Abstract: An apparatus includes a detection beam path, along which detection radiation is guided, and a means for splitting the detection radiation between first and second detection paths, with a detector being in each detection path. A microlens array is arranged upstream of at least one detector. The first detector has a first spatial resolution, and the second detector has a second spatial resolution that is lower than the first spatial resolution. Also, the first detector has a first temporal resolution, and the second detector has a second temporal resolution that is higher than the first temporal resolution. Captured image data and computationally combined to form a three-dimensionally resolved resulting image.

Abstract: A device includes a detection path, along which detection radiation is guided, and a means for splitting the detection radiation between first and second detection paths. A detector has detector elements in each detection path. A microlens array is disposed upstream of each detector in a pupil. The first and second detectors have a substantially identical spatial resolution. The detector elements of the first detector are arranged line by line in a first line direction, while the detector elements of the second detector are arranged line by line in a second line direction. The first and second detectors are arranged relative to the image to be captured such that the first and second line directions are inclined relative to one another. A readout unit for reading out the image data of the detectors is configured for selectively reading those detector elements arranged line by line which form an image line.

Abstract: A light microscope has a light source for illuminating a specimen, a photon-counting detector array with a plurality of photon-counting detector elements for measuring detection light coming from the specimen, wherein the photon-counting detector elements are configured to output respective measured photon count rates, and a control device for controlling the photon-counting detector array. The control device is configured to individually influence the measurable photon count rates which are simultaneously measurable with different photon-counting detector elements and/or which are consecutively measurable with the same photon-counting detector element. Furthermore, in an imaging method the measurable photon count rates of photon-counting detector elements are individually influenced to increase the signal-to-noise ratio for the photon-counting detector array.

Abstract: The invention relates to a microscope having an excitation beam path for guiding excitation light, having a laser light source for providing a laser light beam as excitation light and having a scanning apparatus for aligning and moving a focused laser light beam in the entrance pupil of an illumination objective; wherein the laser focus is directed into an entrance point that is offset with respect to the optical axis of the illumination objective; and also having a detection beam path for guiding detection light, comprising a microlens array having a focal plane for generating partial imaged presentations and a detector arranged in the focal plane of the microlens array for capturing the partial imaged presentations. In addition, an evaluation unit for evaluating the captured image signals of the detector in accordance with light-field technology is present. The invention additionally relates to a method for microscopic image generation.

Abstract: A light microscope having a scanner for scanning a sample with illuminating light and a light detector for measuring sample light. A microlens array having a plurality of microlenses is arranged in front of the light detector in the region of a pupil plane. The light detector respectively has a plurality of detector elements behind each microlens and has a complete readout frequency of at least 100 kHz. By means of the detector elements arranged behind the respective microlens, a wavefront datum regarding the sample light is determined. Moreover, a sample point signal is computed from signals of the detector elements. Illuminating light is successively deflected onto different sample points with the scanner and corresponding sample point signals are captured, wherein, for at least some of the different sample points, a corresponding wavefront datum is also determined. The determined wavefront data can be taken into account in a calculation of a sample image from the plurality of sample point signals.

Abstract: The invention relates to an optical group for detection light of a microscope, in particular a confocal scanning microscope, having an input plane (10) for the passage of detection light to be measured and having a detection beam path arranged downstream of the input plane for guiding the detection light (11) into a detection plane (67), wherein the detection beam path has at least one first beam course (1) having first optical beam-guiding means, in particular first lenses and/or mirrors (20, 30, 34, 36, 58, 60, 66), for guiding the detection light into the detection plane. In the first beam course, the optical group has at least one dispersive device (26) for the spatial spectral splitting of the detection light to be measured and a manipulation device (49) for manipulating the spectrally spatially split detection light.

Abstract: A microscope and method of microscopy having a light source for providing illumination light, a controllable manipulation device for generating in a variable manner an illumination pattern of the illumination light to be selected, an illumination beam path with a microscope lens for guiding the illumination pattern to a sample to be examined, a detector having a plurality of pixels for examining the fluorescent light emitted by the sample, a detection beam path for guiding the fluorescent light emitted by the sample to the detector, a main beam splitter for splitting illumination light and fluorescent light, a control and evaluation unit for controlling the manipulation device and for evaluating the data measured by the detector.

