Abstract: Disclosed is a probe (21) for an oscilloscope (24) comprising a multi-stage transistor amplifier (26) which is used as an impedance transformer and the output of which is connected to the oscilloscope (24). An electronic switching device (27) that can be remote-controlled by means of the oscilloscope (24) is assigned to the input (Vin) of the amplifier (26). Said electronic switching device (27) allows frame potential or a reference voltage to be alternatively connected to the amplifier input (Vin) instead of the measuring-circuit voltage of the measuring tip (22) such that the direct voltage offset is measured when the amplifier input (Vin) is connected to frame while the gain error in the oscilloscope (24) is measured when the reference voltage is applied, and said direct voltage offset or gain error is adequately taken into account when the measuring-circuit voltage in the oscilloscope is evaluated.

Abstract: A waveguide system comprises a differential waveguide with at least one first and one second signal conductor, which are coupled to one another within the waveguide, and a divider network with front network elements disposed at a front end of the waveguide in the signal-flow direction and with rear network elements disposed at a rear end of the waveguide in the signal-flow direction. The front network elements comprise a first parallel element, which extends in the direction from the first signal conductor to the earth conductor, and a second parallel element, which extends in the direction from the second signal conductor to the earth conductor. Alternatively, the parallel element can also be disposed between the signal conductors.

Abstract: A test-signal detection system provides a probe, a first transmission line and a measuring device. The probe is connected to the measuring device by the first transmission line. The first transmission line transmits broadband test signals to the measuring device. The test-signal detection system provides at least one further transmission line. The probe is additionally connected to the measuring device at least indirectly by the at least one further transmission line. The at least one further transmission line transmits DC-voltage test signals to the measuring device.

Abstract: In an oscilloscope probe with a transistor amplifier constructed on a semiconductor substrate using integrated circuit technology, at least one part of the input-voltage divider is also constructed together with the amplifier using integrated-circuit technology on the semiconductor substrate.

Abstract: Disclosed is a probe for an oscilloscope comprising a multi-stage transistor amplifier that acts as an impedance transformer. Said amplifier is a d.c.-coupled emitter follower circuit that is composed of bipolar transistors or a d.c.-coupled source follower circuit which is composed of field effect transistors and the successive amplifier elements of which are dimensioned and tuned to each other in such a way that the resulting offset direct voltage between the input and the output is minimal.

Abstract: The invention relates to a coaxial plug for connecting to a high-frequency transmission line. The housing of the coaxial plug has two slits arranged opposite each other, extending from the plug-side end in the axial direction, and both arranged and designed to form an axial abutment for receiving a BNC pin. A latching fork is arranged on the housing with two latching prongs tangentially overlapping an axial slit of the housing. between the abutment and the plug-side end Each BNC pin is held between a latching prong and an abutment of the axial slit, creating a locked connection between the coaxial plug and the BNC coaxial socket. The latching fork is pivotably arranged between a locking position in which the latching prongs tangentially overlap the axial slits, and a clearing position in which the latching prongs clear the axial slits over the entire length thereof.

Abstract: The invention concerns a probe with at least two test prods, which are provided on a changing device connected to the probe and which can be alternately connected to an electric waveguide running inside the probe.