Patents by Inventor Nayak Ratnakar Aravind

Nayak Ratnakar Aravind has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7952824
    Abstract: Various embodiments of the present invention provide systems and methods for storage medium flaw detection. For example, some embodiments provide flaw detection systems that include an input circuit, a data processing circuit and a defect detection circuit. The input circuit is operable to receive an input signal and to provide a filtered output. The data processing circuit is operable to receive the filtered output and to compute a difference between the filtered output and an expected output, and the defect detection circuit receives the difference between the filtered output and the expected output and compares a derivative of the difference with a threshold value, and asserts a defect signal when a magnitude of the derivative of the difference exceeds a threshold value.
    Type: Grant
    Filed: March 6, 2009
    Date of Patent: May 31, 2011
    Assignee: Agere Systems Inc.
    Inventors: Scott M. Dziak, Nayak Ratnakar Aravind
  • Publication number: 20110063746
    Abstract: Various embodiments of the present invention provide systems, methods and media formats for efficiently determining a position error of a head in relation to a storage medium. In one case, a system is disclosed that includes a storage medium with a series of data. The series of data includes a first defined marker and a second defined marker located a distance from the first defined marker, and position location data. The systems further include a first detector circuit that is operable to detect the first defined marker and to establish a location of the first defined marker, and a second detector circuit that is operable to detect the second defined marker and to establish a location of the second defined marker. The systems further include an error calculation circuit and an interpolation circuit. The error calculation circuit is operable to calculate an interpolation offset based at least in part on the location of the first defined marker and the location of the second defined marker.
    Type: Application
    Filed: September 29, 2008
    Publication date: March 17, 2011
    Inventor: Nayak Ratnakar Aravind
  • Publication number: 20110018748
    Abstract: Various embodiments of the present invention provide systems and methods for data processing. For example, a data processing circuit is disclosed that includes an analog to digital converter, a digital interpolation circuit, a phase error circuit, and a phase adjustment control circuit. The analog to digital converter samples an analog data input at a sampling phase governed at least in part by a coarse control, and provides a series of digital samples. The digital interpolation circuit interpolates between a subset of the series of digital samples based at least in part on a fine control. The phase error circuit calculates a phase error value. The phase adjustment control circuit is operable to determine the coarse control and the fine control based at least in part on the phase error value.
    Type: Application
    Filed: July 27, 2009
    Publication date: January 27, 2011
    Inventors: Nayak Ratnakar Aravind, James A. Bailey, Robert H. Leonowich
  • Publication number: 20110002211
    Abstract: Various embodiments of the present invention provide systems, methods and media formats for processing user data derived from a storage medium. As an example, a system is described that includes a storage medium with a series of data. The series of data includes a servo data and a user data region. The user data region includes a first synchronization pattern and a second synchronization pattern located a distance from the first synchronization pattern. A storage buffer is provided that is operable to receive at least a portion of the series of data. A retiming circuit calculates an initial phase offset and frequency offset for a defined bit within the storage buffer using a first location of the first synchronization pattern and a second location of the second synchronization pattern. An error correction loop circuit re-samples the series of data from the storage buffer based at least in part on the initial phase offset and a frequency offset.
    Type: Application
    Filed: July 2, 2009
    Publication date: January 6, 2011
    Inventor: Nayak Ratnakar Aravind
  • Publication number: 20100329096
    Abstract: Various embodiments of the present invention provide systems and methods for data processing. As an example, a data processing circuit is discussed that includes a summation circuit, a data detector circuit, an error feedback circuit, and an error calculation circuit. The summation circuit subtracts a low frequency offset feedback from an input signal to yield a processing output. The data detector circuit applies a data detection algorithm to a derivative of the processing output and provides an ideal output. The error feedback circuit includes a conditional subtraction circuit that conditionally subtracts an interim low frequency offset correction signal from a delayed version of the derivative of the processing output to yield an interim factor. The error calculation circuit generates an interim low frequency offset correction signal based at least in part on the interim factor and a derivative of the ideal output.
    Type: Application
    Filed: June 24, 2009
    Publication date: December 30, 2010
    Inventor: Nayak Ratnakar Aravind
  • Publication number: 20100226031
    Abstract: Various embodiments of the present invention provide systems and methods for storage medium flaw detection. For example, some embodiments provide flaw detection systems that include an input circuit, a data processing circuit and a defect detection circuit. The input circuit is operable to receive an input signal and to provide a filtered output. The data processing circuit is operable to receive the filtered output and to compute a difference between the filtered output and an expected output, and the defect detection circuit receives the difference between the filtered output and the expected output and compares a derivative of the difference with a threshold value, and asserts a defect signal when a magnitude of the derivative of the difference exceeds a threshold value.
    Type: Application
    Filed: March 6, 2009
    Publication date: September 9, 2010
    Inventors: Scott M. Dziak, Nayak Ratnakar Aravind
  • Publication number: 20100208574
    Abstract: Various embodiments of the present invention provide systems and methods for reduced latency feedback in a data processing system. For example, some embodiments provide a data processing system that includes a variable gain amplifier, a processing circuit, a data detector, and an error signal calculation circuit. The variable gain amplifier amplifies a data input signal and provides an amplified signal. The processing circuit generates a signal output corresponding to the amplified signal, and includes a conditional multiplication circuit. The conditional multiplication circuit conditionally multiplies the signal output by a gain correction signal and provides the result as an interim output. The data detector applies a data detection algorithm to the signal output and provides an ideal output. The error signal calculation circuit generates a gain correction signal based at least in part on the interim output and a derivative of the ideal output.
    Type: Application
    Filed: February 16, 2009
    Publication date: August 19, 2010
    Inventors: Nayak Ratnakar Aravind, Richard Rauschmayer
  • Publication number: 20100074078
    Abstract: Various embodiments of the present invention provide systems and methods for media defect detection. For example, a media defect detection systems is disclosed that includes a data input derived from a medium, a fast envelope calculation circuit that receives the data input and provides a fast decay envelope value based on the data input, a slow envelope calculation circuit that receives the data input and provides a slow decay envelope value based on the data input, and a media defect detection circuit. The media defect detection circuit receives the slow decay envelope value and the fast decay envelope value, calculates a ratio value of the fast decay envelope value to the slow decay envelope value, and asserts a defect output based at least in part on the comparison of the ratio value to a defect threshold value.
    Type: Application
    Filed: September 23, 2008
    Publication date: March 25, 2010
    Inventors: Yang Cao, Scott M. Dziak, Nayak Ratnakar Aravind, Richard Rauschmayer, Weijun Tan