Abstract: To provide a testing apparatus having a function of testing a D/A converter and so forth with a reduced testing time. The testing apparatus tests a converter having functionality of converting an input signal and outputting the signal thus converted. The testing apparatus comprises: a pattern generator which generates an input signal having a predetermined cycle; a clock generator which generates a measurement clock having a predetermined cycle; a measurement unit which receives the measurement clock, and sequentially measures the values of the output signal, synchronously with the measurement clock; and a storage unit which stores, at different corresponding addresses, the values thus sequentially measured by the measurement unit.

Abstract: There is provided a joint structure of a wound iron core in which iron core characteristics can be enhanced by improving the distribution of magnetic flux within an iron core. A wound iron core is formed to provide a joining structure or a butt joining structure and a lap joining structure disposed in an appropriate arrangement in which the a margin of overlapping is more increased as being closer to an outer periphery from an inner periphery of the iron core, taking a distribution of magnetic flux density within the iron core into consideration.

Abstract: There is provided a joint structure of a wound iron core in which iron core characteristics can be enhanced by improving the distribution of magnetic flux within an iron core. A wound iron core is formed to provide a joining structure or a butt joining structure and a lap joining structure disposed in an appropriate arrangement in which the a margin of overlapping is more increased as being closer to an outer periphery from an inner periphery of the iron core, taking a distribution of magnetic flux density within the iron core into consideration.

Abstract: There is provided an analysis apparatus 30 for analyzing test results of testing, by using a test apparatus, a plurality of devices under test having the same configuration. The analysis apparatus 30 includes: an acquiring unit 300 that acquires a judgment result of comparing, to an expected value, a value of data in storage read out for each flip-flop, the data having been stored as a result of scan testing onto flip-flops provided linked to one another by scan chain connection within the devices under test; a result storage unit 310 that stores the judgment result for each flip-flop in association with a position of the flip-flop in a scan chain; a composite unit 350 that generates a composite result in which a plurality of judgment results for the devices under test are combined with one another for each position in the scan chain; and a display unit 360 that displays the composite result.

Abstract: A liquid crystal substrate inspection apparatus includes an inspection device for inspecting a liquid crystal substrate and a prober replacing device disposed adjacent to the inspection device. The prober replacing device has a conveying device for conveying a prober for inspecting a liquid crystal substrate. The inspection device and the prober replacing device are arranged next to each other, so that it is possible to shorten an inspection time of the liquid crystal substrate. The prober replacing device has the conveying device for automatically conveying the prober to the inspection device.

Abstract: A storing unit stores determining data pertaining to permission of activation of an application. A control unit determines, when an activation request for an application is received, whether activation of the application is permitted based on the determining data, and activates the application when it is determined that the activation of the application is permitted.

Abstract: A communication terminal having a wireless communication facility including sending and receiving a message which is sent to a receiving terminal without a send request from a receiving terminal through a message center, including: a message sending/receiving unit sending and receiving the message; a time control unit controlling current time; a message analysis unit analyzing a message which is sent by a message center, received by the message sending/receiving unit, and includes time information assigned by a message center, and retrieving the time information; and a time setting unit setting in the time control unit a time indicated by the time information retrieved by the message analysis unit as a current time.

Abstract: To provide a testing apparatus having a function of testing a D/A converter and so forth with a reduced testing time. The testing apparatus tests a converter having functionality of converting an input signal and outputting the signal thus converted. The testing apparatus comprises: a pattern generator which generates an input signal having a predetermined cycle; a clock generator which generates a measurement clock having a predetermined cycle; a measurement unit which receives the measurement clock, and sequentially measures the values of the output signal, synchronously with the measurement clock; and a storage unit which stores, at different corresponding addresses, the values thus sequentially measured by the measurement unit.

