Patents by Inventor Pan Liu

Pan Liu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170039659
    Abstract: A daily electricity generation planning method of a cascade hydropower plants is disclosed, and the method is comprised of the steps as follows: step 1, regardless of the constraints for opening and closing the generator, taking the power similarity between the power plant group and the typical demand as one of optimization objectives, and performing a first optimization to obtain a daily electricity generation plan; step 2, according to the derived daily electricity generation plan, determining an opening and closing status for the generator; and step 3, considering the constraints for opening and closing the generator, taking the power similarity between the power plant group and the typical demand as the optimization objective, performing a second optimization to obtain the daily electricity generation plan.
    Type: Application
    Filed: April 30, 2014
    Publication date: February 9, 2017
    Inventors: Pan LIU, Xizhen CHEN, Zejun LI, Wang ZHANG
  • Patent number: 9484527
    Abstract: A magnetic multilayer film for a temperature sensor is disclosed. The magnetic multilayer film comprises: a bottom magnetic composite layer provided on a substrate, the bottom magnetic composite layer having a direct pinning structure, an indirect pinning structure, a synthetic ferromagnetic structure, or a synthetic anti-ferromagnetic structure; a spacer layer provided on the bottom magnetic composite layer; and a top magnetic composite layer provided on the spacer layer, the top magnetic composite layer having the direct pinning structure, the indirect pinning structure, the synthetic ferromagnetic structure, or the synthetic anti-ferromagnetic structure, wherein a ferromagnetic layer of the bottom magnetic composite layer closest to the spacer layer has a magnetic moment anti-parallel with that of a ferromagnetic layer of the top magnetic composite layer closest to the spacer layer.
    Type: Grant
    Filed: February 18, 2016
    Date of Patent: November 1, 2016
    Assignee: INSTITUTE OF PHYSICS, CHINESE ACADEMY OF SCIENCES
    Inventors: Xiufeng Han, Zhonghui Yuan, Pan Liu, Guoqiang Yu, Jiafeng Feng, Dianlin Zhang
  • Publication number: 20160163965
    Abstract: A magnetic multilayer film for a temperature sensor is disclosed. The magnetic multilayer film comprises: a bottom magnetic composite layer provided on a substrate, the bottom magnetic composite layer having a direct pinning structure, an indirect pinning structure, a synthetic ferromagnetic structure, or a synthetic anti-ferromagnetic structure; a spacer layer provided on the bottom magnetic composite layer; and a top magnetic composite layer provided on the spacer layer, the top magnetic composite layer having the direct pinning structure, the indirect pinning structure, the synthetic ferromagnetic structure, or the synthetic anti-ferromagnetic structure, wherein a ferromagnetic layer of the bottom magnetic composite layer closest to the spacer layer has a magnetic moment anti-parallel with that of a ferromagnetic layer of the top magnetic composite layer closest to the spacer layer.
    Type: Application
    Filed: February 18, 2016
    Publication date: June 9, 2016
    Inventors: Xiufeng HAN, Zhonghui YUAN, Pan LIU, Guoqiang YU, Jiafeng FENG, Dianlin ZHANG
  • Patent number: 9191154
    Abstract: Embodiments of methods and/or systems for estimating phase error noise are disclosed.
    Type: Grant
    Filed: May 19, 2011
    Date of Patent: November 17, 2015
    Assignee: New Jersey Institute of Technology
    Inventors: Yesheskel Bar-Ness, Pan Liu
  • Publication number: 20140380463
    Abstract: Methods for setting and verifying a password in a password protected device. Setting a password includes receiving a configuration password entered via a keyboard, wherein the configuration password includes position information of at least one key on the keyboard, and symbol information of at least one key on the keyboard, and storing the configuration password. Verifying a password includes receiving an entered password on the keyboard, obtaining a stored configuration password, wherein the configuration password includes position information of at least one key on the keyboard and symbol information of at least one key on the keyboard, and verifying the entered password based on the configuration password. The keyboard may be a randomly arranged keyboard. Even if nearby persons can see the selection of symbols displayed on the keys for a password, they cannot determine the real content of the password, and thus cannot access the password-protected device.
