Abstract: The present invention discloses a door-in-door having a display screen assembly and a refrigerator having the same. The door-in-door comprises a first door body and a second door body; the first door body has a transparent panel, and the second door body is provided with a display screen assembly. When the first door body closes the cabinet, a display interface of the display screen assembly is displayed through the transparent panel of the first door body. According to the present invention, an operation state of the refrigerator can be learnt about without opening the first door body.

Abstract: Moisture-driven degradation of a crack stop in a semiconductor die is mitigated by forming a groove in an upper surface of the die between an edge of the die and the crack stop; entirely filling the groove with a moisture barrier material; preventing moisture penetration of the semiconductor die by presence of the moisture barrier material; and dissipating mechanical stress in the moisture barrier material without presenting a stress riser in the bulk portion of the die. The moisture barrier material is at least one of moisture-absorbing, moisture adsorbing, and hydrophobic.

Abstract: The present invention discloses a surface light source assembly and a refrigerator having the same. The surface light source assembly comprises: a light source and a light guide plate which is vertically illuminated by the light source, wherein the light source is provided along a first side of the light guide plate; a plurality of light guide spots is provided at a front surface of the light guide plate, a through hole is vertically formed in the middle of the light guide plate; a first region is provided at a position close to the upper edge of the through hole, the diameter and density of the light guide spots in the first region are less than the diameter and density of the light guide spots in the peripheral region of the first region.

Abstract: An aquatic weed planting plate for an aquarium is disclosed. The aquatic weed planting plate for aquarium includes a plate body and at least four feet. A plurality of planting holes is formed in the plate body at intervals. A plurality of dirt collecting holes is formed around each planting hole. The plate body is provided with fixing devices for fixing aquatic weeds, and each fixing device corresponds to one planting hole. The fixing device includes a fixing sleeve, two clamping members and a luminous ring. The plate body is provided with nets for collecting dirt, each net corresponds to one dirt collecting hole, the lower portion of each net is provided with a connecting tube; a plurality of conveying pipes is also arranged below the plate body, each conveying pipe is communicated with the plurality of connecting tubes, each connecting tube is communicated with the corresponding conveying pipe.

Abstract: Embodiments of the present invention relate to an heterogenous thermal interface material (TIM). The heterogenous TIM includes two or more different materials. One material has a low elastic modulus, also known as Young's modulus, and is utilized primarily to transfer heat from one component to another component. Another material has a higher elastic modulus and is primarily utilized to bond or connect the corners and/or edges of one component to the other component. The high elastic modulus material is generally located within the heterogenous TIM where TIM strain is or is expected to be high. For example, the high elastic modulus material may be located at the corner and/or edge regions of the heterogenous TIM.

Abstract: Systems and/or techniques associated with active control of electronic package warpage are provided. In one example, a system includes an electronic package and an integrated circuit. The electronic package includes a patterned structural material associated with a mechanical characteristic that changes in response to an applied condition. The integrated circuit controls the applied condition associated with the patterned structural material based on sensor data associated with a status of the electronic package.

Abstract: A heat spreader is disclosed with regions where material is absent to reduce the mass/weight of the heat spreader without substantially reducing the temperature of the semiconductor chip and without substantially affecting the warpage and mechanical stress/strain in the electronic package.

Abstract: Embodiments of the present invention relate to an heterogenous thermal interface material (TIM). The heterogenous TIM includes two or more different materials. One material has a low elastic modulus, also known as Young's modulus, and is utilized primarily to transfer heat from one component to another component. Another material has a higher elastic modulus and is primarily utilized to bond or connect the corners and/or edges of one component to the other component. The high elastic modulus material is generally located within the heterogenous TIM where TIM strain is or is expected to be high. For example, the high elastic modulus material may be located at the corner and/or edge regions of the heterogenous TIM.

Abstract: A laminate structure includes a conductive layer and a dielectric layer in contact with the conductive layer, the dielectric layer comprises a selectively patterned high-modulus dielectric material that balances a differential stress between the conductive layer and the dielectric layer to mechanically stiffen the laminate structure and reduce warpage.

Abstract: A multiple chip carrier assembly including a carrier having a first surface and a second surface is attached to a plurality of chips is described. The plurality of chips include a first chip and a second chip. Each of the chips has first surface with a first set of solder balls for connecting to a package and a second set of solder balls for connecting to a high signal density bridge element. A second surface of each chip is bonded to the first surface of the carrier. A package has a first surface which is connected to the first sets of solder balls of the first and second chips. A high signal density bridge element having high signal density wiring on one or more layers is connected to the second sets of solder balls of the first and second chips. The bridge element is disposed between the first surface of the package and the first surfaces of the first and second chips.

Abstract: The present invention discloses a surface light source assembly and a refrigerator having the same. The surface light source assembly comprises: a light source and a light guide plate which is vertically illuminated by the light source, wherein the light source is provided along a first side of the light guide plate; a plurality of light guide spots is provided at a front surface of the light guide plate, a through hole is vertically formed in the middle of the light guide plate; a first region is provided at a position close to the upper edge of the through hole, the diameter and density of the light guide spots in the first region are less than the diameter and density of the light guide spots in the peripheral region of the first region.

