Patents by Inventor Patrick R. KHAYAT

Patrick R. KHAYAT has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20180267851
    Abstract: Apparatuses and methods for performing an error correction code (ECC) operation are provided. One example method can include performing a first error code correction (ECC) operation on a portion of data, performing a second ECC operation on the portion of data in response to the first ECC operation failing, and performing a third ECC operation on the portion of data in response to the second ECC operation failing.
    Type: Application
    Filed: March 17, 2017
    Publication date: September 20, 2018
    Inventors: Mustafa N. Kaynak, Patrick R. Khayat, Sivagnanam Parthasarathy
  • Patent number: 10061643
    Abstract: The present disclosure includes apparatuses and methods for estimating an error rate associated with memory. A number of embodiments include sensing data stored in a memory, performing an error detection operation on the sensed data, determining a quantity of parity violations associated with the error detection operation, and estimating an error rate associated with the memory based on the determined quantity of parity violations.
    Type: Grant
    Filed: December 16, 2016
    Date of Patent: August 28, 2018
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Mustafa N. Kaynak, Patrick R. Khayat, Nicholas J. Richardson
  • Patent number: 9990988
    Abstract: A determination can be made as to whether a state of a memory cell is in a valley between adjacent distributions of states associated with respective data states. A signal indicative of a data state of the memory cell and whether the state of the memory cell is in the valley can be transmitted.
    Type: Grant
    Filed: June 10, 2015
    Date of Patent: June 5, 2018
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak, Robert B. Eisenhuth
  • Publication number: 20180143875
    Abstract: The present disclosure includes apparatuses and methods for monitoring error correction operations performed in memory. A number of embodiments include a memory and circuitry configured to determine a quantity of erroneous data corrected during an error correction operation performed on soft data associated with a sensed data state of a number of memory cells of the memory, determine a quality of soft information associated with the erroneous data corrected during the error correction operation performed on the soft data, and determine whether to take a corrective action on the sensed data based on the quantity of the erroneous data corrected during the error correction operation and the quality of the soft information associated with the erroneous data corrected during the error correction operation.
    Type: Application
    Filed: January 17, 2018
    Publication date: May 24, 2018
    Inventors: Mustafa N. Kaynak, Patrick R. Khayat, Sivagnanam Parthasarathy
  • Publication number: 20180144791
    Abstract: Apparatuses and methods for determining soft data for fractional digit memory cells are provided. One example apparatus can include a controller to determine states of memory cells of a group of memory cells operated as fractional digit memory cells, and determine soft data based, at least partially, on dimensions to which particular memory cells correspond with respect to the group of memory cells, determined states of the memory cells with respect to a state adjacent a state corresponding to a swapping shell, and whether a particular memory cell is a candidate for swapping.
    Type: Application
    Filed: January 18, 2018
    Publication date: May 24, 2018
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak
  • Publication number: 20180081753
    Abstract: Methods and apparatuses for generating probabilistic information for error correction using current integration are disclosed. An example method comprises sensing a first plurality of memory cells based on a first sense threshold, responsive to sensing the first plurality of cells, associating a first set of probabilistic information with the first plurality of memory cells, sensing a second plurality of memory cells based on a second sense threshold, responsive to sensing the second plurality of memory cells, associating a second set of probabilistic information with the second plurality of memory cells, and performing an error correction operation on the first and second pluralities of memory cells based, at least in part, on the first and second values.
    Type: Application
    Filed: September 16, 2016
    Publication date: March 22, 2018
    Applicant: MICRON TECHNOLOGY, INC.
    Inventors: Patrick R. Khayat, Sivagnanam Parthasarathy, Mustafa N. Kaynak, Mark A. Helm, Aaron S. Yip
  • Publication number: 20180083653
    Abstract: An apparatus is provided. The apparatus comprises a first syndrome computation circuit configured to receive a codeword having a plurality of rows and a plurality of columns and further configured to compute a first syndrome for at least a portion of a first component codeword of the codeword. The apparatus further comprises a second syndrome computation circuit configured to receive the codeword and to compute a second syndrome for at least a portion of a second component codeword of the codeword. The apparatus further comprises a bit correction circuit configured to correct one or more erroneous bits in the codeword based, at least in part, on at least one of the first and second syndrome, wherein the first and second component codewords span two or more rows and two or more columns of the codeword.
