Patents by Inventor Mark Lawrence Delaney

Mark Lawrence Delaney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130076892
    Abstract: A method utilizing image correlation to determine position measurements in a machine vision system. In a first operating state, the machine vision system utilizes traditional scale-based techniques to determine position measurements, while in a second operating state, image correlation displacement sensing techniques are utilized to determine position measurements. The image correlation techniques provide for higher accuracy for measuring distances between features that are separated by more than one field of view. The user may toggle between the operating states through a selection on the user interface, and guidance may be provided regarding when the image correlation mode is likely to provide higher accuracy, depending on factors such as the distance to be measured and the characteristics of the surface being measured.
    Type: Application
    Filed: September 23, 2011
    Publication date: March 28, 2013
    Applicant: MITUTOYO CORPORATION
    Inventors: Michael Nahum, Mark Lawrence Delaney
  • Patent number: 8280172
    Abstract: A method for correcting coaxial light image edge location errors in a precision machine vision inspection system is disclosed. The method comprises comparing an edge position measurement of a workpiece edge feature using coaxial light and stage light. Edge position measurements using stage light have a lower uncertainty than that of coaxial light. Position correction factors may be determined from the difference between the two edge position measurements. The position correction factors may be stored for correcting subsequent edge position measurements that are based on images acquired using coaxial light. In some embodiments, position correction factors may be determined based on comparing edge position measurements for a plurality of edges.
    Type: Grant
    Filed: March 22, 2011
    Date of Patent: October 2, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Shannon Roy Campbell, Mark Lawrence Delaney
  • Publication number: 20120243790
    Abstract: A method for correcting coaxial light image edge location errors in a precision machine vision inspection system is disclosed. The method comprises comparing an edge position measurement of a workpiece edge feature using coaxial light and stage light. Edge position measurements using stage light have a lower uncertainty than that of coaxial light. Position correction factors may be determined from the difference between the two edge position measurements. The position correction factors may be stored for correcting subsequent edge position measurements that are based on images acquired using coaxial light. In some embodiments, position correction factors may be determined based on comparing edge position measurements for a plurality of edges.
    Type: Application
    Filed: March 22, 2011
    Publication date: September 27, 2012
    Applicant: MITUTOYO CORPORATION
    Inventors: Shannon Roy Campbell, Mark Lawrence Delaney
  • Patent number: 8269830
    Abstract: A robust video tool is provided for use in a machine vision inspection system. The robust video tool comprises a region of interest, a user interface, edge detection operations, and excluded region operations that determine a set of current-feature edge points which includes edge points detected in the region of interest and excludes edge points in an excluded region. The excluded region is determined by an excluded region generator, based on at least one previously characterized feature which is a feature characterized by using a video tool that detects the edge points of, and characterizes dimensional parameters of, the previously characterized feature. Importantly, the robust video tool features and operations are configured to allow learn mode programming on a workpiece that is either properly fabricated or improperly fabricated, and the resulting program will operate reliably on a run mode workpiece that is either properly fabricated or improperly fabricated.
    Type: Grant
    Filed: April 14, 2011
    Date of Patent: September 18, 2012
    Assignee: Mitutoyo Corporation
    Inventor: Mark Lawrence Delaney
  • Publication number: 20120092488
    Abstract: A method is disclosed for operating a machine vision inspection system to determine a fluorescent imaging height for acquiring a fluorescent image for repeatably determining the location of a feature within the fluorescent material. The height of an exposed workpiece portion exposed outside of the fluorescent material is determined (e.g., using a height sensor or autofocus operations). The determined height is repeatable. The exposed portion has a characteristic height relative to the fluorescent material and/or features located therein. The fluorescent imaging height, which may be inside the fluorescent material, is determined relative to the determined height of the exposed portion. The fluorescent imaging height is determined such that it enhances the detection of the desired feature located within the fluorescent material in the resulting fluorescent image.
    Type: Application
    Filed: October 13, 2010
    Publication date: April 19, 2012
    Applicant: MITUTOYO CORPORATION
    Inventor: Mark Lawrence Delaney