Abstract: The invention relates to a system comprising a probe and a measuring device, wherein the probe is connected to an input of the measuring device, and wherein an analog-digital converter is connected downstream of the input of the measuring device. The probe provides an analog-digital converter for the generation of a value-discrete and/or time-discrete signal from an analog input signal, wherein the value-discrete and/or time-discrete signal is supplied to the analog-digital converter of the measuring device. The invention further relates to a method for the registration of an analog signal by means of a system comprising a probe and a measuring device.

Abstract: A circuit for the compensation of an offset voltage in a measurement amplifier and/or of a DC-signal component contained in a measurement signal is provided. The circuit comprises a measurement-signal terminal for the measurement signal. The non-inverting input of the measurement amplifier serves for the feeding in of an AC-signal component of the measurement signal via a first capacitor. Additionally, the circuit contains a second amplifier for the addition of the DC-signal component in the measurement signal and of a signal corresponding to the negative offset voltage and to the negative DC-signal component, and a unit arranged at the input end or output end of the measurement amplifier for subtraction of an output signal of the second amplifier from the AC-signal component of the measurement signal.

Abstract: An adapter for a sensor measuring a differential signal comprises two electrically conductive test-contact elements which are arranged in each case eccentrically relative to an axis of rotation in order to register respectively one partial signal of the differential signal. Moreover, two adjustment components, each rotatable about one of the two axes of rotation, are provided in the adapter for the adjustment of a variable spacing distance between the two test-contact elements. The two adjustment components are connected to one another in a force-fit manner.

Abstract: An electronic test apparatus, such as an oscilloscope, comprising a logic analyzer frontend, wherein the logic analyzer frontend comprises a digital input port configured to receive a digital signal from a device under test. The logic analyzer frontend further comprises at least one analog-to-digital converter that is arranged downstream of the digital input port, and a digital comparator that is arranged downstream of the analog-to-digital converter. The digital comparator is configured to generate an adjusted digital signal and to provide the adjusted digital signal to further components of the electronic test apparatus. The logic analyzer frontend further comprises a digital correction unit configured to adjust a digital decision threshold value of the comparator.

Abstract: A circuit for the compensation of an offset voltage in a measurement amplifier and/or of a DC-signal component contained in a measurement signal is provided. The circuit comprises a measurement-signal terminal for the measurement signal. The non-inverting input of the measurement amplifier serves for the feeding in of an AC-signal component of the measurement signal via a first capacitor. Additionally, the circuit contains a second amplifier for the addition of the DC-signal component in the measurement signal and of a signal corresponding to the negative offset voltage and to the negative DC-signal component, and a unit arranged at the input end or output end of the measurement amplifier for subtraction of an output signal of the second amplifier from the AC-signal component of the measurement signal.

Abstract: A circuit for compensating an offset voltage in an amplifier or a DC component in a signal supplied to the amplifier comprises the amplifier and a first voltage source. The amplifier has at least one measurement signal port and at least two contacts for a supply voltage. Each of two contacts is connected to a different terminal of the first voltage source. The potential at each contact is separated from a ground potential and from an external supply potential.

Abstract: A probe system for registering a differential input signal has a first input network, which is supplied with a first component of the differential input signal in order to generate a first intermediate signal, and a second input network which is supplied with a second component of the differential input signal in order to generate a second intermediate signal. A differential amplifier for the amplification of the difference between the intermediate signals is arranged in the signal flow direction downstream of the input networks. At least one compensation network is used to compensate the influence of the input networks and is arranged at the output end of the differential amplifier or in a feedback path connecting an output to an input of the differential amplifier.

Abstract: An adapter for a sensor measuring a differential signal comprises two electrically conductive test-contact elements which are arranged in each case eccentrically relative to an axis of rotation in order to register respectively one partial signal of the differential signal. Moreover, two adjustment components, each rotatable about one of the two axes of rotation, are provided in the adapter for the adjustment of a variable spacing distance between the two test-contact elements. The two adjustment components are connected to one another in a force-fit manner.

Abstract: The invention relates to a system comprising a probe and a measuring device, wherein the probe is connected to an input of the measuring device, and wherein an analog-digital converter is connected downstream of the input of the measuring device. The probe provides an analog-digital converter for the generation of a value-discrete and/or time-discrete signal from an analog input signal, wherein the value-discrete and/or time-discrete signal is supplied to the analog-digital converter of the measuring device. The invention further relates to a method for the registration of an analog signal by means of a system comprising a probe and a measuring device.

Abstract: Disclosed is a probe for an oscilloscope comprising a multi-stage transistor amplifier that acts as an impedance transformer. Said amplifier is a d.c.-coupled emitter follower circuit that is composed of bipolar transistors or a d.c.-coupled source follower circuit which is composed of field effect transistors and the successive amplifier elements of which are dimensioned and tuned to each other in such a way that the resulting offset direct voltage between the input and the output is minimal.

