Abstract: A conductive-contact holder base accommodates at least a signal conductive-contact that is a conductive contact for performing input and output of a signal for a predetermined circuit configuration and a ground conductive-contact that is a conductive contact for supplying a ground potential to the predetermined circuit configuration. A holder base is formed of a conductive material, including a first opening for accommodating the signal conductive-contact; and a second opening for accommodating the ground conductive-contact while maintaining an electrical connection with the ground conductive-contact. An insulating member covers an inner surface of the first opening.

Abstract: In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.

Abstract: A conductive-contact holder accommodates at least a signal conductive-contact that is a conductive contact for performing input and output of a signal for a predetermined circuit configuration and a ground conductive-contact that is a conductive contact for supplying a ground potential to the predetermined circuit configuration. A holder base is formed of a conductive material, including a first opening for accommodating the signal conductive-contact; and a second opening for accommodating the ground conductive-contact while maintaining an electrical connection with the ground conductive-contact. An insulating member covers an inner surface of the first opening.

Abstract: A holder 1 is formed by laminating support members 3, 4 and 5 and passing holder holes 2 through them. A pair of needle members 9 and 10 are provided on either end of the coil spring 8. Each of the needle members 9 on one side is prevented from coming off by one of the support members 3. The length L between the flange portion 9b received in a large diameter hole 2b of the holder hole and the tip of the needle portion 10a is made substantially equal to the depth D of the large diameter hole 2b of the holder 1. Because the coil springs are thus placed substantially in an unstressed state, when at least one of the needle members is prevented from projecting from a corresponding end of the holder hole, the part that prevents the needle members from coming off is not subjected to a compressive load of the coil springs.

Abstract: A microcontactor probe has an insulator (6, 7) formed with a support hole (8, 9) having an open end and a close end, a lead conductor (11) exposed inside the support hole (8, 9) at the close end, and a resilient conductive assembly (2, 3, 4) fitted in the support hole (8, 9) and kept from falling.

Abstract: Provided is a support member assembly suitable for use in a contact probe head comprising a support member formed with a plurality of holder holes for supporting conductive contact members in a mutually parallel relationship, and a reinforcing member integrally formed with the support member and extending in a part of the support member devoid of any holder holes. The reinforcing member increases the overall mechanical strength of the support member assembly, and prevents the thermal deformation of the support member. Because the holder holes are formed in the support member made of material suitable for forming holes, such as plastic material and ceramic material, the holder holes can be formed at high precision and at low cost.

Abstract: A uniform contact resistance is obtained by a contact spring (2) having a leg portion (2b), a body portion (2c) and a tightly twisted neck portion (2a); a holder (6) having a reception hole (7) from which the leg portion (2b) and the neck portion (2a) are allowed to project and the body portion (2c) is inhibited from coming out; a float type guide plate (5) having a guide hole (3) into which the neck portion (2a) is inserted, and a support spring (15) interposed between the holder and the guide plate.

Abstract: A holder supported by an arm comprises a metallic reinforcing member and a plastic holder hole forming member filled in an opening formed in the reinforcing member. Holder holes are formed in the holder hole forming member, and a coil spring and electroconductive needle members are installed in each holder hole to thereby provide a contact probe having two moveable ends. Because the holder is essentially made of the metallic member, the mechanical strength of the holder can be improved over that formed strictly from plastic material. Therefore, the contact probe holder would not suffer from dimensional changes of the holder owing to aging compounded by temperature changes for testing (tests under high temperature conditions) and residual stress so that the change in the pitch of the holder holes can be avoided, and a high level of precision can be ensured. Therefore, the contact probe allows tests to be conducted in a stable manner over an extended period of time.

Abstract: A first needle-like member includes a columnar member formed by a conductive material such as a metal material with its up-and-down direction being longitudinal, and a contact member formed on a semiconductor integrated circuit (body to be contacted) side with respect to the columnar member, which are integrally formed. In the columnar member, a through hole is formed in the longitudinal direction of the first needle-like member. The through hole has opening ends on both sides thereof. Thus, in the process of manufacturing the needle-like member, the contact member is formed on a rod-like body being a raw material from the same direction as a drill insertion direction to form the through hole.

Abstract: A conductive-contact holder accommodates at least a signal conductive-contact that is a conductive contact for performing input and output of a signal for a predetermined circuit configuration and a ground conductive-contact that is a conductive contact for supplying a ground potential to the predetermined circuit configuration. A holder base is formed of a conductive material, including a first opening for accommodating the signal conductive-contact; and a second opening for accommodating the ground conductive-contact while maintaining an electrical connection with the ground conductive-contact. An insulating member covers an inner surface of the first opening.

