Patents by Inventor Katsutaka Kimura
Katsutaka Kimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7230867Abstract: A sense amplifier capable of performing high-speed data sense operation with lower power consumption using a minuscule signal from a memory cell even in a case where a memory array voltage is reduced. A plurality of drive switches for over-driving are distributively arranged in a sense amplifier area, and a plurality of drive switches for restore operation are concentratively disposed at one end of a row of the sense amplifiers. A potential for over-driving is supplied using a meshed power line circuit. Through the use of the drive switches for over-driving, initial sense operation can be performed on data line pairs with a voltage having an amplitude larger than a data-line amplitude, allowing implementation of high-speed sense operation. The distributed arrangement of the drive switched for over-driving makes it possible to dispersively supply current in sense operation, thereby reducing a difference in sense voltage with respect to far and near positions of the sense amplifiers.Type: GrantFiled: August 18, 2005Date of Patent: June 12, 2007Assignee: Renesas Technology Corp.Inventors: Riichiro Takemura, Kiyoo Itoh, Tomonori Sekiguchi, Takeshi Sakata, Katsutaka Kimura
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Publication number: 20070127295Abstract: Disclosed is a nonvolatile memory system including at least one nonvolatile memory each having a plurality of nonvolatile memory cells and a buffer memory; and a control device coupled to the nonvolatile memory. The control device is enabled to receive external data and to apply the data to the nonvolatile memory, and the nonvolatile memory is enabled to operate a program operation including storing the received data to the buffer memory and storing the data held in the buffer memory to ones of nonvolatile memory cells. Moreover, the control device is enabled to receive external data while the nonvolatile memory is operating in the program operation. Also, the buffer memory is capable of receiving a unit of data, equal to the data length of data to be stored at one time of the program operation, the data length being more than 1 byte.Type: ApplicationFiled: January 25, 2007Publication date: June 7, 2007Inventors: Masataka Kato, Tetsuo Adachi, Toshihiro Tanaka, Toshio Sasaki, Hitoshi Kume, Katsutaka Kimura
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Publication number: 20070070702Abstract: To enable one non-volatile memory cell to store four-value information, three different kinds of threshold voltages are serially applied to a word line in a verify operation to execute a write operation, the threshold voltages of the memory cell are controlled, and two-value (one-bit) information corresponding to the four-value (two-bit) information to be written are synthesized by a write data conversion circuit for each of the write operations carried out three times. In this way, the four-value (two-bit) information are written into one memory cell, and the memory capacity of the memory cell can be increased. In the information read operation, three different kinds of voltages are applied to a word line, three kinds of two-value (one-bit) information so read out are synthesized by a read conversion circuit and the memory information of the memory cell are converted to the two-bit information.Type: ApplicationFiled: November 13, 2006Publication date: March 29, 2007Inventors: Yusuke Jyouno, Takayuki Kawahara, Katsutaka Kimura
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Patent number: 7180774Abstract: A semiconductor integrated device having a plurality of memory cells, each including a floating gate, a control gate and an auxiliary gate formed over a side surface of the floating gate through an insulator film. Auxiliary gates coupled to selected memory cells function to generate hot electrons and are alternately arranged with other auxiliary gates functioning to prevent write errors in the non-selected memory cells.Type: GrantFiled: February 22, 2005Date of Patent: February 20, 2007Assignees: Hitachi, Ltd., Hitachi Device Engineering Co., Ltd.Inventors: Takashi Kobayashi, Hideaki Kurata, Naoki Kobayashi, Hitoshi Kume, Katsutaka Kimura, Shunichi Saeki
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Patent number: 7173853Abstract: Disclosed is a nonvolatile memory system including at least one nonvolatile memory each having a plurality of nonvolatile memory cells and a buffer memory; and a control device coupled to the nonvolatile memory. The control device is enabled to receive external data and to apply the data to the nonvolatile memory, and the nonvolatile memory is enabled to operate a program operation including storing the received data to the buffer memory and storing the data held in the buffer memory to ones of nonvolatile memory cells. Moreover, the control device is enabled to receive external data while the nonvolatile memory is operating in the program operation. Also, the buffer memory is capable of receiving a unit of data, equal to the data length of data to be stored at one time of the program operation, the data length being more than 1 byte.Type: GrantFiled: May 23, 2006Date of Patent: February 6, 2007Assignee: Renesas Technology Corp.Inventors: Masataka Kato, Tetsuo Adachi, Toshihiro Tanaka, Toshio Sasaki, Hitoshi Kume, Katsutaka Kimura
