Abstract: A semiconductor device formed on a substrate includes a first diode junction formation, a second diode junction formation, and at least one through-silicon-via (TSV), in which a cathode and an anode of the first diode are cross-connected to an anode and cathode of the second diode through the at least one TSV for achieving electrical robustness in through-silicon-via based integrated circuits, including photosensitive devices and circuits for signal processing applications.

Abstract: An amplifier system can include a feedback amplifier circuit having an amplifier, a feedback capacitor connected between an input terminal and an output terminal of the amplifier by at least one first switch, and a reset capacitor connected across the feedback capacitor by at least one second switch and between a pair of reference voltages by at least one third switch. During an input-signal processing phase of operation, a control circuit may close the at least one first switch and open the at least one second switch to electrically connect the feedback capacitor between the input and output terminals to engage feedback processing by the feedback amplifier circuit, and close the third switch to electrically connect the reset capacitor between the first and second voltages to charge the reset capacitor to a selectable voltage difference.

Abstract: The invention provides a systematic error correction network coupled to a converter. The converter may display a systematic non-linearity error, and the systematic error correction network shapes a correction transform function that acts like counter distortion function for the non-linearity error. The systematic error correction network then scales the correction transform function according to a reference variable, where the magnitude of non-linearity error is related to the reference variable. The scaled correction transform function is then applied to the converter path in order to generate a corrected analog output signal.

Abstract: A circuit system for performing correlated double sampling may include a signal sampling stage having an amplifier with a feedback capacitor and a pair of storage capacitors coupled to an output of the amplifier, and a differential analog to digital converter (ADC) having a pair of inputs coupled respectively to storage capacitors of the signal sampling stage. The signal sampling stage may receive reset and signal values from a sensor device and may store processed versions of those signals on respective storage capacitors. The differential ADC may generate a digital value representing a signal captured by the sensor device from a differential digitization operation performed on the processed versions of the reset and signal values. In this manner, the system may correct for any signal errors introduced by components of the sampling stage.

Abstract: A semiconductor device formed on a substrate includes a first diode junction formation, a second diode junction formation, and at least one through-silicon-via (TSV), in which a cathode and an anode of the first diode are cross-connected to an anode and cathode of the second diode through the at least one TSV for achieving electrical robustness in through-silicon-via based integrated circuits, including photosensitive devices and circuits for signal processing applications.

Abstract: A semiconductor device formed on a substrate includes a first diode junction formation, a second diode junction formation, and at least one through-silicon-via (TSV), in which a cathode and an anode of the first diode are cross-connected to an anode and cathode of the second diode through the at least one TSV for achieving electrical robustness in through-silicon-via based integrated circuits, including photosensitive devices and circuits for signal processing applications.

Abstract: A semiconductor device formed on a substrate includes a first diode junction formation, a second diode junction formation, and at least one through-silicon-via (TSV), in which a cathode and an anode of the first diode are cross-connected to an anode and cathode of the second diode through the at least one TSV for achieving electrical robustness in through-silicon-via based integrated circuits, including photosensitive devices and circuits for signal processing applications.

Abstract: An accurate, cost-efficient temperature sensor may be integrated into an integrated circuit (IC) using common materials as the IC's interconnect metallization. The temperature sensor may include an impedance element having a length of metal made of the interconnect metal, a current source connected between a first set of contacts at opposite ends of the impedance element, and an analog-to-digital converter connected between a second set of contacts at opposite ends of the impedance element. The temperature sensor may exploits the proportional relationship between the metal's resistance and temperature to measure ambient temperature. Alternatively, such a temperature sensor may be used on disposable chemical sensors where the impedance element is made of a common metal as conductors that connect a sensor reactant to sensor contacts. In either case, because the impedance element is formed of a common metal as other interconnect, it is expected to incur low manufacturing costs.

Abstract: An amplifier system can include a feedback amplifier circuit having an amplifier, a feedback capacitor connected between an input terminal and an output terminal of the amplifier by at least one first switch, and a reset capacitor connected across the feedback capacitor by at least one second switch and between a pair of reference voltages by at least one third switch. During an input-signal processing phase of operation, a control circuit may close the at least one first switch and open the at least one second switch to electrically connect the feedback capacitor between the input and output terminals to engage feedback processing by the feedback amplifier circuit, and close the third switch to electrically connect the reset capacitor between the first and second voltages to charge the reset capacitor to a selectable voltage difference.

Abstract: A system and method for reducing noise in resolver-to-digital converters (RDC) using a cascaded tracking loop filter. In some embodiments, one or more tracking loop filters may be implemented in a cascade to attenuate carrier harmonic frequencies in the digitized output of an RDC. Where a plurality of tracking loop filters are implemented, the output of one tracking loop filter may be input into a successive tracking loop filter.