Abstract: An opening 5a is formed in a part of a high strength base plate 5 for providing electroconductive contact units, and a holder hole forming member 7 made of plastic material is filled into the opening via an insulating film 6. Holder holes 2 are formed in the holder hole forming member, and a coil spring 8 and electroconductive needle members 9 and 10 are installed in each holder hole. Because the proportion of the reinforcing material in the thickness of the holder is so high that the contact probe holder can be made almost as strong as the high strength base plate. Thus, even when the thickness of the holder is minimized, the mechanical strength of the holder can be ensured as opposed to the conventional arrangement including a simply insert molded metallic member, and the holder can be made even thinner.

Abstract: In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.

Abstract: In the electroconductive contact unit of the present invention, an electroconductive needle member 2 is made of a noble metal alloy having a high hardness and wear resistance, and formed with a gold plated layer 8 via a Ni under layer 7, and a flat surface 2e is formed by a tip portion thereof so as to expose the material of the needle member. Thereby, the durability of the needle member is ensured and the electroconductivity of the electric path between the needle member and coil spring is minimized on account of the gold plated layer. Even when the contact surface is soiled by solder deposition after repeated applications to contact objects such as solder balls, simply grinding the contact surface and revealing a new surface, the contact resistance between the contact surface and contact object can be kept unchanged by grinding so that the test can be conducted with the benefit of low resistance at all times.

Abstract: In the electroconductive contact unit of the present invention, a gold plated layer 8 is formed over the surface of an electroconductive needle member 2 via a Ni under layer 7a, and a layer of iridium (titanium nitride, rhodium or hafnium nitride) is formed on the gold plated layer 8 of the needle portion 2a by sputtering, via an Ni under layer 7b. Thereby, the tip portion is provided with an improved resistance to oxidization and wear without using any special material for the needle member, and the durability of the needle member is improved so that the running cost can be minimized.

Abstract: In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.

Abstract: The support member assembly 1 is formed by laminating a plurality of plastic layered assemblies 6 each incorporated with a reinforcing plate 3 and integrally joining them by heating. Holder holes 2 are formed in the parts of the assembly corresponding to the openings 3a of the reinforcing plates 3. The reinforcing member increases the overall mechanical strength of the support member assembly. Furthermore, because a number of reinforcing plates can be layered and each reinforcing plate may be provided with a small thickness, the working of the strips of the reinforcing plates between adjacent openings can be achieved without any difficulty, and the manufacturing cost of such a support member assembly can be reduced. When each plastic layered assembly comprises plastic material formed by impregnating non-woven fabric with thermosetting resin, the drilling of holder holes for receiving electroconductive contact members can be more favorably and economically performed.

Abstract: Provided is a support member assembly suitable for use in a contact probe head comprising a support member formed with a plurality of holder holes for supporting conductive contact members in a mutually parallel relationship, and a reinforcing member integrally formed with the support member and extending in a part of the support member devoid of any holder holes. The reinforcing member increases the overall mechanical strength of the support member assembly, and prevents the thermal deformation of the support member. Because the holder holes are formed in the support member made of material suitable for forming holes, such as plastic material and ceramic material, the holder holes can be formed at high precision and at low cost.

Abstract: An opening 5a is formed in a part of a high strength base plate 5 for providing electroconductive contact units, and a holder hole forming member 7 made of plastic material is filled into the opening via an insulating film 6. Holder holes 2 are formed in the holder hole forming member, and a coil spring 8 and electroconductive needle members 9 and 10 are installed in each holder hole. Because the proportion of the reinforcing material in the thickness of the holder is so high that the contact probe holder can be made almost as strong as the high strength base plate. Thus, even when the thickness of the holder is minimized, the mechanical strength of the holder can be ensured as opposed to the conventional arrangement including a simply insert molded metallic member, and the holder can be made even thinner.

Abstract: A holder 1 is formed by laminating support members 3, 4 and 5 and passing holder holes 2 through them. A pair of needle members 9 and 10 are provided on either end of the coil spring 8. Each of the needle members 9 on one side is prevented from coming off by one of the support members 3. The length L between the flange portion 9b received in a large diameter hole 2b of the holder hole and the tip of the needle portion 10a is made substantially equal to the depth D of the large diameter hole 2b of the holder 1. Because the coil springs are thus placed substantially in an unstressed state, when at least one of the needle members is prevented from projecting from a corresponding end of the holder hole, the part that prevents the needle members from coming off is not subjected to a compressive load of the coil springs.

Abstract: A holder supported by an arm comprises a metallic reinforcing member and a plastic holder hole forming member filled in an opening formed in the reinforcing member. Holder holes are formed in the holder hole forming member, and a coil spring and electroconductive needle members are installed in each holder hole to thereby provide a contact probe having two moveable ends. Because the holder is essentially made of the metallic member, the mechanical strength of the holder can be improved over that formed strictly from plastic material. Therefore, the contact probe holder would not suffer from dimensional changes of the holder owing to aging compounded by temperature changes for testing (tests under high temperature conditions) and residual stress so that the change in the pitch of the holder holes can be avoided, and a high level of precision can be ensured. Therefore, the contact probe allows tests to be conducted in a stable manner over an extended period of time.