Patents by Inventor Masaoki Yamagata

Masaoki Yamagata has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220412727
    Abstract: An illumination device has a light source unit, a lens unit, and a filter unit An imaging device receives object light, generated by the illumination light, from the measurement object at a predetermined observation solid angle, and pixels of the imaging device can each identify the different light wavelength ranges. A processing device includes an arithmetic unit configured to obtain a normal vector at each point of the measurement object corresponding to each pixel from inclusion relation between the plurality of solid angle regions, constituting the object light, and the predetermined observation solid angle, and a shape reconstruction unit configured to reconstruct the shape of the measurement object.
    Type: Application
    Filed: November 26, 2020
    Publication date: December 29, 2022
    Applicants: Machine Vision Lighting Inc., MITUTOYO CORPORATION
    Inventors: Shigeki MASUMURA, Yasuhiro TAKAHAMA, Jyota MIYAKURA, Masaoki YAMAGATA
  • Publication number: 20220290971
    Abstract: A coordinate measuring apparatus includes a measuring part that measures a workpiece, three or more access points that are provided at positions away from the measuring part and perform wireless communication with the measuring part using radio waves, a laser tracker that irradiates a reflection part provided in each access point with a laser beam and receives the laser beam reflected by the reflection part, and a control part that obtains a first coordinate of the each access point by the laser tracker receiving the laser beam reflected by the reflection part, obtains a second coordinate of the measuring part on the basis of the wireless communication between the access point and the measuring part, causes the measuring part to measure a third coordinate of the workpiece, and obtains a spatial coordinate of the workpiece on the basis of the first coordinate, the second coordinate, and the third coordinate.
    Type: Application
    Filed: March 4, 2022
    Publication date: September 15, 2022
    Applicant: MITUTOYO CORPORATION
    Inventors: Tsutomu ICHIMURA, Kazuhiko HIDAKA, Masaoki YAMAGATA
  • Patent number: 10895449
    Abstract: A shape measuring device includes a holding unit which holds a measuring target of which a shape is to be measured, a first measurement unit which measures relative coordinates of a plurality of measurement points on a first surface of the measurement target with respect to a defined point, a second measurement unit which operates independently from the first measurement unit and measures relative coordinates of a plurality of measurement points on a second surface of the measurement target, which is a reverse surface of the first surface, with respect to the defined point, and a calculation unit which calculates a shape of the measurement target on the basis of results measured by the first measurement unit and the second measurement unit.
    Type: Grant
    Filed: October 15, 2019
    Date of Patent: January 19, 2021
    Assignee: Mitutoyo Corporation
    Inventors: Kentaro Nemoto, Masaoki Yamagata, Ryohei Kanno, Hiroaki Kawata
  • Patent number: 10852128
    Abstract: A shape measuring apparatus includes a first light source, a second light source, an optical system, an image capturer, and a controller. The first light source emits visible light. The second light source emits measurement light used in a measurement. The optical system emits the visible light and the measurement light at the same position on a work piece. The image capturer captures an image of the measurement light reflected by the work piece. The controller is configured to cause the emission of the visible light onto the work piece with the first light source when determining a measurement position, and to control the emission of the measurement light onto the work piece with the second light source when making the measurement.
    Type: Grant
    Filed: February 19, 2014
    Date of Patent: December 1, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Masaoki Yamagata, Kentaro Nemoto, Eisuke Moriuchi, Tadashi Iwamoto
  • Patent number: 10684109
    Abstract: An indicator inspection machine inspects the accuracy of an indicator based on a value displayed by the indicator when a spindle changes position. The indicator inspection machine includes a measurement spindle provided so as to be freely raised and lowered in order to displace the spindle of the indicator; a contact point provided to a distalmost end of the measurement spindle, the contact point making contact with an indicator contact point provided to a distalmost end of the spindle of the indicator; a drive mechanism driving the measurement spindle; and a controller controlling the drive mechanism so as to bring the contact point into contact with the indicator contact point while changing a speed of the measurement spindle at a predetermined periodicity.
