Abstract: A container includes: a storage member having a bottom-surface member and a side-surface member; and two protectors disposed at two corners adjacent to each other, the two corners belonging to four corners of a storage space. Each of the two protectors has a support portion detachably fitted in a corresponding one of two cuts, a first reception portion having a first reception surface facing an end surface of a housed object, and a second reception portion having a second reception surface facing an end surface of the housed object. The first and/or second reception portion is integral with the support portion. The second reception portion has, in at least a part adjacent to a bottom surface, an evacuation portion in which a distance between the second reception surface and a side surface of the side-surface member facing the second reception surface increases along with approach to the bottom surface.

Abstract: In a housing of a connector, there is formed an opening to be fitted with a protruding portion formed on a flat cable in a state in which a terminal section of the flat cable is electrically connected with contactors of a contact portion in an opening space.

Abstract: A container includes: a storage member having a bottom-surface member and a side-surface member; and two protectors disposed at two corners adjacent to each other, the two corners belonging to four corners of a storage space. Each of the two protectors has a support portion detachably fitted in a corresponding one of two cuts, a first reception portion having a first reception surface facing an end surface of a housed object, and a second reception portion having a second reception surface facing an end surface of the housed object. The first and/or second reception portion is integral with the support portion. The second reception portion has, in at least a part adjacent to a bottom surface, an evacuation portion in which a distance between the second reception surface and a side surface of the side-surface member facing the second reception surface increases along with approach to the bottom surface.

Abstract: A backlight apparatus 1 comprises a light guiding plate 2 having a front surface 21, a rear surface 22, and an end face 23; a light source portion 3 comprising a plate-shaped light source substrate 31 extending substantially parallel to the rear surface 22 of the light guiding plate 2 and having a front surface 31a and a rear surface 31b, and a light source 32 provided on the light source substrate 31 so as to face the end face 23 of the light guiding plate 2; a backlight chassis 4 arranged facing the rear surface 31b of the light source substrate 31 and having a front surface 41 and a rear surface 42; and a fixing member 5 to sandwich and fix the light guiding plate 2, the light source substrate 31, and the backlight chassis 4 in a thickness direction of the light guiding plate 2.

Abstract: Each pixel comprises: first and second sub-pixels; a buffer capacitance; first and second switching elements that connect the first and second sub-pixels to a source signal line; and a third switching element that connects the second sub-pixel to the buffer capacitance. The first and second switching elements operate according to a first gate control signal applied from a gate drive circuit. The third switching element operates according to a second gate control signal applied from the gate drive circuit. A power supply circuit generates a first power supply voltage and supplies same to the gate drive circuit during a first time period in which the first and second switching elements are turned ON, and thereafter, generates a second power supply voltage higher than the first power supply voltage, and supplies same to the gate drive circuit during a second time period in which the third switching element is turned ON.

Abstract: In performing a programmed-point inspection of a circuit pattern using a review SEM, stable inspection can be performed while suppressing the generation of a false report even when a variation in a circuit pattern to be inspected is large. SEM images that are obtained by sequentially imaging a predetermined circuit pattern using the review SEM are stored into a storage unit. Images that meet a set condition are selected from the stored SEM images, and averaged to create an average image (GP image). By performing pattern check by GP comparison using this GP image, an inspection can be performed while suppressing the generation of a false report even when a variation in the circuit patterns is large.

Abstract: Disclosed is a method of inspecting an object to be inspected in a semiconductor manufacturing process, for resolving the problem to increase defect detection sensitivity. An image capture means is used to image capture a designated area of the object to be inspected; a defect is detected in the captured image; a circuit pattern is recognized from the captured image; a characteristic value is computed, relating to an image tone and shape, from the detected defect; a characteristic value is computed, relating to the image tone and shape, from the recognized circuit pattern; either a specified defect or circuit pattern is filtered and extracted from the detected defect and the recognized circuit pattern; a mapping characteristic value is determined from the characteristic value of either the filtered and extracted specified defect or circuit pattern; and the distribution of the determined characteristic values is displayed onscreen in a map format.

Abstract: A method for generating vibration and measuring vibration properties of a structure, such as information equipment, micro-electrco/mechanical systems, and large-equipment, using a non-contact type laser excitation in a non-contact type vibration property measurement system.

Abstract: In order to provide a technique for performing global alignment (detecting position shift and rotation of a wafer) stably and automatically using an optical microscope, as a pattern for global alignment, multiple alignment pattern candidates are calculated (107), multiple data for matching are created for each alignment pattern (108), matching is performed with respect to the data for matching for each alignment pattern in descending order of appropriateness as an alignment pattern with an image (113) based on an image signal from the optical microscope (114), and the amount of position shift and the amount of rotation of the wafer are calculated (116) on the basis of the results of matching (115).

