Patents by Inventor Nobuo Kochi

Nobuo Kochi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090175498
    Abstract: To realize high speed and high precision with device and method of three-dimensional measurement by applying estimating process to points corresponding to feature points in a plurality of motion frame images. With the device and method of calculating location information through processes of choosing a stereo pair, relative orientation, and bundle adjustment and using corresponding points of feature points extracted from respective motion frame images, each process is made up of two stages. To the first process section (stages:5A and 6A), robust estimation is applied to determine estimated values of calculation parameters. In the second process section (stages:5B and 6B), corresponding points and stereo pair of large residual errors are excluded, and estimating calculation is carried out again to make measurements in three dimensions.
    Type: Application
    Filed: July 2, 2008
    Publication date: July 9, 2009
    Inventors: Nobuo KOCHI, Tetsuji ANAI, Hitoshi OTANI
  • Publication number: 20090175497
    Abstract: With apparatus and method for measuring in three dimensions by applying an estimating process to points corresponding to feature points in a plurality of motion image frames, high speed and high accuracy are realized. The apparatus comprises: a first track determining section (4B) that determines corresponding points of feature points extracted from frames of motion images and estimates by robust estimation a coordinate transformation projection parameters between frames using part of the determined corresponding points, a second track determining section (4C) that utilizes the estimated value to determine coordinate values of estimated location of each corresponding point, to determine residuals of the coordinate values relative to the estimated values for each corresponding point, to apply threshold process, and to exclude points of large residuals as incorrect corresponding points.
    Type: Application
    Filed: July 2, 2008
    Publication date: July 9, 2009
    Inventors: Tetsuji ANAI, Nobuo KOCHI, Hitoshi OTANI
  • Publication number: 20090161946
    Abstract: An image processing apparatus comprises an inputting section for inputting a plurality of continuous images which were photographed by a photographing section progressively moving relative to a photographed object; an extracting section for extracting characteristic points from images input by the inputting section; a tracking section for tracking the points corresponding to the characteristic points in the plurality of continuous images; an embedding section for embedding tracking data, which includes data of extracted and tracked points by the extracting section and the tracking section, into each image; and an outputting section for outputting the plurality of continuous images sequentially in which the tracking data was embedded by the embedding section.
    Type: Application
    Filed: December 19, 2008
    Publication date: June 25, 2009
    Applicant: KABUSHIKI KAISHA TOPCON
    Inventors: Hirokazu Sato, Nobuyuki Fukaya, Mitsuharu Yamada, Tetsuji Anai, Nobuo Kochi
  • Publication number: 20090148037
    Abstract: To provide a color-coded target having a color code of colors chosen not to cause code reading errors and technique for automatically detecting and processing the targets. The color-coded target CT1 of this invention includes, on its surface: a position detecting pattern P1 indicating a position to be measured; a reference color pattern P2 having a plurality of unit areas tinted in different colors for use as color references; and a color code pattern P3 having a plurality of unit areas tinted in different colors for discriminating the targets. The colors of the color code pattern P3 are chosen so that adjacent colors in the HSI color space are different in at least one of hue, saturation, and intensity by a specified value or greater.
    Type: Application
    Filed: December 4, 2008
    Publication date: June 11, 2009
    Inventors: Takuya MORIYAMA, Nobuo KOCHI
  • Patent number: 7539340
    Abstract: A three-dimensional coordinate measuring apparatus has a first and second incident angle adjusting sections for adjusting the attitude of the object in the directions of first and second neutral axes, respectively, to adjust the incident angle of the beam projected on the object from an imaging optical system relative to the object so that first and second stereoscopic images of the object can be formed, a matching process section for searching for corresponding points corresponding to measurement points in first and second search directions generally perpendicular to the first and second neutral axes, respectively, in the first and second stereoscopic images, and a shape measuring section for obtaining three-dimensional coordinate data of the object based on the relation between the measurement points and the corresponding points in the first and second stereoscopic images.
    Type: Grant
    Filed: April 23, 2004
    Date of Patent: May 26, 2009
    Assignee: Topcon Corporation
    Inventors: Nobuo Kochi, Yasuko Tsuruga
  • Patent number: 7489335
    Abstract: A photographic apparatus with an image correction function is provided, in which even if an image has a large distortion at its peripheral area, the lens distortion is suitably corrected and the image distortion is small in spite of an image having a wide field of view. The apparatus comprises a photographic lens section 10 able to adjust photographic parameters, a photographic parameter detecting section 20 for detecting the photographic parameters of the photographic lens section 10 during photographing, a photoreceptor section 30 for receiving the image information formed by the photographic lens section 10, and an image correction section 50 for receiving an image signal from the photoreceptor section 30, and for performing distortion correction of the information signal based on a predetermined calibration parameter corresponding to the photographic parameter detected at the photographic parameter detecting section 20.
