Patents by Inventor Thomas G. Miller
Thomas G. Miller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10366860Abstract: An x-ray target, a method of using the x-ray target, and a computer program product with instructions for carrying out a method of using the x-ray target. The x-ray target includes a substrate made from a soft x-ray producing material and a high aspect ratio structure made from a hard x-ray producing material. The hard x-ray producing material is embedded in the substrate, formed on the substrate, cantilevered out from the edge of the substrate, or any combination thereof. The high aspect ratio structure comprises a plurality of high aspect ratio structures arranged in one or more grids or arrays, and the high aspect ratio structures in one of the one or more grids or arrays are arranged to form a Hadamard matrix structure.Type: GrantFiled: February 21, 2018Date of Patent: July 30, 2019Assignee: FEI CompanyInventors: N. William Parker, Mark W. Utlaut, Laurens Franz Taemsz Kwakman, Thomas G. Miller
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Patent number: 10340119Abstract: Techniques are described that facilitate automated extraction of lamellae and attaching the lamellae to sample grids for viewing on transmission electron microscopes. Some embodiments of the invention involve the use of machine vision to determine the positions of the lamella, the probe, and/or the TEM grid to guide the attachment of the probe to the lamella and the attachment of the lamella to the TEM grid. Techniques that facilitate the use of machine vision include shaping a probe tip so that its position can be readily recognized by image recognition software. Image subtraction techniques can be used to determine the position of the lamellae attached to the probe for moving the lamella to the TEM grid for attachment. In some embodiments, reference structures are milled on the probe or on the lamella to facilitate image recognition.Type: GrantFiled: March 20, 2017Date of Patent: July 2, 2019Assignee: FEI CompanyInventors: Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard J. Young, Thomas G. Miller, Brian Roberts Routh, Jr., Stacey Stone, Todd Templeton
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Publication number: 20190193014Abstract: An air cleaner assembly and components therefor are described. The components include features of an air cleaner housing; advantageous main filter cartridges; and, advantageous safety filter cartridge features. Features of the main filter cartridge are provided to engage an access cover of the assembly, and a cartridge support within the housing, in a preferred manner. Methods of assembly and use are also described.Type: ApplicationFiled: March 4, 2019Publication date: June 27, 2019Inventors: Douglas L. Iddings, Daniel Adamek, Thomas G. Miller, Johan G. DeWit, Michel Baseotto, Roberto Merckx, Julien Dils, Paul R. Coulonvaux, James R. Scott
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Patent number: 10176969Abstract: A method for rapid switching between operating modes with differing beam currents in a charged particle system is disclosed. Many FIB milling applications require precise positioning of a milled pattern within a region of interest (RoI). This may be accomplished by using fiducial marks near the RoI, wherein the FIB is periodically deflected to image these marks during FIB milling. Any drift of the beam relative to the RoI can then be measured and compensated for, enabling more precise positioning of the FIB milling beam. It is often advantageous to use a lower current FIB for imaging since this may enable higher spatial resolution in the image of the marks. For faster FIB milling, a larger beam current is desired. Thus, for optimization of the FIB milling process, a method for rapidly switching between high and low current operating modes is desirable.Type: GrantFiled: February 8, 2016Date of Patent: January 8, 2019Assignee: FEI CompanyInventor: Thomas G. Miller
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Publication number: 20180322630Abstract: The diagnostic vector classification support system and method disclosed herein may both reduce the time and effort required to train radiologists to interpret medical images, and provide a decision support system for trained radiologists who, regardless of training, have the potential to miss relevant findings. In an embodiment, a morphological image is used to identify a zone of interest in a co-registered functional image. An operator's grading of a feature at least partially contained within the zone of interest is compared to one or more computer-generated grades for the feature. Where the operator and computer-generated grades differ, diagnostic support can be provided such as displaying additional images, revising the zone of interest, annotating one or more displayed images, displaying a computer-generated feature grade, among other possibilities disclosed herein.Type: ApplicationFiled: June 28, 2018Publication date: November 8, 2018Applicant: Seno Medical Instruments, Inc.Inventors: Anthony Thomas Stavros, Reni S. Butler, Philip T. Lavin, Jason Zalev, Thomas G. Miller
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Publication number: 20180277361Abstract: A method and apparatus for material deposition onto a sample to form a protective layer composed of at least two materials that have been formulated and arranged according to the material properties of the sample.Type: ApplicationFiled: May 21, 2018Publication date: September 27, 2018Applicant: FEI CompanyInventors: Brian Roberts Routh, JR., Thomas G. Miller, Chad Rue, Noel Thomas Franco
