Patents by Inventor Seung H. Kang

Seung H. Kang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9244853
    Abstract: A multi-core processor is presented. The multi-core processor includes a first spin transfer torque magnetoresistive random-access memory (STT-MRAM) cache associated with a first core of the multi-core processor and tuned according to first attributes and a second STT-MRAM cache associated with a second core of the multi-core processor and tuned according to second attributes.
    Type: Grant
    Filed: August 10, 2012
    Date of Patent: January 26, 2016
    Assignee: QUALCOMM Incorporated
    Inventors: Seung H. Kang, Xiaochun Zhu, Xiaoxia Wu
  • Publication number: 20160020383
    Abstract: A method for integrating a magnetic tunnel junction (MTJ) device into an integrated circuit includes providing in a semiconductor back-end-of-line (BEOL) process flow a substrate having a first interlevel dielectric layer and at least a first conductive interconnect. Over the first interlevel dielectric layer and the first conductive interconnect, magnetic tunnel junction material layers are deposited. From the material layers a magnetic tunnel junction stack, coupled to the first conductive interconnect, is defined using a single mask process. The magnetic tunnel junction stack is integrated into the integrated circuit.
    Type: Application
    Filed: September 30, 2015
    Publication date: January 21, 2016
    Inventors: Seung H. KANG, David BANG, Kangho LEE
  • Patent number: 9230630
    Abstract: One feature pertains to a method for implementing a physically unclonable function (PUF). The method includes providing an array of magnetoresistive random access memory (MRAM) cells, where the MRAM cells are each configured to represent one of a first logical state and a second logical state. The array of MRAM cells are un-annealed and free from exposure to an external magnetic field oriented in a direction configured to initialize the MRAM cells to a single logical state of the first and second logical states. Consequently, each MRAM cell has a random initial logical state of the first and second logical states. The method further includes sending a challenge to the MRAM cell array that reads logical states of select MRAM cells of the array, and obtaining a response to the challenge from the MRAM cell array that includes the logical states of the selected MRAM cells of the array.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: January 5, 2016
    Assignee: QUALCOMM Incorporated
    Inventors: Xiaochun Zhu, Steven M. Millendorf, Xu Guo, David M. Jacobson, Kangho Lee, Seung H. Kang, Matthew Michael Nowak
  • Patent number: 9214624
    Abstract: A perpendicular magnetic tunnel junction (MTJ) apparatus includes a tunnel magnetoresistance (TMR) enhancement buffer layer deposited between the tunnel barrier layer and the reference layers An amorphous alloy spacer is deposited between the TMR enhancement buffer layer and the reference layers to enhance TMR The amorphous alloy spacer blocks template effects of face centered cubic (fcc) oriented pinned layers and provides strong coupling between the pinned layers and the TMR enhancement buffer layer to ensure full perpendicular magnetization.
    Type: Grant
    Filed: February 19, 2013
    Date of Patent: December 15, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Kangho Lee, Wei-Chuan Chen, Seung H. Kang
  • Patent number: 9214214
    Abstract: One feature pertains to a method of implementing a physically unclonable function (PUF). The method includes exposing an array of magnetoresistive random access memory (MRAM) cells to an orthogonal external magnetic field. The MRAM cells are each configured to represent one of a first logical state and a second logical state, and the orthogonal external magnetic field is oriented in an orthogonal direction to an easy axis of a free layer of the MRAM cells to place the MRAM cells in a neutral logical state that is not the first logical state or the second logical state. The method further includes removing the orthogonal external magnetic field to place each of the MRAM cells of the array randomly in either the first logical state or the second logical state.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: December 15, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Xiaochun Zhu, Steven M. Millendorf, Xu Guo, David M. Jacobson, Kangho Lee, Seung H. Kang, Matthew Michael Nowak
  • Patent number: 9203013
    Abstract: An apparatus includes a structure that includes a bottom cap layer surrounding a metal pad. The apparatus also includes a magnetic tunnel junction (MTJ) device that includes a bottom electrode coupled to the structure. The MTJ device includes magnetic tunnel junction layers, a top electrode, and a logic cap layer. The MTJ device is offset with respect to the metal pad.
    Type: Grant
    Filed: April 29, 2013
    Date of Patent: December 1, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Xia Li, Seung H. Kang, Xiaochun Zhu
  • Patent number: 9196337
    Abstract: A low sensing current non volatile flip flop includes a first stage to sense a resistance difference between two magnetic tunnel junctions (MTJs) and a second stage having circuitry to amplify the output of the first stage. The output of the first stage is initially pre-charged and determined by the resistance difference of the two MTJs when the sensing operation starts. The first stage does not have a pull-up path to a source voltage (VDD), and therefore does not have a DC path from VDD to ground during the sensing operation. A slow sense enable (SE) signal slope reduces peak sensing current in the first stage. A secondary current path reduces the sensing current duration of the first stage.
