Patents by Inventor Tomonori Ishikawa

Tomonori Ishikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4833508
    Abstract: A field effect semiconductor device which utilizes a 2DEG and is composed of a semi-insulating GaAs substrate; an i-type GaAs active layer; a superlattice structure layer which comprises a first i-type AlAs thin layer, a GaAs thin layer doped with an Si atomic plane, and a second i-type AlAs thin layer, these thin layers forming a GaAs quantum well; and n-type AlGaAs layer; and electrodes for source, drain, and gate.
    Type: Grant
    Filed: December 7, 1987
    Date of Patent: May 23, 1989
    Assignee: Fujitsu Limited
    Inventors: Tomonori Ishikawa, Shigehiko Sasa, Satoshi Hiyamizu
  • Patent number: 4734750
    Abstract: High electron mobility heterojunction semiconductor devices provided with a means to cause exposure of the electron source layer thereof to an electromagnetic wave allows modulation, adjustment and the like of the characteristics thereof even after completion of the production thereof, thus realizing a considerable magnitude of flexibility in the characteristics as well as considerably different modes in various embodiments, including field effect transistors which allow modulation of threshold voltage etc., connection channels or capacitors having a smaller resistance, programmable memory devices, image sensors. In addition, the high electron mobility heterojunction semiconductor devices can have a much higher operation speed than those available in the prior art.
    Type: Grant
    Filed: June 29, 1987
    Date of Patent: March 29, 1988
    Assignee: Fujitsu Limited
    Inventors: Shigeru Okamura, Tomonori Ishikawa