    Type: Application
    Filed: September 16, 2016
    Publication date: March 22, 2018
    Applicant: MICRON TECHNOLOGY, INC.
    Inventors: Patrick R. Khayat, Sivagnanam Parthasarathy, Mustafa N. Kaynak
  • Patent number: 9904594
    Abstract: The present disclosure includes apparatuses and methods for monitoring error correction operations performed in memory. A number of embodiments include a memory and circuitry configured to determine a quantity of erroneous data corrected during an error correction operation performed on soft data associated with a sensed data state of a number of memory cells of the memory, determine a quality of soft information associated with the erroneous data corrected during the error correction operation performed on the soft data, and determine whether to take a corrective action on the sensed data based on the quantity of the erroneous data corrected during the error correction operation and the quality of the soft information associated with the erroneous data corrected during the error correction operation.
    Type: Grant
    Filed: April 15, 2016
    Date of Patent: February 27, 2018
    Assignee: Micron Technology, Inc.
    Inventors: Mustafa N. Kaynak, Patrick R. Khayat, Sivagnanam Parthasarathy
  • Patent number: 9875792
    Abstract: Apparatuses and methods for determining soft data for fractional digit memory cells are provided. One example apparatus can include a controller to determine states of memory cells of a group of memory cells operated as fractional digit memory cells, and determine soft data based, at least partially, on dimensions to which particular memory cells correspond with respect to the group of memory cells, determined states of the memory cells with respect to a state adjacent a state corresponding to a swapping shell, and whether a particular memory cell is a candidate for swapping.
    Type: Grant
    Filed: December 17, 2015
    Date of Patent: January 23, 2018
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak
  • Publication number: 20180013451
    Abstract: One example of layer-by-layer error correction can include iteratively error correcting the codeword on a layer-by-layer basis with the first error correction circuit in a first mode and determining on the layer-by-layer basis whether a number of parity errors in a particular layer is less than a threshold number of parity errors. The codeword can be transferred to a second error correction circuit when the number of parity errors is less than the threshold number of parity errors. The codeword can be iteratively error corrected with the first error correction circuit in a second mode when the number of parity errors is at least the threshold number of parity errors. The threshold number of parity errors can be at least partially based on an adjustable code rate of the first error correction circuit or the second error correction circuit.
    Type: Application
    Filed: July 11, 2016
    Publication date: January 11, 2018
    Inventors: Mustafa N. Kaynak, Patrick R. Khayat, Sivagnanam Parthasarathy, Nicholas J. Richardson
  • Publication number: 20170300377
    Abstract: The present disclosure includes apparatuses and methods for monitoring error correction operations performed in memory. A number of embodiments include a memory and circuitry configured to determine a quantity of erroneous data corrected during an error correction operation performed on soft data associated with a sensed data state of a number of memory cells of the memory, determine a quality of soft information associated with the erroneous data corrected during the error correction operation performed on the soft data, and determine whether to take a corrective action on the sensed data based on the quantity of the erroneous data corrected during the error correction operation and the quality of the soft information associated with the erroneous data corrected during the error correction operation.
    Type: Application
    Filed: April 15, 2016
    Publication date: October 19, 2017
    Inventors: Mustafa N. Kaynak, Patrick R. Khayat, Sivagnanam Parthasarathy
  • Patent number: 9685243
    Abstract: Apparatuses and methods involving the determination of soft data from hard reads are provided. One example method can include determining, using a hard read, a state of a memory cell. Soft data is determined based, at least partially, on the determined state.
    Type: Grant
    Filed: August 8, 2016
    Date of Patent: June 20, 2017
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak
  • Publication number: 20170097859
    Abstract: The present disclosure includes apparatuses and methods for estimating an error rate associated with memory. A number of embodiments include sensing data stored in a memory, performing an error detection operation on the sensed data, determining a quantity of parity violations associated with the error detection operation, and estimating an error rate associated with the memory based on the determined quantity of parity violations.
