Abstract: A client device is fabricated using a semiconductor fabrication process. One or more uncontrollable random physical processes in the semiconductor fabrication process can cause small differences between the client device and other client devices. When the client device is presented with a challenge from a server device, the client device generates a random response that depends on its physical properties. The server device stores this random response as a part of a virtual PUF circuitry storage device having other random responses from the other client devices. The server device uses the random response of the client device stored in the virtual PUF circuitry storage device for one or more encryption algorithms to encrypt information to be provided to the client device.

Abstract: Some embodiments include apparatuses and methods having an interface to receive information from memory cells, the memory cells configured to have a plurality of states to indicate values of information stored in the memory cells, and a control unit to monitor errors in information retrieved from the memory cells. Based on the errors in the information, the control unit generates control information to cause the memory cell to change to from a state among the plurality of states to an additional state. The additional state is different from the plurality of states.

Abstract: An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.

Abstract: Some embodiments include apparatuses and methods having an interface to receive information from memory cells, the memory cells configured to have a plurality of states to indicate values of information stored in the memory cells, and a control unit to monitor errors in information retrieved from the memory cells. Based on the errors in the information, the control unit generates control information to cause the memory cell to change to from a state among the plurality of states to an additional state. The additional state is different from the plurality of states.

Abstract: Techniques are described that includes using a memory to store data within a system. The techniques include lowering a supply voltage applied to said memory and ceasing use of the memory to store data within the system. The techniques further include reading values from the memory with the supply voltage being lowered. The techniques further include determining a radiation level from an amount of corrupted ones of the values.

Abstract: Embodiments include apparatuses and systems including a circuit which increases a speed of removal of data stored in a memory cell. In embodiments, the circuit includes a first discharge device coupled to an access transistor of a memory cell and coupled to an output terminal of a charge pump circuit to pull up a first voltage level at the output terminal to ground in response to a signal to accelerate leakage of a first leakage current; and a second discharge device coupled to a voltage generator circuit to pull down a second voltage level at a cell plate node of the memory cell to ground in response to the signal to accelerate leakage of a second leakage current, wherein the cell plate node is coupled to a storage node of the memory cell by a capacitor. Other embodiments may also be described and claimed.

Abstract: Techniques are described that includes using a memory to store data within a system. The techniques include lowering a supply voltage applied to said memory and ceasing use of the memory to store data within the system. The techniques further include reading values from the memory with the supply voltage being lowered. The techniques further include determining a radiation level from an amount of corrupted ones of the values.

Abstract: An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.

Abstract: Embodiments include apparatuses, methods, and systems including a circuit which may increase a speed of removal of data stored in a memory cell. In embodiments, the circuit may include a control logic to detect a signal and a boost circuit coupled to the control logic to allow the control logic to disable an operation of the boost circuit in response to detection of the signal. A discharge device may be coupled to the boost circuit to accelerate leakage of a leakage current in response to the detection of the signal. In the embodiment, the leakage current is a leakage current of a memory cell coupled to the discharge device and acceleration of the leakage of the leakage current and the disablement of the operation of the boost circuit may increase a speed of erasure of data in the memory cell. Other embodiments may also be described and claimed.

Abstract: Embodiments include apparatuses, methods, and systems including a circuit which may increase a speed of removal of data stored in a memory cell. In embodiments, the circuit may include a control logic to detect a signal and a boost circuit coupled to the control logic to allow the control logic to disable an operation of the boost circuit in response to detection of the signal. A discharge device may be coupled to the boost circuit to accelerate leakage of a leakage current in response to the detection of the signal. In the embodiment, the leakage current is a leakage current of a memory cell coupled to the discharge device and acceleration of the leakage of the leakage current and the disablement of the operation of the boost circuit may increase a speed of erasure of data in the memory cell. Other embodiments may also be described and claimed.

Abstract: Apparatus, systems, and methods for data movement in a memory device are described. In one embodiment, a memory controller comprises logic to move a row of data from a first row of a memory in a first section of a memory device to a second row of memory in a second section of the memory device without passing the data through a communication interface. Other embodiments are also disclosed and claimed.

Abstract: Some embodiments include apparatuses and methods having an interface to receive information from memory cells, the memory cells configured to have a plurality of states to indicate values of information stored in the memory cells, and a control unit to monitor errors in information retrieved from the memory cells. Based on the errors in the information, the control unit generates control information to cause the memory cell to change to from a state among the plurality of states to an additional state. The additional state is different from the plurality of states.

Abstract: Embodiments include apparatuses, methods, and systems including a circuit which may increase a speed of removal of data stored in a memory cell. In embodiments, the circuit may include a control logic to detect a signal and a boost circuit coupled to the control logic to allow the control logic to disable an operation of the boost circuit in response to detection of the signal. A discharge device may be coupled to the boost circuit to accelerate leakage of a leakage current in response to the detection of the signal. In the embodiment, the leakage current is a leakage current of a memory cell coupled to the discharge device and acceleration of the leakage of the leakage current and the disablement of the operation of the boost circuit may increase a speed of erasure of data in the memory cell. Other embodiments may also be described and claimed.

Abstract: An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.

Abstract: An apparatus is described that includes a semiconductor chip memory array having resistive storage cells. The apparatus also includes a comparator to compare a first word to be written into the array against a second word stored in the array at the location targeted by a write operation that will write the first word into the array. The apparatus also includes circuitry to iteratively write to one or more bit locations where a difference exists between the first word and the second word with increasing write current intensity with each successive iteration.

Abstract: In one embodiment, the present invention includes a translation lookaside buffer (TLB) to store entries each having a translation portion to store a virtual address (VA)-to-physical address (PA) translation and a second portion to store bits for a memory page associated with the VA-to-PA translation, where the bits indicate attributes of information in the memory page. Other embodiments are described and claimed.

Abstract: Systems and methods may provide for determining whether a memory access request is error-tolerant, and routing the memory access request to a reliable memory region if the memory access request is error-tolerant. Moreover, the memory access request may be routed to an unreliable memory region if the memory access request is error-tolerant. In one example, use of the unreliable memory region enables a reduction in the minimum operating voltage level for a die containing the reliable and unreliable memory regions.

Abstract: Apparatus, systems, and methods for data movement in a memory device are described. In one embodiment, a memory controller comprises logic to move a row of data from a first row of a memory in a first section of a memory device to a second row of memory in a second section of the memory device without passing the data through a communication interface. Other embodiments are also disclosed and claimed.

Abstract: In one embodiment, the present invention includes a translation lookaside buffer (TLB) to store entries each having a translation portion to store a virtual address (VA)-to-physical address (PA) translation and a second portion to store bits for a memory page associated with the VA-to-PA translation, where the bits indicate attributes of information in the memory page. Other embodiments are described and claimed.

Abstract: Some embodiments include a counter having a first generator to generate signals having different frequencies, and a second generator to generate counter values of the counter. Each of the counter values may be based at least in part on a number of transitions of a respective signal among the signals. Other embodiments are described.