Patents by Inventor Mark Lawrence Delaney

Mark Lawrence Delaney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11756186
    Abstract: A workpiece inspection and defect detection system includes a light source configuration, a lens configuration, and a camera configuration for imaging workpieces. The system acquires training and run mode workpiece images for acquiring corresponding sets of training and run mode workpiece image data. Each set of image data includes at least first and second color channel workpiece image data corresponding to first and second color channels (e.g., for which ratios between the first and second color channel workpiece image data may be determined as part of synthetic image data to improve the ability of the system to detect defects). The defect detection portion is trained based at least in part on the image data, and is utilized to perform analysis to determine defect images that include workpieces with defects (e.g., for which metrology operations may be performed for measuring dimensions of defects, etc.).
    Type: Grant
    Filed: September 15, 2021
    Date of Patent: September 12, 2023
    Assignee: Mitutoyo Corporation
    Inventor: Mark Lawrence Delaney
  • Publication number: 20230082268
    Abstract: A workpiece inspection and defect detection system includes a light source configuration, a lens configuration, and a camera configuration for imaging workpieces. The system acquires training and run mode workpiece images for acquiring corresponding sets of training and run mode workpiece image data. Each set of image data includes at least first and second color channel workpiece image data corresponding to first and second color channels (e.g., for which ratios between the first and second color channel workpiece image data may be determined as part of synthetic image data to improve the ability of the system to detect defects). The defect detection portion is trained based at least in part on the image data, and is utilized to perform analysis to determine defect images that include workpieces with defects (e.g., for which metrology operations may be performed for measuring dimensions of defects, etc.).
    Type: Application
    Filed: September 15, 2021
    Publication date: March 16, 2023
    Inventor: Mark Lawrence Delaney
  • Patent number: 10812701
    Abstract: A method is provided for operating a tunable acoustic gradient (TAG) lens imaging system. The method includes: (a) providing a smart lighting pulse control routine/circuit (SLPCRC) that provides a first mode of exposure control corresponding to a points from focus (PFF) mode of the TAG lens imaging system and a second mode of exposure control corresponding to an extended depth of focus (EDOF) mode of the TAG lens imaging system; (b) placing a workpiece in a field of view of the TAG lens imaging system; and (c) periodically modulating a focus position of the TAG lens imaging system without macroscopically adjusting the spacing between elements in the TAG lens imaging system, wherein the focus position is periodically modulated over a plurality of focus positions along a focus axis direction in a focus range including a surface height of the workpiece, at a modulation frequency of at least 30 kHz.
    Type: Grant
    Filed: December 13, 2018
    Date of Patent: October 20, 2020
    Assignee: Mitutoyo Corporation
    Inventors: Vahan Senekerimyan, Joseph Andrew Summers, Scott Ellis Hemmings, Mark Lawrence Delaney, Paul Gerard Gladnick, Bjorn Erik Bertil Jansson
  • Publication number: 20200195836
    Abstract: A method is provided for operating a tunable acoustic gradient (TAG) lens imaging system. The method includes: (a) providing a smart lighting pulse control routine/circuit (SLPCRC) that provides a first mode of exposure control corresponding to a points from focus (PFF) mode of the TAG lens imaging system and a second mode of exposure control corresponding to an extended depth of focus (EDOF) mode of the TAG lens imaging system; (b) placing a workpiece in a field of view of the TAG lens imaging system; and (c) periodically modulating a focus position of the TAG lens imaging system without macroscopically adjusting the spacing between elements in the TAG lens imaging system, wherein the focus position is periodically modulated over a plurality of focus positions along a focus axis direction in a focus range including a surface height of the workpiece, at a modulation frequency of at least 30 kHz.
    Type: Application
    Filed: December 13, 2018
    Publication date: June 18, 2020
    Inventors: Vahan Senekerimyan, Joseph Andrew Summers, Scott Ellis Hemmings, Mark Lawrence Delaney, Paul Gerard Gladnick, Bjorn Erik Bertil Jansson
  • Patent number: 9961253
    Abstract: A system for providing an automatically focused image comprises an imaging system including a high speed periodically modulated variable focal length (VFL) lens, a VFL lens controller, a VFL-projected light source, a focus determining portion, an exposure timing adjustment circuit, and an exposure strobe time controller. The focus determining portion comprises an optical detector that inputs reflected VFL-projected light that is projected to, and reflected from, a workpiece through the VFL lens, and provides a focus deviation signal. The exposure timing adjustment circuit provides an exposure timing adjustment signal based on the focus deviation signal, which indicates a time when the imaging system focus Z-height approximately coincides with the workpiece surface Z height. The exposure strobe time controller uses the exposure timing adjustment signal to adjust the image exposure time so the imaging system focus Z-height coincides with the workpiece surface Z height at the adjusted image exposure time.
