Patents by Inventor Ken Takeuchi
Ken Takeuchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20110267886Abstract: A NAND cell unit includes memory cells which are connected in series. An erase operation is effected on all memory cells. Then, a soft-program voltage, which is opposite in polarity to the erase voltage applied in an erase operation, is applied to all memory cells, thereby setting all memory cells out of an over-erased state. Thereafter, a program voltage of 20V is applied to the control gate of a selected memory cell, 0V is applied to the control gates of the two memory cells provided adjacent to the selected memory cell, and 11V is applied to the control gates of the remaining memory cells. Data is thereby programmed into the selected memory cell. The time for which the program voltage is applied to the selected memory cell is adjusted in accordance with the data to be programmed into the selected memory cell. Hence, data “0” can be correctly programmed into the selected memory cell, multi-value data can be read from any selected memory cell at high speed.Type: ApplicationFiled: July 11, 2011Publication date: November 3, 2011Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Tomoharu Tanaka, Hiroshi Nakamura, Ken Takeuchi, Riichiro Shirota, Fumitaka Arai, Susumu Fujimura
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Publication number: 20110260781Abstract: The interposer is disposed on an upper surface of the stacked structure formed by stacking a plurality of a DRAM chip and a plurality of a flash memory chip. Thus down-size of an entire device is accomplished. A boost converter having an inductor is used as a voltage boost circuit. Thus down-size of the entire device is accomplished in comparison to a voltage boost circuit using a charge pump connected in parallel with a plurality of a capacitance.Type: ApplicationFiled: April 17, 2009Publication date: October 27, 2011Applicant: THE UNIVERSITY OF TOKYOInventors: Ken Takeuchi, Tadashi Yasufuku, Koichi Ishida, Makoto Takamiya, Takayasu Sakurai
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Patent number: 8000147Abstract: A NAND cell unit includes memory cells which are connected in series. An erase operation is effected on all memory cells. Then, a soft-program voltage, which is opposite in polarity to the erase voltage applied in an erase operation, is applied to all memory cells, thereby setting all memory cells out of an over-erased state. Thereafter, a program voltage of 20V is applied to the control gate of a selected memory cell, 0V is applied to the control gates of the two memory cells provided adjacent to the selected memory cell, and 11V is applied to the control gates of the remaining memory cells. Data is thereby programmed into the selected memory cell. The time for which the program voltage is applied to the selected memory cell is adjusted in accordance with the data to be programmed into the selected memory cell. Hence, data “0” can be correctly programmed into the selected memory cell, multi-value data can be read from any selected memory cell at high speed.Type: GrantFiled: May 17, 2010Date of Patent: August 16, 2011Assignee: Kabushiki Kaisha ToshibaInventors: Tomoharu Tanaka, Hiroshi Nakamura, Ken Takeuchi, Riichiro Shirota, Fumitaka Arai, Susumu Fujimura
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Publication number: 20110170355Abstract: One package contains a plurality of memory chips. Each memory chip has an I/O terminal which generates a busy signal. The busy signal enables a busy state when a power supply voltage value reaches a specified and guaranteed range after a power-on sequence. The busy signal maintains the busy state until completion of initialization operations for the plurality of memory chips. The busy signal releases the busy state after completion of all initialization operations for the plurality of memory chips.Type: ApplicationFiled: March 25, 2011Publication date: July 14, 2011Inventors: Hiroshi Nakamura, Kenichi Imamiya, Ken Takeuchi
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Patent number: 7969784Abstract: Data having three values or more is stored in a memory cell in a nonvolatile manner. A data circuit has a plurality of storage circuits. One of the plurality of storage circuits is a latch circuit. Another one of the plurality of storage circuits is a capacitor. The latch circuit and the capacitor function to temporarily store program/read data having two bits or more. Data held by the capacitor is refreshed using the latch circuit if data variation due to leakage causes a program. As a result, the data circuit does not become large in size even if multi-level data is used.Type: GrantFiled: December 21, 2010Date of Patent: June 28, 2011Assignee: Kabushiki Kaisha ToshibaInventors: Ken Takeuchi, Tomoharu Tanaka, Noboru Shibata