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Patent number: 10026170Abstract: The diagnostic vector classification support system and method disclosed herein may both reduce the time and effort required to train radiologists to interpret medical images, and provide a decision support system for trained radiologists who, regardless of training, have the potential to miss relevant findings. In an embodiment, a morphological image is used to identify a zone of interest in a co-registered functional image. An operator's grading of a feature at least partially contained within the zone of interest is compared to one or more computer-generated grades for the feature. Where the operator and computer-generated grades differ, diagnostic support can be provided such as displaying additional images, revising the zone of interest, annotating one or more displayed images, displaying a computer-generated feature grade, among other possibilities disclosed herein.Type: GrantFiled: July 19, 2016Date of Patent: July 17, 2018Assignee: Seno Medical Instruments, Inc.Inventors: Anthony Thomas Stavros, Reni S. Butler, Philip T. Lavin, Jason Zalev, Thomas G. Miller
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Publication number: 20180190467Abstract: An x-ray target, a method of using the x-ray target, and a computer program product with instructions for carrying out a method of using the x-ray target. The x-ray target includes a substrate made from a soft x-ray producing material and a high aspect ratio structure made from a hard x-ray producing material. The hard x-ray producing material is embedded in the substrate, formed on the substrate, cantilevered out from the edge of the substrate, or any combination thereof. The high aspect ratio structure comprises a plurality of high aspect ratio structures arranged in one or more grids or arrays, and the high aspect ratio structures in one of the one or more grids or arrays are arranged to form a Hadamard matrix structure.Type: ApplicationFiled: February 21, 2018Publication date: July 5, 2018Applicant: FEI CompanyInventors: N. William Parker, Mark W. Utlaut, Laurens Franz Taemsz Kwakman, Thomas G. Miller
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Publication number: 20180182676Abstract: A system for analyzing defects comprises determining coordinates of a defect using a wafer inspection tool; identifying a structure of interest near the defect coordinates; directing a focused ion beam toward the wafer to expose the structure of interest; and forming an image of the exposed structure of interest, wherein the focused ion beam is directed to the mill at a location corresponding to the identified structure of interest rather than at the coordinates of the defect.Type: ApplicationFiled: December 21, 2017Publication date: June 28, 2018Applicant: FEI CompanyInventor: Thomas G. Miller
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Patent number: 9978586Abstract: A method and apparatus for material deposition onto a sample to form a protective layer composed of at least two materials that have been formulated and arranged according to the material properties of the sample.Type: GrantFiled: March 31, 2016Date of Patent: May 22, 2018Assignee: FEI CompanyInventors: Brian Roberts Routh, Jr., Thomas G. Miller, Chad Rue, Noel Thomas Franco
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Patent number: 9934930Abstract: An x-ray target, a method of using the x-ray target, and a computer program product with instructions for carrying out a method of using the x-ray target. The x-ray target includes a substrate made from a soft x-ray producing material and a high aspect ratio structure made from a hard x-ray producing material. The hard x-ray producing material is embedded in the substrate, formed on the substrate, cantilevered out from the edge of the substrate, or any combination thereof. The high aspect ratio structure comprises a plurality of high aspect ratio structures arranged in one or more grids or arrays, and the high aspect ratio structures in one of the one or more grids or arrays are arranged to form a Hadamard matrix structure.Type: GrantFiled: March 12, 2015Date of Patent: April 3, 2018Assignee: FEI CompanyInventors: N. William Parker, Mark W. Utlaut, Laurens Franz Taemsz Kwakman, Thomas G. Miller
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Patent number: 9818584Abstract: An inductively coupled plasma source for a focused charged particle beam system includes a conductive shield within the plasma chamber in order to reduce capacitative coupling to the plasma. The internal conductive shield is maintained at substantially the same potential as the plasma source by a biasing electrode or by the plasma. The internal shield allows for a wider variety of cooling methods on the exterior of the plasma chamber.Type: GrantFiled: July 7, 2014Date of Patent: November 14, 2017Assignee: FEI CompanyInventors: Thomas G. Miller, Shouyin Zhang
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Publication number: 20170256380Abstract: Techniques are described that facilitate automated extraction of lamellae and attaching the lamellae to sample grids for viewing on transmission electron microscopes. Some embodiments of the invention involve the use of machine vision to determine the positions of the lamella, the probe, and/or the TEM grid to guide the attachment of the probe to the lamella and the attachment of the lamella to the TEM grid. Techniques that facilitate the use of machine vision include shaping a probe tip so that its position can be readily recognized by image recognition software. Image subtraction techniques can be used to determine the position of the lamellae attached to the probe for moving the lamella to the TEM grid for attachment. In some embodiments, reference structures are milled on the probe or on the lamella to facilitate image recognition.Type: ApplicationFiled: March 20, 2017Publication date: September 7, 2017Applicant: FEI CompanyInventors: Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard J. Young, Thomas G. Miller, Brian Roberts Routh, JR., Stacey Stone, Todd Templeton