Abstract: A fat or oil composition containing the following ingredients (A) and (B): (A) 100 parts by weight of a fat or oil containing 15 wt. % or more of diacylglycerols having, in the constituent fatty acids thereof, an unsaturated fatty acid content of 80 wt. % or more, a conjugated linoleic acid content of from 2 to 92 wt. %, and an ?3 unsaturated fatty acid content of less than 15 wt. %; having a monoacylglycerol content of 5 wt. % or less and a free fatty acid content of 5 wt. % or less; and containing 1,3-diacylglycerol/1,2-diacylglycerol at a weight ratio of from 1 to 5; and (B) from 0.001 to 2 parts by weight of a tocopherol.

Abstract: A conventional pattern inspection, which compares an image to be inspected with a reference image and subjects the resulting difference value to the defect detection using the threshold of defect determination, has difficulty in highly-sensitive inspection. Because defects occur only in specific circuit pattern sections, false reports occur in the conventional pattern inspections which are not based on the position. Disclosed are a defect inspection method and a device thereof which perform a pattern inspection by acquiring a GP image in advance, designating a place to be inspected and a threshold map to the GP image on the GUI, setting the identification reference of the defects, next acquiring the image to be inspected, applying the identification reference to the image to be inspected, and identifying the defects with the identification reference, thereby enabling the highly-sensitive inspection.

Abstract: In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.

Abstract: In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.

Abstract: Provided are a preparation process of a purified green-tea extract capable of easily and efficiently removing a turbidity component contained in a green tea extract; a purified green-tea extract prepared by the preparation process; and a packaged beverage containing the purified green-tea extract. The preparation process of a purified green-tea extract containing, in the solid content thereof, from 36 to 99 mass % of non-polymer catechins comprises bringing a green tea extract into contact with a mixed solution containing an organic solvent and water at a mass ratio of from 65/35 to 97/3 and active carbon and/or acid clay or active clay, adjusting the organic solvent/water mass ratio of the resulting solution to from 0/100 to 85/15, and then separating the turbidity component thus separated.

Abstract: A non-tea-based, packaged beverage with a green tea extract mixed therein contains the following ingredients (A) and (B): (A) 0.06 to 0.5 wt. % of non-polymer catechins, and (B) 9 to 13.5 mM of citric acid or a salt thereof. Its pH is from 3.4 to 4.2. The non-tea-based, packaged beverage contains catechins at a high concentration, is reduced in bitterness and astringency, is suited for long-term drinking, and is excellent in the stability of bitterness and astringency and also in the feeling as it passes down the throat, and moreover, its color tone remains stable over a long term even when packed in a clear package and stored at high temperatures.

Abstract: Provided is a beer flavored beverage containing the non-polymer catechins at a high concentration but having bitterness and refreshing finish suitable for the beverage to have a beer taste and suppressed astringency. The beer flavored beverage containing the non-polymer catechins according to the present invention comprises the following components (A), (B), (C), and (D): (A) from 0.03 to 0.4 mass % of the non-polymer catechins; (B) a malt extract; (C) from 0.0005 to 0.06 mass % of potassium; and (D) from 0 to 2.8 mass % of an alcohol, in which: a mass ratio ((C)/(A)) between the component (A) and the component (C) ranges from 0.003 to 1.2; and a quantitative ratio between the component (A) and the component (D) satisfies a relationship represented by the following expression (1):0?(d)?3?6.5×(a) (1) (in the expression (1), (a) and (d) represent a mass fraction (mass %) of the component (A) and a mass fraction (mass %) of the component (D), respectively).

Abstract: In order to provide a technique for performing global alignment (detecting position shift and rotation of a wafer) stably and automatically using an optical microscope, as a pattern for global alignment, multiple alignment pattern candidates are calculated (107), multiple data for matching are created for each alignment pattern (108), matching is performed with respect to the data for matching for each alignment pattern in descending order of appropriateness as an alignment pattern with an image (113) based on an image signal from the optical microscope (114), and the amount of position shift and the amount of rotation of the wafer are calculated (116) on the basis of the results of matching (115).

Abstract: Provided is an examination technique to detect defects with high sensitivity at an outer-most repetitive portion of a memory mat of a semiconductor device and even in a peripheral circuit having no repetitiveness. A circuit pattern inspection apparatus comprises an image detection unit for acquiring an image of a circuit pattern composed of multiple die having a repetitive pattern, a defect judgment unit which composes, in respect of an acquired detected image, reference images by switching addition objectives depending on regions of repetitive pattern and the other regions and compares a composed reference image with the detected image to detect a defect, and a display unit for displaying the image of the detected defect.