Abstract: An embodiment solid electrolyte includes a first compound and a second compound. The first compound is represented by a first chemical formula Li7-aPS6-a(X11-bX2b)a, wherein X1 and X2 are the same or different and each represents F, Cl, Br, or I, and wherein 0<a?2 and 0<b<1, and the second compound is represented by a second chemical formula Li7-cP1-2dMdS6-c-3d(X11-eX2e)c, wherein X1 and X2 are the same or different and each represents F, Cl, Br, or I, wherein M represents Ge, Si, Sn, or any combination thereof, and wherein 0<c?2, 0<d<0.5, and 0<e<1.

Abstract: A secondary battery includes an electrode assembly having a positive electrode provided with a positive electrode tab, a separator, and a negative electrode provided with a negative electrode tab, the positive electrode, the separator, and the negative electrode being wound, the electrode assembly having a core part at a center thereof; a can configured to receive the electrode assembly therein, the negative electrode tab being connected to the can; a cap assembly coupled to an opening of the can, the positive electrode tab being connected to the cap assembly; and a reinforcing member provided on an end of the separator exposed beyond the positive electrode or the negative electrode to prevent heat of the positive electrode tab or the negative electrode tab from being transferred to the separator.

Abstract: A method of manufacturing a composite electrode for an all-solid-state battery includes: preparing a precursor solution by mixing at least one solid electrolyte precursor and at least one polar solvent; stirring the precursor solution; preparing an electrode slurry by adding an active material to the stirred precursor solution; and heat-treating the electrode slurry and obtaining the composite electrode for the all-solid-state battery, wherein the composite electrode for the all-solid-state battery includes: the active material; and a coating layer disposed on the active material and including a solid electrolyte.

Abstract: An arbitration control circuit in a pseudo-static random access memory (PSRAM) device includes a first arbiter circuit and a second arbiter circuit. The first arbiter circuit receives a normal access request signal and a refresh access request signal and generates a first output signal in response to a logical operation to arbitrate between the normal access reqeuest signal and the refresh access request signal. The second arbiter circuit configured to receive the first output signal and a delayed signal of the first output signal, and to generate a second output signal in response to a logical operation of the first output signal and the delayed signal. The second output signal has a first logical state indicative of granting the read or write access request and a second logical state indicative of granting the refresh access request to the memory cells of the PSRAM device.

Abstract: An arbitration control circuit in a pseudo-static random access memory (PSRAM) device includes a first arbiter circuit and a second arbiter circuit. The first arbiter circuit receives a normal access request signal and a refresh access request signal and generates a first output signal in response to a logical operation to arbitrate between the normal access reqeuest signal and the refresh access request signal. The second arbiter circuit configured to receive the first output signal and a delayed signal of the first output signal, and to generate a second output signal in response to a logical operation of the first output signal and the delayed signal. The second output signal has a first logical state indicative of granting the read or write access request and a second logical state indicative of granting the refresh access request to the memory cells of the PSRAM device.

Abstract: An arbitration control circuit in a pseudo-static random access memory (PSRAM) device includes a set-reset latch circuit receiving a normal access request signal and a refresh access request signal as first and second input signals and generating a first output signal having zero or more signal transitions in response to the order the first input signal and the second input signal is asserted. The arbitration control circuit further includes a unidirectional delay circuit applying a unidirectional delay to the first output signal and a D-flip-flop circuit latching the first output signal as data in response to the delayed signal as clock. The D-flip-flop generates a second output signal having a first logical state indicative of granting the normal access request and a second logical state indicative of granting the refresh access request to the memory cells of the PSRAM device.

Abstract: A sense amplifier circuit implements a sense scheme using sense amplifier feedback control to disconnect the bit lines from the sense circuit during the read operation after the bit line signals are sensed. In this manner, read disturbance during the read operation is prevented. In some embodiments, the sense amplifier circuit includes a pair of pass gates to couple a pair of differential bit lines to a sense circuit. The sense amplifier circuit further includes a feedback control circuit to open the pair of pass gates in response to at least one of the sensed signals at the sense circuit changing logical state. The pair of pass gates are opened to disconnect the pair of differential bit lines from the sense circuit.

Abstract: A sense amplifier circuit implements a sense scheme using sense amplifier feedback control to disconnect the bit lines from the sense circuit during the read operation after the bit line signals are sensed. In this manner, read disturbance during the read operation is prevented. In some embodiments, the sense amplifier circuit includes a pair of pass gates to couple a pair of differential bit lines to a sense circuit. The sense amplifier circuit further includes a feedback control circuit to open the pair of pass gates in response to at least one of the sensed signals at the sense circuit changing logical state. The pair of pass gates are opened to disconnect the pair of differential bit lines from the sense circuit.