Abstract: The present invention provides a novel esterase derived from Ideonella sp. 0-0013 strain (FERM BP-08660) having the following properties: (1) function, substrate specificity: hydrolyzes methyl 3-hydroxypalmitate to generate 3-hydroxypalmitic acid and methanol; (2) optimal temperature for functioning: 37° C.; (3) optimal pH and stable pH range: pH 7 or more to pH 10 or less; (4) temperature stability: 97% of the enzyme is stable at 43° C.; (5) inhibition, activation, and stabilization: activated by sodium ion and potassium ion, and inhibited by strontium ion, iron ion (divalent), and methyl palmitate; (6) molecular weight: about 46,500 Da (by SDS-PAGE), about 41,000 Da (by a gel filtration method); and (7) isoelectric point: pI 4 (by polyacrylamide gel isoelectric focusing method); a microorganism producing the enzyme; and a method of producing the enzyme.

Abstract: An apparatus for bending a glass sheet includes a final hearth bed. This final hearth bed has a top surface that is upwardly convexly curved along a plane perpendicular to an axis of the glass sheet. The top surface has an upstream end, a downstream end that is at a level lower than that of the upstream end, and an intermediate point defined therebetween. The top surface has (a) a first section that extends from the upstream end to the intermediate point and that is parallel with the axis or upwardly inclined relative to the axis and (b) a second section that extends from the intermediate point to the downstream end and that is downwardly inclined relative to the axis. The final hearth bed has a bottom surface that is along the first direction or inclined downwardly relative to the first direction.

Abstract: For bending a glass sheet so that the glass sheet has a compound curvature, an apparatus comprises a furnace including hearth beds on a bed support and a quenching unit provided with upper and lower air blowers. The final hearth bed may have a top surface with a simple curvature, be provided with one upstream corner cut away thereby defining a cut surface section and arranged in such a manner that the cut surface section is nearly parallel to the hearth bed adjacent to the final hearth bed. Alternatively, the final hearth bed may have a top surface with a compound curvature, so that the glass sheet is bent under the conditions set by controlling a temperature in a downstream part of the furnace, adjusting the inclination of the lower air blower and/or rotating final hearth bed so as to reverse the upstream and downstream ends thereof.

Abstract: For bending a glass sheet so that the glass sheet has a compound curvature, an apparatus comprises a furnace including hearth beds on a bed support and a quenching unit provided with upper and lower air blowers. The final hearth bed may have a top surface with a simple curvature, be provided with one upstream corner cut away thereby defining a cut surface section and arranged in such a manner that the cut surface section is nearly parallel to the hearth bed adjacent to the final hearth bed. Alternatively, the final hearth bed may have a top surface with a compound curvature, so that the glass sheet is bent under the conditions set by controlling a temperature in a downstream part of the furnace, adjusting the inclination of the lower air blower and/or rotating final hearth bed so as to reverse the upstream and downstream ends thereof.

Abstract: There is provided a joint structure of a wound iron core in which iron core characteristics can be enhanced by improving the distribution of magnetic flux within an iron core. A wound iron core is formed to provide a joining structure or a butt joining structure and a lap joining structure disposed in an appropriate arrangement in which the a margin of overlapping is more increased as being closer to an outer periphery from an inner periphery of the iron core, taking a distribution of magnetic flux density within the iron core into consideration.

Abstract: A liquid crystal substrate inspection apparatus includes an inspection device for inspecting a liquid crystal substrate and a prober replacing device disposed adjacent to the inspection device. The prober replacing device has a conveying device for conveying a prober for inspecting a liquid crystal substrate. The inspection device and the prober replacing device are arranged next to each other, so that it is possible to shorten an inspection time of the liquid crystal substrate. The prober replacing device has the conveying device for automatically conveying the prober to the inspection device.

Abstract: An apparatus for testing plural pixels arranged in a matrix array on a TFT substrate comprises an electron gun for incidenting the electron beam to the TFT substrate, a secondary electron detector for detecting the amount of secondary electrons generated by incidenting the electron beam to the TFT substrate, and a stage for carrying the TFT substrate which is held thereon. The electron gun is placed against the TFT substrate held on the stage and incidents the electron beam to each basic scanning area. The electron gun scans the electron beam in one basic scanning area a predetermined number of times to obtain a secondary electron waveform necessary for testing the presence/absence of a defect in the pixel. The stage is always moved while the electron gun scans the electron beam in each basic scanning area, whereby the entire area of the TFT substrate is tested.