Abstract: A microscopy method, and related microscope, including producing illumination radiation and directing it at a focus. The illumination radiation is switched temporally between at least two modes, such that focus modulation is effected at which temporally varying and mutually different mode fields of the illumination radiation are produced in the focus. The focus is guided at least over regions of a sample to be examined, wherein detection radiation in the sample is or may be brought about by the illumination radiation in the focus at least at a point of origin. The detection radiation is captured in a manner assigned to the at least one point of origin. In addition to the illumination radiation, at least one disexcitation beam of rays of disexcitation radiation is directed at the focus. The disexcitation radiation prevents the detection radiation from being brought about in the region that is illuminated by the disexcitation radiation.

Abstract: A light-scanning microscope including a scan optics for generating a pupil plane conjugate to the pupil plane of the microscope objective, and a variably adjustable beam deflection unit in the conjugate pupil plane. An intermediate image lies between the microscope objective and the scan optics. The scan optics image a second intermediate image (Zb2) into the first intermediate image via the beam deflection unit, wherein the second intermediate image is spatially curved. The deflection unit is not arranged in a collimated section of the beam path, but is instead arranged in a convergent section. Then, in terms of the optical properties and quality thereof, the scan optics needs rather to correspond merely to an eyepiece instead of a conventional scanner objective.

Abstract: A method and an apparatus for imaging a sample (14). In the method, a first excitation radiation (5) is focused into a volume of the sample (14) and a caused first detection radiation (15) is captured and evaluated in respect of a form of its wavefront. A second excitation radiation (11) is manipulated on the basis of the evaluation results in order to correct the ascertained deviations of the wavefront. A region (20) to be imaged of the sample (14) is scanned by means of the second excitation radiation (11) and a second detection radiation (16) is captured as image data. The second excitation radiation (11) is directed in the form of at least two partial beams (11T) into the sample volume, into a respective spot (22) illuminated by the partial beam (11T) and the second detection radiations (16) respectively caused by the partial beams (11T) are captured separately.

Abstract: The invention relates to an optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope.

Abstract: An optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope, having an optical scanning unit for providing a first pupil plane, a first beam deflecting device, which is made of a first scanner arranged on the first pupil plane, for scanning the excitation radiation and/or manipulation radiation in a first coordinate direction, a first focusing device for generating a second pupil plane, which is optically conjugated to the first pupil plane, and a second beam deflecting device for deflecting the excitation radiation and/or manipulation radiation, said second deflecting device being arranged on the second pupil plane, a second focusing device in order to generate a third pupil plane, which is optically conjugated to the first pupil plane and the second pupil plane, a third beam deflecting device is arranged on the third pupil plane for deflecting the excitation radiation and/or manipulation radiation, and a variable beam deflecting means is provided betwee

Abstract: Scanning fluorescence microscopes with an observation beam path from a measurement volume to an image plane. A beam combiner is provided for coupling an illumination system and a diaphragm arranged in the image plane for slow composition of the image because of the sequential scanning and subject the sample to loading as a result of inefficient use of the excitation light. The microscope simultaneously detects fluorescence from different focal planes in each case quasi-confocally. The observation beam path between the beam combiner and the image plane has a first diffractive optics for splitting light beams into beam bundles along different orders of diffraction, imparting to the light beams a spherical phase that is different from the other orders of diffraction. A second diffractive optics is provided for the compensation of chromatic aberrations of the split beam bundles, and a collecting optics is provided for focusing split beam bundles into the image plane.

Abstract: A microscopy method, and related microscope, including producing illumination radiation and directing it at a focus. The illumination radiation is switched temporally between at least two modes, such that focus modulation is effected at which temporally varying and mutually different mode fields of the illumination radiation are produced in the focus. The focus is guided at least over regions of a sample to be examined, wherein detection radiation in the sample is or may be brought about by the illumination radiation in the focus at least at a point of origin. The detection radiation is captured in a manner assigned to the at least one point of origin. In addition to the illumination radiation, at least one disexcitation beam of rays of disexcitation radiation is directed at the focus. The disexcitation radiation prevents the detection radiation from being brought about in the region that is illuminated by the disexcitation radiation.