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Publication number: 20110134700Abstract: A select gate transistor has a select gate electrode composed of a first-level conductive layer and a second-level conductive layer. The first-level conductive layer has contact areas. The second-level conductive layer has its portions removed that are located above the contact areas. Two adjacent select gate electrodes that are adjacent to each other in the column direction are arranged such that the contact areas of one select gate electrode are not opposed to the contact areas of the other select gate electrode. One select gate electrode has its first- and second-level conductive layers removed in their portions that are opposed to the contact areas of the other select gate electrode.Type: ApplicationFiled: February 11, 2011Publication date: June 9, 2011Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi, Yuji Takeuchi, Kenichi Imamiya, Ken Takeuchi, Hideko Oodaira
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Publication number: 20110096598Abstract: Data having three values or more is stored in a memory cell in a nonvolatile manner. A data circuit has a plurality of storage circuits. One of the plurality of storage circuits is a latch circuit. Another one of the plurality of storage circuits is a capacitor. The latch circuit and the capacitor function to temporarily store program/read data having two bits or more. Data held by the capacitor is refreshed using the latch circuit if data variation due to leakage causes a program. As a result, the data circuit does not become large in size even if multi-level data is used.Type: ApplicationFiled: December 21, 2010Publication date: April 28, 2011Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Ken TAKEUCHI, Tomoharu TANAKA, Noboru SHIBATA
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Patent number: 7933134Abstract: One package contains a plurality of memory chips. Each memory chip has an I/O terminal which generates a busy signal. The busy signal enables a busy state when a power supply voltage value reaches a specified and guaranteed range after a power-on sequence. The busy signal maintains the busy state until completion of initialization operations for the plurality of memory chips. The busy signal releases the busy state after completion of all initialization operations for the plurality of memory chips.Type: GrantFiled: September 27, 2007Date of Patent: April 26, 2011Assignee: Kabushiki Kaisha ToshibaInventors: Hiroshi Nakamura, Kenichi Imamiya, Ken Takeuchi
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Publication number: 20110075488Abstract: A non-volatile semiconductor device has a memory cell array having electrically erasable programmable non-volatile memory cells, reprogramming and retrieval circuits that temporarily store data to be programmed in the memory cell array and sense data retrieved from the memory cell array. Each reprogramming and retrieval circuit has first and second latches that are selectively connected to the memory cell array and transfer data. A controller controls the reprogramming and retrieval circuits on a data-reprogramming operation to and a data-retrieval operation from the memory cell array. Each reprogramming and retrieval circuit has a multilevel logical operation mode and a caching operation mode. In the multilevel logical operation mode, re-programming and retrieval of upper and lower bits of two-bit four-level data is performed using the first and the second latches to store the two-bit four-level data in one of the memory cells in a predetermined threshold level range.Type: ApplicationFiled: December 6, 2010Publication date: March 31, 2011Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Koji Hosono, Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya
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Patent number: 7893477Abstract: A select gate transistor has a select gate electrode composed of a first-level conductive layer and a second-level conductive layer. The first-level conductive layer has contact areas. The second-level conductive layer has its portions removed that are located above the contact areas. Two adjacent select gate electrodes that are adjacent to each other in the column direction are arranged such that the contact areas of one select gate electrode are not opposed to the contact areas of the other select gate electrode. One select gate electrode has its first- and second-level conductive layers removed in their portions that are opposed to the contact areas of the other select gate electrode.Type: GrantFiled: July 27, 2007Date of Patent: February 22, 2011Assignee: Kabushiki Kaisha ToshibaInventors: Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi, Yuji Takeuchi, Kenichi Imamiya, Ken Takeuchi, Hideko Oodaira
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Publication number: 20110010402Abstract: Provided is a technique for a data-driven database which frees a user from having to be conscious of a sequence in which instructions of a program for accessing a database are described, an interrelation of data items, and the like, and from having to describe redundant instructions. A data-driven database processor includes: schema definition storage means 2 for storing a schema definition of a database 24; derived definition storage means 3 for storing a derived definition describing a cause-and-effect relationship that exists when a value of a given data item is derived from a value of another data item; derived definition processing means 26 for generating a trigger program 27 that makes a chain of changes to values of data items based on the cause-and-effect relationship described in the derived definition; and a database management system 23 for executing the trigger program 27 when a change is made to the other data item that affects the value of the given data item.Type: ApplicationFiled: December 24, 2008Publication date: January 13, 2011Inventors: Ken Takeuchi, Yuji Takeuchi, Takahiro Yodo