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Publication number: 20060273405Abstract: In a masking pattern (a) for patterning word and data lines, length is changed between adjacent word lines so as to be shifted from each other at their tips, and furthermore, the tip of each word line is cut obliquely. It is thus possible to prevent the resist pattern from separation and contact of adjacent patterns. Consequently, it is also possible to prevent break failures of patterned lines and short failures between those patterned lines.Type: ApplicationFiled: August 16, 2006Publication date: December 7, 2006Inventors: Tomonori Sekiguchi, Toshihiko Tanaka, Toshiaki Yamanaka, Takeshi Sakata, Katsutaka Kimura
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Publication number: 20060275986Abstract: A semiconductor integrated circuit device with third gates comprising second conduction type source/drain diffusion layer regions 205 formed first conduction type well 201, floating gates 203b formed on semiconductor substrate 200 through an insulator film 202, control gates 211a formed on floating gates 203b through nitrogen-introduced silicon oxide film 210a and third gates 207a different from the floating gates and the control gates, formed through the semiconductor substrates, the floating gates, the control gates and the insulator film, where the third gates are formed as filled in gaps between the floating gates existing in a vertical direction to word lines and channels and the height of third gates 207a thus formed is made lower than that of floating gates 203b, has improved reduction of memory cell size and operating speed and improved reliability after programming/erasing cycles.Type: ApplicationFiled: August 7, 2006Publication date: December 7, 2006Inventors: Takashi Kobayashi, Yasushi Goto, Tokuo Kure, Hideaki Kurata, Hitoshi Kume, Katsutaka Kimura, Syunichi Saeki
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Publication number: 20060209599Abstract: Disclosed is a nonvolatile memory system including at least one nonvolatile memory each having a plurality of nonvolatile memory cells and a buffer memory; and a control device coupled to the nonvolatile memory. The control device is enabled to receive external data and to apply the data to the nonvolatile memory, and the nonvolatile memory is enabled to operate a program operation including storing the received data to the buffer memory and storing the data held in the buffer memory to ones of nonvolatile memory cells. Moreover, the control device is enabled to receive external data while the nonvolatile memory is operating in the program operation. Also, the buffer memory is capable of receiving a unit of data, equal to the data length of data to be stored at one time of the program operation, the data length being more than 1 byte.Type: ApplicationFiled: May 23, 2006Publication date: September 21, 2006Inventors: Masataka Kato, Tetsuo Adachi, Toshihiro Tanaka, Toshio Sasaki, Hitoshi Kume, Katsutaka Kimura
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Patent number: 7110320Abstract: Disclosed is a nonvolatile memory system including at least one nonvolatile memory each having a plurality of nonvolatile memory cells and a buffer memory; and a control device coupled to the nonvolatile memory. The control device is enabled to receive external data and to apply the data to the nonvolatile memory, and the nonvolatile memory is enabled to operate a program operation including storing the received data to the buffer memory and storing the data held in the buffer memory to ones of nonvolatile memory cells. Moreover, the control device is enabled to receive external data while the nonvolatile memory is operating in the program operation. Also, the buffer memory is capable of receiving a unit of data, equal to the data length of data to be stored at one time of the program operation, the data length being more than 1 byte.Type: GrantFiled: March 30, 2004Date of Patent: September 19, 2006Assignee: Renesas Technology Corp.Inventors: Masataka Kato, Tetsuo Adachi, Toshihiro Tanaka, Toshio Sasaki, Hitoshi Kume, Katsutaka Kimura
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Patent number: 7105873Abstract: In a masking pattern (a) for patterning word and data lines, length is changed between adjacent word lines so as to be shifted from each other at their tips, and furthermore, the tip of each word line is cut obliquely. It is thus possible to prevent the resist pattern from separation and contact of adjacent patterns. Consequently, it is also possible to prevent break failures of patterned lines and short failures between those patterned lines.Type: GrantFiled: October 29, 2002Date of Patent: September 12, 2006Assignee: Hitachi, Ltd.Inventors: Tomonori Sekiguchi, Toshihiko Tanaka, Toshiaki Yamanaka, Takeshi Sakata, Katsutaka Kimura