Abstract: A method for the determination and compensation of geometric imaging errors which occur during the imaging of an object by sequential single or multispot scanning by means of a microscopic imaging system, which includes: establishing a reference object with a defined plane structure; and generating an electronic image data set of this structure free of geometric imaging errors. Then, generating at least one electronic actual image data set with the imaging system; comparing the actual image data set with the reference image data set with respect to the locations of those pixels which have the same object point as origin in each case; and determining location deviations in the actual image data set compared to the reference image data set.

Abstract: A microscope, in particular according to any of the preceding claims, consisting of an illuminating device, comprising an illumination light source and an illumination beam path for illuminating the specimen with a light sheet, a detection device for detecting light emitted by the specimen, and an imaging optical unit, which images the specimen via an imaging objective in an imaging beam path at least partly onto the detection device, wherein the light sheet is essentially planar at the focus of the imaging objective or in a defined plane in proximity of the geometrical focus of the imaging objective, and wherein the imaging objective has an optical axis, which intersects the plane of the light sheet at an angle that is different from zero, preferably perpendicularly, wherein an amplitude and/or phase filter is provided in the illumination beam path, said filter acting as a sine spatial filter in that it limits the illumination light in at least one spatial direction by filtering the spatial frequencies that

Abstract: An optical assembly for scanning excitation radiation and/or manipulation radiation in a laser scanning microscope. The assembly an optical scanning unit as a first focusing device for providing a first pupil plane, a first beam deflecting device, which is made of a first scanner arranged in the first pupil plane, for scanning the excitation radiation and/or manipulation radiation in a first coordinate direction, and a second focusing device for generating a second pupil plane, which is optically conjugated to the first pupil plane. A second beam deflecting device is provided for deflecting the excitation radiation and/or manipulation radiation, said second deflecting device being arranged in the second pupil plane. A third focusing device is provided in order to generate a third pupil plane, optically conjugated to the first pupil plane.

Abstract: An optical assembly that is designed for positioning in a beam path of a light microscope having means for providing structured illuminating light in a sample plane of the light microscope, so that structured illuminating light can be generated in different orientations. The optical assembly has an adjustable deflector in order to deflect an incident light bundle onto one of several beam paths in a selectable manner. Beam splitting devices are located in the beam paths in order to split the light bundle of the respective beam paths into partial light bundles, which are spatially separated from each other. Beam guides are provided for each of the partial light bundles, and guide the partial light bundles to a pupil plane. The beam guides are arranged in such a way that the partial light bundles that belong to the same beam path form a light spot pattern in the pupil plane; and that the light spot patterns of different beam paths in the pupil plane are different from each other.

Abstract: A light-scanning microscope including a scan optics for generating a pupil plane conjugate to the pupil plane of the microscope objective, and a variably adjustable beam deflection unit in the conjugate pupil plane. An intermediate image lies between the microscope objective and the scan optics. The scan optics image a second intermediate image (Zb2) into the first intermediate image via the beam deflection unit, wherein the second intermediate image is spatially curved. The deflection unit is not arranged in a collimated section of the beam path, but is instead arranged in a convergent section. Then, in terms of the optical properties and quality thereof, the scan optics needs rather to correspond merely to an eyepiece instead of a conventional scanner objective.

Abstract: A light-scanning microscope including a scan optics for generating a pupil plane conjugate to the pupil plane of the microscope objective, and a variably adjustable beam deflection unit in the conjugate pupil plane. An intermediate image lies between the microscope objective and the scan optics. The scan optics image a second intermediate image (Zb2) into the first intermediate image via the beam deflection unit, wherein the second intermediate image is spatially curved. The deflection unit is not arranged in a collimated section of the beam path, but is instead arranged in a convergent section. Then, in terms of the optical properties and quality thereof, the scan optics needs rather to correspond merely to an eyepiece instead of a conventional scanner objective.