Patents by Inventor Sriram Muthukumar

Sriram Muthukumar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060038289
    Abstract: Some embodiments of the present invention include integrated inductors and compliant interconnects for semiconductor packaging.
    Type: Application
    Filed: October 14, 2005
    Publication date: February 23, 2006
    Inventors: Rockwell Hsu, Sriram Muthukumar, Jiangqi He
  • Publication number: 20060033172
    Abstract: Embodiments of the invention provide a first component with a compliant interconnect bonded to a second component with a land pad by a metal to metal bond. In some embodiments, the first component may be a microprocessor die and the second component a package substrate.
    Type: Application
    Filed: August 11, 2004
    Publication date: February 16, 2006
    Inventors: Sriram Muthukumar, Shriram Ramanathan
  • Patent number: 6979489
    Abstract: In the present invention, there are provided self-assembled ZnO nanotips grown on relatively low temperatures on various substrates by metalorganic chemical vapor deposition (MOCVD). The ZnO nanotips are made at relatively low temperatures, giving ZnO a unique advantage over other wide bandgap semiconductors such as GaN and SiC. The nanotips have controlled uniform size, distribution and orientation. These ZnO nanotips are of single crystal quality, show n-type conductivity and have good optical properties. Selective growth of ZnO nanotips also has been realized on patterned (100) silicon on r-sapphire (SOS), and amorphous SiO2 on r-sapphire substrates. Self-assembled ZnO nanotips can also be selectively grown on patterned layers or islands made of a semiconductor, an insulator or a metal deposited on R-plane (01{overscore (1)}2) Al2O3 substrates as long as the ZnO grows in a columnar stucture along the c-axis [0001] of ZnO on these materials.
    Type: Grant
    Filed: September 13, 2002
    Date of Patent: December 27, 2005
    Assignee: Rutgers, The State University of New Jersey
    Inventors: Yicheng Lu, Sriram Muthukumar, Nuri William Emanetoglu
  • Publication number: 20050239275
    Abstract: A compliant interconnect with two or more layers of metal of two or more compositions with internal stresses is described herein.
    Type: Application
    Filed: April 26, 2004
    Publication date: October 27, 2005
    Inventors: Sriram Muthukumar, Thomas Dory
  • Publication number: 20050145970
    Abstract: In the present invention, there is provided semiconductor devices such as a Schottky UV photodetector fabricated on n-type ZnO and MgxZn1-xO epitaxial films. The ZnO and MgxZn1-xO films are grown on R-plane sapphire substrates and the Schottky diodes are fabricated on the ZnO and MgxZn1-xO films using silver and aluminum as Schottky and ohmic contact metals, respectively. The Schottky diodes have circular patterns, where the inner circle is the Schottky contact, and the outside ring is the ohmic contact. Ag Schottky contact patterns are fabricated using standard liftoff techniques, while the Al ohmic contact patterns are formed using wet chemical etching. These detectors show low frequency photoresponsivity, high speed photoresponse, lower leakage current and low noise performance as compared to their photoconductive counterparts. This invention is also applicable to optical modulators, Metal Semiconductor Field Effect Transistors (MESFETs) and more.
    Type: Application
    Filed: January 25, 2005
    Publication date: July 7, 2005
    Inventors: Yicheng Lu, Haifeng Sheng, Sriram Muthukumar, Nuri Emanetoglu, Jian Zhong, Shaohua Liang
  • Patent number: 6846731
    Abstract: In the present invention, there is provided semiconductor devices such as a Schottky UV photodetector fabricated on n-type ZnO and MgxZn1-xO epitaxial films. The ZnO and MgxZn1-xO films are grown on R-plane sapphire substrates and the Schottky diodes are fabricated on the ZnO and MgxZn1-xO films using silver and aluminum as Schottky and ohmic contact metals, respectively. The Schottky diodes have circular patterns, where the inner circle is the Schottky contact, and the outside ring is the ohmic contact. Ag Schottky contact patterns are fabricated using standard liftoff techniques, while the Al ohmic contact patterns are formed using wet chemical etching. These detectors show low frequency photoresponsivity, high speed photoresponse, lower leakage current and low noise performance as compared to their photoconductive counterparts. This invention is also applicable to optical modulators, Metal Semiconductor Field Effect Transistors (MESFETs) and more.
    Type: Grant
    Filed: May 30, 2002
    Date of Patent: January 25, 2005
    Assignee: Rutgers, The State University of New Jersey
    Inventors: Yicheng Lu, Haifeng Sheng, Sriram Muthukumar, Nuri William Emanetoglu, Jian Zhong
  • Publication number: 20030213428
    Abstract: In the present invention, there are provided self-assembled ZnO nanotips grown on relatively low temperatures on various substrates by metalorganic chemical vapor deposition (MOCVD). The ZnO nanotips are made at relatively low temperatures, giving ZnO a unique advantage over other wide bandgap semiconductors such as GaN and SiC. The nanotips have controlled uniform size, distribution and orientation. These ZnO nanotips are of single crystal quality, show n-type conductivity and have good optical properties. Selective growth of ZnO nanotips also has been realized on patterned (100) silicon on r-sapphire (SOS), and amorphous SiO2 on r-sapphire substrates. Self-assembled ZnO nanotips can also be selectively grown on patterned layers or islands made of a semiconductor, an insulator or a metal deposited on R-plane (01{overscore (1)}2) Al2O3 substrates as long as the ZnO grows in a columnar stucture along the c-axis [0001] of ZnO on these materials.
    Type: Application
    Filed: September 13, 2002
    Publication date: November 20, 2003
    Applicant: Rutgers, The State University of New Jersey
    Inventors: Yicheng Lu, Sriram Muthukumar, Nuri William Emanetoglu
  • Publication number: 20030129813
    Abstract: In the present invention, there is provided semiconductor devices such as a Schottky UV photodetector fabricated on n-type ZnO and MgxZn1-xO epitaxial films. The ZnO and MgxZn1-xO films are grown on R-plane sapphire substrates and the Schottky diodes are fabricated on the ZnO and MgxZn1-xO films using silver and aluminum as Schottky and ohmic contact metals, respectively. The Schottky diodes have circular patterns, where the inner circle is the Schottky contact, and the outside ring is the ohmic contact. Ag Schottky contact patterns are fabricated using standard liftoff techniques, while the Al ohmic contact patterns are formed using wet chemical etching. These detectors show low frequency photoresponsivity, high speed photoresponse, lower leakage current and low noise performance as compared to their photoconductive counterparts. This invention is also applicable to optical modulators, Metal Semiconductor Field Effect Transistors (MESFETs) and more.
    Type: Application
    Filed: May 30, 2002
    Publication date: July 10, 2003
    Applicant: Rutgers, The State University Of New Jersey
    Inventors: Yicheng Lu, Haifeng Sheng, Sriram Muthukumar, Nuri William Emanetoglu, Jian Zhong