Abstract: An ophthalmic lens design method includes: acquiring first information about a purpose of an ophthalmic lens; acquiring second information about at least one of a visual line of a wearer for the purpose, a place, a use tool, and a body of the wearer; acquiring data indicating a number of first regions, positions, shapes, and sizes of a plurality of first regions set on a surface of the ophthalmic lens, and distances to a target viewed through the first regions; setting a variable numerical value among numerical values indicating the number of first regions, the positions, the shapes, and the sizes of the plurality of first regions, and the distances in the data and setting the plurality of first regions and the distances on the surface; and setting a target aberration distribution based on the plurality of first regions and the distances that have been set.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner. The fluorescence passes through a dichroic mirror into a plane-parallel plate after light of unnecessary wavelength is removed by a filter. The plane-parallel plate is driven in synchronization with the galvano-scanner by a computer and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens. Then, the fluorescence forms an image of the irradiation point of the inspection surface of the sample on a pin hole of a pin hole plate by using a collective lens.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner. The fluorescence passes through a dichroic mirror into a plane-parallel plate after light of unnecessary wavelength is removed by a filter. The plane-parallel plate is driven in synchronization with the galvano-scanner by a computer and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens. Then, the fluorescence forms an image of the irradiation point of the inspection surface of the sample on a pin hole of a pin hole plate by using a collective lens.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner. The fluorescence passes through a dichroic mirror into a plane-parallel plate after light of unnecessary wavelength is removed by a filter. The plane-parallel plate is driven in synchronization with the galvano-scanner by a computer and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens. Then, the fluorescence forms an image of the irradiation point of the inspection surface of the sample on a pin hole of a pin hole plate by using a collective lens.

Abstract: A line of sight detection device calibration method, which calibrates a line of sight detection device that measures movement of an eyeball of a subject wearing eyeglasses and detects a transmission point at which a line of sight of the subject passes through a lens of the eyeglasses based on a result of measurement, includes: a measurement step of measuring the movement of the eyeball of the subject in a condition in which a first baseline is arranged at a predetermined position relative to the lens of the eyeglasses and the first baseline reflected in a corner cube substantially corresponds to a second baseline of the corner cube; and a calibration step of calibrating the line of sight detection device based on a result of measurement by the measurement step.

Abstract: A cell observation method includes a detection step of detecting radiation light that is radiated from an observation target when the observation target is irradiated with irradiation light; and a determination step of determining whether a cell included in the observation target is alive or dead based on the radiation light. Another cell observation method may include detecting radiation light that is radiated from an observation target when the observation target is irradiated with irradiation light; and detecting the number of live cells included in the observation target based on the radiation light. Another cell observation method may include acquiring a spectrum of irradiation light that irradiates an observation target when the observation target is irradiated with the irradiation light; and detecting a state of at least one of lipid and protein included in the observation target based on the spectrum.

Abstract: A line of sight detection device calibration method, which calibrates a line of sight detection device that measures movement of an eyeball of a subject wearing eyeglasses and detects a transmission point at which a line of sight of the subject passes through a lens of the eyeglasses based on a result of measurement, includes: a measurement step of measuring the movement of the eyeball of the subject in a condition in which a first baseline is arranged at a predetermined position relative to the lens of the eyeglasses and the first baseline reflected in a corner cube substantially corresponds to a second baseline of the corner cube; and a calibration step of calibrating the line of sight detection device based on a result of measurement by the measurement step.

Abstract: A confocal scanning microscope including: an objective system (second objective lens 23 and objective lens 24) illuminating a sample SA with illumination light; a scanning mechanism 31 scanning the sample SA to obtain an intensity signal; and a scanning optical system 32 provided between the scanning mechanism and the objective system. The scanning optical system composed of, in order from the scanning mechanism side, a first positive lens group G1, a second negative lens group G2, and a third positive lens group G3. The third lens group has two chromatic aberration correction portions each formed by a positive lens and a negative lens or negative lens and positive lens. Glass materials are selected such that one performs chromatization and the other performs achromatization, thereby providing a confocal scanning microscope capable of correcting lateral chromatic aberration generated in the objective system in the specific wavelength region by the scanning optical system.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner. The fluorescence passes through a dichroic mirror into a plane-parallel plate after light of unnecessary wavelength is removed by a filter. The plane-parallel plate is driven in synchronization with the galvano-scanner by a computer and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens. Then, the fluorescence forms an image of the irradiation point of the inspection surface of the sample on a pin hole of a pin hole plate by using a collective lens.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner. The fluorescence passes through a dichroic mirror into a plane-parallel plate after light of unnecessary wavelength is removed by a filter. The plane-parallel plate is driven in synchronization with the galvano-scanner by a computer and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens. Then, the fluorescence forms an image of the irradiation point of the inspection surface of the sample on a pin hole of a pin hole plate by using a collective lens.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner. The fluorescence passes through a dichroic mirror and comes into deflection system after light of unnecessary wavelength is removed by a filter. The deflection system is driven in synchronization with the galvano-scanner by a computer and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens. Then the fluorescence forms an image of the irradiation point of the inspection surface of the sample on a pin hole of a pin hole plate by using a collective lens.