Abstract: An apparatus for testing plural pixels arranged in a matrix array on a TFT substrate comprises an electron gun for incidenting the electron beam to the TFT substrate, a secondary electron detector for detecting the amount of secondary electrons generated by incidenting the electron beam to the TFT substrate, and a stage for carrying the TFT substrate which is held thereon. The electron gun is placed against the TFT substrate held on the stage and incidents the electron beam to each basic scanning area. The electron gun scans the electron beam in one basic scanning area a predetermined number of times to obtain a secondary electron waveform necessary for testing the presence/absence of a defect in the pixel. The stage is always moved while the electron gun scans the electron beam in each basic scanning area, whereby the entire area of the TFT substrate is tested.

Abstract: An apparatus for bending a glass sheet includes a final hearth bed. This final hearth bed has a top surface that is upwardly convexly curved along a plane perpendicular to an axis of the glass sheet. The top surface has an upstream end, a downstream end that is at a level lower than that of the upstream end, and an intermediate point defined therebetween. The top surface has (a) a first section that extends from the upstream end to the intermediate point and that is parallel with the axis or upwardly inclined relative to the axis and (b) a second section that extends from the intermediate point to the downstream end and that is downwardly inclined relative to the axis. The final hearth bed has a bottom surface that is along the first direction or inclined downwardly relative to the first direction.

Abstract: A wafer (22) is placed on an upper surface of a holder body (23), and the holder body is inserted into a plurality of holder-aimed concave recesses (14) formed on supporters (12) accommodated in a heat treatment furnace such that the holder body is held horizontally. The holder body is formed into a disk shape free of recessed cut portions, and the holder body is formed with an upwardly projecting ring-like projection (24) extending in the circumferential direction of the holder body around the axis of the holder body. The wafer holder is constituted such that the wafer is placed on the holder body while contacting with the upper surface of the projection, and such that the outer diameter of the projection is formed to be in a range of 0.5D to 0.98D wherein D is the diameter of the wafer, so that the outer periphery of the wafer is kept from contacting with the projection. Occurrence of slips in the wafer is restricted by preventing warpage of the holder body upon fabricating the holder body.

Abstract: For bending a glass sheet so that the glass sheet has a compound curvature, an apparatus comprises a furnace including hearth beds on a bed support and a quenching unit provided with upper and lower air blowers. The final hearth bed may have a top surface with a simple curvature, be provided with one upstream corner cut away thereby defining a cut surface section and arranged in such a manner that the cut surface section is nearly parallel to the hearth bed adjacent to the final hearth bed. Alternatively, the final hearth bed may have a top surface with a compound curvature, so that the glass sheet is bent under the conditions set by controlling a temperature in a downstream part of the furnace, adjusting the inclination of the lower air blower and/or rotating final hearth bed so as to reverse the upstream and downstream ends thereof.

Abstract: An ultra-high-temperature heat treatment apparatus includes an electric furnace, a furnace tube made of porous SiC/CVD-SiC, a heat-insulating apparatus fitted into the furnace tube for interrupting heat conduction from the furnace tube, a contamination control apparatus disposed beneath the furnace tube for preventing contamination in the furnace tube, and a separator mechanism for separating a wafer, subject to heat treatment in the furnace tube, from an annular holder. The electric furnace includes a heater comprised of heater elements which are replaceable independently of each other. Each heater element includes a heat-generating portion disposed along the inner wall face of the heat insulator so as not to be in close contact therewith, and a fixture portion fixed to the heat insulator. This heater construction makes it possible to reduce heater repair costs, suppress reactions between the heat-generating portions and the heat insulator, and suppress a contraction of the heat insulator.