    Type: Grant
    Filed: August 13, 2004
    Date of Patent: February 10, 2009
    Assignee: Topcon Corporation
    Inventors: Nobuo Kochi, Tadayuki Ito, Takayuki Noma
  • Patent number: 7479982
    Abstract: A device for measuring data for calibration for obtaining data for calibration of a camera 2 capable of varying its optical conditions, wherein the data for calibration are obtained using a plurality of images of a calibration chart 1 having marks arranged thereon which were photographed with the camera 1 under varied optical conditions, comprising: a mark extracting part 131 for extracting the marks from the images of the chart; an internal parameter calculating part 134 for calculating data for calibration under optical conditions under which the images of the chart were photographed based on the positions of the marks extracted by the mark extracting part and a plurality of conditions under which the images of the chart were photographed; and an internal parameter function calculating part 160 for calculating data for calibration corresponding to the varied optical photographing conditions of the camera 2, using the data for calibration calculated in the internal parameter calculating part and a plurality
    Type: Grant
    Filed: July 3, 2003
    Date of Patent: January 20, 2009
    Assignee: Topcon Corporation
    Inventors: Hitoshi Otani, Nobuo Kochi, Takayuki Noma
  • Publication number: 20080204654
    Abstract: An automatic suction device for an eyeglass lens and a method for determining suction jig installation position, capable of recognizing that a frame exchange lens holder is being installed on a placement table, making transition to installation work of a frame exchange mode, and avoiding an erroneous contact between the frame exchange frame and a lens holding frame. The kind of holding means placed on the placement table is determined from an image of the inside of an opening (141), which image is taken by a CCD camera (105), and the installation position of a suction jig (121) at an eyeglass lens (L) placed on a frame exchange lens holder (300) is obtained.
    Type: Application
    Filed: March 24, 2005
    Publication date: August 28, 2008
    Inventors: Tsutomu Kigawa, Kazuo Kitamura, Nobuo Kochi, Takahiro Watanabe, Yoshimasa Ogawa
  • Publication number: 20080095402
    Abstract: A position measurement device is provided that can precisely measure the photographing position or posture of a photographing device or the coordinates of an object based on sequentially changing photographed images.
    Type: Application
    Filed: September 28, 2007
    Publication date: April 24, 2008
    Inventors: Nobuo Kochi, Tetsuji Anai, Hitoshi Otani, Hirokazu Sato
  • Patent number: 7349580
    Abstract: A calibrating apparatus for a zoom lens comprising: a first image-acquiring section 60 for acquiring a first image-for-calibration by photographing an area, in which reference marks for calibration are positioned, with a photographic device-to-be-calibrated 19 whose focal length is set to a first focal length; a second image-acquiring section 62 for acquiring a second image-for-calibration by photographing the area, in which the reference marks for calibration are positioned, with the photographic device-to-be-calibrated 19 whose focal length is set to a second focal length; a correction coefficient calculating section 64 for calculating a calibration correction coefficient for the first and second focal lengths, with the use of the photographed reference marks in the first and second image-for-calibrations: and a reference mark inferring section 66 for inferring a positional relationship of the photographed reference marks for calibration in the second image-for-calibration, with the use of the photographed
    Type: Grant
    Filed: June 2, 2004
    Date of Patent: March 25, 2008
    Assignee: Topcon Corporation
    Inventors: Takayuki Noma, Hitoshi Otani, Nobuo Kochi
  • Patent number: 7329867
    Abstract: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample.
    Type: Grant
    Filed: August 18, 2006
    Date of Patent: February 12, 2008
    Assignee: Topcon Corporation
    Inventors: Nobuo Kochi, Hirotami Koike, Yasuko Tsuruga, Shinichi Okada
  • Patent number: 7301560
    Abstract: A three-dimensional field for calibration having a wide-angle area 110 and a zooming area 120 located within an area overlapped with the wide-angle area 110 comprises: a plurality of rough alignment reference marks 122 for zooming and a plurality of precise alignment reference marks 124 for zooming, and the rough alignment reference marks 122 and the precise alignment reference marks 124 for zooming being arranged within the zooming area 120; and a plurality of rough alignment reference marks 112 for wide-angle and a plurality of precise alignment reference marks 114 for wide-angle, the rough alignment reference marks 112 and the precise alignment reference 124 marks for wide-angle being arranged within the wide-angle area 110.
    Type: Grant
    Filed: May 26, 2004
    Date of Patent: November 27, 2007
    Assignee: Topcon Corporation
    Inventors: Takayuki Noma, Tadayuki Ito, Hitoshi Otani, Mitsuharu Yamada, Nobuo Kochi
  • Publication number: 20070263924
    Abstract: An image processing device is provided that can precisely measure the photographing position or posture of a photographing device or the coordinates of an object based on sequentially changing photographed images. A series of sequentially photographed images are acquired, from which feature points are extracted. The feature points are tracked and correlated to each other. Stereo images are selected from the series of photographed images correlated, and subjected to an orientation and a 3D measurement. The error range of corresponding points obtained by the 3D measurement is calculated. Based on the calculated error range, it is determined whether or not the corresponding points are appropriate for 3D measurement. Those corresponding points determined as inappropriate are deleted. Another orientation and another 3D measurement are performed using those corresponding points excluding the deleted ones, thus improving the measurement precision.