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Patent number: 7864592Abstract: Data having three values or more is stored in a memory cell in a nonvolatile manner. A data circuit has a plurality of storage circuits. One of the plurality of storage circuits is a latch circuit. Another one of the plurality of storage circuits is a capacitor. The latch circuit and the capacitor function to temporarily store program/read data having two bits or more. Data held by the capacitor is refreshed using the latch circuit if data variation due to leakage causes a program. As a result, the data circuit does not become large in size even if multi-level data is used.Type: GrantFiled: September 1, 2009Date of Patent: January 4, 2011Assignee: Kabushiki Kaisha ToshibaInventors: Ken Takeuchi, Tomoharu Tanaka, Noboru Shibata
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Patent number: 7859907Abstract: A non-volatile semiconductor device has a memory cell array having electrically erasable programmable non-volatile memory cells, reprogramming and retrieval circuits that temporarily store data to be programmed in the memory cell array and sense data retrieved from the memory cell array. Each reprogramming and retrieval circuit has first and second latches that are selectively connected to the memory cell array and transfer data. A controller controls the reprogramming and retrieval circuits on a data-reprogramming operation to and a data-retrieval operation from the memory cell array. Each reprogramming and retrieval circuit has a multilevel logical operation mode and a caching operation mode. In the multilevel logical operation mode, re-programming and retrieval of upper and lower bits of two-bit four-level data is performed using the first and the second latches to store the two-bit four-level data in one of the memory cells in a predetermined threshold level range.Type: GrantFiled: November 18, 2009Date of Patent: December 28, 2010Assignee: Kabushiki Kaisha ToshibaInventors: Koji Hosono, Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya
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Publication number: 20100309722Abstract: A semiconductor memory device capable of preventing a defect caused by lowering the etching precision in an end area of the memory cell array is provided. A first block is constructed by first memory cell units each having of memory cells, a second block is constructed by second memory cell units each having a plurality of memory cells, and the memory cell array is constructed by arranging the first blocks on both end portions thereof and arranging the second blocks on other portions thereof. The structure of the first memory cell unit on the end side of the memory cell array is different from that of the second memory cell unit. Wirings for connecting the selection gate lines of the memory cell array to corresponding transistors in a row decoder are formed of wiring layers formed above wirings for connecting control gate lines of the memory cell array to the transistors in the row decoder.Type: ApplicationFiled: August 12, 2010Publication date: December 9, 2010Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu, Seiichi Aritome
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Publication number: 20100309723Abstract: A semiconductor memory device capable of preventing a defect caused by lowering the etching precision in an end area of the memory cell array is provided. A first block is constructed by first memory cell units each having of memory cells, a second block is constructed by second memory cell units each having a plurality of memory cells, and the memory cell array is constructed by arranging the first blocks on both end portions thereof and arranging the second blocks on other portions thereof. The structure of the first memory cell unit on the end side of the memory cell array is different from that of the second memory cell unit. Wirings for connecting the selection gate lines of the memory cell array to corresponding transistors in a row decoder are formed of wiring layers formed above wirings for connecting control gate lines of the memory cell array to the transistors in the row decoder.Type: ApplicationFiled: August 12, 2010Publication date: December 9, 2010Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu, Seiichi Aritome