Abstract: An integrated circuit may include a plurality of circuit sub-systems that include at least one converter circuit operating in respective critical phases and non-critical phases of operation, a clock distribution circuit that has an input for an externally-supplied clock signal that is active during the non-critical phases and inactive during the critical phases, and a clock generator to generate an internal clock signal to the converter circuit that is active when the external-supplied clock signal is inactive.

Abstract: The invention provides a systematic error correction network coupled to a converter. The converter may display a systematic non-linearity error, and the systematic error correction network shapes a correction transform function that acts like counter distortion function for the non-linearity error. The systematic error correction network then scales the correction transform function according to a reference variable, where the magnitude of non-linearity error is related to the reference variable. The scaled correction transform function is then applied to the converter path in order to generate a corrected analog output signal.

Abstract: A system and method for reducing noise in resolver-to-digital converters (RDC) using a cascaded tracking loop filter. In some embodiments, one or more tracking loop filters may be implemented in a cascade to attenuate carrier harmonic frequencies in the digitized output of an RDC. Where a plurality of tracking loop filters are implemented, the output of one tracking loop filter may be input into a successive tracking loop filter.

Abstract: An integrated circuit may include a plurality of circuit sub-systems that include at least one converter circuit operating in respective critical phases and non-critical phases of operation, a clock distribution circuit that has an input for an externally-supplied clock signal that is active during the non-critical phases and inactive during the critical phases, and a clock generator to generate an internal clock signal to the converter circuit that is active when the external-supplied clock signal is inactive.

Abstract: Disclosed embodiments are directed to an electrical overstress protection circuit. The electrical overstress protection circuit may include an intermediate node receiving a reference voltage, a first pair of clamp devices, having opposite polarity, clamping an input signal line to the intermediate node, and a second pair of clamp devices, each clamping the intermediate node to one of two reference potentials. The electrical overstress protection circuit may also include a filter connected to the intermediate node to reduce noise at the intermediate node.

Abstract: An open drain driver (7) selectively switches a MOSFET switch (MN1) which is passively held in the conducting state into the non-conducting state. The MOSFET switch (MN1) switches an AC analogue input signal on a main input terminal (3) to a main output terminal (4) and the gate of the MOSFET switch (MN1) is AC coupled by a capacitor (C1) to the drain thereof. The open drain driver (7) comprises a first MOSFET (MN2) and a second MOSFET (MN3) through which the gate of the MOSFET switch (MN1) is pulled to ground (Vss). The gate of the first MOSFET (MN2) is coupled to the supply voltage (VDD) for maintaining the first MOSFET (MN2) in the open state. A control signal is applied to the gate of the second MOSFET (MN3) for selectively operating the open drain driver (7) in the conducting state for operating the MOSFET switch (MN1) in the non-conducting state.

Abstract: An accurate, low noise conditionally resetting integrator circuit in an analog to digital system samples, with an analog to digital converter, the output of an integrating circuit a number of times during a measuring period; isolates the input for the integrating circuit during sample event; generates a reset signal in response to the integrating circuit output reaching a predetermined level; and resets the feedback capacitor of the integrating circuit by isolating it from the amplifier circuit of the integrating circuit and connecting it to a reference source during a sample event.

Abstract: A calibratable analog-to-digital converter system with a split analog-to-digital converter architecture including N Analog-to-Digital Converters (ADCs) each configured to convert the same analog input signal into a digital signal. Calibration logic is responsive to the digital signals output by the N ADCs and is configured to calibrate each of the ADCs based on the digital signals output by each ADC.

Abstract: An acquisition and averaging circuit is provided in which, during a sampling phase capacitors in sample blocks 4 and 6 are sequentially connected to the input signal to sample it and are then isolated so as to hold the sample. The capacitors are then connected to a combining/averaging arrangement such that an average of the sample values is formed.

Abstract: An asynchronous digital sample rate converter includes a random access memory for storing input data values and a read only memory for storing a reduced set of interpolation filter coefficients. Input data is written to the random access memory at the input sample rate. Output samples are provided from a multiply/accumulate engine which given a stream of input data and filter coefficients produces an output sample upon request at the output frequency. The initial address for reading input data from the random access memory, and the addresses for coefficients from the read only memory are provided by an auto-centering scheme which is a first order closed loop system with a digital integrator fed by an approximation of the input to output sample rate ratio. This auto-centering scheme may include a feed forward low pass filter to cancel steady state error, and an interpolated write address to reduce noise.