene resulting in a stream comprising ethylene and ethane; separating the stream comprising ethylene and ethane into a stream comprising ethylene and ethane in which stream the amount of ethylene is greater than the amount of ethane and a stream comprising ethane and ethylene in which stream the amount of ethane is greater than the amount of ethylene; producing ethylene oxide by subjecting ethylene and ethane from the stream comprising ethylene and ethane, in which stream the amount of ethylene is greater than the amount of ethane, to oxidation conditions resulting in a stream comprising ethylene oxide, unconverted ethylene and ethane; and recovering ethylene oxide from the stream comprising ethylene oxide, unconverted ethylene and ethaneType: ApplicationFiled: March 25, 2013Publication date: March 19, 2015Inventors: Jovan Jovanovic, Timothy Michael Nisbet, Timothe Johannes Olthof, Michiel Johannes Franciscus Maria Verhaak
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Patent number: 8947116Abstract: A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.Type: GrantFiled: September 1, 2011Date of Patent: February 3, 2015Assignee: Aehr Test SystemsInventors: Scott E. Lindsey, Junyje Yeh, Jovan Jovanovic, Seang P. Malathong
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Publication number: 20140232424Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: April 28, 2014Publication date: August 21, 2014Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 8747123Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: December 5, 2013Date of Patent: June 10, 2014Assignee: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Publication number: 20140091810Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: ApplicationFiled: December 5, 2013Publication date: April 3, 2014Applicant: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu
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Patent number: 8628336Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.Type: GrantFiled: July 11, 2013Date of Patent: January 14, 2014Assignee: Aehr Test SystemsInventors: Donald P. Richmond, II, Kenneth W. Deboe, Frank O. Uher, Jovan Jovanovic, Scott E. Lindsey, Thomas T. Maenner, Patrick M. Shepherd, Jeffrey L. Tyson, Mark C. Carbone, Paul W. Burke, Doan D. Cao, James F. Tomic, Long V. Vu