Abstract: An imaging system comprising: a first lighting device that emits terahertz waves at a first quantity of light emission in a first operation mode, and emits terahertz waves at a second quantity of light emission, which is larger than the first quantity of light emission, in a second operation mode; a first detection device that detects reflected terahertz waves by a target and a control device that switches from the first operation mode to the second operation mode in a case where the first detection device detects the target in the first operation mode.

Abstract: A system includes a transmission unit configured to generate an electromagnetic wave, a first reception unit configured to detect the electromagnetic wave, and a processing unit configured to determine whether an output of the electromagnetic wave from the transmission unit is more than or equal to a threshold based on first image information obtained by capturing an image of the transmission unit in a state where the transmission unit is irradiating the electromagnetic wave.

Abstract: An apparatus includes an extract unit configured to extract features of a first image based on an electromagnetic wave in a first frequency band, an acquire unit configured to acquire motion information about the features, a classify unit configured to classify the features into a first group and a second group based on the motion information, and a remove unit configured to remove, from the first image, a signal corresponding to the feature belonging to the first group.

Abstract: A system includes a first transmission unit configure to emit a first terahertz wave, a second transmission unit disposed at a position different from a position of the first transmission unit and configured to emit a second terahertz wave, a detection unit for detecting at least one of a first reflected terahertz wave that is a part of the first terahertz wave reflected from an object, or a second reflected terahertz wave that is a part of the second terahertz wave reflected from the object, and outputting image data based on the detected terahertz wave, and a first control unit configured to, under a condition set based on the image data, control at least one of an operation of the first transmission unit or an operation of the second transmission unit.

Abstract: The present invention relates to a device for radiating or receiving an electromagnetic wave. The device includes a substrate including a recess coated by a material that reflects the electromagnetic wave, a metal portion that radiates or receives the electromagnetic wave, and an electronic element connected to the metal portion on the substrate. The metal portion includes a portion provided above an opening of the recess and a portion which is located on the substrate and connected to the electronic element.

Abstract: An illumination apparatus includes a case, a plurality of oscillators configured to generate electromagnetic waves, and housed in the case and arranged two-dimensionally, a window unit configured to emit therefrom the electromagnetic waves, and disposed on a first side of the case, a plurality of inflow holes configured to allow fluid to flow into the case, and disposed at positions at which the electromagnetic waves from the window unit propagate, and a discharging unit configured to discharge the fluid, which has flowed into the case, out of the case, and disposed on a second side of the case, which is an opposite side to the first side. When the oscillator is viewed from the window unit, a part of the oscillator is located on an inner side of the inflow hole, and the fluid which has flowed into the case through the inflow hole reaches the oscillator.

Abstract: An image capture device 1001 captures an image by using a terahertz wave and includes a generating unit 112 that includes a plurality of generation elements each of which generates the terahertz wave and rests on a resting plane 117, an irradiation optical system 111 that irradiates an object with the terahertz wave, an imaging optical system 101 that images the terahertz wave that is reflected from the object, and a sensor 102 that includes pixels. The plurality of generation elements include at least a first generation element 113 and a second generation element 114 that have different angles of radiation to the object. There is an overlap region in which a region of radiation of a first terahertz wave 156 from the first generation element to the object overlaps a region of radiation of a second terahertz wave 157 from the second generation element to the object.

Abstract: An image capture device 1001 captures an image by using a terahertz wave and includes a generating unit 112 that includes a plurality of generation elements each of which generates the terahertz wave and rests on a resting plane 117, an irradiation optical system 111 that irradiates an object with the terahertz wave, an imaging optical system 101 that images the terahertz wave that is reflected from the object, and a sensor 102 that includes pixels. The plurality of generation elements include at least a first generation element 113 and a second generation element 114 that have different angles of radiation to the object. There is an overlap region in which a region of radiation of a first terahertz wave 156 from the first generation element to the object overlaps a region of radiation of a second terahertz wave 157 from the second generation element to the object.

Abstract: A terahertz wave camera that acquires information on a measurement target includes: a sensor unit in which a plurality of elements having spectral sensitivity to the terahertz wave are arranged; a readout circuit unit that reads out signals from the elements; a first light-shielding portion; and an optical unit. The first light-shielding portion reduces disturbance light to which the readout circuit unit has spectral sensitivity. The optical unit guides a terahertz wave from the measurement target to the sensor unit.

Abstract: A camera system is provided. The camera system is arranged to form a part of a monitoring system arranged in a place of a facility where an inspection object lines up. The camera system comprises an imaging system configured to acquire an image formed by a terahertz wave reflected by the inspection object.

Abstract: A processing system comprising a first imaging system configured to capture a first image based on a terahertz wave from an inspection target, a second imaging system configured to capture a second image of the inspection target based on an electromagnetic wave of a wavelength different from the terahertz wave, and a processor configured to process the first image and the second image, wherein the processor detects an inspection region based on the second image and processes information of a region of the first image corresponding to the inspection region.

Abstract: A movable body includes an imaging system which acquires an image formed by a terahertz wave, wherein the image is an image obtained by capturing an inspection object inside the movable body.