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Patent number: 7105409Abstract: A semiconductor integrated circuit device with third gates comprising second conduction type source/drain diffusion layer regions 205 formed first conduction type well 201, floating gates 203b formed on semiconductor substrate 200 through an insulator film 202, control gates 211a formed on floating gates 203b through nitrogen-introduced silicon oxide film 210a and third gates 207a different from the floating gates and the control gates, formed through the semiconductor substrates, the floating gates, the control gates and the insulator film, where the third gates are formed as filled in gaps between the floating gates existing in a vertical direction to word lines and channels and the height of third gates 207a thus formed is made lower than that of floating gates 203b, has improved reduction of memory cell size and operating speed and improved reliability after programming/erasing cycles.Type: GrantFiled: July 27, 2004Date of Patent: September 12, 2006Assignee: Renesas Technology Corp.Inventors: Takashi Kobayashi, Yasushi Goto, Tokuo Kure, Hideaki Kurata, Hitoshi Kume, Katsutaka Kimura, Syunichi Saeki
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Patent number: 7092296Abstract: Disclosed is a nonvolatile memory system including at least one nonvolatile memory each having a plurality of nonvolatile memory cells and a buffer memory; and a control device coupled to the nonvolatile memory. The control device is enabled to receive external data and to apply the data to the nonvolatile memory, and the nonvolatile memory is enabled to operate a program operation including storing the received data to the buffer memory and storing the data held in the buffer memory to ones of nonvolatile memory cells. Moreover, the control device is enabled to receive external data while the nonvolatile memory is operating in the program operation. Also, the buffer memory is capable of receiving a unit of data, equal to the data length of data to be stored at one time of the program operation, the data length being more than 1 byte.Type: GrantFiled: May 27, 2005Date of Patent: August 15, 2006Assignee: Hitachi, Ltd.Inventors: Masataka Kato, Tetsuo Adachi, Toshihiro Tanaka, Toshio Sasaki, Hitoshi Kume, Katsutaka Kimura
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Publication number: 20060126400Abstract: In a large scale integrated DRAM in pursuit of micro fabrication, data line-word line coupling capacitances are unbalanced between paired data lines. An imbalance in data line-word line means generation of large noise when the data lines are subjected to amplification, which is highly likely invite deterioration of very small signals on the data lines and erroneous amplification of data. One or a few each of a plurality of word lines connected to a plurality of memory cells connected to one data line are alternately connected to subword driver arrays arranged on the opposing sides of a memory array. Positive and negative word line noise components cancel each other in the subword drivers when the data lines are subjected to amplification, so that the word line noise can be reduced. Therefore, signals read out by sense amplifiers can be prevented from deterioration thereby to increase the reliability of memory operation.Type: ApplicationFiled: February 9, 2006Publication date: June 15, 2006Inventors: Tomonori Sekiguchi, Riichiro Takemura, Kazuhiko Kajigaya, Katsutaka Kimura, Tsugio Takahashi
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Publication number: 20060114718Abstract: To enable one non-volatile memory cell to store four-value information, three different kinds of threshold voltages are serially applied to a word line in a verify operation to execute a write operation, the threshold voltages of the memory cell are controlled, and two-value (one-bit) information corresponding to the four-value (two-bit) information to be written are synthesized by a write data conversion circuit for each of the write operations carried out three times. In this way, the four-value (two-bit) information are written into one memory cell, and the memory capacity of the memory cell can be increased. In the information read operation, three different kinds of voltages are applied to a word line, three kinds of two-value (one-bit) information so read out are synthesized by a read conversion circuit and the memory information of the memory cell are converted to the two-bit information.Type: ApplicationFiled: January 17, 2006Publication date: June 1, 2006Inventors: Yusuke Jyouno, Takayuki Kawahara, Katsutaka Kimura
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Patent number: 7043466Abstract: The neural network processing system according to the present invention includes a memory circuit for storing neuron output values, connection weights, the desired values of outputs, and data necessary for learning; an input/output circuit for writing or reading data in or out of said memory circuit; a processing circuit for performing a processing for determining the neuron outputs such as the product, sum and nonlinear conversion of the data stored in said memory circuit, a comparison of the output value and its desired value, and a processing necessary for learning; and a control circuit for controlling the operations of said memory circuit, said input/output circuit and said processing circuit.Type: GrantFiled: December 20, 2000Date of Patent: May 9, 2006Assignee: Renesas Technology Corp.Inventors: Takao Watanabe, Katsutaka Kimura, Kiyoo Itoh, Yoshiki Kawajiri