    Type: Grant
    Filed: September 13, 2012
    Date of Patent: November 24, 2015
    Assignees: QUALCOMM Incorporated, Industry-Academic Cooperation Foundation, Yonsei University
    Inventors: Seong-Ook Jung, Youngdon Jung, Kyungho Ryu, Jisu Kim, Jung Pill Kim, Seung H. Kang
  • Patent number: 9196334
    Abstract: A hierarchical memory magnetoresistive random-access memory architecture is disclosed. In a particular embodiment, an apparatus includes a first magnetoresistive random-access memory (MRAM) device corresponding to a first level in a hierarchical memory system. The apparatus includes a second MRAM device corresponding to a second level in the hierarchical memory system. The first MRAM device has a first access latency and includes a first magnetic tunnel junction (MTJ) device having a first physical configuration. The second MRAM device has a second access latency and includes a second MTJ device having a second physical configuration. The first access latency is less than the second access latency.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: November 24, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Seung H. Kang, Xiaochun Zhu
  • Patent number: 9190201
    Abstract: An integrated magnetic film enhanced inductor and a method of forming an integrated magnetic film enhanced inductor are disclosed. The integrated magnetic film enhanced inductor includes an inductor metal having a first portion and a second portion, a top metal or bottom metal coupled to the inductor metal, and an isolation film disposed one of in, on, and adjacent to at least one of the first portion and the second portion of the inductor metal. The isolation film includes a magnetic material, such as a magnetic film.
    Type: Grant
    Filed: March 4, 2009
    Date of Patent: November 17, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Xia Li, Matthew Nowak, Seung H. Kang, Brian Matthew Henderson
  • Patent number: 9189201
    Abstract: An entropy source and a random number (RN) generator are disclosed. In one aspect, a low-energy entropy source includes a magneto-resistive (MR) element and a sensing circuit. The MR element is applied a static current and has a variable resistance determined based on magnetization of the MR element. The sensing circuit senses the resistance of the MR element and provides random values based on the sensed resistance of the MR element. In another aspect, a RN generator includes an entropy source and a post-processing module. The entropy source includes at least one MR element and provides first random values based on the at least one MR element. The post-processing module receives and processes the first random values (e.g., based on a cryptographic hash function, an error detection code, a stream cipher algorithm, etc.) and provides second random values having improved randomness characteristics.
    Type: Grant
    Filed: February 6, 2012
    Date of Patent: November 17, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: David M. Jacobson, Xiaochun Zhu, Wenqing Wu, Kendrick Hoy Leong Yuen, Seung H. Kang
  • Patent number: 9164729
    Abstract: A method and apparatus for generating random binary sequences from a physical entropy source having a state A and a state B by detecting whether the physical entropy source is in the state A or in the state B, attempting to shift the state of the physical entropy source to the opposite state in a probabilistic manner with less than 100% certainty, and producing one of four outputs based on the detected state and the state of the physical entropy source before the attempted shift. The outputs are placed in first and second queues and extracted in pairs from each queue. Random binary bits are output based on the sequences extracted from each queue.
    Type: Grant
    Filed: February 5, 2013
    Date of Patent: October 20, 2015
    Assignee: QUALCOMM INCORPORATED
    Inventors: Wenqing Wu, Peiyuan Wang, Raghu Sagar Madala, Senthil Kumar Govindaswamy, Kendrick H. Yuen, Robert P. Gilmore, Jung Pill Kim, Seung H. Kang
  • Patent number: 9159910
    Abstract: A method for integrating a magnetic tunnel junction (MTJ) device into an integrated circuit includes providing in a semiconductor back-end-of-line (BEOL) process flow a substrate having a first interlevel dielectric layer and at least a first metal interconnect. Over the first interlevel dielectric layer and the first metal interconnect, magnetic tunnel junction material layers are deposited. From the material layers a magnetic tunnel junction stack, coupled to the first metal interconnect, is defined using a single mask process. The magnetic tunnel junction stack is integrated into the integrated circuit.
    Type: Grant
    Filed: January 19, 2009
    Date of Patent: October 13, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Seung H. Kang, David Bang, Kangho Lee
  • Patent number: 9136463
    Abstract: In a particular embodiment, a method is disclosed that includes forming a magnetic tunnel junction (MTJ) structure including a conductive layer on a substrate. The method also includes depositing a sacrificial layer on the conductive layer before depositing a patterning film layer.