    Type: Application
    Filed: September 11, 2014
    Publication date: December 25, 2014
    Inventors: Feng Chen, Pan Liu, Xiao Yu Wang, Ziao Zhi Yan
  • Publication number: 20140123274
    Abstract: Methods and systems for setting and verifying a password in a password protected device. Setting a password includes receiving a configuration password entered via a keyboard, wherein the configuration password includes position information of at least one key on the keyboard, and symbol information of at least one key on the keyboard, and storing the configuration password. Verifying a password includes receiving an entered password on the keyboard, obtaining a stored configuration password, wherein the configuration password includes position information of at least one key on the keyboard and symbol information of at least one key on the keyboard, and verifying the entered password based on the configuration password. The keyboard may be a randomly arranged keyboard. Even if nearby persons can see the selection of symbols displayed on the keys for a password, they cannot determine the real content of the password, and thus cannot access the password-protected device.
    Type: Application
    Filed: October 22, 2013
    Publication date: May 1, 2014
    Inventors: Feng Chen, Pan Liu, Xiao Yu Wang, Ziao Zhi Yan
  • Patent number: 8681687
    Abstract: Aspects of a method and system for channel estimation for interference suppression are provided. In this regard, one or more circuits and/or processors of a mobile communication device may generate and/or receive a first set of channel estimates and a second set of channel estimates. The one or more circuits and/or processors may modify the second set of channel estimates based on a comparison of a measure of correlation between the first set of channel estimates and the second set of channel estimates with a threshold. The first set of channel estimates and/or the modified second set of channel estimates may be utilized for cancelling interference in received signals. The first set of channel estimates may be associated with a first transmit antenna of a base transceiver station and the second set of channel estimates may be associated with a second transmit antenna of the base transceiver station.
    Type: Grant
    Filed: December 4, 2012
    Date of Patent: March 25, 2014
    Assignee: Broadcom Corporation
    Inventors: Wei Luo, Pan Liu, Thirunathan Sutharsan
  • Patent number: 8569714
    Abstract: A double tilt sample holder for in-situ measuring mechanical and electrical properties of microstructures in transmission electron microscope (TEM) is provided. The sample holder includes a home-made hollow sample holder body, a sensor for measuring mechanical/electrical properties, a pressing piece, a sample holder head, a sensor carrier. The sensor for measuring mechanical/electrical properties is fixed on the sensor carrier on the sample holder head by the pressing piece, while the sensor carrier is connected to the sample holder head through a pair of supporting shafts located on sides of the sample holder head. The sensor carrier can tilt within the plane perpendicular to the ample holder head by revolving around the supporting shafts (i.e. tilting along Y axis at an angle of ±30°). The sample holder also allows obtaining mechanical/electrical parameters concurrently.
    Type: Grant
    Filed: July 11, 2011
    Date of Patent: October 29, 2013
    Assignee: Beijing University of Technology
    Inventors: Xiaodong Han, Yonghai Yue, Yuefei Zhang, Pan Liu, Kun Zheng, Xiaodong Wang, Ze Zhang
  • Publication number: 20130105706
    Abstract: A double tilt sample holder for in-situ measuring mechanical and electrical properties of microstructures in transmission electron microscope (TEM) is provided. The sample holder includes a home-made hollow sample holder body, a sensor for measuring mechanical/electrical properties, a pressing piece, a sample holder head, a sensor carrier. The sensor for measuring mechanical/electrical properties is fixed on the sensor carrier on the sample holder head by the pressing piece, while the sensor carrier is connected to the sample holder head through a pair of supporting shafts located on sides of the sample holder head. The sensor carrier can tilt within the plane perpendicular to the ample holder head by revolving around the supporting shafts (i.e. tilting along Y axis at an angle of ±30°). The sample holder also allows obtaining mechanical/electrical parameters concurrently.
    Type: Application
    Filed: July 11, 2011
    Publication date: May 2, 2013
    Applicant: BEIJING UNIVERSITY OF TECHNOLOGY
    Inventors: Xiaodong Han, Yonghai Yue, Yuefei Zhang, Pan Liu, Kun Zheng, Xiaodong Wang, Ze Zhang
  • Patent number: 8358610
    Abstract: Aspects of a method and system for channel estimation for interference suppression are provided. In this regard, one or more circuits and/or processors of a mobile communication device may generate and/or receive a first set of channel estimates and a second set of channel estimates. The one or more circuits and/or processors may modify the second set of channel estimates based on a comparison of a measure of correlation between the first set of channel estimates and the second set of channel estimates with a threshold. The first set of channel estimates and/or the modified second set of channel estimates may be utilized for cancelling interference in received signals. The first set of channel estimates may be associated with a first transmit antenna of a base transceiver station and the second set of channel estimates may be associated with a second transmit antenna of the base transceiver station.