    Type: Grant
    Filed: December 29, 2016
    Date of Patent: May 1, 2018
    Assignee: Mitutoyo Corporation
    Inventors: Robert Kamil Bryll, Mark Lawrence Delaney
  • Publication number: 20170324895
    Abstract: A system for providing an automatically focused image comprises an imaging system including a high speed periodically modulated variable focal length (VFL) lens, a VFL lens controller, a VFL-projected light source, a focus determining portion, an exposure timing adjustment circuit, and an exposure strobe time controller. The focus determining portion comprises an optical detector that inputs reflected VFL-projected light that is projected to, and reflected from, a workpiece through the VFL lens, and provides a focus deviation signal. The exposure timing adjustment circuit provides an exposure timing adjustment signal based on the focus deviation signal, which indicates a time when the imaging system focus Z-height approximately coincides with the workpiece surface Z height. The exposure strobe time controller uses the exposure timing adjustment signal to adjust the image exposure time so the imaging system focus Z-height coincides with the workpiece surface Z height at the adjusted image exposure time.
    Type: Application
    Filed: December 29, 2016
    Publication date: November 9, 2017
    Inventors: Robert Kamil Bryll, Mark Lawrence Delaney
  • Patent number: 9774765
    Abstract: An image acquisition system is operated to provide an image that is relatively free of the effect of longitudinal chromatic aberration. The system includes a variable focal length lens (e.g., a tunable acoustic gradient index of refraction lens) that is operated to periodically modulate a focus position. First, second, third, etc., wavelength image exposure contributions are provided by operating an illumination system to provide instances of strobed illumination of first, second, third, etc., wavelengths (e.g., green, blue, red, etc.) timed to correspond with respective phase timings of the periodically modulated focus position which focus the respective wavelength image exposure contributions at the same focus plane. The respective phase timings of the periodically modulated focus position compensate for longitudinal chromatic aberration of at least the variable focal length lens.
    Type: Grant
    Filed: September 15, 2015
    Date of Patent: September 26, 2017
    Assignee: Mitutoyo Corporation
    Inventors: Robert Kamil Bryll, Mark Lawrence Delaney
  • Publication number: 20170078532
    Abstract: An image acquisition system is operated to provide an image that is relatively free of the effect of longitudinal chromatic aberration. The system includes a variable focal length lens (e.g., a tunable acoustic gradient index of refraction lens) that is operated to periodically modulate a focus position. First, second, third, etc., wavelength image exposure contributions are provided by operating an illumination system to provide instances of strobed illumination of first, second, third, etc., wavelengths (e.g., green, blue, red, etc.) timed to correspond with respective phase timings of the periodically modulated focus position which focus the respective wavelength image exposure contributions at the same focus plane. The respective phase timings of the periodically modulated focus position compensate for longitudinal chromatic aberration of at least the variable focal length lens.
    Type: Application
    Filed: September 15, 2015
    Publication date: March 16, 2017
    Inventors: Robert Kamil Bryll, Mark Lawrence Delaney
  • Patent number: 9456120
    Abstract: A method improves focus height repeatability in a machine vision inspection system. A region of interest is defined within a field of view imaged by a camera portion, wherein an aligned edge feature in the region of interest may introduce a focus height sensitivity that varies depending on the aligned edge feature offset relative to the image pixels. A first set of focus-determining operations determines a focus height for the region of interest, and comprise at least one of: (a) operations that reduce the sensitivity of the focus height determination to the offset of the aligned edge feature relative to the image pixels; and (b) operations that adjust the offset of the aligned edge feature relative to the image pixels according to a predetermined offset repeatability criteria, such that the image data used in the focus height determination fulfills the offset repeatability criteria.
    Type: Grant
    Filed: July 11, 2013
    Date of Patent: September 27, 2016
    Assignee: Mitutoyo Corporation
    Inventor: Mark Lawrence Delaney
  • Patent number: 9350921
    Abstract: A method for controlling a structured illumination pattern generating portion is provided for illuminating a workpiece during an image acquisition by a camera in a precision machine vision inspection system. A controllable spatial light modulator (e.g., a digital light processing projector) is part of the generating portion for generating the structured illumination pattern. The pattern may comprise an array of stripes including a sinusoidal gray level intensity variation across each stripe. An overall image exposure is increased by repeating a complete structured illumination pattern generation iteration, including gray level variation, a plurality of times during an image integration period. Structured illumination microscopy techniques for determining a workpiece surface profile may benefit, wherein multiple (e.g., 3 or 4) images are acquired at respective focus positions to be analyzed, by using the method to project a different phase of a structured light pattern for each of the multiple images.
