Patents by Inventor Naoshi Aikawa

Naoshi Aikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7286225
    Abstract: A spectroscope includes an optical fiber 218, a collimator optical system 231 for collimating signal light come out from the optical fiber 218, a spectroscopic element 233 for dispersing the signal light collimated by the collimator optical system 231, a detector 237 composed of a plurality of detector elements 237a disposed at least in a direction of dispersion and detecting the light dispersed by the spectroscopic element 233, and a focusing optical system 236 for focusing the signal light come out from the detector 237 onto a detecting surface of the detector 237. It is set such that the focusing optical system 236 makes a diameter of a spot of the signal light focused on the detecting surface of the detector 237 smaller than an arranged pitch of the detector 237 and a numerical aperture of the collimator optical system 231 is larger than that of the optical fiber 218.
    Type: Grant
    Filed: November 30, 2005
    Date of Patent: October 23, 2007
    Assignee: Nikon Corporation
    Inventor: Naoshi Aikawa
  • Patent number: 7271953
    Abstract: A confocal microscope includes a light source that emits illuminating light beam, an illuminating optical system that irradiates the illuminating light beam onto a specimen, a condensing optical system that condenses the light reflected off the specimen and a light detection unit. The light detection unit includes a mask member, a movable shutter and a light detector. The mask member includes a plurality of reflecting/transmitting surfaces each constituting a light separating surface, and only the central portion of the light flux entering the mask member from the condensing optical system exits through a pinhole. The movable shutter opens or closes off a plurality of pinholes individually, and the light detector detects the light flux having passed through the pinholes.
    Type: Grant
    Filed: March 17, 2005
    Date of Patent: September 18, 2007
    Assignee: Nikon Corporation
    Inventors: Hisashi Okugawa, Naoshi Aikawa
  • Patent number: 7256890
    Abstract: A spectroscope capable of suppressing the dimension and the cost with avoiding a problem caused by polarization dependency of the diffraction grating. The spectroscope includes a polarizing beam splitter plate 3 that divides the light from an input fiber 1 into a first and a second optical paths and polarizes each light of each optical path having different direction of polarization with each other, a Fresnel rhomb half wave plate 5 that arranges the direction of polarization of the light in the first optical path into that in the second optical path and a plane mirror 4 that deflects the second optical path such that at least a portion of an area where the light through the first optical path is incident on the diffraction grating 6 and an area where the light through the second optical path is incident on the diffraction grating overlap each other.
    Type: Grant
    Filed: November 18, 2005
    Date of Patent: August 14, 2007
    Assignee: Nikon Corporation
    Inventors: Hisao Osawa, Naoshi Aikawa, Akira Adachi
  • Publication number: 20070127003
    Abstract: A multibeam type scanning microscope that has N beams, wherein the system is devised so that the respective beams perform scanning in LM stages in the Y direction at maximum magnification where the discrete scanning direction is the Y direction, thus performing scanning in an area of N×LM stages overall, and scanning is controlled so that the following processes (1) and (2) are successively repeated LK times at a magnification that is 1/LK times the maximum magnification. Here, L, M and N are integers of 2 or greater, and K is a natural number. (1) The respective beams perform scanning in the Y direction at a sampling interval that is LK times that at the maximum magnification. (2) When scanning of LM-K stages is completed in the Y direction, and the repetition is less than the LKth time, the scanning skips ((N?1)×LM-K+1) stages.
    Type: Application
    Filed: December 4, 2006
    Publication date: June 7, 2007
    Applicant: NIKON CORPORATION
    Inventor: Naoshi Aikawa
  • Publication number: 20060114458
    Abstract: A spectroscope capable of suppressing the dimension and the cost with avoiding a problem caused by polarization dependency of the diffraction grating. The spectroscope includes a polarizing beam splitter plate 3 that divides the light from an input fiber 1 into a first and a second optical paths and polarizes each light of each optical path having different direction of polarization with each other, a Fresnel rhomb half wave plate 5 that arranges the direction of polarization of the light in the first optical path into that in the second optical path and a plane mirror 4 that deflects the second optical path such that at least a portion of an area where the light through the first optical path is incident on the diffraction grating 6 and an area where the light through the second optical path is incident on the diffraction grating overlap each other.
    Type: Application
    Filed: November 18, 2005
    Publication date: June 1, 2006
    Inventors: Hisao Osawa, Naoshi Aikawa, Akira Adachi
  • Publication number: 20060114459
    Abstract: A spectroscope includes an optical fiber 218, a collimator optical system 231 for collimating signal light come out from the optical fiber 218, a spectroscopic element 233 for dispersing the signal light collimated by the collimator optical system 231, a detector 237 composed of a plurality of detector elements 237a disposed at least in a direction of dispersion and detecting the light dispersed by the spectroscopic element 233, and a focusing optical system 236 for focusing the signal light come out from the detector 237 onto a detecting surface of the detector 237. It is set such that the focusing optical system 236 makes a diameter of a spot of the signal light focused on the detecting surface of the detector 237 smaller than an arranged pitch of the detector 237 and a numerical aperture of the collimator optical system 231 is larger than that of the optical fiber 218.
    Type: Application
    Filed: November 30, 2005
    Publication date: June 1, 2006
    Inventor: Naoshi Aikawa
  • Publication number: 20050213206
    Abstract: A confocal microscope includes a light source that emits illuminating light beam, an illuminating optical system that irradiates the illuminating light beam onto a specimen, a condensing optical system that condenses the light reflected off the specimen and a light detection unit. The light detection unit includes a mask member, a movable shutter and a light detector. The mask member includes a plurality of reflecting/transmitting surfaces each constituting a light separating surface, and only the central portion of the light flux entering the mask member from the condensing optical system exits through a pinhole. The movable shutter opens or closes off a plurality of pinholes individually, and the light detector detects the light flux having passed through the pinholes.
    Type: Application
    Filed: March 17, 2005
    Publication date: September 29, 2005
    Inventors: Hisashi Okugawa, Naoshi Aikawa