    Type: Grant
    Filed: June 14, 2018
    Date of Patent: June 16, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Masaoki Yamagata, Shiro Igasaki
  • Publication number: 20200132439
    Abstract: A shape measuring device includes a holding unit which holds a measuring target of which a shape is to be measured, a first measurement unit which measures relative coordinates of a plurality of measurement points on a first surface of the measurement target with respect to a defined point, a second measurement unit which operates independently from the first measurement unit and measures relative coordinates of a plurality of measurement points on a second surface of the measurement target, which is a reverse surface of the first surface, with respect to the defined point, and a calculation unit which calculates a shape of the measurement target on the basis of results measured by the first measurement unit and the second measurement unit.
    Type: Application
    Filed: October 15, 2019
    Publication date: April 30, 2020
    Applicant: Mitutoyo Corporation
    Inventors: Kentaro Nemoto, Masaoki Yamagata, Ryohei Kanno, Hiroaki Kawata
  • Patent number: 10480930
    Abstract: Provided is an optical displacement meter capable of enlarging an output signal region with respect to a region in which a light-receiving amount needs to be measured, a method for adjusting an optical displacement meter, and an optical displacement measuring method. The optical displacement meter includes a light-receiving element in which a maximum value of an output signal is set with respect to a boundary value, which is a maximum value of a region in which the light-receiving amount needs to be measured. The entire region of the output signal of the light-receiving element can be assigned to the valid region, in which the light-receiving amount needs to be measured with an optical displacement meter, and the optical displacement meter can have an enlarged output signal region with respect to the region in which the light-receiving amount needs to be measured.
    Type: Grant
    Filed: February 22, 2018
    Date of Patent: November 19, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Kentaro Tamura, Masaoki Yamagata
  • Publication number: 20180364019
    Abstract: An indicator inspection machine inspects the accuracy of an indicator based on a value displayed by the indicator when a spindle changes position. The indicator inspection machine includes a measurement spindle provided so as to be freely raised and lowered in order to displace the spindle of the indicator; a contact point provided to a distalmost end of the measurement spindle, the contact point making contact with an indicator contact point provided to a distalmost end of the spindle of the indicator; a drive mechanism driving the measurement spindle; and a controller controlling the drive mechanism so as to bring the contact point into contact with the indicator contact point while changing a speed of the measurement spindle at a predetermined periodicity.
    Type: Application
    Filed: June 14, 2018
    Publication date: December 20, 2018
    Applicant: MITUTOYO CORPORATION
    Inventors: Masaoki YAMAGATA, Shiro IGASAKI
  • Patent number: 10119848
    Abstract: A jig includes three columnar members, a stylus head receiving member, and a jig fixation portion. The second columnar member extends in a Z direction. The first columnar member extends in an X direction and is configured as a cantilever beam protruding in the X direction by having a first end of the first columnar member joined to a first end of the second columnar member. The third columnar member extends in the X direction and is configured as a cantilever beam protruding in the same direction as the first columnar member by having a first end of the third columnar member joined to a second end of the second columnar member. The stylus head receiving member is joined to the third columnar member such that a surface where a stylus head at a forefront end of a spindle of a gauge makes contact faces the first columnar member. The jig fixation portion is provided to the first columnar member so as to be attachable to a measurement spindle of the gauge inspection machine.
    Type: Grant
    Filed: October 20, 2016
    Date of Patent: November 6, 2018
    Assignee: MITUTOYO CORPORATION
    Inventors: Yuki Kurahashi, Masaoki Yamagata
  • Publication number: 20180259319
    Abstract: Provided is an optical displacement meter capable of enlarging an output signal region with respect to a region in which a light-receiving amount needs to be measured, a method for adjusting an optical displacement meter, and an optical displacement measuring method. The optical displacement meter includes a light-receiving element in which a maximum value of an output signal is set with respect to a boundary value, which is a maximum value of a region in which the light-receiving amount needs to be measured. The entire region of the output signal of the light-receiving element can be assigned to the valid region, in which the light-receiving amount needs to be measured with an optical displacement meter, and the optical displacement meter can have an enlarged output signal region with respect to the region in which the light-receiving amount needs to be measured.