    Type: Grant
    Filed: June 6, 2013
    Date of Patent: May 24, 2016
    Assignee: Mitutoyo Corporation
    Inventors: Mark Lawrence Delaney, Paul Gerard Gladnick
  • Patent number: 9177222
    Abstract: A user interface for setting parameters for an edge location video tool is provided. In one implementation, the user interface includes a multi-dimensional parameter space representation with edge zones that allows a user to adjust a single parameter combination indicator in a zone in order to adjust multiple edge detection parameters for detecting a corresponding edge. The edge zones indicate the edge features that are detectable when the parameter combination indicator is placed within the edge zones. In another implementation, representations of multiple edge features that are detectable by different possible combinations of the edge detection parameters are automatically provided in one or more windows. When a user selects one of the edge feature representation, the corresponding combination of edge detection parameters is set as the parameters for the edge location video tool.
    Type: Grant
    Filed: December 18, 2012
    Date of Patent: November 3, 2015
    Assignee: Mitutoyo Corporation
    Inventors: Yuhua Ding, Robert Kamil Bryll, Mark Lawrence Delaney, Michael Nahum
  • Patent number: 9080855
    Abstract: A method utilizing image correlation to determine position measurements in a machine vision system. In a first operating state, the machine vision system utilizes traditional scale-based techniques to determine position measurements, while in a second operating state, image correlation displacement sensing techniques are utilized to determine position measurements. The image correlation techniques provide for higher accuracy for measuring distances between features that are separated by more than one field of view. The user may toggle between the operating states through a selection on the user interface, and guidance may be provided regarding when the image correlation mode is likely to provide higher accuracy, depending on factors such as the distance to be measured and the characteristics of the surface being measured.
    Type: Grant
    Filed: September 23, 2011
    Date of Patent: July 14, 2015
    Assignee: Mitutoyo Corporation
    Inventors: Michael Nahum, Mark Lawrence Delaney
  • Patent number: 8937654
    Abstract: A machine vision inspection system comprises an optical portion providing an image of a field of view of a workpiece which may be a magnified image. A first camera and a second camera provide first and second images of a shared or common field of view of the workpiece and are arranged such that the orientation of the common field of view imaged in the first camera is rotated relative to the orientation of the common field of view imaged in the second camera. Signal processing provides an edge measurement of an edge feature within the common field of view and determines which of the first and second images is used as a basis for the edge measurement based on whether their respective edge orientation (with respect to the pixel array of each camera) differs from the pixel array orientation of their associated camera by an orientation difference threshold amount.
    Type: Grant
    Filed: August 22, 2012
    Date of Patent: January 20, 2015
    Assignee: Mitutoyo Corporation
    Inventor: Mark Lawrence Delaney
  • Publication number: 20150015696
    Abstract: A method improves focus height repeatability in a machine vision inspection system. A region of interest is defined within a field of view imaged by a camera portion, wherein an aligned edge feature in the region of interest may introduce a focus height sensitivity that varies depending on the aligned edge feature offset relative to the image pixels. A first set of focus-determining operations determines a focus height for the region of interest, and comprise at least one of: (a) operations that reduce the sensitivity of the focus height determination to the offset of the aligned edge feature relative to the image pixels; and (b) operations that adjust the offset of the aligned edge feature relative to the image pixels according to a predetermined offset repeatability criteria, such that the image data used in the focus height determination fulfills the offset repeatability criteria.
    Type: Application
    Filed: July 11, 2013
    Publication date: January 15, 2015
    Inventor: Mark Lawrence Delaney
  • Publication number: 20140362203
    Abstract: A method for controlling a structured illumination pattern generating portion is provided for illuminating a workpiece during an image acquisition by a camera in a precision machine vision inspection system. A controllable spatial light modulator (e.g., a digital light processing projector) is part of the generating portion for generating the structured illumination pattern. The pattern may comprise an array of stripes including a sinusoidal gray level intensity variation across each stripe. An overall image exposure is increased by repeating a complete structured illumination pattern generation iteration, including gray level variation, a plurality of times during an image integration period. Structured illumination microscopy techniques for determining a workpiece surface profile may benefit, wherein multiple (e.g., 3 or 4) images are acquired at respective focus positions to be analyzed, by using the method to project a different phase of a structured light pattern for each of the multiple images.
