Patents by Inventor Pieter J. Kerstens

Pieter J. Kerstens has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170219695
    Abstract: Methods and systems for performing multiple pulse LIDAR measurements are presented herein. In one aspect, each LIDAR measurement beam illuminates a location in a three dimensional environment with a sequence of multiple pulses of illumination light. Light reflected from the location is detected by a photosensitive detector of the LIDAR system during a measurement window having a duration that is greater than or equal to the time of flight of light from the LIDAR system out to the programmed range of the LIDAR system, and back. The pulses in a measurement pulse sequence can vary in magnitude and duration. Furthermore, the delay between pulses and the number of pulses in each measurement pulse sequence can also be varied. In some embodiments, the multi-pulse illumination beam is encoded and the return measurement pulse sequence is decoded to distinguish the measurement pulse sequence from exogenous signals.
    Type: Application
    Filed: October 31, 2016
    Publication date: August 3, 2017
    Inventors: David S. Hall, Pieter J. Kerstens
  • Publication number: 20170146640
    Abstract: A plurality of beams of illumination light are emitted from a LIDAR device over a range of angles and scanned about an axis of rotation. The range of angles includes the axis of rotation. Intermediate electronics boards provide mechanical support and electrical connectivity between a rotating electronics board and various elements of a light emission and collection engine. One or more of the optical elements of the collection optics, the illumination optics, or both, is constructed from one or more materials that absorb light outside of a predetermined wavelength range. An overmolded lens is fixedly coupled to one or more of the light detecting elements to collect incoming light over a larger range of angles. A lens element is disposed in the light path between a light emitting element and the illumination optics to flatten the intensity distribution of light emitted from the light emitting element to reduce peak intensity.
    Type: Application
    Filed: November 23, 2016
    Publication date: May 25, 2017
    Inventors: David S. Hall, Mathew Noel Rekow, Stephen S. Nestinger, Pieter J. Kerstens
  • Patent number: 5248876
    Abstract: A confocal imaging system utilizes an opaque mask with a slit and a row of pinpoint sensors or utilizes an opaque mask with a skewed pattern of pinholes and an array of isolated pinpoint sensors in a matching pattern in order to obtain sufficient data to provide a complete image for imaging and/or inspecting an object such as electronics in a single one-dimensional scan. The system also simultaneously produces multiple images at different heights in the single one-dimensional scan of the viewed object, and also simultaneously produces images taken in different spectral bands in the same one-dimensional scan of the object to be imaged and/or inspected. The relative height or depth of the different images can be modified by simply adjusting the inclination between the confocal imaging system and a path followed by the object that is to be imaged and/or inspected during the one-dimensional scan.
    Type: Grant
    Filed: April 21, 1992
    Date of Patent: September 28, 1993
    Assignee: International Business Machines Corporation
    Inventors: Pieter J. Kerstens, Jon R. Mandeville, Frederick Y. Wu