Patents by Inventor Mukul Kumar

Mukul Kumar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7437506
    Abstract: A method and system for virtual storage element placement within a storage area network is disclosed. According to one embodiment of the present invention, first data is received which specifies an access characteristic of a virtual storage element to be associated with a storage area network. Once received, the first data is used along with second data specifying a topology of a storage area network to select a virtualization device of the storage area network. According to another embodiment of the present invention, third data specifying a characteristic of one or more virtualization devices of the storage area network is additionally used to select the virtualization device. Thereafter, the virtual storage element to be associated with the storage area network is associated with the selected virtualization device.
    Type: Grant
    Filed: April 26, 2004
    Date of Patent: October 14, 2008
    Assignee: Symantec Operating Corporation
    Inventors: Mukul Kumar, Subhojit Roy
  • Patent number: 7386664
    Abstract: A method and system for mirror storage element resynchronization in a storage virtualization device is disclosed. According to one embodiment of the present invention, a read operation on a region of a data volume is received at a first module of a first storage virtualization device where the data volume is associated with at least a first mirror storage element and a second mirror storage element, a state indicated by a bit corresponding to the region of the data volume within a first synchronization map is determined in response to receiving the read operation, the read operation is processed using the first module if the bit is determined to indicate a first state and using a second module of the first storage virtualization device if the bit is determined to indicate a second state.
    Type: Grant
    Filed: October 13, 2004
    Date of Patent: June 10, 2008
    Assignee: Symantec Operation Corporation
    Inventors: Subhojit Roy, Prasad Limaye, Mukul Kumar, Niranjan S. Pendharkar, Arun M. Rokade, Shishir S. Asgaonkar, Ashish K. Saxena, Pooja Sarda, Prasad K. Dharap, Anand A. Kekre
  • Publication number: 20050228937
    Abstract: A system for communication using emulated LUN blocks in storage virtualization environments includes a first host and an off-host virtualizer. The off-host virtualizer may be configured to generate operating system metadata for a virtual storage device, and to make the operating system metadata accessible to the first host. A first layer of a storage software stack at the host may use the operating system metadata to detect the existence of the virtual storage device as an addressable storage device. The off-host virtualizer may also be configured to provide configuration information at a designated set of block addresses within the virtual storage device. A second layer of the storage software stack may be configured to read the configuration information from the designated set of blocks.
    Type: Application
    Filed: June 20, 2005
    Publication date: October 13, 2005
    Inventors: Ronald Karr, Mukul Kumar, Subhojit Roy
  • Patent number: 6397682
    Abstract: A method is disclosed for determining the resistance of polycrystalline materials to intergranular degradation or failure (IGDF), by analyzing the random grain boundary network connectivity (RGBNC) microstructure. Analysis of the disruption of the RGBNC microstructure may be assess the effectiveness of materials processing in increasing IGDF resistance.
    Type: Grant
    Filed: February 9, 2001
    Date of Patent: June 4, 2002
    Assignee: The United States of America as represented by the Department of Energy
    Inventors: Mukul Kumar, Adam J. Schwartz, Wayne E. King
  • Publication number: 20020002865
    Abstract: A method is disclosed for determining the resistance of polycrystalline materials to intergranular degradation or failure (IGDF), by analyzing the random grain boundary network connectivity (RGBNC) microstructure. Analysis of the disruption of the RGBNC microstructure may be assess the effectiveness of materials processing in increasing IGDF resistance. Comparison of the RGBNC microstructures of materials exposed to extreme operating conditions to unexposed materials may be used to diagnose and predict possible onset of material failure due to IGDF.
    Type: Application
    Filed: February 9, 2001
    Publication date: January 10, 2002
    Inventors: Mukul Kumar, Adam J. Schwartz, Wayne E. King