Abstract: A confocal scanning microscope including: an objective system (second objective lens 23 and objective lens 24) illuminating a sample SA with illumination light; a scanning mechanism 31 scanning the sample SA to obtain an intensity signal; and a scanning optical system 32 provided between the scanning mechanism and the objective system. The scanning optical system composed of, in order from the scanning mechanism side, a first positive lens group G1, a second negative lens group G2, and a third positive lens group G3. The third lens group has two chromatic aberration correction portions each formed by a positive lens and a negative lens or negative lens and positive lens. Glass materials are selected such that one performs chromatization and the other performs achromatization, thereby providing a confocal scanning microscope capable of correcting lateral chromatic aberration generated in the objective system in the specific wavelength region by the scanning optical system.

Abstract: A confocal scanning microscope including: an objective system (second objective lens 23 and objective lens 24) illuminating a sample SA with illumination light; a scanning mechanism 31 scanning the sample SA to obtain an intensity signal; and a scanning optical system 32 provided between the scanning mechanism and the objective system. The scanning optical system composed of, in order from the scanning mechanism side, a first positive lens group G1, a second negative lens group G2, and a third positive lens group G3. The third lens group has two chromatic aberration correction portions each formed by a positive lens and a negative lens or negative lens and positive lens. Glass materials are selected such that one performs chromatization and the other performs achromatization, thereby providing a confocal scanning microscope capable of correcting lateral chromatic aberration generated in the objective system in the specific wavelength region by the scanning optical system.

Abstract: The present application has a proposition to provide a highly efficient laser excitation fluorescent microscope. Accordingly, a laser excitation fluorescent microscope of the present application includes a laser light source part radiating at least two types of excitation lights having different wavelengths; a light collecting part collecting the two types of excitation lights on a sample; a high-functional dichroic mirror, disposed between the laser light source part and the light collecting part, reflecting the two types of excitation lights to make the excitation lights incident on the light collecting part, and transmitting two types of fluorescence generated at the sample; and a detecting part detecting light transmitted through the high-functional dichroic mirror, in which an incident angle ? of the excitation lights and the fluorescence to the high-functional dichroic mirror satisfies a formula of 0°<?<45°.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens 86, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner. The fluorescence passes through a dichroic mirror and comes into deflection means as 2-dimensional deflection means after light of unnecessary wavelength is removed by a filter. The deflection means is driven in synchronization with the galvano-scanner by a computer and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample and the fluorescence is collected by an objective lens. Here, because of the magnification chromatic aberration of the objective lens, the fluorescence going out from the objective lens travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner. The fluorescence passes through a dichroic mirror into a deflection system after light of unnecessary wavelength is removed by a filter. The deflection system is driven in synchronization with the galvano-scanner by a computer and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens. Then, the fluorescence forms an image of the irradiation point of the inspection surface of the sample on a pin hole of a pin hole plate by using a collective lens.

Abstract: The present application has a proposition to provide a highly efficient laser excitation fluorescent microscope. Accordingly, a laser excitation fluorescent microscope of the present application includes a laser light source part radiating at least two types of excitation lights having different wavelengths; a light collecting part collecting the two types of excitation lights on a sample; a high-functional dichroic mirror, disposed between the laser light source part and the light collecting part, reflecting the two types of excitation lights to make the excitation lights incident on the light collecting part, and transmitting two types of fluorescence generated at the sample; and a detecting part detecting light transmitted through the high-functional dichroic mirror, in which an incident angle ? of the excitation lights and the fluorescence to the high-functional dichroic mirror satisfies a formula of 0°<?<45°.

Abstract: A confocal scanning microscope including: an objective system (second objective lens 23 and objective lens 24) illuminating a sample SA with illumination light; a scanning mechanism 31 scanning the sample SA to obtain an intensity signal; and a scanning optical system 32 provided between the scanning mechanism and the objective system. The scanning optical system composed of, in order from the scanning mechanism side, a first positive lens group G1, a second negative lens group G2, and a third positive lens group G3. The third lens group has two chromatic aberration correction portions each formed by a positive lens and a negative lens or negative lens and positive lens. Glass materials are selected such that one performs chromatization and the other performs achromatization, thereby providing a confocal scanning microscope capable of correcting lateral chromatic aberration generated in the objective system in the specific wavelength region by the scanning optical system.

Abstract: Fluorescence is generated from an irradiated point on an inspection surface of a sample (7) and the fluorescence is collected by an objective lens (6). Here, because of the magnification chromatic aberration of the objective lens 86, the fluorescence going out from the objective lens (6) travels along a path shifted from the irradiation light and changed substantially into a non-scan light by a galvano-scanner (5). The fluorescence passes through a dichroic mirror (4) and comes into deflection means (9) as 2-dimensional deflection means after light of unnecessary wavelength is removed by a filter (8). The deflection means (9) is driven in synchronization with the galvano-scanner (5) by a computer (10) and corrects the shift and inclination of the optical axis generated by the magnification chromatic aberration of the objective lens (6).

Abstract: A multibeam type scanning microscope that has N beams, wherein the system is devised so that the respective beams perform scanning in LM stages in the Y direction at maximum magnification where the discrete scanning direction is the Y direction, thus performing scanning in an area of N×LM stages overall, and scanning is controlled so that the following processes (1) and (2) are successively repeated LK times at a magnification that is 1/LK times the maximum magnification. Here, L, M and N are integers of 2 or greater, and K is a natural number. (1) The respective beams perform scanning in the Y direction at a sampling interval that is LK times that at the maximum magnification. (2) When scanning of LM-K stages is completed in the Y direction, and the repetition is less than the LKth time, the scanning skips ((N?1)×LM-K+1) stages.