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Patent number: 7031187Abstract: To enable one non-volatile memory cell to store four-value information, three different kinds of threshold voltages are serially applied to a word line in a verify operation to execute a write operation, the threshold voltages of the memory cell are controlled, and two-value (one-bit) information corresponding to the four-value (two-bit) information to be written are synthesized by a write data conversion circuit for each of the write operations carried out three times. In this way, the four-value (two-bit) information are written into one memory cell, and the memory capacity of the memory cell can be increased. In the information read operation, three different kinds of voltages are applied to a word line, three kinds of two-value (one-bit) information so read out are synthesized by a read conversion circuit and the memory information of the memory cell are converted to the two-bit information.Type: GrantFiled: April 27, 2004Date of Patent: April 18, 2006Assignee: Hitachi, Ltd.Inventors: Yusuke Jyouno, Takayuki Kawahara, Katsutaka Kimura
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Patent number: 7030438Abstract: In a large scale integrated DRAM in pursuit of micro fabrication, data line-word line coupling capacitances are unbalanced between paired data lines. A data line-word line imbalance generates large noise when the data lines are subjected to amplification, which is highly likely to invite deterioration of very small signals on the data lines and erroneous amplification of data. One or a few of a plurality of word lines connected to a plurality of memory cells connected to one data line are alternately connected to subword driver arrays arranged on the opposing sides of a memory array. Positive and negative word line noise components cancel each other in the subword drivers when the data lines are subjected to amplification, so that the word line noise can be reduced. Therefore, signals read out by sense amplifiers can be prevented from deterioration thereby to increase the reliability of memory operation.Type: GrantFiled: August 11, 2003Date of Patent: April 18, 2006Assignee: Hitachi, Ltd.Inventors: Tomonori Sekiguchi, Riichiro Takemura, Kazuhiko Kajigaya, Katsutaka Kimura, Tsugio Takahashi
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Publication number: 20060039218Abstract: A sense amplifier capable of performing high-speed data sense operation with lower power consumption using a minuscule signal from a memory cell even in a case where a memory array voltage is reduced. A plurality of drive switches for over-driving are distributively arranged in a sense amplifier area, and a plurality of drive switches for restore operation are concentratively disposed at one end of a row of the sense amplifiers. A potential for over-driving is supplied using a meshed power line circuit. Through the use of the drive switches for over-driving, initial sense operation can be performed on data line pairs with a voltage having an amplitude larger than a data-line amplitude, allowing implementation of high-speed sense operation. The distributed arrangement of the drive switched for over-driving makes it possible to dispersively supply current in sense operation, thereby reducing a difference in sense voltage with respect to far and near positions of the sense amplifiers.Type: ApplicationFiled: August 18, 2005Publication date: February 23, 2006Inventors: Riichiro Takemura, Kiyoo Itoh, Tomonori Sekiguchi, Takeshi Sakata, Katsutaka Kimura
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Publication number: 20050270889Abstract: Disclosed herein is a dynamic RAM comprising a plurality of word lines respectively connected to address select terminals of a plurality of dynamic memory cells, a plurality of complementary bit line pairs respectively connected to input/output terminals of the plurality of dynamic memory cells and placed in directions opposite to one another, and a sense amplifier array which is supplied with an operating voltage according to an operation timing signal and comprises a plurality of latch circuits for respectively amplifying the differences in voltage between the complementary bit line pairs.Type: ApplicationFiled: August 8, 2005Publication date: December 8, 2005Inventors: Tomonori Sekiguchi, Kazuhiko Kajigaya, Katsutaka Kimura, Riichiro Takemura, Tsugio Takahashi, Yoshitaka Nakamura
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Publication number: 20050243603Abstract: A semiconductor integrated device having a plurality of memory cells, each including a floating gate, a control gate and an auxiliary gate formed over a side surface of the floating gate through an insulator film. Auxiliary gates coupled to selected memory cells function to generate hot electrons and are alternately arranged with other auxiliary gates functioning to prevent write errors in the non-selected memory cells.Type: ApplicationFiled: February 22, 2005Publication date: November 3, 2005Inventors: Takashi Kobayashi, Hideaki Kurata, Naoki Kobayashi, Hitoshi Kume, Katsutaka Kimura, Shunichi Saeki