Abstract: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample.

Abstract: The present invention provides a model forming apparatus that can simply and efficiently form a three-dimensional model of an object using previously obtained three-dimensional model data of the object as a starting point. The apparatus comprises a photographing section 110 for photographing an object 10, an image data storage section 130 for storing three-dimensional model data of the object, a display section 140 for displaying a three-dimensional model based on the three-dimensional model data of the object 10, a recognition section 150 for recognizing an unmodeled part of the object 10 based on the three-dimensional model data stored in the image data storage section 130, and a photographing instruction information section 160 for obtaining photographing instruction information related to photographing the unmodeled part. The photographing section 110 photographs the object 10 in accordance with the photographing instruction information obtained by the photographing instruction information section 160.

Abstract: An image forming process for easily making an image drawing (ortho-image) in an actual place while confirming it in real time. Measuring of control points (at least three points) is performed (S110), and preparation is made for forming an ortho-image based on image data thereof and survey data. Where photographing is carried out from a plurality of directions, additional image measuring is performed (S140). Then, ortho-image formation is performed on a PC (S160). Here, if a formed ortho-image is not what is desired, ortho-image correction is performed (S180). After a satisfactory image is obtained (S200), the process moves to a next area to be measured, and the same operation is repeated. On the other hand, unless a satisfactory image is obtained, additional image measuring (S140) is performed again.

Abstract: This invention provides an electron beam measuring device capable of performing three-dimensional image measurement of a sample with high precision, irrespective of the tilt angle and height of the sample, by adjusting an electron optical system of a scanning charged-particle beam device so as to be suitable for image measurement.

Abstract: Disclosed is an image formation system which supports a survey and a photographing free from errors in the field. A control point data storing section 50 stores control point data required for forming a first orthogonally projected image. An image data storing section 60 stores digitized photographed image from which the orthogonally projected image is formed. An additional survey control point data storing section 55 stores control point survey data obtained by additional survey in the field. An additional image data storing section 65 stores digital image data obtained by additional survey and photographing in the field. An orthogonally projected image formation section 70 integrates the control point data and the image data, thus forming and synthesizing a final orthogonally projected image. An orthogonally projected image acquirement plan making section 80 makes an orthogonally projected image acquirement plan for spots to be amended.

Abstract: An image measuring apparatus includes an approximate position measuring portion for approximately obtaining, from a pair of images of a subject for measurement in different directions, positional information of the subject for measurement in each of the images. A data setting portion, having one image of the pair of images set as a reference image and the other image as a searched image, sets up, in accordance with the positional information obtained in the approximate position measuring portion, reference data blocks in the reference image and sets up searched areas in the searched image and searched data blocks in the searched area. A correspondence determining portion obtains correspondence between the searched data block set up in the searched area and the reference data block.

Abstract: The present invention discloses a stereo image measuring device capable of carrying out high-speed and highly reliable three-dimensional measurement for a stereo image, easily correcting any omitted measurement, measurement errors or the like, and achieving a much higher speed, efficiency and reliability for measurement as a whole. A survey instrument measures a number of control points on site. A camera is, for example a digital camera, a film camera or the like. A control point search unit executes correlation between a control point measured beforehand by the instrument survey and an image. A search area setting unit sets a search area to be used for image correlation processing based on the control points correlated by the control point search unit, and sets respective data blocks, i.e., a reference data block and a search data block. An arithmetic operation unit executes orientation calculation, and image correlation processing (stereo matching) for the search area set by the search area setting unit.

Abstract: The present invention discloses a stereo image measuring device capable of carrying out high-speed and highly reliable three-dimensional measurement for a stereo image, easily correcting any omitted measurement, measurement errors or the like, and achieving a much higher speed, efficiency and reliability for measurement as a whole. A survey instrument measures a number of control points on site. A camera is, for example a digital camera, a film camera or the like. A control point search unit executes correlation between a control point measured beforehand by the instrument survey and an image. A search area setting unit sets a search area to be used for image correlation processing based on the control points correlated by the control point search unit, and sets respective data blocks, i.e., a reference data block and a search data block. An arithmetic operation unit executes orientation calculation, and image correlation processing (stereo matching) for the search area set by the search area setting unit.

Abstract: The present invention provides a three-dimensional image measuring apparatus and method capable of measuring projections and depressions on a surface of an object with fine precision, as well as ensuring stable convergence, even for stereo images with significant project distortion.

