Patents by Inventor Matthew Mark Thomas

Matthew Mark Thomas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220343487
    Abstract: A method is provided for measuring and quantifying optical distortion of a transparent object using a single image. Embodiments provided herein include a method including: receiving an image of an object and a transparent object, where the object is visible through the transparent object, where a portion of the image of the object is visible through the transparent object is an inside region of interest (iROI), where a portion of the image of the object not viewed through the transparent object is an outside region of interest (oROI); determining measured pixel locations for a plurality of identified pixels in the image, the plurality of identified pixels corresponding to the distinct points in the image; calculating virtual locations in the image representing the distinct points within the iROI; determining, for respective distinct points within the iROI, differences between the virtual location and the measured pixel location.
    Type: Application
    Filed: February 23, 2022
    Publication date: October 27, 2022
    Inventors: Xue LIU, David J. SUNDQUIST, Matthew Mark THOMAS, Steven M. VOLZ, Hui Lin YANG
  • Patent number: 11119052
    Abstract: An inspection system for detecting optical defects in a transparency includes a first rounded array of first elongated light elements, and a second rounded array of second elongated light elements. The second rounded array is positionable radially outboard of the first rounded array. The inspection system further includes a light-element-moving system configured to radially translate at least the first elongated light elements. The inspection system also includes an image recording device positionable on a side of the transparency opposite the first and second rounded arrays and configured to record images of the transparency during radial translation of at least the first elongated light elements during backlighting of the transparency. The inspection system includes a processor configured to analyze the images recorded during radial translation of at least the first elongated light elements, and detect optical defects in the transparency based on analysis of the images.
    Type: Grant
    Filed: December 3, 2019
    Date of Patent: September 14, 2021
    Assignee: The Boeing Company
    Inventors: Xue Liu, Matthew Mark Thomas, Hui Lin Yang
  • Publication number: 20210164920
    Abstract: An inspection system for detecting optical defects in a transparency includes a first rounded array of first elongated light elements, and a second rounded array of second elongated light elements. The second rounded array is positionable radially outboard of the first rounded array. The inspection system further includes a light-element-moving system configured to radially translate at least the first elongated light elements. The inspection system also includes an image recording device positionable on a side of the transparency opposite the first and second rounded arrays and configured to record images of the transparency during radial translation of at least the first elongated light elements during backlighting of the transparency. The inspection system includes a processor configured to analyze the images recorded during radial translation of at least the first elongated light elements, and detect optical defects in the transparency based on analysis of the images.
    Type: Application
    Filed: December 3, 2019
    Publication date: June 3, 2021
    Inventors: Xue Liu, Matthew Mark Thomas, Hui Lin Yang
  • Publication number: 20210129971
    Abstract: A system includes a robotic arm of a robotic device, an imaging device coupled to the robotic arm, and a processor configured to control movement of the robotic arm to move the imaging device along a preprogrammed measurement path of a transparency while prompting the imaging device to record images of localized portions of the transparency. The processor is configured to determine one or more localized transparency characteristics based on an analysis of the images of the localized portions.
    Type: Application
    Filed: November 1, 2019
    Publication date: May 6, 2021
    Inventors: James W. Brown, JR., John Joseph Haake, Xue Liu, Anthony Carl Roberts, Nathaniel Philip Roman, Matthew Mark Thomas, Lucian Woods