Abstract: A complete test involving the entire number of devices in a large group of managed devices (T) is periodically performed to determine whether the devices are operating normally or have a malfunction; a test result (Ic) is recorded in a management database (Db) for each cycle of the complete test, and a device that has been found to be malfunctioning is repaired or replaced; and the suitability of a device model is determined or a suitable device model is selected for each of the managed devices (T) on the basis of history information (N) about each of the managed devices (T) obtained from the test result (Ic) of the complete test that spans a plurality of cycles, as recorded in the management database (Db).

Abstract: A service condition, a cause of a malfunction, or another aspect of a device in a large group of devices to be managed can be analyzed in an accurate and efficient manner. A complete test involving the entire number of devices in a large group of managed devices (T) is periodically performed to determine whether the devices are operating normally or have a malfunction; a test result (Ic) is recorded for each cycle of the complete test, and a device that has been found to be malfunctioning is repaired or replaced; and analysis data G, E are created showing a malfunctioning frequency (N) of each of the managed devices (T) on the basis of the test result (Ic) of the complete test that spans a plurality of cycles.

Abstract: Either a complete overhaul for replacing with recommended devices the entire number of devices in a large group of managed devices T, or a partial overhaul for repairing or replacing with recommended devices only those managed devices T that are malfunctioning is selectively performed as an initial overhaul. A complete test involving the entire number of the managed devices T is then periodically performed to determine whether the devices are operating normally or have a malfunction. Any devices found to be malfunctioning during any complete test are repaired or replaced with recommended devices.

Abstract: In a wheel pant device (12), wheel pant plates (34 and 36) that form this wheel pant device are able to be rotated in at least a vehicle width direction. By detecting a driving state of a vehicle using a detecting device and rotating the wheel pant plates of the wheel pant device (12) in response to that detected driving state, the airflow acting on the vehicle can be controlled, thereby enabling the driving performance of the vehicle to be improved.

Abstract: A single wiring layer is formed on each of both the roughened surfaces of a core substrate by a semiadditive method. The wiring layers formed on the surfaces of the core substrate are electrically connected through a through hole formed in the core substrate. The through hole is formed in the core substrate by laser machining. The through hole is filled up with conductive a plug. Both the surfaces of the core substrate are coated with solder resist layers, respectively, with predetermined terminal parts of the wiring layers exposed through openings formed in the solder resist layers. End surfaces of the conductive plug filling up the through holes, and the surfaces of the wiring layers are planarized by mechanical or chemical-mechanical polishing.