Abstract: An integrated circuit (IC) chip carrier includes an IC chip electrically connected to an IC chip carrier by a plurality of chip-carrier contacts, a cover thermally connected the IC chip upper surface, and an in-plane thermal conductance (ITC) layer upon the IC chip carrier between the IC chip carrier and the IC chip. The ITC layer includes an extension tab connected to a vertical side surface of the cover. Heat is transferred vertically from the IC chip to the cover. Heat is also transferred vertically from the IC chip to the ITC layer. Heat is also transferred within the ITC layer through the ITC layer basal plane(s). The ITC layer basal plane(s) are positioned horizontally where the ITC layer is between the IC chip and the IC chip carrier. The ITC layer basal planes are positioned vertically where the extension tab contacts the vertical side surface of the cover.

Abstract: Moisture-driven degradation of a crack stop in a semiconductor die is mitigated by forming a groove in an upper surface of the die between an edge of the die and the crack stop; entirely filling the groove with a moisture barrier material; preventing moisture penetration of the semiconductor die by presence of the moisture barrier material; and dissipating mechanical stress in the moisture barrier material without presenting a stress riser in the bulk portion of the die. The moisture barrier material is at least one of moisture-absorbing, moisture adsorbing, and hydrophobic.

Abstract: A technique relates to an electronic package. A substrate is configured to receive a chip. A stiffener is attached to the substrate. The stiffener includes a core material with a first material formed on opposing sides of the core material.

Abstract: A semiconductor device which includes a substrate having integrated circuits; and metallization layers on the substrate, the metallization layers having a peripheral region adjacent to a kerf region of the semiconductor device and containing a crack stop structure. The crack stop structure includes a bottom portion containing a plurality of the metallization layers connected by vias with each metallization layer decreasing in width in a step pyramid structure from a bottom of the bottom portion to a top of the bottom portion; and a top portion containing a top metallization layer of the metallization layers connected to the bottom portion, the top metallization layer being wider than a top-most metallization layer of the bottom portion and having a segment that extends toward the kerf region so as to create an overhang with respect to the bottom portion.

Abstract: A semiconductor device which includes a substrate having integrated circuits; and metallization layers on the substrate, the metallization layers having a peripheral region adjacent to a kerf region of the semiconductor device and containing a crack stop structure. The crack stop structure includes a bottom portion containing a plurality of the metallization layers connected by vias with each metallization layer decreasing in width in a step pyramid structure from a bottom of the bottom portion to a top of the bottom portion; and a top portion containing a top metallization layer of the metallization layers connected to the bottom portion, the top metallization layer being wider than a top-most metallization layer of the bottom portion and having a segment that extends toward the kerf region so as to create an overhang with respect to the bottom portion.

Abstract: An integrated circuit (IC) device carrier, such as a chip carrier, die carrier, or the like, includes a contact that locally reduces laminate strain within the IC device carrier. One type of contact pad described includes tapered sidewall(s). For example, a positively tapered contact pad includes one or more sidewalls obtusely angled relative to the contact surface of the IC carrier and a negatively tapered contact pad includes one or more sidewalls acutely angled relative to the contact surface of the IC carrier. Another type of contact pad described includes a contact pad connected to one or more pillars. The pillar(s) are also connected to a ring formed within an internal wiring level of the IC device carrier.

Abstract: An electronic package includes a carrier and a semiconductor chip. In a first aspect, a lid is attached to the chip and subsequently the gap between the lid and the carrier is filled by a seal band that includes seal band material and a plurality of shim members. In another aspect, an interleaved seal band includes a pattern of a first type of seal band material and a second type of seal band material. In another aspect, the lid includes a plurality of surfaces at different topographies to reduce the thickness of the seal band between the topographic lid and the carrier. In yet another aspect the electronic package further includes a frame concentric with the chip. The lid is attached to the frame with a solder, epoxy or elastomer and placed on the chip with a thermal interface material. The seal band material is dispensed on the chip carrier and the frame is then moved towards the chip carrier allowing a minimum seal band thickness.

Abstract: An integrated circuit (IC) chip carrier includes an IC chip electrically connected to an IC chip carrier by a plurality of chip-carrier contacts, a cover thermally connected the IC chip upper surface, and an in-plane thermal conductance (ITC) layer upon the IC chip carrier between the IC chip carrier and the IC chip. The ITC layer includes an extension tab connected to a vertical side surface of the cover. Heat is transferred vertically from the IC chip to the cover. Heat is also transferred vertically from the IC chip to the ITC layer. Heat is also transferred within the ITC layer through the ITC layer basal plane(s). The ITC layer basal plane(s) are positioned horizontally where the ITC layer is between the IC chip and the IC chip carrier. The ITC layer basal planes are positioned vertically where the extension tab contacts the vertical side surface of the cover.

Abstract: An integrated circuit (IC) chip carrier includes an IC chip electrically connected to an IC chip carrier by a plurality of chip-carrier contacts, a cover thermally connected the IC chip upper surface, and an in-plane thermal conductance (ITC) layer upon the IC chip carrier between the IC chip carrier and the IC chip. The ITC layer includes an extension tab connected to a vertical side surface of the cover. Heat is transferred vertically from the IC chip to the cover. Heat is also transferred vertically from the IC chip to the ITC layer. Heat is also transferred within the ITC layer through the ITC layer basal plane(s). The ITC layer basal plane(s) are positioned horizontally where the ITC layer is between the IC chip and the IC chip carrier. The ITC layer basal planes are positioned vertically where the extension tab contacts the vertical side surface of the cover.