    Type: Application
    Filed: June 6, 2013
    Publication date: December 11, 2014
    Applicant: Mitutoyo Corporation
    Inventors: Mark Lawrence Delaney, Paul Gerard Gladnick
  • Publication number: 20140126804
    Abstract: A user interface for setting parameters for an edge location video tool is provided. In one implementation, the user interface includes a multi-dimensional parameter space representation with edge zones that allows a user to adjust a single parameter combination indicator in a zone in order to adjust multiple edge detection parameters for detecting a corresponding edge. The edge zones indicate the edge features that are detectable when the parameter combination indicator is placed within the edge zones. In another implementation, representations of multiple edge features that are detectable by different possible combinations of the edge detection parameters are automatically provided in one or more windows. When a user selects one of the edge feature representation, the corresponding combination of edge detection parameters is set as the parameters for the edge location video tool.
    Type: Application
    Filed: December 18, 2012
    Publication date: May 8, 2014
    Applicant: MITUTOYO CORPORATION
    Inventors: Yuhua Ding, Robert Kamil Bryll, Mark Lawrence Delaney, Michael Nahum
  • Patent number: 8689127
    Abstract: A user interface for setting parameters for an edge location video tool is provided. The user interface includes a multi-dimensional parameter space representation that allows a user to adjust a single parameter combination indicator in order to adjust multiple edge detection parameters at once. One or more edge feature representation windows may be provided which indicate the edge features detectable by the current configuration of the edge detection parameters.
    Type: Grant
    Filed: November 5, 2012
    Date of Patent: April 1, 2014
    Assignee: Mitutoyo Corporation
    Inventors: Yuhua Ding, Mark Lawrence Delaney, Michael Nahum
  • Publication number: 20140055604
    Abstract: A machine vision inspection system comprises an optical portion providing an image of a field of view of a workpiece which may be a magnified image. A first camera and a second camera provide first and second images of a shared or common field of view of the workpiece and are arranged such that the orientation of the common field of view imaged in the first camera is rotated relative to the orientation of the common field of view imaged in the second camera. Signal processing provides an edge measurement of an edge feature within the common field of view and determines which of the first and second images is used as a basis for the edge measurement based on whether their respective edge orientation (with respect to the pixel array of each camera) differs from the pixel array orientation of their associated camera by an orientation difference threshold amount.
    Type: Application
    Filed: August 22, 2012
    Publication date: February 27, 2014
    Applicant: MITUTOYO CORPORATION
    Inventor: Mark Lawrence Delaney
  • Patent number: 8648906
    Abstract: A method is disclosed for operating a machine vision inspection system to determine a fluorescent imaging height for acquiring a fluorescent image for repeatably determining the location of a feature within the fluorescent material. The height of an exposed workpiece portion exposed outside of the fluorescent material is determined (e.g., using a height sensor or autofocus operations). The determined height is repeatable. The exposed portion has a characteristic height relative to the fluorescent material and/or features located therein. The fluorescent imaging height, which may be inside the fluorescent material, is determined relative to the determined height of the exposed portion. The fluorescent imaging height is determined such that it enhances the detection of the desired feature located within the fluorescent material in the resulting fluorescent image.
    Type: Grant
    Filed: October 13, 2010
    Date of Patent: February 11, 2014
    Assignee: Mitutoyo Corporation
    Inventor: Mark Lawrence Delaney
  • Publication number: 20130162806
    Abstract: A method for operating an edge focus tool to focus the optics of a machine vision inspection system proximate to an edge adjacent to a beveled surface feature is provided. The method comprises defining a region of interest (ROI) including the edge in a field of view of the machine vision inspection system; acquiring an image stack of the ROI over a Z range including the edge; generating a point cloud including a Z height for a plurality of points in the ROI, based on determining a best focus Z height measurement for the plurality of points; defining a proximate subset of the point cloud comprising points proximate to the beveled surface feature and corresponding to the shape of the beveled surface feature; defining a Z-extremum subset of the proximate subset of the point cloud; and focusing the optics at a Z height corresponding to the Z-extremum subset.
    Type: Application
    Filed: December 23, 2011
    Publication date: June 27, 2013
    Applicant: MITUTOYO CORPORATION
    Inventors: Yuhua Ding, Shannon Roy Campbell, Mark Lawrence Delaney, Robert Kamil Bryll