Abstract: Provided is a vital stain inspection method for distinguishing between cancer cells and normal cells within a lumen, or on the serous membrane side of an organ, by means of laser irradiation after organ tissue has been stained by curcumin, Red #3 or Red #106, which are edible color dyes.

Abstract: A wireless communication system is provide that includes deep body temperature sensors that include a measured deep body temperature into an advertising packet that is then transmitted. A display unit displays a measurement result of a deep body temperature. When the wireless connection to the display unit is not established, each of the deep body temperature sensors includes a result of determination of whether it is stuck to a human body into an advertising packet and transmits the advertising packet. In an aspect, the display unit is wirelessly connected to a sensor stuck to a human body among the deep body temperature sensors.

Abstract: A cancer test device (1) is provided with: an application unit (40) for applying a staining agent (45), which can selectively stain a product of a cancer-relating gene in a living cell a chromatic color, onto a group of living cells; an imaging unit (10) for imaging the group of living cells having the staining agent (45) applied thereto; and a determination unit (52) for determining the level of malignancy of cancerization of the group of living cells on the basis of the state of the stained expression pattern of the cancer-relating gene in the group of living cells in an image obtained by the aforementioned imaging.

Abstract: A neck movement measuring device is provided that includes displacement sensors and a controller. The displacement sensors are formed as sheets attachable to the neck skin of a subject and measure the deformation amount. The controller receives measured values of the displacement sensors and sets a reference value based on measured values of the displacement sensor. In addition, the controller outputs the displacement amount relative to the reference value as a measurement result.

Abstract: A semiconductor device includes: a drift layer of a first conduction type provided in a semiconductor substrate having a first principal plane and a second principal plane opposed to the first principal plane; a first semiconductor layer of a second conduction type provided between the first principal plane of the semiconductor substrate and the drift layer and having impurity concentration higher than impurity concentration of the drift layer; a first buffer layer of a first conduction type provided between the second principal plane of the semiconductor substrate and the drift layer and having hydrogen-induced donors with impurity concentration higher than impurity concentration of the drift layer; and a second semiconductor layer of a first conduction type or a second conduction type provided between the second principal plane of the semiconductor substrate and the first buffer layer and having impurity concentration higher than impurity concentration of the drift layer, wherein the first buffer layer incl

Abstract: A semiconductor device includes: a drift layer of a first conduction type provided in a semiconductor substrate having a first principal plane and a second principal plane opposed to the first principal plane; a first semiconductor layer of a second conduction type provided between the first principal plane of the semiconductor substrate and the drift layer and having impurity concentration higher than impurity concentration of the drift layer; a first buffer layer of a first conduction type provided between the second principal plane of the semiconductor substrate and the drift layer and having hydrogen-induced donors with impurity concentration higher than impurity concentration of the drift layer; and a second semiconductor layer of a first conduction type or a second conduction type provided between the second principal plane of the semiconductor substrate and the first buffer layer and having impurity concentration higher than impurity concentration of the drift layer, wherein the first buffer layer incl

Abstract: Crop production in agriculture, horticulture, and the like has still been significantly damaged by pests and the like, and pests that are resistant to existing drugs have appeared. Due to such concerns, it is desired to develop novel insecticidal agents and acaricides. The present invention has found that a compound represented by general formula (1): wherein X and Y represent an oxygen atom or a sulfur atom, R1 represents a hydrogen atom or the like, R2 represents a substituted phenyl group or the like, R3 represents a hydrogen atom or the like, and R4 represents a phenyl group or the like, or a salt thereof has a high insecticidal effect on pests in agriculture and horticulture, and the like. The present invention provides an agricultural and horticultural insecticidal agent containing the compound or a salt thereof as an active ingredient, and a method of use thereof.

Abstract: A tool transport system equipped with a tool storage portion that does not depend on the tool standard is awaited. The tool transport system includes a plurality of machine tools, and a tool storage portion having a plurality of holding parts. Each of the plurality of holding parts has a common holding mechanism capable of holding any of a plurality of tool holders. The tool transport system includes a transport device. A first tool holder of the plurality of tool holders has a common connection mechanism, and a first attachment mechanism. A second tool holder of the plurality of tool holders has the common connection mechanism, and a second attachment mechanism to which a second tool to be used in a second machine tool of the plurality of machine tools is attachable.

Abstract: Electrostatic chuck assemblies, systems including the assemblies, and methods of using the electrostatic chuck assemblies and systems are disclosed. Exemplary electrostatic chuck assemblies include a detector or circuit to detect a chucking event, such as insufficient chucking power and/or substrate warpage. Exemplary systems and methods can adjust a chucking power based on the measured or determined chucking event.

Abstract: Crop production in agriculture, horticulture, and the like has still been significantly damaged by pests and the like, and pests that are resistant to existing drugs have appeared. Due to such concerns, it is desired to develop novel insecticidal agents and acaricides. The present invention provides a compound represented by general formula (1): wherein X and Y represent an oxygen atom or a sulfur atom, R1 represents a hydrogen atom or the like, R2 represents a substituted phenyl group or the like, R3 represents a hydrogen atom or the like, and R4 represents a phenyl group or the like, or a salt thereof, an agricultural and horticultural insecticidal agent containing the compound as an active ingredient, and a method of use thereof.