Abstract: An arbitration control circuit in a pseudo-static random access memory (PSRAM) device includes a set-reset latch circuit receiving a normal access request signal and a refresh access request signal as first and second input signals and generating a first output signal having zero or more signal transitions in response to the order the first input signal and the second input signal is asserted. The arbitration control circuit further includes a unidirectional delay circuit applying a unidirectional delay to the first output signal and a D-flip-flop circuit latching the first output signal as data in response to the delayed signal as clock. The D-flip-flop generates a second output signal having a first logical state indicative of granting the normal access request and a second logical state indicative of granting the refresh access request to the memory cells of the PSRAM device.

Abstract: A memory device incorporates a chip enable protection circuit implementing a secured chip enable method providing a passcode protected enable scheme with secure chip disable for the memory device. The passcode can be programmed at manufacturing or programmed by the user. Memory device access is enabled by receiving the correct passcode and memory device access is denied when the wrong passcode is entered. Furthermore, the secured chip enable method implements secure chip disable where the memory device is disabled in response to receiving wrong passcodes repeatedly for a maximum number of tries.

Abstract: A memory device incorporates a chip enable protection circuit implementing a secured chip enable method providing a passcode protected enable scheme with secure chip disable for the memory device. The passcode can be programmed at manufacturing or programmed by the user. Memory device access is enabled by receiving the correct passcode and memory device access is denied when the wrong passcode is entered. Furthermore, the secured chip enable method implements secure chip disable where the memory device is disabled in response to receiving wrong passcodes repeatedly for a maximum number of tries.

Abstract: A resistive memory device implements a selective refresh operation in which only memory cells with reduced sense margin are refreshed. In some embodiments, the selective refresh operation introduces a sense margin guardband so that a memory cell having programmed resistance that falls within the sense margin guardband will be refreshed during the read operation. The selective refresh operation is performed transparently at each read cycle of the memory cells and only memory cells with reduced sense margins are refreshed.

Abstract: A resistive memory device implements a selective refresh operation in which only memory cells with reduced sense margin are refreshed. In some embodiments, the selective refresh operation introduces a sense margin guardband so that a memory cell having programmed resistance that falls within the sense margin guardband will be refreshed during the read operation. The selective refresh operation is performed transparently at each read cycle of the memory cells and only memory cells with reduced sense margins are refreshed.

Abstract: A resistive memory device implements a selective refresh operation in which only memory cells with reduced sense margin are refreshed. In some embodiments, the selective refresh operation introduces a sense margin guardband so that a memory cell having programmed resistance that falls within the sense margin guardband will be refreshed during the read operation. The selective refresh operation is performed transparently at each read cycle of the memory cells and only memory cells with reduced sense margins are refreshed.

Abstract: A method in a resistive memory device includes configuring two or more memory cells in a column of the array sharing the same bit line and the same source line to operate in parallel as a merged memory cell; programming the resistance of the merged memory cell in response to the write data, the resistance of the two or more resistive memory cells in the merged memory cell being programmed simultaneously; and reading the programmed resistance value of the merged memory cell, the programmed resistance of the two or more memory cells in the merged memory cell being read simultaneously.

Abstract: A circuit for detecting a signal transition on an input signal includes a mirror delay circuit and an input blocking circuit to prevent signal glitches or undesired signal pulses from being passed to the output signal node, thereby preventing signal distortions from being detected as a valid signal transition. The input transition detection circuit generates stable and correct transition detection pulses having a consistent pulse width.

Abstract: A resistive memory device implements a selective refresh operation in which only memory cells with reduced sense margin are refreshed. In some embodiments, the selective refresh operation introduces a sense margin guardband so that a memory cell having programmed resistance that falls within the sense margin guardband will be refreshed during the read operation. The selective refresh operation is performed transparently at each read cycle of the memory cells and only memory cells with reduced sense margins are refreshed.

Abstract: A resistive memory device incorporates a reference current generation circuit to generate a reference current for the sense amplifier that is immune to variation in the resistance of the reference resistive memory cells. In some embodiments, the reference current generation circuit uses reference resistive memory cells configured in the low resistance state only. The reference current generation circuit generates the reference current by combining a reference cell current and a bias current. The bias current is regulated by a feedback circuit in response to changes in the reference current to maintain the reference current at a substantially constant value and having a current value being an average of the cell currents for a resistive memory cell in the high resistance state and the low resistance state.

Abstract: A method in a resistive memory device includes configuring two or more memory cells in a column of the array sharing the same bit line and the same source line to operate in parallel as a merged memory cell; programming the resistance of the merged memory cell in response to the write data, the resistance of the two or more resistive memory cells in the merged memory cell being programmed simultaneously; and reading the programmed resistance value of the merged memory cell, the programmed resistance of the two or more memory cells in the merged memory cell being read simultaneously.

Abstract: A resistive memory device incorporates a reference current generation circuit to generate a reference current for the sense amplifier that is immune to variation in the resistance of the reference resistive memory cells. In some embodiments, the reference current generation circuit uses reference resistive memory cells configured in the low resistance state only. The reference current generation circuit generates the reference current by combining a reference cell current and a bias current. The bias current is regulated by a feedback circuit in response to changes in the reference current to maintain the reference current at a substantially constant value and having a current value being an average of the cell currents for a resistive memory cell in the high resistance state and the low resistance state.