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Patent number: 9718021Abstract: A filter cartridge arrangement is provided which includes a media pack comprising Z-filter media, a preform and a housing seal member. Improvements in the preform and seal member are described which include: a single beveled surface of the seal member to facilitate installation; and, an inside region of the seal member having a tip adjacent in inwardly directed lip of the preform, to control flash during molding. A variety of media pack configurations and features are described.Type: GrantFiled: February 2, 2015Date of Patent: August 1, 2017Assignee: Donaldson Company, Inc.Inventors: Benny Kevin Nelson, Sheldon Anderson, Thomas G. Miller, Ross Norman Anderson, John Orlin Kirkwold, Kevin Schrage, Troy Murphy, Donald Raymond Mork, Richard J. Osendorf
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Patent number: 9691583Abstract: Applicants have found that energetic neutral particles created by a charged exchange interaction between high energy ions and neutral gas molecules reach the sample in a ion beam system using a plasma source. The energetic neutral create secondary electrons away from the beam impact point. Methods to solve the problem include differentially pumped chambers below the plasma source to reduce the opportunity for the ions to interact with gas.Type: GrantFiled: July 7, 2015Date of Patent: June 27, 2017Assignee: FEI CompanyInventors: Thomas G. Miller, Sean Kellogg, Shouyin Zhang, Mostafa Maazouz, Anthony Graupera
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Patent number: 9655594Abstract: Methods and compositions for gelatin based tissue mimicking opto-acoustic phantom that accurately replicates opto-acoustic properties of biological tissue and permits matching of each optical and each acoustic property of specific tissues independently so that by changing one property the other property is not altered. Such phantoms can match tissue properties in the specific range of system parameters required for evaluation of hardware and software performance, calibration, validation or personnel training of optical, optoacoustic, ultrasonic or combined system used for imaging, sensing or monitoring of tissue morphology and molecular composition.Type: GrantFiled: December 17, 2013Date of Patent: May 23, 2017Assignee: SENO MEDICAL INSTRUMENTS, INC.Inventors: Alexander A. Oraevsky, Dmitri A. Tsyboulski, Thomas G. Miller
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Publication number: 20170133220Abstract: A method and apparatus for material deposition onto a sample to form a protective layer composed of at least two materials that have been formulated and arranged according to the material properties of the sample.Type: ApplicationFiled: March 31, 2016Publication date: May 11, 2017Applicant: FEI CompanyInventors: Brian Roberts Routh, JR., Thomas G. Miller, Chad Rue, Noel Thomas Franco
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Patent number: 9601313Abstract: Techniques are described that facilitate automated extraction of lamellae and attaching the lamellae to sample grids for viewing on transmission electron microscopes. Some embodiments of the invention involve the use of machine vision to determine the positions of the lamella, the probe, and/or the TEM grid to guide the attachment of the probe to the lamella and the attachment of the lamella to the TEM grid. Techniques that facilitate the use of machine vision include shaping a probe tip so that its position can be readily recognized by image recognition software. Image subtraction techniques can be used to determine the position of the lamellae attached to the probe for moving the lamella to the TEM grid for attachment. In some embodiments, reference structures are milled on the probe or on the lamella to facilitate image recognition.Type: GrantFiled: November 6, 2015Date of Patent: March 21, 2017Assignee: FEI COMPANYInventors: Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Richard J. Young, Thomas G. Miller, Brian Roberts Routh, Jr., Stacey Stone, Todd Templeton
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Publication number: 20160343132Abstract: The diagnostic vector classification support system and method disclosed herein may both reduce the time and effort required to train radiologists to interpret medical images, and provide a decision support system for trained radiologists who, regardless of training, have the potential to miss relevant findings. In an embodiment, a morphological image is used to identify a zone of interest in a co-registered functional image. An operator's grading of a feature at least partially contained within the zone of interest is compared to one or more computer-generated grades for the feature. Where the operator and computer-generated grades differ, diagnostic support can be provided such as displaying additional images, revising the zone of interest, annotating one or more displayed images, displaying a computer-generated feature grade, among other possibilities disclosed herein.Type: ApplicationFiled: July 19, 2016Publication date: November 24, 2016Applicant: Seno Medical Instruments, Inc.Inventors: Anthony Thomas Stavros, Reni S. Butler, Philip T. Lavin, Jason Zalev, Thomas G. Miller
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Publication number: 20160296121Abstract: A handheld optoacoustic probe includes an ultrasound transducer array and optical fibers with a first end formed into a fiber bundle providing an input and a second, distal end providing an output. A light bar guide retains the distal end of the optical fibers on the same plane. One or more optical windows may be associated with, and spaced from the light bar guide so as to prevent contact between a coupling agent and the distal ends of the optical fibers, thus mitigating a potential acoustic effect of the coupling agent in response to light emitting from the fibers. A silicon rubber acoustic lens doped with TiO2 may be provided, with a reflective metal surrounding the outer surface of the acoustic lens. A handheld probe shell houses the light bar guide, the ultrasound transducer array, and the acoustic lens.Type: ApplicationFiled: May 2, 2016Publication date: October 13, 2016Inventors: Donald G. Herzog, Thomas G. Miller