    Type: Application
    Filed: February 22, 2018
    Publication date: September 13, 2018
    Inventors: Kentaro Tamura, Masaoki Yamagata
  • Patent number: 9989356
    Abstract: A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce laser light; a first optical member configured to linearly spread the laser light from the light source and generate the line laser; and a second optical member, provided between the light source and the first optical member, configured to adjust an area of irradiation with a line laser on the work; a first sensor configured to receive a line laser reflected by the work and capture an image of the work; a lens configured to form an image of a line laser reflected by the work on an imaging surface of the first sensor; and a control part configured to control adjustment of the area of irradiation with the line laser on the work by the second optical member.
    Type: Grant
    Filed: March 5, 2014
    Date of Patent: June 5, 2018
    Assignee: MITUTOYO CORPORATION
    Inventors: Masaoki Yamagata, Kentaro Nemoto, Eisuke Moriuchi, Tadashi Iwamoto
  • Publication number: 20170115141
    Abstract: A jig includes three columnar members, a stylus head receiving member, and a jig fixation portion. The second columnar member extends in a Z direction. The first columnar member extends in an X direction and is configured as a cantilever beam protruding in the X direction by having a first end of the first columnar member joined to a first end of the second columnar member. The third columnar member extends in the X direction and is configured as a cantilever beam protruding in the same direction as the first columnar member by having a first end of the third columnar member joined to a second end of the second columnar member. The stylus head receiving member is joined to the third columnar member such that a surface where a stylus head at a forefront end of a spindle of a gauge makes contact faces the first columnar member. The jig fixation portion is provided to the first columnar member so as to be attachable to a measurement spindle of the gauge inspection machine.
    Type: Application
    Filed: October 20, 2016
    Publication date: April 27, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Yuki KURAHASHI, Masaoki YAMAGATA
  • Patent number: 9500474
    Abstract: An illumination apparatus according to the present invention includes a light source, a reflecting mirror, an optical system, and a calculator. The reflecting mirror includes a first reflector and a second reflector, and is capable, while changing a reflection angle, of reflecting and directing at an object a first divided light, the first divided light being a portion of light from the light source emitted at the first reflector. The optical system divides the light from the light source into the first divided light and a second divided light, and guides the second divided light to the second reflector. The calculator is capable of calculating the reflection angle of the reflecting mirror by receiving the second divided light reflected by the second reflector.
    Type: Grant
    Filed: January 21, 2015
    Date of Patent: November 22, 2016
    Assignee: MITUTOYO CORPORATION
    Inventors: Masaoki Yamagata, Kentaro Nemoto, Toshihisa Takai, Tadashi Iwamoto
  • Patent number: 9354041
    Abstract: Coordinate measuring apparatus includes a probe having an optical system emitting light along a plane at a workpiece, an image capture apparatus having image capture elements arranged on an image capture plane and capturing an image of the workpiece from a position different from that of the predetermined plane, and a controller controlling the emitting optical system. The controller determines whether the image capture elements arranged in an image capture region on the image capture plane detect light incident on the workpiece due to the light from the emitting optical system, turns on the light emitted from the emitting optical system when the image capture elements arranged within the image capture region detect the incident light, and blinks the light emitted from the emitting optical system at a predetermined periodicity when the image capture elements arranged within the image capture region do not detect the incident light.
    Type: Grant
    Filed: September 11, 2014
    Date of Patent: May 31, 2016
    Assignee: MITUTOYO CORPORATION
    Inventor: Masaoki Yamagata
  • Patent number: 9255792
    Abstract: An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. The bottom surface forms a surface where, of the light reflected from the work piece, light following a direct reflection direction is reflected in a direction moving away from the incidence region, from a position where light emitted from the emitting region is emitted at the work piece. Accordingly, an amount of second order reflected light striking the incidence region can be suppressed and, therefore, an occurrence of an erroneous value in received light distribution can be suppressed.