Abstract: An oral pressure measurement device is provided that includes a handle and a sensor extending from the handle. The sensor includes a plate-like first pressure sensor for pressure measurement and a plate-like second pressure sensor for pressure measurement. The sensor portion further includes a first pressure dispersion plate arranged above a first principal surface of the first pressure sensor and a second pressure dispersion plate arranged above a second principal surface of the second pressure sensor. The first pressure dispersion plate and the second pressure dispersion plate are separately arranged.

Abstract: A substrate processing system includes: a carry-in/out section in which a cassette accommodating a plurality of substrates is carried in/out; a batch processing section in which a wafer lot including the plurality of substrates is collectively processed in a state where each of the plurality of substrates stand upright; a single-wafer processing section in which the plurality of substrates included in the wafer lot are processed one by one in a horizontal state; and an interface section that delivers the plurality of substrates from the batch processing section to the single-wafer processing section. The interface section includes: a standby table that horizontally holds a substrate in a state of being in contact with pure water; and a transfer mechanism that delivers the substrate from the batch processing section to the standby table.

Abstract: A surface electrode having a first surface and a plurality of electrode elements disposed on the first surface and spaced from each other in a manner so as to be configured to contact a measured surface of an object to be measured; a stretchable wire electrically connecting the plurality of electrode elements; and a stretchable insulator covering a side of the stretchable wire adjacent to the electrode elements.

Abstract: An elastically deformable electrode that includes a plurality of electrode elements spaced from each other, and a liquid wire which is a liquid conductor configured to electrically connect the plurality of electrode elements. The electrode may also include a solid wire sealing the liquid wire, and an insulator between the solid wire and the plurality of electrode elements.

Abstract: In an RFC diode, a semiconductor substrate includes an n? drift layer, an n buffer layer, and a diffusion layer provided between and in contact with the n buffer layer and a second metal layer. The diffusion layer includes an n+ cathode layer provided in contact with the n buffer layer and the second metal layer in a diode region. The n+ cathode layer includes a first n+ cathode layer in contact with the second metal layer and a second n+ cathode layer provided between the first n+ cathode layer and the n buffer layer in contact with the n buffer layer. Crystal defect density of the first n+ cathode layer is higher than crystal defect density of another diffusion layer.

Abstract: A substrate processing system includes: a carry-in/out section in which a cassette accommodating a plurality of substrates is carried in/out; a batch processing section in which a wafer lot including the plurality of substrates is collectively processed; a single-wafer processing section in which the substrates of the wafer lot is processed one by one; and an interface section that delivers the substrates between the batch processing section and the single-wafer processing section. The batch processing section includes: a processing bath in which the wafer lot is immersed and processed; and a first transfer device that transfers the wafer lot to the processing bath. The interface section includes: an immersion bath disposed outside a movement range of the first transfer device and that immerses the wafer lot; and a second transfer device that holds and transfers the wafer lot between the first transfer device and the immersion bath.

Abstract: A light-emitting element (10) includes: a light-emitting part (30) including a light-emitting region; a first optical path control unit (71) which has positive optical power and to which light emitted from the light-emitting region enters; a second optical path control unit (72) which has positive optical power and to which light exited from the first optical path control unit (71) enters; and a bonding member (35) interposed between the first optical path control unit (71) and the second optical path control unit (72), in which an optical axis (LN1) of the first optical path control unit (71) is displaced from an optical axis (LN2) of the second optical path control unit (72).

Abstract: In an analysis system for analyzing a fatigue and/or stress state of an organization, the analysis system includes an information acquisition unit, an information storage unit, a fatigue and/or stress value acquisition unit, the fatigue and/or stress value being calculated based on the information regarding the fatigue and/or the stress, an adjustment target extraction unit configured to extract adjustment targets from among a plurality of members based on personal information including health information and a predetermined condition, the predetermined condition including whether a predetermined health state is good, and a fatigue and/or stress state analysis unit configured to adjust a set of the fatigue and/or stress values by correcting or excluding from an analysis the fatigue and/or stress value of the adjustment targets and to analyze the fatigue and/or stress state of the organization based on an adjusted set of the fatigue and/or stress values.

Abstract: A first principal electrode and a first control electrode pad are formed on a first principal surface of the semiconductor chip. A second principal electrode and a second control electrode pad are formed on a second principal surface of the semiconductor chip. The second principal electrode and the second control electrode pad are respectively bonded to first and second metal patterns of an insulating substrate. Bonding sections of first and second wires overlap a bonding section of the second principal electrode or the second control electrode pad in plan view. Thickness of the first and second metal patterns is 0.2 mm or less.

Abstract: A semiconductor device includes a semiconductor substrate having a drift layer of a first conductivity type and a collector layer of a second conductivity type. A first buffer layer having a higher impurity concentration peak than that of the drift layer is formed between the drift layer and the collector layer and a second buffer layer having a higher impurity concentration peak than that of the drift layer is formed between the first buffer layer and the collector layer. A kurtosis of a peak of an impurity concentration of the second buffer layer is lower than a kurtosis of a peak of an impurity concentration of the first buffer layer.