    Type: Grant
    Filed: November 20, 2007
    Date of Patent: September 15, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Xia Li, Seung H. Kang, Xiaochun Zhu
  • Patent number: 9110746
    Abstract: Embodiments of the disclosure are directed to generating a random number. An embodiment of the disclosure passes a current from a read operation through a magnetic tunnel junction (MTJ) to cause a first magnetization orientation of a free layer to switch to a second magnetization orientation, the switch in magnetization orientation causing a change in a resistance of the MTJ, and periodically samples the resistance of the MTJ to generate a bit value for the random number.
    Type: Grant
    Filed: September 4, 2012
    Date of Patent: August 18, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Xiaochun Zhu, Wenqing Wu, David M. Jacobson, Seung H. Kang, Kendrick H. Yuen
  • Patent number: 9105310
    Abstract: A method includes creating a breakdown condition at a semiconductor transistor structure that includes an overlap region and a channel region. The breakdown condition is created by causing a first voltage difference between a gate of the semiconductor transistor structure and the overlap region to exceed a breakdown voltage of the semiconductor transistor structure while maintaining a second voltage difference between the gate and the channel region at less than the breakdown voltage.
    Type: Grant
    Filed: February 5, 2013
    Date of Patent: August 11, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Xia Li, Seung H. Kang, Xiaochun Zhu
  • Patent number: 9105340
    Abstract: A memory cell comprises a magnetic tunnel junction (MTJ) structure that includes a free layer coupled to a bit line and a pinned layer. A magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state. The pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line.
    Type: Grant
    Filed: September 16, 2013
    Date of Patent: August 11, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Kangho Lee, Seung H. Kang, Xiachun Zhu
  • Patent number: 9093149
    Abstract: A one time programmable (OPT) and multiple time programmable (MTP) structure is constructed in a back end of line (BEOL) process using only one, two or three masks. The OTP/MTP structure can be programmed in one of three states, a pre-programmed high resistance state, and a programmable low resistance state and a programmable very high resistance state. In the programmable low resistance state, a barrier layer is broken down during an anti-fuse programming so that the OTP/MTP structure exhibits resistance in the hundred ohm order of magnitude. In the very high resistance state a conductive fuse is blown open during programming so that the OTP/MTP structure exhibits resistance in the mega-ohm order of magnitude. The OTP/MTP structure may include a magnetic tunnel junction (MTJ) structure or a metal-insulator-metal (MIM) capacitor structure.
    Type: Grant
    Filed: September 4, 2012
    Date of Patent: July 28, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Xia Li, Seung H. Kang
  • Patent number: 9064589
    Abstract: A two-transistor one-MTJ (2T1MTJ) three port structure includes two separate pin layer structures coupled to one free layer structure. The pin layer structures may include an anti-ferromagnetic layer (AFM) layer coupled to a pin layer. The free layer structure includes free layer coupled to a barrier layer and a cap layer. The free layer structure may include a thin barrier layer coupled to each of the pin layer stacks. The three port MTJ structure provides separate write and read paths which improve read sensing margin without increasing write voltage or current. The three port MTJ structure may be fabricated with a simple two step MTJ etch process.
    Type: Grant
    Filed: January 24, 2012
    Date of Patent: June 23, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Xia Li, Xiaochun Zhu, Seung H. Kang, Jung Pill Kim, Wah Nam Hsu, Taehyun Kim, Kangho Lee
  • Patent number: 9047964
    Abstract: A Multi-Level Memory Cell (MLC) using multiple Magnetic Tunnel Junction (MTJ) structures having one or more layers with varying thickness is disclosed. The multiple MTJ structures, which are vertically stacked and arranged in series, may have substantially identical area dimensions to minimize fabrication costs because one mask can be used to pattern the multiple MTJ structures. Further, varying the thicknesses associated with the one or more layers may provide the multiple MTJ structures with different switching current densities and thereby increase memory density and improve read and write operations. In one embodiment, the layers with the varying thicknesses may include tunnel barriers or magnesium oxide layers associated with the multiple MTJ structures and/or free layers associated with the multiple MTJ structures.
    Type: Grant
    Filed: August 20, 2012
    Date of Patent: June 2, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Kangho Lee, Taehyun Kim, Jung Pill Kim, Seung H. Kang
  • Patent number: 9014749
    Abstract: A system and method to initiate a housekeeping operation at a mobile device is disclosed. In a particular embodiment, a method at a mobile device includes modifying a scheduled housekeeping operation in response to determining that the mobile device is in a charging mode.
    Type: Grant
    Filed: August 12, 2010
    Date of Patent: April 21, 2015
    Assignee: QUALCOMM Incorporated
    Inventors: Thomas R. Toms, Hari M. Rao, Seung H. Kang, Jung Pill Kim, Jungwon Suh