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Publication number: 20100226173Abstract: A NAND cell unit includes memory cells which are connected in series. An erase operation is effected on all memory cells. Then, a soft-program voltage, which is opposite in polarity to the erase voltage applied in an erase operation, is applied to all memory cells, thereby setting all memory cells out of an over-erased state. Thereafter, a program voltage of 20V is applied to the control gate of a selected memory cell, 0V is applied to the control gates of the two memory cells provided adjacent to the selected memory cell, and 11V is applied to the control gates of the remaining memory cells. Data is thereby programmed into the selected memory cell. The time for which the program voltage is applied to the selected memory cell is adjusted in accordance with the data to be programmed into the selected memory cell. Hence, data “0” can be correctly programmed into the selected memory cell, multi-value data can be read from any selected memory cell at high speed.Type: ApplicationFiled: May 17, 2010Publication date: September 9, 2010Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Tomoharu Tanaka, Hiroshi Nakamura, Ken Takeuchi, Riichiro Shirota, Fumitaka Arai, Susumu Fujimura
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Patent number: 7787277Abstract: A semiconductor memory device capable of preventing a defect caused by lowering the etching precision in an end area of the memory cell array is provided. A first block is constructed by first memory cell units each having of memory cells, a second block is constructed by second memory cell units each having a plurality of memory cells, and the memory cell array is constructed by arranging the first blocks on both end portions thereof and arranging the second blocks on other portions thereof. The structure of the first memory cell unit on the end side of the memory cell array is different from that of the second memory cell unit. Wirings for connecting the selection gate lines of the memory cell array to corresponding transistors in a row decoder are formed of wiring layers formed above wirings for connecting control gate lines of the memory cell array to the transistors in the row decoder.Type: GrantFiled: March 21, 2008Date of Patent: August 31, 2010Assignee: Kabushiki Kaisha ToshibaInventors: Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu, Seiichi Aritome
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Patent number: 7751259Abstract: One package contains a plurality of memory chips. Each memory chip has an I/O terminal which generates a busy signal. The busy signal enables a busy state when a power supply voltage value reaches a specified and guaranteed range after a power-on sequence. The busy signal maintains the busy state until completion of initialization operations for the plurality of memory chips. The busy signal releases the busy state after completion of all initialization operations for the plurality of memory chips.Type: GrantFiled: September 27, 2007Date of Patent: July 6, 2010Assignee: Kabushiki Kaisha ToshibaInventors: Hiroshi Nakamura, Kenichi Imamiya, Ken Takeuchi
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Patent number: 7746707Abstract: A NAND cell unit includes memory cells which are connected in series. An erase operation is effected on all memory cells. Then, a soft-program voltage, which is opposite in polarity to the erase voltage applied in an erase operation, is applied to all memory cells, thereby setting all memory cells out of an over-erased state. Thereafter, a program voltage of 20V is applied to the control gate of a selected memory cell, 0V is applied to the control gates of the two memory cells provided adjacent to the selected memory cell, and 11V is applied to the control gates of the remaining memory cells. Data is thereby programmed into the selected memory cell. The time for which the program voltage is applied to the selected memory cell is adjusted in accordance with the data to be programmed into the selected memory cell. Hence, data “0” can be correctly programmed into the selected memory cell, multi-value data can be read from any selected memory cell at high speed.Type: GrantFiled: October 30, 2007Date of Patent: June 29, 2010Assignee: Kabushiki Kaisha ToshibaInventors: Tomoharu Tanaka, Hiroshi Nakamura, Ken Takeuchi, Riichiro Shirota, Fumitaka Arai, Susumu Fujimura
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Patent number: 7729178Abstract: The non-volatile semiconductor memory device has a circuit which maintains and holds the potentials of bit lines, and either ones of even-bit lines or odd-bit lines are connected to the circuit. When the bit line potential holding circuit is connected to even-bit lines and a block copy is performed, data is first outputted to the even-bit lines, and after the potential of the even-bit line is determined, the bit line potential holding circuit operates. Then, biasing of the potential of the even-bit lines is carried out by the bit line potential holding circuit, the potentials of the bit lines are maintained and held. At the same time, data is outputted to the odd-bit lines and the potentials of the odd-bit lines are determined. Then, a program voltage is supplied to a selected word line, and data is simultaneously written (programmed) in the memory cells connected to the even-bit lines, and the memory cells connected to the odd-bit lines.Type: GrantFiled: September 4, 2007Date of Patent: June 1, 2010Assignee: Kabushiki Kaisha ToshibaInventors: Yasushi Kameda, Ken Takeuchi, Hitoshi Shiga, Takuya Futatsuyama, Koichi Kawai