    Type: Grant
    Filed: November 9, 2009
    Date of Patent: January 22, 2013
    Assignee: Broadcom Corporation
    Inventors: Wei Luo, Pan Liu, Thirunathan Sutharsan
  • Patent number: 8302494
    Abstract: A sensor for quantitative testing electromechanical properties and microstructure of nano-materials and a manufacturing method for the sensor are provided. The sensor comprises a suspended structure, pressure-sensitive resistor cantilevers, support beams, bimetallic strip and other components. When the bimetallic strip produces bending deformation, one of the pressure-sensitive resistor cantilevers is actuated and then stretches the low-dimensional nano-materials which drive the other pressure-sensitive resistor cantilever to bend. Through signal changes are outputted by the Wheatstone bridge, the variable stresses of low-dimensional nano-materials are obtained. Meanwhile, the variable strains of low-dimensional nano-materials are obtained by the horizontal displacements between two cantilevers, so the stress-strain curves of low-dimensional nano-materials are worked out. When the low-dimensional nano-materials are measured in the power state, the voltage-current curves are also obtained.
    Type: Grant
    Filed: April 7, 2010
    Date of Patent: November 6, 2012
    Assignee: Beijing University of Technology
    Inventors: Xiaodong Han, Pan Liu, Yonghai Yue, Ze Zhang
  • Patent number: 8069733
    Abstract: A device for measuring electromechanical properties and microstructure of nano-materials under stress state comprises two bimetallic strips placed on an insulated metal ring plated with insulating paint, wherein the two bimetallic strips are placed in parallel or V-shaped to insulated metal ring on the same plane, one end of each bimetallic strip is fixed on the insulated metal ring, the other end of the bimetallic strip hangs inside of the insulated ring, the distance of two bimetallic strips were controlled within 0.002-1 mm. Also provided is a method for measuring electromechanical properties and microstructure of nano-materials under stress state.
    Type: Grant
    Filed: December 7, 2009
    Date of Patent: December 6, 2011
    Assignee: Beijing University of Technology
    Inventors: Xiaodong Han, Pan Liu, Yuefei Zhang, Yonghai Yue, Ze Zhang
  • Patent number: 8023583
    Abstract: Embodiments of methods and/or systems for estimating phase error noise are disclosed.
    Type: Grant
    Filed: December 2, 2005
    Date of Patent: September 20, 2011
    Assignee: New Jersey Institute of Technology
    Inventors: Yesheskel Bar-Ness, Pan Liu
  • Publication number: 20110222639
    Abstract: Embodiments of methods and/or systems for estimating phase error noise are disclosed.
    Type: Application
    Filed: May 19, 2011
    Publication date: September 15, 2011
    Applicant: New Jersey Institute of Technology
    Inventors: Yesheskel Bar-Ness, Pan Liu
  • Publication number: 20110111761
    Abstract: Aspects of a method and system for channel estimation for interference suppression are provided. In this regard, one or more circuits and/or processors of a mobile communication device may generate and/or receive a first set of channel estimates and a second set of channel estimates. The one or more circuits and/or processors may modify the second set of channel estimates based on a comparison of a measure of correlation between the first set of channel estimates and the second set of channel estimates with a threshold. The first set of channel estimates and/or the modified second set of channel estimates may be utilized for cancelling interference in received signals. The first set of channel estimates may be associated with a first transmit antenna of a base transceiver station and the second set of channel estimates may be associated with a second transmit antenna of the base transceiver station.