Abstract: An image capture device 1001 captures an image by using a terahertz wave and includes a generating unit 112 that includes a plurality of generation elements each of which generates the terahertz wave and rests on a resting plane 117, an irradiation optical system 111 that irradiates an object with the terahertz wave, an imaging optical system 101 that images the terahertz wave that is reflected from the object, and a sensor 102 that includes pixels. The plurality of generation elements include at least a first generation element 113 and a second generation element 114 that have different angles of radiation to the object. There is an overlap region in which a region of radiation of a first terahertz wave 156 from the first generation element to the object overlaps a region of radiation of a second terahertz wave 157 from the second generation element to the object.

Abstract: The present invention relates to a device for radiating or receiving an electromagnetic wave. The device includes a substrate including a recess coated by a material that reflects the electromagnetic wave, a metal portion that radiates or receives the electromagnetic wave, and an electronic element connected to the metal portion on the substrate. The metal portion includes a portion provided above an opening of the recess and a portion which is located on the substrate and connected to the electronic element.

Abstract: A measurement apparatus includes a terahertz wave generating unit configured to generate a terahertz wave in response to incidence of pump light thereon; a terahertz wave detecting unit configured to detect the terahertz wave in response to incidence of probe light thereon; an adjusting unit configured to adjust an optical path length difference to adjust a timing at which the terahertz wave and the probe light reach the terahertz wave detecting unit; an amount-of-change detecting unit configured to detect an amount of change in the optical path length difference; a vibration obtaining unit configured to obtain information about a magnitude of vibration of the adjusting unit; a determining unit configured to determine whether the magnitude is within a range of an allowable value; and an output unit configured to output a measurement start trigger in a case where the determining unit determines the magnitude is within the range.

Abstract: A light delaying apparatus comprises: a first reflector moving along a circumference defined and turning back the light along an axis parallel to an optical axis of the light incident on the first reflector; a second reflector configured to reflect the light turned back by the first reflector such that to be coaxial with the optical axis of the light turned back by the first reflector; and an angular encoder configured to, in order to detect the position of the first reflector on the circumference, include reading patterns in which at least a part of intervals between boundaries of the reading patterns is arranged irregularly, wherein the interval between the boundaries of the reading patterns corresponds to an adjusted quantity of the light delay converted from a time interval during which a time domain response of an electromagnetic wave is measured by using the light reflected by the second reflector.

Abstract: A time-domain waveform of a terahertz wave is measured by a method based on time-domain spectroscopy by using an optical delay unit to adjust an optical path length along which excitation light propagates thereby adjusting a difference between a time at which the excitation light arrives at a generating unit configured to generate the terahertz wave and a time at which the excitation light arrives at a detection unit configured to detect the terahertz wave. The optical delay unit is driven according to a first speed pattern to acquire a first time-domain waveform. The optical delay unit is then driven according to a second speed pattern different from the first speed pattern to acquire a second time-domain waveform. The first time-domain waveform and the second time-domain waveform are averaged.

Abstract: An apparatus configured to acquire information on an object to be measured by an electromagnetic wave pulse, the apparatus includes: a generating unit configured to generate the electromagnetic wave pulse with which the object to be measured is irradiated; a detecting unit configured to detect the electromagnetic wave pulse from the object to be measured; a casing including at least a part of a propagation path of the electromagnetic wave pulse leading from the generating unit to the detecting unit; and a measuring window unit configured to change a propagation distance of the electromagnetic wave pulse by moving a measuring window disposed in a part of the casing. The object to be measured is disposed on an opposite side of the propagation path of the electromagnetic wave pulse inside the casing by interposing the measuring window.

Abstract: An apparatus including: an element configured to generate or detect a terahertz wave; a semi-spherical lens configured to guide the terahertz wave outgoing from the element or entering the element; and a holder configured to hold the semi-spherical lens and the element in a state in which a flat surface of the semi-spherical lens and the element are in contact with each other or in a state in which the flat surface of the semi-spherical lens and the element clamp a substance which allows the terahertz wave to pass therethrough and the flat surface of the semi-spherical lens and the element are in contact with the substance, wherein the holder includes: a resiliently deformable portion; and a position adjusting unit configured to adjust a relative position between the semi-spherical lens and the element in a direction parallel to the flat surface of the semi-spherical lens by resiliently deforming the resiliently deformable portion.

Abstract: A measurement apparatus may include: an irradiating unit configured to shape at least one terahertz wave and irradiate first and second surfaces of the object with the at least one shaped terahertz wave; a positional information acquiring unit configured to acquire positional information on a measurement area of the at least one shaped terahertz wave; and a position adjusting unit configured to relatively adjust a converging position of the at least one shaped terahertz wave and a position of the object in a depth direction of the object on a basis of the acquired positional information, which may be acquired by using relationship information indicating a relationship between positions of the first and second surfaces and intensities or beam propagation shapes of at least one first pulse and at least one second pulse of the at least one terahertz wave reflected respectively from the first and second surfaces.