    Type: Grant
    Filed: February 3, 2015
    Date of Patent: February 9, 2016
    Assignee: MITUTOYO CORPORATION
    Inventors: Kentaro Nemoto, Masaoki Yamagata, Eisuke Moriuchi, Tadashi Iwamoto
  • Publication number: 20150226544
    Abstract: An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. In addition, a light reflection prevention structure or a diffusion structure is provided to the bottom surface of the probe cover. Light reflected from the work piece is prevented from reflecting off the bottom surface by the reflection prevention structure, or the reflected light is diffused by the diffusion structure. Accordingly, an occurrence of an erroneous value in received light distribution due to second order reflected light can be inhibited.
    Type: Application
    Filed: February 3, 2015
    Publication date: August 13, 2015
    Applicant: MITUTOYO CORPORATION
    Inventors: Kentaro NEMOTO, Masaoki YAMAGATA, Eisuke MORIUCHI, Tadashi IWAMOTO
  • Publication number: 20150226543
    Abstract: An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. The bottom surface forms a surface where, of the light reflected from the work piece, light following a direct reflection direction is reflected in a direction moving away from the incidence region, from a position where light emitted from the emitting region is emitted at the work piece. Accordingly, an amount of second order reflected light striking the incidence region can be suppressed and, therefore, an occurrence of an erroneous value in received light distribution can be suppressed.
    Type: Application
    Filed: February 3, 2015
    Publication date: August 13, 2015
    Applicant: MITUTOYO CORPORATION
    Inventors: Kentaro NEMOTO, Masaoki YAMAGATA, Eisuke MORIUCHI, Tadashi IWAMOTO
  • Publication number: 20150211842
    Abstract: An illumination apparatus according to the present invention includes a light source, a reflecting mirror, an optical system, and a calculator. The reflecting mirror includes a first reflector and a second reflector, and is capable, while changing a reflection angle, of reflecting and directing at an object a first divided light, the first divided light being a portion of light from the light source emitted at the first reflector. The optical system divides the light from the light source into the first divided light and a second divided light, and guides the second divided light to the second reflector. The calculator is capable of calculating the reflection angle of the reflecting mirror by receiving the second divided light reflected by the second reflector.
    Type: Application
    Filed: January 21, 2015
    Publication date: July 30, 2015
    Applicant: MITUTOYO CORPORATION
    Inventors: Masaoki YAMAGATA, Kentaro NEMOTO, Toshihisa TAKAI, Tadashi IWAMOTO
  • Publication number: 20150077761
    Abstract: Coordinate measuring apparatus includes a probe having an optical system emitting light along a plane at a workpiece, an image capture apparatus having image capture elements arranged on an image capture plane and capturing an image of the workpiece from a position different from that of the predetermined plane, and a controller controlling the emitting optical system. The controller determines whether the image capture elements arranged in an image capture region on the image capture plane detect light incident on the workpiece due to the light from the emitting optical system, turns on the light emitted from the emitting optical system when the image capture elements arranged within the image capture region detect the incident light, and blinks the light emitted from the emitting optical system at a predetermined periodicity when the image capture elements arranged within the image capture region do not detect the incident light.
    Type: Application
    Filed: September 11, 2014
    Publication date: March 19, 2015
    Inventor: Masaoki YAMAGATA
  • Patent number: 8964281
    Abstract: An optical probe includes a laser light source that emits laser light, a collimator lens that converts the laser light into parallel light, a light shape changing section that converts the parallel light into linear laser light, an irradiating section to irradiate an object with a selected part of the linear laser light, an image pickup section that picks up an image of the object based on the laser light reflected from the object, and a controller that controls irradiation of the linear laser light. The linear laser light is composed of a plurality of parts including one end part and the other end part; and the irradiating section irradiates the object with the parts of the linear laser light sequentially from the one end part to the other end part.
    Type: Grant
    Filed: September 12, 2012
    Date of Patent: February 24, 2015
    Assignee: Mitutoyo Corporation
    Inventors: Masaoki Yamagata, Kentaro Nemoto