    Type: Application
    Filed: December 16, 2016
    Publication date: April 6, 2017
    Inventors: Sivagnanam Parthasarathy, Mustafa N. Kaynak, Patrick R. Khayat, Nicholas J. Richardson
  • Patent number: 9558064
    Abstract: The present disclosure includes apparatuses and methods for estimating an error rate associated with memory. A number of embodiments include sensing data stored in a memory, performing an error detection operation on the sensed data, determining a quantity of parity violations associated with the error detection operation, and estimating an error rate associated with the memory based on the determined quantity of parity violations.
    Type: Grant
    Filed: January 28, 2015
    Date of Patent: January 31, 2017
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Mustafa N. Kaynak, Patrick R. Khayat, Nicholas J. Richardson
  • Publication number: 20160351275
    Abstract: Apparatuses and methods involving the determination of soft data from hard reads are provided. One example method can include determining, using a hard read, a state of a memory cell. Soft data is determined based, at least partially, on the determined state.
    Type: Application
    Filed: August 8, 2016
    Publication date: December 1, 2016
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak
  • Patent number: 9412472
    Abstract: Apparatuses and methods involving the determination of soft data from hard reads are provided. One example method can include determining, using a hard read, a state of a memory cell. Soft data is determined based, at least partially, on the determined state.
    Type: Grant
    Filed: November 13, 2015
    Date of Patent: August 9, 2016
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak
  • Publication number: 20160218740
    Abstract: The present disclosure includes apparatuses and methods for estimating an error rate associated with memory. A number of embodiments include sensing data stored in a memory, performing an error detection operation on the sensed data, determining a quantity of parity violations associated with the error detection operation, and estimating an error rate associated with the memory based on the determined quantity of parity violations.
    Type: Application
    Filed: January 28, 2015
    Publication date: July 28, 2016
    Inventors: Sivagnanam Parthasarathy, Mustafa N. Kaynak, Patrick R. Khayat, Nicholas J. Richardson
  • Patent number: 9391645
    Abstract: Apparatuses and methods for determining soft data using a classification code are provided. One example apparatus can include a classification code (CC) decoder and an outer code decoder coupled to the CC decoder. The CC decoder is configured to receive a CC codeword. The CC codeword includes a piece of an outer code codeword and corresponding CC parity digits. The CC decoder is configured to determine soft data associated with the piece of the outer code codeword, at least partially, using the corresponding CC digits.
    Type: Grant
    Filed: June 9, 2015
    Date of Patent: July 12, 2016
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak
  • Patent number: 9355730
    Abstract: The present disclosure includes methods and apparatuses for mapping between program states and data patterns. One method includes: programming a group of G memory cells such that a combination of respective program states of the group maps to a constellation point corresponding to a received N unit data pattern, the group used to store N/G units of data per memory cell; wherein the constellation point is one of a number of constellation points of a constellation associated with mapping respective program state combinations of the group of memory cells to N unit data patterns; and wherein the constellation comprises a first mapping shell and a second mapping shell, the constellation points corresponding to the respective first and second mapping shells determined, at least partially, based on a polynomial expression of order equal to G.
    Type: Grant
    Filed: February 19, 2015
    Date of Patent: May 31, 2016
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak, Zhenlei Shen
  • Patent number: 9318205
    Abstract: The present disclosure includes methods and apparatuses for mapping between program states and data patterns. One method includes: programming a group of G memory cells such that a combination of respective program states of the group maps to a constellation point corresponding to a received N unit data pattern, the group used to store N/G units of data per memory cell; wherein the constellation point is one of a number of constellation points of a constellation associated with mapping respective program state combinations of the group of memory cells to N unit data patterns; and wherein the constellation comprises a first mapping shell and a second mapping shell, the constellation points corresponding to the respective first and second mapping shells determined, at least partially, based on a polynomial expression of order equal to G.
    Type: Grant
    Filed: February 19, 2015
    Date of Patent: April 19, 2016
    Assignee: Micron Technology, Inc.
    Inventors: Sivagnanam Parthasarathy, Patrick R. Khayat, Mustafa N. Kaynak, Zhenlei Shen