Abstract: A differential probe provides a probe input which comprises two inputs for recording a first and second input signal. The differential probe further provides a first amplifier which is connected to the two inputs. The differential probe additionally provides a compensation device, which generates and superposes on the first and second input signal a differential offset signal. The compensation device also generates a common-mode offset signal which is independent of the differential offset signal.

Abstract: Disclosed is a probe (21) for an oscilloscope (24) comprising a multi-stage transistor amplifier (26) which is used as an impedance transformer and the output of which is connected to the oscilloscope (24). An electronic switching device (27) that can be remote-controlled by means of the oscilloscope (24) is assigned to the input (Vin) of the amplifier (26). Said electronic switching device (27) allows frame potential or a reference voltage to be alternatively connected to the amplifier input (Vin) instead of the measuring-circuit voltage of the measuring tip (22) such that the direct voltage offset is measured when the amplifier input (Vin) is connected to frame while the gain error in the oscilloscope (24) is measured when the reference voltage is applied, and said direct voltage offset or gain error is adequately taken into account when the measuring-circuit voltage in the oscilloscope is evaluated.

Abstract: A probe system for registering a differential input signal has a first input network, which is supplied with a first component of the differential input signal in order to generate a first intermediate signal, and a second input network which is supplied with a second component of the differential input signal in order to generate a second intermediate signal. A differential amplifier for the amplification of the difference between the intermediate signals (Ip, In) is arranged in the signal flow direction downstream of the input networks. At least one compensation network is used to compensate the influence of the input networks and is arranged at the output end of the differential amplifier or in a feedback path connecting an output to an input of the differential amplifier.

Abstract: A test-signal detection system provides a probe, a first transmission line and a measuring device. The probe is connected to the measuring device by the first transmission line. The first transmission line transmits broadband test signals to the measuring device. The test-signal detection system provides at least one further transmission line. The probe is additionally connected to the measuring device at least indirectly by the at least one further transmission line. The at least one further transmission line transmits DC-voltage test signals to the measuring device.

Abstract: In a system for measuring at least one high-frequency signal, comprising at least one broadband probe and at least one measuring apparatus, each broadband probe and each measuring apparatus comprise a high-frequency connection for transmitting a high-frequency signal, and each measuring apparatus, or instead of a measuring apparatus each signal processing unit, comprises power supply connections for supplying power to each of the broadband probes, and comprise data signal connections for transmitting communication data between the measuring apparatus or signal processing unit and the broadband probe head.

Abstract: In an oscilloscope probe with a transistor amplifier constructed on a semiconductor substrate using integrated circuit technology, at least one part of the input-voltage divider is also constructed together with the amplifier using integrated-circuit technology on the semiconductor substrate.

Abstract: A waveguide system comprises a differential waveguide with at least one first and one second signal conductor, which are coupled to one another within the waveguide, and a divider network with front network elements disposed at a front end of the waveguide in the signal-flow direction and with rear network elements disposed at a rear end of the waveguide in the signal-flow direction. The front network elements comprise a first parallel element, which extends in the direction from the first signal conductor to the earth conductor, and a second parallel element, which extends in the direction from the second signal conductor to the earth conductor. Alternatively, the parallel element can also be disposed between the signal conductors.

Abstract: In a system for measuring at least one high-frequency signal, comprising at least one broadband probe and at least one measuring apparatus, each broadband probe and each measuring apparatus comprise a high-frequency connection for transmitting a high-frequency signal, and each measuring apparatus, or instead of a measuring apparatus each signal processing unit, comprises power supply connections for supplying power to each of the broadband probes, and comprise data signal connections for transmitting communication data between the measuring apparatus or signal processing unit and the broadband probe head.

Abstract: The invention concerns a probe with at least two test prods, which are provided on a changing device connected to the probe and which can be alternately connected to an electric waveguide running inside the probe.

Abstract: The invention relates to a coaxial plug for connecting to a high-frequency transmission line. The housing of the coaxial plug has two slits arranged opposite each other, extending from the plug-side end in the axial direction, and both arranged and designed to form an axial abutment for receiving a BNC pin. A latching fork is arranged on the housing with two latching prongs tangentially overlapping an axial slit of the housing between the abutment and the plug-side end. Each BNC pin is held between a latching prong and an abutment of the axial slit, creating a locked connection between the coaxial plug and the BNC coaxial socket. The latching fork is pivotably arranged between a locking position in which the latching prongs tangentially overlap the axial slits, and a clearing position in which the latching prongs clear the axial slits over the entire length thereof.