    Type: Application
    Filed: November 9, 2009
    Publication date: May 12, 2011
    Inventors: Wei Luo, Pan Liu, Thirunathan Sutharsan
  • Publication number: 20110107472
    Abstract: A sensor for quantitative test electromechanical properties and microstructure of nano-materials and a manufacturing method for the sensor are provided. The sensor comprises a suspended structure, pressure-sensitive resistor cantilevers, support beams, bimetallic strip and other components. When the bimetallic strip produces bending deformation, one of the pressure-sensitive resistor cantilevers is actuated and then stretches the low-dimensional nano-materials which drive the other pressure-sensitive resistor cantilever to bend. Through signal changes are outputted by the Wheatstone bridge, the variable stresses of low-dimensional nano-materials are obtained. Meanwhile, the variable strains of low-dimensional nano-materials are obtained by the horizontal displacements between two cantilevers, so the stress-strain curves of low-dimensional nano-materials are worked out. When the low-dimensional nano-materials are measured in the power state, the voltage-current curves are also obtained.
    Type: Application
    Filed: April 7, 2010
    Publication date: May 5, 2011
    Applicant: BEIJING UNIVERSITY OF TECHNOLOGY
    Inventors: XIAODONG HAN, PAN LIU, YONGHAI YUE, ZE ZHANG
  • Patent number: 7923683
    Abstract: A method for analyzing a sample for the manufacture of integrated circuits, e.g., dynamic random access memory devices, commonly called DRAMS. The method also provides an integrated chip including a thickness, a width, and a length. In a specific embodiment, the integrated chip has at least one elongated structure through a portion of the thickness, while being normal to the width and the length. In a specific embodiment, the elongated structure has a structure width and a structure length that extends through a vertical portion of the thickness. The method includes removing a slice of the integrated chip from a portion of the thickness in a directional manner normal to the structure length. In a specific embodiment, the slice is provided through an entirety of the one elongated structure along the structure length to cause a portion of a thickness of the slice providing the elongated structure to be of a substantially uniform sample thickness.
    Type: Grant
    Filed: October 27, 2008
    Date of Patent: April 12, 2011
    Assignee: Semiconductor Manufacturing International (Shanghai) Corporation
    Inventors: Qi Hua Zhang, Chorng Shyr Niou, Pan Liu, Ming Li
  • Patent number: 7877071
    Abstract: Apparatus and method to provide unified STTD/CLTD dedicated pilot processing in a wireless receiver. The technique allows different set of parameters to be introduced to a same processing module to process STTD and CLTD diversity signals to recover a pilot signal. Introducing another set of parameters to the processing module also allows processing of a non-diversity signal to recover a pilot. The unified processing of STTD/CLTD signals is achieved by converting STTD/CLTD pilot bits as Hadamard-like bits and processing these bits along with orthogonal pilot bits which are encoded as Hadamard encoded bits.
    Type: Grant
    Filed: December 26, 2007
    Date of Patent: January 25, 2011
    Assignee: Broadcom Corporation
    Inventors: Hongwei Kong, Li Fung Chang, Pan Liu
  • Publication number: 20100154557
    Abstract: A device for measuring electromechanical properties and microstructure of nano-materials under stress state comprises two bimetallic strips placed on an insulated metal ring plated with insulating paint, wherein the two bimetallic strips are placed in parallel or V-shaped to insulated metal ring on the same plane, one end of each bimetallic strip is fixed on the insulated metal ring, the other end of the bimetallic strip hangs inside of the insulated ring, the distance of two bimetallic strips were controlled within 0.002-1 mm. Also provided is a method for measuring electromechanical properties and microstructure of nano-materials under stress state.
    Type: Application
    Filed: December 7, 2009
    Publication date: June 24, 2010
    Applicant: BEIJING UNIVERSITY OF TECHNOLOGY
    Inventors: Xiaodong Han, Pan Liu, Yuefei Zhang, Yonghai Yue, Ze Zhang
  • Publication number: 20100124854
    Abstract: A structure for improving the voltage difference of a connector includes a communication connector, an enclosure, and a conducting gasket. The communication connector is assembled with the enclosure. The conducting gasket is located and conducted at the connection area of the communication connector and the enclosure. Thereby, the conductivity of the communication connector and the enclosure is increased and the voltage difference is improved. Furthermore the connector does not require traditional manual welding for connection; thereby manufacturing time and cost are reduced.
    Type: Application
    Filed: November 17, 2008
    Publication date: May 20, 2010
    Inventor: TING-PAN LIU