Abstract: An image calibration method according to the present invention includes the steps of receiving a calibration request from a user terminal 20 (S10), receiving a calibration object image photographed in accordance with an instruction for calibration photographing (S16), performing a calibration process using the received calibration object image (S26), receiving a subject image photographed by a camera 2, transmitted from the user terminal 20 (S30), performing a calibration on the subject image in accordance with results of the calibration process to form a corrected subject image (S32), and returning the formed corrected subject image to the user terminal 20 (S34). The present invention allows acquisition of a corrected subject image in which distortions due to the camera lens are corrected even for those unskilled in three-dimensional measurement based on the principle of the stereo method, precise two-dimensional measurement, and precise image formation.

Abstract: A device includes a shape measuring section 350 for measuring shape data from a pair of stereovision images of an object taken with an image taking section 2209 a memory section 340 for storing target data related to the images of the object; an image display section 330 for superposing the paired stereovision images of the object and the stereovision target data image based on the target data and for displaying the images; and a comparison display processing section 360 for comparing the shape data of the object measured by the shape measuring section 350, with the target data and reflecting the results of the comparison on the superposed display on the image display section 330.

Abstract: This invention provides an electron beam measuring device capable of performing three-dimensional image measurement of a sample with high precision, irrespective of the tilt angle and height of the sample, by adjusting an electron optical system of a scanning charged-particle beam device so as to be suitable for image measurement.

Abstract: A three-dimensional image display apparatus is provided that can integrate and visualize 3D measurement data obtained from a stereo image with an image of a measuring object to which stereoscopic texture is applied.

Abstract: A photographic apparatus with an image correction function is provided, in which even if an image has a large distortion at its peripheral area, the lens distortion is suitably corrected and the image distortion is small in spite of an image having a wide field of view. The apparatus comprises a photographic lens section 10 able to adjust photographic parameters, a photographic parameter detecting section 20 for detecting the photographic parameters of the photographic lens section 10 during photographing, a photoreceptor section 30 for receiving the image information formed by the photographic lens section 10, and an image correction section 50 for receiving an image signal from the photoreceptor section 30, and for performing distortion correction of the information signal based on a predetermined calibration parameter corresponding to the photographic parameter detected at the photographic parameter detecting section 20.

Abstract: To provide an electron beam system capable of performing three-dimensional measurement of a sample with high precision irrespective of the tilt angle and height of the sample.

Abstract: An electron beam device according to the present invention is made up of an electron beam source for emitting an electron beam, an electron optical system for irradiating the electron beam onto a specimen, a specimen holder for holding the specimen, a specimen tilting section for producing relative tilt angles between the specimen holder and the electron beam, an electron beam detecting section for detecting electron beam emitted from the specimen, and a data correcting section for correcting the three-dimensional detection data to have specified relationship under the condition of a relative tilt angle between the specimen holder and the electron beam.

Abstract: An electron beam device according to the present invention is made up of an electron beam source for emitting an electron beam, an electron optical system for irradiating the electron beam onto a specimen, a specimen holder for holding the specimen, a specimen tilting section for producing relative tilt angles between the specimen holder and the electron beam, an electron beam detecting section for detecting electron beam emitted from the specimen, and a data correcting section for correcting the three-dimensional detection data to have specified relationship under the condition of a relative tilt angle between the specimen holder and the electron beam.

Abstract: A calibrating apparatus for a zoom lens comprising: a first image-acquiring section 60 for acquiring a first image-for-calibration by photographing an area, in which reference marks for calibration are positioned, with a photographic device-to-be-calibrated 19 whose focal length is set to a first focal length; a second image-acquiring section 62 for acquiring a second image-for-calibration by photographing the area, in which the reference marks for calibration are positioned, with the photographic device-to-be-calibrated 19 whose focal length is set to a second focal length; a correction coefficient calculating section 64 for calculating a calibration correction coefficient for the first and second focal lengths, with the use of the photographed reference marks in the first and second image-for-calibrations: and a reference mark inferring section 66 for inferring a positional relationship of the photographed reference marks for calibration in the second image-for-calibration, with the use of the photographed

Abstract: A three-dimensional field for calibration having a wide-angle area 110 and a zooming area 120 located within an area overlapped with the wide-angle area 110 comprises: a plurality of rough alignment reference marks 122 for zooming and a plurality of precise alignment reference marks 124 for zooming, and the rough alignment reference marks 122 and the precise alignment reference marks 124 for zooming being arranged within the zooming area 120; and a plurality of rough alignment reference marks 112 for wide-angle and a plurality of precise alignment reference marks 114 for wide-angle, the rough alignment reference marks 112 and the precise alignment reference 124 marks for wide-angle being arranged within the wide-angle area 110.

Abstract: [Problem to be Solved] To provide a three-dimensional coordinate measuring apparatus which does not show no significant differences in measurement accuracy depending upon the measurement direction even in three-dimensional shape measurement using anisotropic shape measurement in which measuring accuracy varies depending upon the measurement direction.