    Type: Application
    Filed: May 10, 2007
    Publication date: November 15, 2007
    Inventors: Nobuo Kochi, Tetsuji Anai, Hitoshi Otani
  • Publication number: 20070236561
    Abstract: An image processing device is provided that can precisely measure the photographing position or posture of a photographing device or the coordinates of an object based on sequentially changing photographed images. A series of sequentially photographed images are acquired, from which feature points are extracted. The feature points are tracked and correlated. Stereo images are selected from the series of photographed images correlated. Images selectable as stereo images are grouped into a group of images, from which stereo images are selected, before an orientation and a 3D measurement are performed. The images are grouped according to the distance from the object to the photographing position or the photographing magnification. Images with abrupt changes are removed so as to improve the measurement precision.
    Type: Application
    Filed: April 3, 2007
    Publication date: October 11, 2007
    Inventors: Tetsuji Anai, Nobuo Kochi, Hitoshi Otani
  • Publication number: 20070140528
    Abstract: A technique is provided that can precisely measure the photographing position and posture of a photographing device and the coordinates of an object from moving images or photographed images that sequentially change gradually, even in the case with the need to process the sway of the photographing device and the disappearance and reappearance of characteristic points.
    Type: Application
    Filed: December 7, 2006
    Publication date: June 21, 2007
    Inventors: Tetsuji Anai, Nobuo Kochi, Hitoshi Otani, Hirokazu Sato
  • Publication number: 20070091174
    Abstract: The object of the invention is to improve the efficiency of and promote the automation of non-contact three-dimensional measurement over a wide area utilizing a projection device for projecting a target pattern. A projection device for three-dimensional measurement 80 according to the invention includes: a projection section 12 for projecting onto the shape of a measuring object a measurement pattern P indicating measurement points Q; a pattern projection control section 493 for controlling the projection section 12 to project the measurement pattern P; a pattern detection section 491 for detecting the measurement points Q from a photographed image of the measurement pattern P projected by the projection section 12; and a pattern forming section 492 for forming, based on displacement of the measurement points Q in a first measurement pattern detected by the pattern detection section 491, a second measurement pattern where the measurement points are increased, deleted or changed.
    Type: Application
    Filed: September 26, 2006
    Publication date: April 26, 2007
    Inventors: Nobuo Kochi, Mitsuharu Yamada, Hiroto Watanabe, Takuya Moriyama
  • Patent number: 7206080
    Abstract: A surface shape measuring apparatus, comprising: a stereo-photographing part 3 for photographing an object 1 in stereo; a relative position changing part 4 for changing the positional relation between the stereo-photographing part 3 and the object 1; means 5 for storing stereo-photographing parameters in a plurality of directions from which the stereo-photographing part 3 photographs the object 1; a stereo-image generating means 6 for controlling the stereo-photographing part 3 to photograph the object 1 from the plurality of directions with the stored stereo-photographing parameters and generating stereo images of the object 1; and a surface shape processing means 7 for measuring the surface shape of the object 1 based on the stereo images of the object 1.
    Type: Grant
    Filed: July 30, 2002
    Date of Patent: April 17, 2007
    Assignee: Topcon Corporation
    Inventors: Nobuo Kochi, Hitoshi Otani, Satoru Niimura
  • Publication number: 20070065004
    Abstract: This invention provides a three-dimensional measurement system that improves the efficiency of and enables the automation of non-contact three-dimensional measurement over a wide range using a coded target. A measuring object 1 is photographed in stereo such that the resulting images include four coded marks CT each having a position detection pattern P1 and a code pattern P3. A series of images are photographed in stereo such that adjacent images share two coded marks CT. The position detection pattern P1 and the code pattern P3 are extracted from a pair of photographed images. A point corresponding to a reference point is searched for using the identification codes of the coded marks CT. A stereo matching area is determined. All the processes including photographing, extraction, orientation and three-dimensional measurement can be fully automated.
    Type: Application
    Filed: July 31, 2006
    Publication date: March 22, 2007
    Inventors: Nobuo Kochi, Takuya Moriyama, Masayuki Hideshima, Mitsuharu Yamada
  • Patent number: 7193626
    Abstract: A stereo image displaying device comprising: a feature element specifying section 40 for specifying feature elements contained in a pair of stereo images taken with a stereo image taking section 10; an image controlling section 30 for controlling the stereo images based on the positions of the specified feature elements in the stereo images to provide finished stereo images; and a displaying section 60 for displaying the finished stereo images in stereovision.
    Type: Grant
    Filed: March 7, 2003
    Date of Patent: March 20, 2007
    Assignee: Topcon Corporation
    Inventors: Hitoshi Otani, Nobuo Kochi, Hiroyuki Aoki, Mitsuharu Yamada, Hirokazu Sato
  • Publication number: 20060289757
    Abstract: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample.
    Type: Application
    Filed: August 18, 2006
    Publication date: December 28, 2006
    Inventors: Nobuo Kochi, Hirotami Koike, Yasuko Tsuruga, Shinichi Okada